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121 results about "Scientific instrument" patented technology

A scientific instrument is, broadly speaking, a device or tool used for scientific purposes, including the study of both natural phenomena and theoretical research.

Retrieval augmented generative question and answer boosting

Systems or techniques are provided for facilitating retrieval augmented generative question and answer boosting. In various embodiments, a system can access a plain text question regarding a scientific instrument. In various aspects, the system can generate, via a large language model that references a document-graph repository, a structured or unstructured answer for the plain text question. In various instances, the document-graph repository can comprise a plurality of document-graphs that respectively correspond to a plurality of technical documents. In various cases, for a first document-graph that corresponds to a first technical document, leaf nodes of the first document-graph can represent respective text blocks written in the first technical document, and non-leaf nodes of the first document-graph can respectively represent a document title, one or more section headings, and one or more scientific instrument identifiers written in the first technical document and beneath which the respective text blocks are nested.
Owner:PPD DEVELOPMENT LP +2

Digital twin calibration

Systems or techniques are provided for facilitating improved digital twin calibration for scientific instruments. In various embodiments, a system can synchronize, via execution of a state-wide Bayesian filter, a parametric state of a digital twin with a physical state of a scientific instrument. In various instances, the state-wide Bayesian filter can comprise a set of calibration iterations, each of which can comprise a Bayesian update to an entirety of the parametric state based on an iteration-common observable that is exhibitable by the scientific instrument and simulatable by the digital twin. In various cases, the scientific instrument can be a charged-particle microscope, the parametric state of the digital twin can be an aberration coefficient vector of the charged-particle microscope, and the iteration-common observable can be a Fourier transform of a convergent beam electron diffraction pattern of an amorphous carbon specimen captured by the charged-particle microscope.
Owner:FEI ELECTRON OPTICS BV

Solid propellant mechanical property testing device and method compatible with SEM (scanning electron microscope) and CT (computed tomography)

The invention relates to an SEM (scanning electron microscope) and CT (computed tomography) compatible solid propellant mechanical property testing device and method, belongs to the technical field of precise scientific instruments and material micro-mechanical property testing, and solves the problems that in the prior art, due to the fact that imaging equipment is single, and image quality becomes poor due to creeping accumulation, micro-scale failure information of propellants is incomplete and inaccurate to obtain. In the mechanical property testing device, the in-situ mechanical testing device performs mechanical loading and load holding on the propellant sample, the SEM obtains the surface appearance of the propellant sample, the double-source double-probe industrial CT obtains the internal three-dimensional structure of the propellant sample, and the in-situ mechanical testing device is transmitted between the transfer cabin main cavity and the electron microscope cabin through the transfer channel. And the vacuum transfer cabin containing the in-situ mechanical testing device is transferred between the transfer channel and the scanning turntable of the double-source double-probe industrial CT by the mechanical arm. According to the invention, more comprehensive and accurate mesoscopic failure information of the propellant sample can be obtained while less time cost is paid.
Owner:JILIN UNIVERSITY

Spectral image analysis via integration-constrained fitting

Systems or techniques are provided for facilitating spectral image analysis via integration-constrained fitting. In various embodiments, a system can access a spectral image of a specimen captured by a scientific instrument, wherein pixels of the spectral image respectively correspond to energy spectra. In various aspects, the system can fit in pixel-wise fashion a function to the energy spectra, wherein the function comprises a plurality of terms that are additively combined, wherein a first term of the plurality of terms represents a fine structure of the energy spectra, and wherein an integral associated with the first term is constrained to zero. In various instances, the system can segment the spectral image by material, based on the first term.
Owner:FEI CO

Scientific instrument purchasing type selection method and device based on artificial intelligence

The invention provides a scientific instrument purchase type selection method and device based on artificial intelligence, and belongs to the technical field of artificial intelligence, and the method comprises the steps: constructing a knowledge graph of all initial instruments; calculating an evaluation value of each initial instrument under each evaluation dimension; matching in the knowledge graph according to model selection demand information input by a user to obtain a candidate instrument set; extracting evaluation values of each candidate instrument in the candidate instrument set under all evaluation dimensions; performing weighted calculation on the evaluation values corresponding to all the candidate instruments according to dimension weight parameters set by a user to obtain a personalized comprehensive score; and generating a model selection scheme including an instrument recommendation result and data traceability information according to the personalized comprehensive score and associated information in the knowledge graph. According to the method, the knowledge graph fusing the multi-source data is constructed, and the scientific instrument purchase type selection scheme based on artificial intelligence is generated in combination with multi-dimensional evaluation, so that accurate recommendation of scientific instrument purchase type selection based on artificial intelligence is realized.
Owner:BEIJING XIN LI FANG TECH INC

Scientific instrument support systems and methods for mitigating spectral drift

Disclosed herein are scientific instrument support systems, related methods, computing devices and computer-readable media. A method of mitigating distortion of an optical emission spectrum obtained from an optical emission spectrometer is provided. The method may comprise a step of obtaining a spectrum recorded with the spectrometer and a respective one or more condition parameters indicative of an operating condition at a time of recording the spectrum. The method may further comprise a step of providing a model configured to output, in response to the one or more condition parameters, one or more transform parameters of a transformation to be applied to the obtained spectrum. A transformation may be applied in accordance with the obtained one or more transform parameters to the obtained spectrum to mitigate distortion of the spectrum due to a discrepancy between the operating condition and a baseline operating condition.
Owner:THERMO FISHER SCI SHANGHAI INSTR CO LTD +2

Mass analyzer calibration via reinforcement learning

Systems / techniques are provided for facilitating mass analyzer calibration via reinforcement learning. In various embodiments, a system can predict, via execution of one or more reinforcement learning neural networks on present-time state data of a mass analyzer of a scientific instrument, what adjustments to one or more operational parameters of the mass analyzer would cause the mass analyzer to approach a calibrated state, wherein the one or more operational parameters include an electrode voltage of the mass analyzer or a timing control of the mass analyzer. In various aspects, the system can modify the one or more operational parameters based on the adjustments, thereby causing the mass analyzer to approach the calibrated state.
Owner:THERMO FISHER SCI BREMEN

Instrument health data workflow

The present disclosure provides a scientific instrument support apparatus comprising a first logic, a second logic, and a third logic. The first logic subscribes to events from a device driver, receives signature data events including a generated signature event, generates signature data with a specified signature identifier in response to the generated signature event, and transmits the signature data to the second logic. The second logic receives the signature data from the first logic, processes the signature data, writes the processed signature data to an instrument health database, and transmits the signature data to a cloud-based database. The third logic presents a graphical user interface based on the processed signature data. The apparatus enables efficient collection, processing, and presentation of scientific instrument data for improved monitoring and analysis.
Owner:DIONEX CORP +1

In-situ torsion experiment device for X-ray CT (Computed Tomography)

The utility model relates to an in-situ torsion experiment device for X-ray CT (Computed Tomography), and belongs to the technical field of scientific instruments for in-situ torsion experiments for X-ray CT. Comprising a driving assembly, a torque sensor and a clamp assembly. Two ends of a shaft of the torque sensor are respectively connected with the driving assembly and a clamp. The driving assembly comprises a motor, an outer shell, a worm gear and a worm, the worm gear and the worm are rotationally arranged in the outer shell and meshed, the upper end of the worm gear is in key connection with the lower end of the torque sensor, and one end of the worm is connected with the output end of the motor. The driving assembly is stable in transmission during an experiment, has a self-locking function, prevents reverse rotation, improves the detection accuracy, is compact in structure, has a large transmission ratio, is suitable for speed reduction, is low in noise and small in vibration, and effectively prevents the influence on other works in a laboratory.
Owner:HANGZHOU MICRONANO FACTORY TECHNOLOGY CO LTD

A sysml-based reliability analysis and design method for high-end scientific instruments

This invention provides a high-end scientific instrument reliability analysis and design method based on SysML, belonging to the field of instrument reliability analysis technology. The method includes: constructing a system model of the target instrument using SysML, the system model including a requirements diagram, internal block diagram, and attribute library; extracting all failure modes from all failure mode libraries and assigning them global numbers to establish a failure mode mapping matrix; performing failure mode and impact analysis (FMEA) for the target instrument based on the system model to obtain a failure mode and impact analysis table; establishing a parameterized reliability model for each functional path; calculating the reliability constraints of each functional path based on the system model and the impact analysis table; and performing reliability analysis based on the measured attributes and reliability constraints of sub-components to generate an optimization scheme. The advantages of this invention are improved accuracy, consistency, and automation of reliability analysis.
Owner:LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS

Lock mass correction during chromatography void time

Disclosed herein are scientific instrument support systems, related methods, computing devices, and computer-readable media. For example, in some embodiments, a scientific instrument support apparatus includes sample analysis logic to cause a sample to be injected into a gas chromatograph and to obtain a mass spectrum of the sample using a mass spectrometer coupled to the output of the gas chromatograph, the mass spectrometer utilizing a mass calibration or a lock mass correction while obtaining the mass spectrum of the sample; calibration gas logic to control a supply of a calibration gas to the mass spectrometer during the void time of the gas chromatograph; and lock mass calibration logic to obtain a mass spectrum of the calibration gas using the mass spectrometer during the void time of the gas chromatograph and to calculate the mass calibration or the lock mass correction to be used by the sample analysis logic.
Owner:THERMO FINNIGAN LLC

A file fingerprint checking and tracing method and system for scientific research instrument data

This invention provides a method and system for verifying and tracing file fingerprints for scientific instrument data, comprising: Step S1, acquiring user identity information and instrument identifier of the scientific instrument, identifying the original data file through file monitoring and automatically collecting basic metadata to generate labeled metadata; Step S2, calculating the file fingerprint based on the algorithm identifier using a digest algorithm and writing it into a fingerprint database; Step S3, performing fingerprint comparison on the file fingerprints; if the fingerprints are the same, reusing the existing content object identifier and adding a new version record; if they are different, creating a new content object identifier and adding a new version record; and when the same reservation identifier, upload time difference not exceeding a preset threshold, and fingerprint inconsistency are met, creating a version fork and recording the fork reason code and fork reason payload for traceability; Step S4, performing verification processing on the downloaded file. The beneficial effect is that this invention can meet the comprehensive requirements of traceability, auditability, and real-time performance for the security management of scientific instrument data.
Owner:NINGBO INST OF MATERIALS TECH & ENG CHINESE ACAD OF SCI

A scientific instrument leasing analysis method and system based on big data

The application is suitable for the field of computers, and provides a scientific instrument leasing analysis method and system based on big data, which comprises the following steps: acquiring position information of leasing equipment, wherein the leasing equipment comprises a first leasing equipment and a second leasing equipment; identifying a changed position relationship of the first leasing equipment and the second leasing equipment according to the position information of the leasing equipment; if it is identified that the first leasing equipment or the second leasing equipment to be used is within a mutual visual monitoring range, releasing use locking of a monitored leasing equipment; instructing at least one of the leasing equipment to monitor the monitored leasing equipment and generating monitoring information; and identifying and analyzing the monitoring information based on big data to determine whether there is a damaged use behavior in the monitoring information, wherein the application has the beneficial effects of reducing the labor intensity of operation and maintenance personnel, being capable of guaranteeing the integrity of the leasing equipment as much as possible, and reducing the risk of damage of the leasing equipment.
Owner:HANGZHOU XIECE INFORMATION TECH CO LTD

Digital sample model for instrumental optimization

System and methods are disclosed for a scientific instrument support system. In at least one embodiment, the system includes a sample, a physical asset configured to interact with the sample, and one or more computing devices having executable instructions stored thereon. When executed, the executable instructions cause the one or more computing devices to generate one or more predictions based on simulations of one or more of the sample, the physical asset, or an interaction of the physical asset with the sample, and update a physics-based digital model of the sample based on accuracy of the one or more predictions. The physics-based digital model is used to reconstruct chemical and physical properties of the sample to generate the simulations of the sample.
Owner:FEI CO

Instrument optimization using analyte-based mass spectrometer and algorithm parameters

Scientific instrument support systems and related methods, computing devices, and computer readable media are disclosed herein. For example, in some embodiments, an apparatus includes a sample introduction device and a mass spectrometer. The mass spectrometer includes a first logic to receive a sample from a queue, the sample including an analyte; a second logic to determine instrumentation method and data analysis parameters based on a property of the analyte; and a third logic to process the sample by applying the instrumentation method and data analysis parameters.
Owner:THERMO FINNIGAN LLC +1

Device and method for testing surface microscopic performance of magnetic material under service condition

The invention relates to a device and a method for testing surface microscopic performance of a magnetic material under a service condition, and belongs to the field of precise scientific instruments. The device is composed of a test loading module and an in-situ detection module. The test loading module drives a worm gear and a worm through a servo motor to drive a lead screw mechanism to achieve pulling or pressing preloading, and fatigue loading is completed in combination with a piezoelectric stack and a flexible hinge. A modularized high-temperature loading cavity and a liquid nitrogen refrigerating device are adopted to realize high or low-temperature environment construction; the position of the coil or the magnitude of current is accurately adjusted through the air cylinder to achieve accurate application of the magnetic field. The in-situ detection module carries out observation by using a behavior in-situ test method, and supports magnetic domain dynamic observation and in-situ mechanical test. According to the invention, the construction of a more complex coupling loading service condition is realized, the real service behavior of the magnetic material is more accurately simulated, a plurality of methods for observing the microscopic performance of the surface of the magnetic material are provided, and a more accurate observation means is provided for the research on the service performance of the magnetic material.
Owner:JILIN UNIVERSITY

Soft and hard heterogeneous data processing system and method for atmospheric sounding lidar

ActiveCN122111888BData streamVirtual space
This application provides a hardware-software heterogeneous data processing system and method for atmospheric sounding lidar, relating to the technical field of embedded architecture for atmospheric remote sensing and scientific instruments. The system includes: a PL (Plug-in) terminal, which performs preliminary processing on lidar signal data to generate target data; a PS (Power Controller) terminal, including an internal cache and a processing core, with a virtual spatial filter configured within the processing core; the target data is stored in the internal cache via an ACP (Automatic Component Processing Filter); the processing core schedules the PL terminal to perform preliminary processing on the digital signal, reads the target data from the internal cache, and runs the virtual spatial filter to filter the target data; the virtual spatial filter performs register-level single-loop fusion of each independent algorithm node, completing the calculation of each independent algorithm within the single loop fusion, and all intermediate data resides in the register file. Relying on the ACP and single-loop fusion architecture, the bus occupancy rate and system latency of data flow are reduced, thereby achieving high throughput and zero bottlenecks at the system level.
Owner:HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES

Instrument integrity and health operation

Scientific instrument support systems and related methods, computing devices, and computer readable media are disclosed herein. For example, in some embodiments, a scientific instrument support apparatus includes a first logic element to generate a first command frame including a flag having a first value; and a second logic element to transmit the first command frame to a first device. The first value indicates that the first device should ignore an operation indicated by the first command frame. The scientific instrument supporting device comprises a third logic element which is used for determining whether a confirmation signal indicating successful operation is received or not; and a fourth logic element for generating a second command frame including a flag having a second value upon receipt of the acknowledgement signal. The second value indicates that the first device should perform an operation indicated by the second command frame.
Owner:DIONEX CORP

A polymer elastomer tensile testing system and analysis method resistant to wall slip

This invention belongs to the field of precision scientific instrument manufacturing and polymer material characterization technology. Specifically, it discloses a tensile testing system and analysis method for polymer elastomers with resistance to wall slip. The method includes the following steps: S1, preparing a defect-free annular polymer elastomer sample; S2, fitting the sample onto two parallel fixed rods of the tensile testing system in a floating contact fit without mechanical clamping; S3, placing the sample in a vacuum chamber; S4, applying periodic tensile deformation to the annular polymer elastomer sample; S5, acquiring the stress response signal of the annular polymer elastomer sample and performing spectral analysis to obtain even-order harmonic signals. This invention, employing the aforementioned tensile testing system and analysis method for polymer elastomers with resistance to wall slip, eliminates measurement artifacts introduced by geometric mismatch in hardware construction and overcomes the defect of misjudging even-order harmonics, providing a new high-sensitivity detection dimension for the characterization of the microstructure of polymer materials.
Owner:ZHEJIANG UNIV

thermofield emission scanning electron microscope (8200)

ActiveCN309977169SEmission scanScientific instrument
1. The name of the design product: hot field emission scanning electron microscope (8200). 2. The use of the design product: precision scientific instrument for high-resolution topography observation and microstructure analysis of sample surface at nanometer scale. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
Owner:BEIJING ZHONGKE KEYI OPTOELECTRONICS TECH CO LTD

Correction and Harmonization of Devices

Systems and methods are provided for correction and harmonization of data from multiple devices, such as scientific instruments. Embodiments of the present disclosure provide systems and methods to automate this process to increase data throughput while standardizing that data despite differences in instrument settings and the challenges of proprietary software. For example, embodiments of the present disclosure include a functioning workflow for acquiring and digesting in very large datasets generated by scientific instruments for the oceanic microbiome proteome which can harmonize data taken from instruments of multiple make, model, and settings and detect flawed data / malfunctioning instruments.
Owner:THE GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY DEPARTMENT OF HEALTH & HUMAN SERVICES

Solving large-scale language model disruptions in scientific instrument workflows

This system / technique provides a way to facilitate the resolution of large-scale language models of disruptions in scientific instrument workflows. [Solution] In various embodiments, the system can cause scientific instruments (e.g., charged particle microscopes, chromatographs, mass spectrometers) to perform a workflow on a sample. In various embodiments, the system can retrieve runtime data logged by the scientific instrument during the workflow in response to the scientific instrument generating an error message that interrupts the workflow. In various cases, the system can synthesize a first text explaining why the workflow was interrupted by running a large-scale language model on the error message and runtime data.
Owner:FEI CO

Digital twin calibration

The invention relates to digital twin calibration. Systems or techniques are provided for facilitating improved digital twin calibration for scientific instruments. In various embodiments, the system can synchronize a parametric state of the digital twinning with a physical state of the scientific instrument via execution of a full-state Bayesian filter. In various instances, the full-state Bayesian filter can include a set of calibration iterations, each calibration iteration in the set of calibration iterations can include Bayesian updates to all of the parametric states based on iterations that can be presented by the scientific instrument and that can be simulated by the digital twinning that share observable amounts. In various instances, the scientific instrument can be a charged particle microscope, the parametric state of the digital twin can be an aberration coefficient vector of the charged particle microscope, and the iterative common observable quantity can be a Fourier transform of a converged beam electron diffraction pattern of an amorphous carbon sample captured by the charged particle microscope.
Owner:FEI ELECTRON OPTICS BV

Mass spectrometer signal correction systems

Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. A scientific instrument support apparatus is disclosed comprising generating logic to generate mass spectrum data during a tandem mass tag labeling experiment including a plurality of channels, determining logic to determine, in the generated mass spectrum data, a correction ratio between a first reporter ion peak intensity corresponding to a first non-deuterated tag and a second reporter ion peak intensity corresponding to a first deuterated tag, and normalizing logic to normalize reporter ion intensities corresponding to a second non-deuterated tag and a second deuterated tag based on the determined correction ratio.
Owner:THERMO FISHER SCI BREMEN +1

Liquid ultrafast electron diffraction station integrated with thz diagnostic structure

This invention belongs to the field of precision scientific instruments and vacuum technology, and discloses a liquid ultrafast electron diffraction experimental station integrating a THz diagnostic structure. The station includes a vacuum chamber, a double-sided flange arranged upstream of the liquid film location along the electron beam transmission path, a position adjustment structure, a vacuum differential pipe, and a THz diagnostic structure. The double-sided flange is fixed between the vacuum pipe flange outside the vacuum chamber and the vacuum chamber itself. The position adjustment structure is axially and adjustablely fixed coaxially within the double-sided flange. The vacuum differential pipe is coaxially fixed within the position adjustment structure and passes through the sidewall of the vacuum chamber. The THz diagnostic structure is positioned between the vacuum differential pipe and the liquid film location. This invention integrates a vacuum differential system and a THz electron beam diagnostic system in situ within a single vacuum chamber, achieving synchronous compatibility between liquid-phase ultrafast electron diffraction and electron pulse time-domain diagnostics, ensuring the accuracy of time-resolved assessment of liquid-phase structure dynamics.
Owner:TSINGHUA UNIVERSITY +1

Application management for charged particle microscope devices

Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, an example method may comprise receiving, by a first device located at a premises and from a second device located external to the premises, and via a network, configuration data for a charged particle microscope located at the premises. The method may comprise updating, by the first device and based on the configuration data, one or more configuration settings associated with the charged particle microscope. The method may comprise causing, based on the updated one or more configuration settings, one or more operations associated with the charged particle microscope to be performed.
Owner:FEI CO

Correction and Harmonization of Devices

Systems and methods are provided for correction and harmonization of data from multiple devices, such as scientific instruments. Embodiments of the present disclosure provide systems and methods to automate this process to increase data throughput while standardizing that data despite differences in instrument settings and the challenges of proprietary software. For example, embodiments of the present disclosure include a functioning workflow for acquiring and digesting in very large datasets generated by scientific instruments for the oceanic microbiome proteome which can harmonize data taken from instruments of multiple make, model, and settings and detect flawed data / malfunctioning instruments.
Owner:THE GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY DEPARTMENT OF HEALTH & HUMAN SERVICES

Storing data from processes used to produce chemical, pharmaceutical, biopharmaceutical, and / or biological products.

This application relates to a computer-implemented method, computer-readable medium, and system for storing heterogeneous sequences of discrete-time data determined from processes producing chemicals, pharmaceuticals, biopharmaceuticals, and / or biological products. The method includes receiving discrete-time data, which includes first data from a first scientific instrument. The method also includes receiving second data from a second scientific instrument. The first and second scientific instruments each have different corresponding observation types, the first data having a first observation type, and the second data having a second observation type. The method further includes: storing the first data and first metadata in a first record of a database, the first data being stored according to the function of stored data mapped by the first observation type; and storing the second data and second metadata in a second record of the database, the second data being stored according to the function of stored data mapped by the second observation type.
Owner:SARTORIUS STEDIM DATA ANALYTICS AB

Lamella lift-out geometry based on sample plane orientation

Systems, methods, or techniques are provided for lamella lift-out based on sample plane orientation. In various embodiments, a method can comprise adjusting, by a scientific instrument, stage tilt and rotation of a sample stage of the scientific instrument based on plane orientation of a sample.
Owner:FEI CO