196 results about "Nanoindentation" patented technology

The present invention relates to a photochromic film comprising a photochromic dye and a resin component. The photochromic film has a nanoindentation hardness of equal to or greater than 800 nm on at least one of surfaces, surface A, thereof. The present invention further relates to a method of manufacturing a photochromic lens. The method of manufacturing a photochromic lens of the present invention comprises forming a photochromic film having a nanoindentation hardness ranging from 500 to 5000 nm on an outermost surface thereof as well as having a smaller nanoindentation hardness on a surface facing a first mold than that on the outermost surface by coating a photochromic liquid comprising a photochromic dye and a curable component on one surface of the first mold for formation of one of surfaces of a lens and subjecting the photochromic liquid to curing treatment, and a photochromic lens comprising a photochromic film on a lens substrate is obtained by means of the above first mold.

The invention discloses a method for evaluating fracturing property of shale based on rock debris microscopic characteristics. The method comprises the following steps: (1) taking the rock debris at specific depth in reservoir of an oil gas well; (2) acquiring the relative amount of total-rock minerals through X-ray diffraction test for the rock debris, and calculating a brittleness index I1 of the minerals; (3) testing the nanoindentation microcosmic mechanical parameters of the rock debris and calculating a microcosmic mechanical brittleness index I2 thereof; (4) calculating the surface crack fractal parameter of the rock debris through scanning electron microscope, thereby acquiring a fractal brittleness index I3; (5) performing 3D laser scanning on the rock debris and calculating the surface rough brittleness index I4; (6) weighting the above four brittleness indexes according to the practical condition of the oil field, thereby acquiring a comprehensive fracturing index I; (7) repeating the steps (1)-(6), calculating the fracturing indexes of the rock debris at different depths and drawing a whole-well comprehensive fracturing index longitudinal layout. According to the method provided by the invention, the comprehensive fracturing index of the shale rock debris can be acquired and the necessary basis is supplied for fracture selecting layer with core-taking difficulty or without core shale reservoir.

The present invention provides a surface-coated cutting tool comprising a coating film on a base, while the coating film comprises a hard layer constituted of a compound selected from a nitride, a carbonitride, an oxynitride and a carboxynitride of at least one primary element selected from a group consisting of the metals belonging to the groups 4a, 5a and 6a of the periodic table as well as B, Al and Si, and the hard layer satisfies the following: (a) (hmax−hf)/hmax is at least 0.2 and not more than 0.7, assuming that hmax represents the maximum indentation depth and hf represents the indentation depth (dent depth) after unloading in a hardness test according to nanoindentation, (b) the thickness of the hard layer is at least 0.5 μm and not more than 15 μm, and (c) the hardness according to nanoindentation is at least 20 GPa and not more than 80 GPa.

The invention relates to a nanoindentation/cutting test device and belongs to the field of electromechanical integration precise scientific instruments. The nanoindentation/cutting test device comprises an X/Y precise positioning platform, a Z-axis macro-motion adjusting mechanism, a precise indentation driving unit, a load signal detection unit and a displacement signal detection unit, wherein the X/Y precise positioning platform is connected with a coarse adjustment mechanism III15 through a connection plate I2, the adjustment mechanism III15 is fixed on a base 1, and a loading platform 8 is connected with the X/Y precise positioning platform through a force sensor 8; and the precise indentation driving unit is fixed on a side plate I3 through the Z-axis macro-motion adjusting mechanism, and the side plate I3 is fixed on the base 1; and the displacement signal detection unit is fixed on the base 1 through a side plate II14. The nanoindentation/cutting test device has the technical effects of compact structure and small volume. The nanoindentation/cutting test device can be used for realizing the mechanical property test of the three-dimensional test piece of which the characteristic dimension is above the millimeter level (the maximum dimension is up to 20mm*20mm*10mm); and the displacement loading resolution reaches the nanometer level and the loading force resolution reaches the micro-Newton level.

Performance and reliability of microelectromechanical system (MEMS) components enhanced dramatically through the incorporation of protective thin film coatings. Current-generation MEMS devices prepared by the LIGA technique employ transition metals such as Ni, Cu, Fe, or alloys thereof, and hence lack stability in oxidizing, corrosive, and/or high temperature environments. Fabrication of a superhard, self-lubricating coating based on a ternary boride compound AlMgB₁₄ is described in this letter as a potential breakthrough in protective coating technology for LIGA microdevices. Nanoindentation tests show that hardness of AlMgB₁₄ films prepared by pulsed laser deposition ranges from 45 GPa to 51 GPa, when deposited at room temperature and 573 K, respectively. Extremely low friction coefficients of 0.04-0.05, which are thought to result from a self-lubricating effect, have also been confirmed by nanoscratch tests on the AlMgB₁₄ films. Transmission electron microscopy studies show that the as-deposited films are amorphous, regardless of substrate temperature; however, analysis of FTIR spectra suggests that the higher substrate temperature facilitates formation of the B₁₂ icosahedral framework, therefore leading to the higher hardness.

The invention provides an AFM (Atomic Force Microscope)-based device and method for performing nanoindentation measurement on the surface of a microparticle. The device is composed of an AFM system, a sheet-shaped plane for holding a sample to be measured is arranged on a sample platform at the top of a scanatron, a double faced adhesive tape for sticking and fixing the sample to be measured is arranged on the sheet-shaped plane, and a nanoindentation needle tip for scanning and nanoindentation operation is fixed in a needle tip holder and arranged above the sample to be measured. When the device is in use, the sample to be measured is adhered to the sheet-shaped plane with the double faced adhesive tape; the sheet-shaped plane is placed on the sample platform at the top of the scanatron; and then the nanoindentation needle tip fixed in the needle tip holder performs scanning and nanoindentation operation above the sample to be measured, wherein the nanoindentation needle tip is a diamond needle tip and has an elasticity coefficient remained between 100N/m and 300N/m and an resonance frequency of 35-65khz. According to the invention, nanoindentation measurement is successfully carried on the surface of a detected powdery microparticle sample with the particle size of 20-80 micrometers.

The invention relates to a a method for testing physical performances of a solid film and a film-substrate interface and belongs to the technical fields of analytic instruments and material performance testing. The method is based on a nanometer indentation continuous stiffness curve and takes the ratio of elastic modulus square of a film-substrate system to the hardness as the ordinate and the indentation depth as the abscissa, a curve is fitted in a iteration screening least square method, and fitted parameters are analyzed and demarcated, thus measuring the physical performances of the film which includes the thickness and the ratio of the elastic modulus square to the hardness and representing parameters related to the thickness of an interface layer and parameters related to the ratio of the elastic modulus square of the interface layer to the hardness and the like. In the method, all tests of the physical performances of the film and the film-substrate interface are based on the nanometer indentation technology, the method can be carried out under the condition of not exposing the substrate surface, the existing equipment does not need to be altered, only the analytic method needs to be change, the application range is wide, and any film material with the film thickness less than the maximum indentation depth of a nanometer indenter can use the method.

A measuring head for a nano-indentation instrument capable of positioning a sample relatively to the measuring head, which includes a measuring axis, a reference axis and a component for detecting a depth of penetration of an indentor into the sample. The measuring and reference axes are attached to a frame for connection to the instrument. The measuring axis incorporates an actuator and includes the indentor, the reference axis incorporates an actuator and includes a reference tip, and the measuring and reference axes each have a component for detecting a force applied by its actuator. Penetration depth is detected by measuring a displacement of the indentor relatively to the reference tip.

The invention provides a method for representing a nano film micro-area deformation area by virtue of combination of a photetching technique and a transmitted electron microtechnique and belongs to the field of film nanoindentation representation. The invention discloses a method for representing a 10-100 nano film microarea deformation area by virtue of combination of a photetching technique and a transmitted electron microtechnique. According to the method, an indentated film is directly transferred into a transmission electron microscope so as to be observed by virtue of a film transfer technology; the microdefect formation, interaction and evolutionary process during a nano film elastoplasticity transition process in a nanoindentation acting process is directly disclosed from the aspect of atom scale; the direct relation between microstructure and macromechanic performance is disclosed; and the method belongs to a film nanoindentation representation method.

The invention discloses a device for testing metallic film failure behaviors under the coupling of force, heat, power and magnetism multi-field, which is characterized in that a warm table of embedded resistance wires is arranged above a heat insulation table; the warm table is connected with a power supply; the two ends of the heat insulation table are filled with convection circulating cooling water; a tested metallic film is arranged on the warm table; a thermocouple is arranged on a sample surface; a nanoindentation gearing is connected with a transmission rod; the two sides of the transmission rod between the nanoindentation gearing and the tested metallic film are respectively provided with a thermal baffle; the two sides of each thermal baffle are provided with circulating cooling water; and magnetic poles are arranged at the two sides of the heat insulation table. The device provided by the invention is used to improve prediction and evaluation level for failure behaviors of an electric thin-film material of an integrated circuit, is simple in operation, can really test and reflect failure performances of micro-components under the condition of actual services.

The invention discloses a method for measuring and representing microcosmic interface phases of asphalt concrete. According to the method, a small asphalt concrete piece is wrapped with epoxy resin AB glue and cured into a flat cylindrical test piece in a mold to prevent the small asphalt concrete piece from being stripped and deformed in the follow-up polishing process and improve the polishing flatness; the test piece is polished with metallographic abrasive paper, and then a final test piece meeting the requirements is obtained after ultrasonic cleaning is performed on the test piece when polishing is completed; the test piece enters a measuring step, all surface phases of the test piece are observed through amplification with a nanoindentation instrument, a measuring region containing all the phases is selected, equally-spaced dotting measuring is performed, and a load-displacement curve and a microscope image are recorded; after the test is finished, the Young modulus and hardness of all the points are computerized according to the load-displacement curve, and then the modulus and hardness indexes of all the phases are obtained by combining the phases where the measured points are located; finally, the size and the mechanical characteristics of a microcosmic interface transition area between asphalt and aggregates in the test piece can be analyzed and estimated according to the changing condition of the distance among the measured points and the mechanical indexes.

The invention relates to a method and a device for testing continuous thermoregulation high-vacuum low-temperature micro nanoindentation, belonging to the field of precise scientific instruments. An X-direction precision regulating module is used for regulating the position of a press-in point; a Z-direction precise press-in driving module is used for pressing in precisely, and a displacement signal and force signal precision detection module is used for detecting a displacement signal and a force signal precisely; a variable temperature object support and a cryostat are connected so as to achieve contact thermoregulation of a sample. The device is integrated with a customerized vacuum box so as to achieve micro nanoindentation testing of a sample when the temperature is continuously changed at 77K-500K under the vacuum environment; the problems of precise temperature variation, heat insulation, precise detection and the like in low-temperature micro nanoindentation testing are solved; the blank of the indentation testing technique of a traditional micro nanoindentation in a low-temperature environment when the environment temperature is changed is filled up. According to the device, the structure is simple, the process is convenient, the size is small, the response is rapid, the positioning is accurate, the temperature can be changed and controlled precisely, the displacement load signal can be detected precisely, and the micro precision press-in function can be achieved.

The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.

The invention discloses a method for inversion calibration of microscopic constitutive parameters of a metal material on the basis of nanoindentation and finite element simulation. The method comprises the following steps: S1, carrying out a nanoindentation test on the surface of the metal material through displacement control so as to obtain an experimental indentation response; S2, establishinga nanoindentation and finiteelement model under an ABAQUS or standard module, and carrying out finiteelement simulation to the process of the nanoindentation test on the metal material mentioned in the step S1 so as to obtain a simulated indentation response; and S3, constructing a multi-objective optimization platform, setting optimization objectives and constraint conditions, acquiring a non-inferior optimal solution set Pareto Front through a multi-objective optimization method based on FMOGA-II algorithm, and determining a unique optimal solution. The method provided by the invention has low cost, is rapid and accurate to calculate, is simple and practicable, is extensively applicable to inversion calibration of microscopic constitutive parameters of multi-metal materials, and has highpractical value in computational mechanics, experimental mechanics and engineering practical application.

An objective is to provide an intermediate transfer member exhibiting higher transferability together with higher cleaning ability and durability, a manufacturing apparatus of an intermediate transfer member in which no large-scale equipment such as a vacuum evaporator or the like is installed, and an image forming apparatus fitted with the intermediate transfer member. Also disclosed is intermediate transfer member 170 possessing substrate 175 and surface layer 176 composed of at least one layer provided on the surface of substrate 175, wherein foregoing substrate 175 has a universal hardness of 50-190 N/mm², and foregoing surface layer 176 has a surface hardness of 3-11 GPa measured in accordance with a nanoindentation method.

The invention relates to a temperature-variable indexable micro-nano indentation testing device, which belongs to the field of precision instruments. It includes three parts: the worktable indexing base, the high and low temperature working chamber and the indenter driving/feeding mechanism. Installed on the equipment base of the table indexing base; the table indexing base is mainly used to realize the table indexing action and to support the whole machine. The high and low temperature working chamber can provide continuous temperature change for the test piece measurement process. Environmental atmosphere, and can isolate external interference, the indenter driving/feeding mechanism mainly realizes the feeding action of the indenter in the vertical direction, and obtains the measurement data through the pressure sensor and the displacement sensor. The invention has the advantages of accurate measurement result, wide measurement range and compact structure, which greatly promotes the development of the technical field of material mechanical property testing and its equipment.

The invention provides a method for backward deducing a constitutive model of a welding joint based on a nanoindentation test, comprising the following steps: step 1, constructing a constitutive modelof the welding joint; 2, carry out dimensional analysis to obtain a dimensionless function between stress and strain; 3, selecting that material satisfying the constitutive relation of the step 1, and carry out finite element simulation on the process of pressing the indenter into the material; 4, determining the selected material and the corresponding stress and strain, substituting the selectedmaterial into a dimensionless function, and determining the function value corresponding to each material; 5, fitting the obtained mechanical property parameter and the function value to obtain the expression of the dimensionless function; 6, perform nano indentation test on that weld joint to obtain the mechanical property parameters of the weld joint; Step 7: The constitutive model of the welded joint is deduced backwards by using the mechanical property parameters. The invention provides a reverse inference method for welding joint constitutive model based on nano-indentation test, which has the advantages of wide applicability, low cost and high accuracy.

A sample holding array is provided which is particularly advantageous for various IR and near IR transmission spectroscopy analysis that yields high quality spectra with minimal artifacts. The sample holding array may also be used desirably with slight modifications for Raman analysis, x-ray fluorescence and nanoindentation.

The invention relates to a precise nanoindentation test device and belongs to the field of precise scientific instruments. The precise nanoindentation test device mainly comprises a precise press-in driving unit, a load signal and displacement signal detection unit and an objective table, wherein the precise press-in driving unit consists of a voice coil motor, a connecting piece, a guide rail and a sliding block; the voice coil motor and the guide rail are arranged on a pedestal; a precise mechanical sensor for detecting pressure of a diamond pressing head pressed into a material is arrangedon the pedestal through a side plate I; a precise displacement sensor for detecting diamond pressing head press-in depth is arranged on the pedestal through a side plate II; the objective table is arranged on the precise mechanical sensor; the diamond pressing head is arranged on the connecting plate; and the connecting plate is assembled on the sliding block through bolts. The precise nanoindentation test device has the advantages of simple structure, convenience for processing, small volume, high positioning precision, quick response and capacity of observing the deformation process and theinjury mechanism of the material in the press-in process in situ under an electron microscope so as to intuitively know the micronano mechanical property of the material.