Low-temperature micro-nano indentation test system for large-stroke low-temperature drift under microscopic assembly

Abstract

The invention relates to a low-temperature micro-nano indentation test system for large-stroke low-temperature drift under a microscopic assembly, belonging to the technical field of precision instruments. The low-temperature micro-nano indentation test system comprises a vacuum chamber system module, a sliding cryostat assembly and an indentation testing mechanical structure module. Large-strokequasi-static loading is carried out with a hybrid drive mode of a precision displacement drive platform and a voice coil motor in cooperation; a sample and an indenter are simultaneously cooled by a contact refrigeration method; an embedded integrated heating element and temperature measuring element are used to carry out continuous temperature varying closed-loop adjustment and weaken the influence of low temperature drift on test results; the microscopic imaging assembly is used to carry out accurate positioning of indentation locations and in-situ observation of surface topography. The low-temperature micro-nano indentation test system can be used for providing the experimental basis for studying the mechanical properties of materials in low temperature environment and the change rule of mechanical properties of materials with temperature, and has significant application value in research on the mechanical properties of key service materials of aerospace and polar and deep-sea scientific research equipment, superconducting transmission equipment, etc.

Description

Technical field [0001] The invention relates to the technical field of precision instruments, and in particular to a low-temperature micro-nano indentation test system with large-stroke low-temperature drift of microscopic components. It can be used to study the mechanical properties of materials in low-temperature environments and the change law of material mechanical properties with temperature. It has significant application value in the study of the mechanical properties of key service materials such as space engines, polar and deep sea scientific research equipment, and superconducting transmission equipment. Background technique [0002] In recent years, with the continuous improvement of the synthesis and preparation of new materials, their characteristic sizes have become smaller and smaller. When using traditional standard tests to measure their mechanical parameters, a series of problems such as clamping and alignment may occur. For this reason, in view of the tradition...

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Problems solved by technology

[0006] The purpose of the present invention is to provide a low-temperature micro-nano indentation test system with large-stroke low-temperature drift under microscopic components, so as to solve the problems existing in the existing low-temperature indentation technology, such as insufficient accuracy of large-stroke loading and the influence of low-temperature "temperature drift", etc. The invention can realize in-situ monitoring, large-stroke precise loading and low-temperature micro-nano indentation test with low "temperature drift", and study the mechanical properties of materials in a low-temperature environment and the change law of mechanical properties of materials with temperature

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