The invention relates to an in-situ high / low-temperature
indentation testing device applied to cone-beam
CT imaging and belongs to the field of testing of mechanical-electrical integration precision scientific instruments and materials. The in-situ high / low-temperature
indentation testing device comprises a cone-beam
CT imaging unit, a high / low-temperature
indentation testing unit, an electric rotating platform, a
vibration isolation platform and a
silicone oil temperature control device, wherein the cone-beam
CT imaging unit, the electric rotating platform and the
silicone oil temperature control device are mounted on the
vibration isolation platform; a high / low-temperature indentation testing unit is fixed on the electric rotating platform and comprises a high / low-temperature loading submodule, a precision loading and detecting submodule and a vacuum guaranteeing submodule. The in-situ high / low-temperature indentation testing device is capable of carrying out in-situ micro-nano indentation testing in the high / low-temperature environment with the temperature from 50 DEG C below zero to 120 DEG C under
dynamic monitoring of the cone-beam CT imaging unit, carrying out in-situ observation and three-dimensional imaging of micro deformation and damage processes of the materials under the actions of
high stress and
high strain, and providing an effective technical manner for revealing
mechanics behaviors of the materials under
thermal coupling loading conditions and constitutive relations of
microstructure changes of the materials.