The invention relates to an imaging elemental analyzer for imaging one or more
analyte elements in an organic sample, wherein the analyzer comprises: a chamber for receiving an organic sample containing one or more
analyte elements to be imaged, wherein the internal
chamber pressure surrounding the sample is in the range of 10 -5 up to 10 -2mbar; at least one irradiant selected from: (i) an
ion gun for irradiating the sample with a high-intensity primary
ion beam, wherein the primary ions are generated in the
ion gun at a pressure below 1 mbar, the
ion gun serving to focus the primary
ion beam onto a localized spot on the sample surface and to move the spot over time to a plurality of locations on the sample surface; (ii) a
laser for irradiating a localized spot on the sample surface and to move the spot over time to a plurality of locations on the sample surface; a gas-filled RF ion guide for receiving the generated ions, comprising the elements released from the sample in response to
irradiation by the primary ions or the
laser, wherein the RF ion guide prevents the propagation of any ions whose m / z values are less than the
mass or
mass range of the
analyte elements;and a time-of-flight (TOF)
mass analyzer for recording the ions or reaction products of the secondary ions formed from the RF ion guidance, wherein the TOF
mass analyzer is configured for a repetition rate of at least 5 kHz. The invention also relates to a corresponding method and a corresponding device for imaging one or more inorganic, non-volatile elements.