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50results about How to "Realize in situ observation" patented technology

Seabed lateral deformation and sliding observation device and method

ActiveCN105301193AObvious lateral deformationTest accurateMaterial analysisOcean bottomMeasurement device
The invention provides a seabed lateral deformation and sliding observation device and method. The seabed lateral deformation and sliding observation device comprises an auxiliary ship and a seabed observation system, wherein the auxiliary ship is provided with an offshore drilling rig and a lifting device, and the seabed observation system is provided with a displacement measurement device, a data acquisition sealing cabin and a subsidence prevention frame. The displacement measurement device is of a rod joint combination structure with a cable, each joint point is provided with a three-axis acceleration sensor, and the displacement deviation of each joint point can be calculated according to the posture change of the corresponding three-axis acceleration sensor. The method includes the steps that the auxiliary ship is utilized for drilling a target point position so that the seabed observation system can be arranged, the seabed lateral deformation and sliding are observed and recorded through the displacement measurement device in the seabed observation system, fishing and recycling are conducted after the in-situ observation cycle is ended, and the deformation amount and the deformation process of seabed soil can be obtained by analyzing data. The seabed lateral deformation and sliding observation device and method provide a new thought and a new method for seabed lateral deformation and sliding observation and have the advantages of being long in observation cycle, capable of being repeatedly used, wide in observation range, high in accuracy and the like.
Owner:OCEAN UNIV OF CHINA

Variable-temperature tension-torsion combined-load in-situ testing device and method for mechanical properties of materials

The invention relates to a variable-temperature tension-torsion combined-load in-situ testing device and method for mechanical properties of materials, and belongs to the field of precise instruments.The device adopts a vertical type structure, and comprises a tension unit, a torsion unit, a force and displacement detection unit, a high-/low-temperature loading system and a sealed cavity. The mechanical properties of the materials under the loading of a single tension or torsion load in a variable-temperature environment can be tested, and particularly can also be tested in a tension and torsion combined load mode in the variable-temperature environment. A variable-temperature load module carries out loading by adopting the high-/low-temperature loading system, continuous temperature changing from -100 DEG C to 300 DEG C can be achieved, and thus, a complicated environment of the materials in an actual service environment is simulated. A biaxial-tension and forward-and-reverse-torsionload test is ingeniously achieved through a symmetrical mechanical structure, the microarea position invariance of in-situ monitored materials is thoroughly guaranteed, and thus, mechanical behaviorsand damage mechanisms of specific microareas of specimen materials can be dynamically monitored in situ.
Owner:JILIN UNIV

Multi-energy complementary power supply ocean observing device

InactiveCN105346692AHigh device independenceAvoid the impact of power supply capacityMachines/enginesEngine componentsSolar powerAcoustic release
The invention relates to a multi-energy complementary power supply ocean observing device, which belongs to the field of ocean engineering equipment. The multi-energy complementary power supply ocean observing device comprises a solar power generating device, a main buoy, a floating body, a cable, an anchor chain, a counterweight, a wave power generation module, a floating ball and an observation device, wherein the observation device comprises a buoyancy chamber, a supporting frame, a signal transmitter, a control chamber, a battery chamber, a acoustic doppler current profiler, a conductivity-temperature-depth system and an online pH detector. The multi-energy complementary power supply ocean observing device is characterized by further comprising a power generation adjusting chamber, a damping disc, a transparent sealing chamber and an acoustic releasing device. During working, the floating body moves up and down under an effect of waves, the main buoy moves with small amplitude under an effect of the damping disc, and the power is generated by means of relative motion between the floating body and the buoy. Electric powers generated by the solar power generating device and the wave power generating device are sent to the observation device after being treated by the power generation adjusting chamber. According to needs, the special observation device can be placed in the transparent chamber. During recycling, a signal is transmitted to the acoustic releasing device, the counterweight is released, and the observation device rises to the sea surface under an effect of buoyancy.
Owner:SHANDONG UNIV

In-situ liquid environment mechanics test platform of transmission electron microscope

The invention relates to the field of raw material in-situ micro-nano experiment platforms and provides an in-situ liquid environment mechanics test platform of a transmission electron microscope. Thein-situ liquid environment mechanics test platform comprises a sample rod and a loading platform, wherein the loading platform comprises a lower chip, an upper chip and a loading device; a first groove is formed in the upper surface of the lower chip; a groove is formed in the bottom surface of the first groove; a lower film window and two through holes are formed in the bottom surface of the groove; a second groove and an upper film window are formed in the lower surface of the upper chip; the second groove and the first groove are used for forming a receiving space for mounting the loadingdevice; a thermal resistor is arranged on the upper surface of the upper chip; the lower surface of the upper chip is connected with the upper surface of the lower chip; the lower surface of the loading device is connected with the bottom surface of the first groove; a driving beam is arranged on the loading device; a sample loading area is arranged in the driving beam; the lower film window, thesample loading area and the upper film window are centered. The in-situ liquid environment mechanics test platform can achieve mechanics test of samples in the liquid corrosion environment; the problem that the transmission electron microscope is incapable of effectively carrying out in-situ mechanics test in the liquid environment at present is solved.
Owner:BEIJING UNIV OF TECH

Method for realizing three-dimensional imaging of symmetrical micro/nano sample through single X-ray measurement

InactiveCN103487452AImprove experimental efficiencyImprove sample utilizationMaterial analysis using radiation diffractionSpatial OrientationsSymmetry operation
The invention discloses a method for realizing three-dimensional imaging of a symmetrical micro/nano sample through single X-ray measurement. The method comprises the following steps: by taking a coherent X-ray diffraction microscope as imaging equipment and utilizing the characteristics of free electron laser all-coherence, high flux and short pulse of X ray, acquiring two-dimensional diffraction data of the symmetrical micro/nano sample under single pulse irradiation, calculating an equivalent line of the diffraction data of the sample according to crystallographic symmetry characteristics of the symmetrical sample to determine spatial orientation of the sample, performing symmetry operation of a crystallographic point group of the sample on the two-dimensional diffraction data by utilizing the spatial symmetry of the sample to obtain three-dimensional diffraction data of the sample, and performing phase retrieval and image reconstruction on the three-dimensional recombinant diffraction data according to an oversampling and iterative algorithm to finally obtain a three-dimensional structure of the symmetrical sample. According to the method, three-dimensional reconstruction of the sample can be realized through single measurement only, the experiment efficiency of three-dimensional imaging is effectively improved, and a new thought is provided for enriching a three-dimensional imaging method.
Owner:SHANDONG UNIV

Multifunctional uniaxial tensile test device for microstructure in-situ online observation

The invention relates to a multifunctional uniaxial tensile test device for microstructure in-situ online observation. The device comprises a rack, a power transmission mechanism, a clamping mechanism and a force measurement mechanism, wherein the clamping mechanism comprises three detachable fixing bases corresponding to a pair of sliding tables and fixation bases, three pins and three insulating washers; the detachable fixing bases are in an inverted-T shape, can be mounted on top surfaces or side surfaces of the sliding tables/ the fixation bases through concave holes in the sliding tables and the fixation bases and are fixed through the pins; an upper clamping block and a lower clamping block used for clamping a test sample are fixed on the first two detachable fixing bases; the three insulating washers separate the three detachable fixing bases from the corresponding sliding tables or the fixation bases; the clamping mechanism and the force measurement mechanism are mounted at the upper parts of the sliding tables and the fixation base at the right end of a screw. The test sample keeps balanced, and microstructure in-situ observation is performed in the horizontal plane of the test sample in the tensile process; the clamping mechanism and the force measurement mechanism are mounted on side surfaces of the sliding tables and the fixation base at the right end of the screw, the test sample stands on one side, and the microstructure in-situ observation in a side plane of the test sample can be realized in the tensile process.
Owner:SHANGHAI JIAO TONG UNIV

Full-strain measurement type in-situ nanometer impress/scratch testing device

The invention relates to a full-strain measurement type in-situ nanometer impress / scratch testing device, belonging to the field of an electric integrated precise scientific instrument. The full-strain measurement type in-situ nanometer impress / scratch testing device comprises a macro-adjustment mechanism, a precise pressing unit, a load and displacement signal detecting unit, and a scratch driving unit; the macro-adjustment mechanism is mounted on a base; the precise pressing unit is connected with an x direction sliding table of the macro-adjustment mechanism through a transition connection board; the load and displacement signal detecting unit comprises two groups of eight strain sheets; the strain sheets are respectively mounted on a flexible hinge and an x direction flexible hinge for detecting a load of the precise pressing unit in an embedded manner; and the scratch driving unit is connected with the base through a screw. Signal detection is carried out by using the internal strain sheets, so that the entire testing device has the advantages of compact structure and small size; and the entire testing device is conveniently mounted on carrier tables, such as a scanning electron microscope (SEM) or an X-ray diffraction meter, so that the in-situ impress and scratch test of the material can be realized. Therefore, the full-strain measurement type in-situ nanometer impress / scratch testing device provides technical support for researching a damage mechanism of the material.
Owner:中机试验装备股份有限公司

Low-temperature micro-nano indentation test system for large-stroke low-temperature drift under microscopic assembly

The invention relates to a low-temperature micro-nano indentation test system for large-stroke low-temperature drift under a microscopic assembly, belonging to the technical field of precision instruments. The low-temperature micro-nano indentation test system comprises a vacuum chamber system module, a sliding cryostat assembly and an indentation testing mechanical structure module. Large-strokequasi-static loading is carried out with a hybrid drive mode of a precision displacement drive platform and a voice coil motor in cooperation; a sample and an indenter are simultaneously cooled by a contact refrigeration method; an embedded integrated heating element and temperature measuring element are used to carry out continuous temperature varying closed-loop adjustment and weaken the influence of low temperature drift on test results; the microscopic imaging assembly is used to carry out accurate positioning of indentation locations and in-situ observation of surface topography. The low-temperature micro-nano indentation test system can be used for providing the experimental basis for studying the mechanical properties of materials in low temperature environment and the change rule of mechanical properties of materials with temperature, and has significant application value in research on the mechanical properties of key service materials of aerospace and polar and deep-sea scientific research equipment, superconducting transmission equipment, etc.
Owner:JILIN UNIV

Mini-type precise in-situ nano impression and scratching testing device

InactiveCN105021478ARealize detectionRealize the scoring functionInvestigating material hardnessElectricityEngineering
The invention relates to a mini-type precise in-situ nano impression and scratching testing device. The mini-type precise in-situ nano impression and scratching testing device comprises macro adjusting mechanisms, a precise pressing-in unit, a load and displacement signal detection unit and a scratch driving unit, wherein an x-directional macro adjusting mechanism is mounted on a substrate; a y-directional macro adjusting mechanism is mounted on an x-directional slide platform; the precise pressing-in unit is mounted on a y-directional slide platform of the y-directional macro adjusting mechanism; a force sensor and y-directional packaging piezoelectric ceramic are mounted at the front end and the inner part of a y-directional flexible hinge respectively; a displacement signal is detected by using the packaging piezoelectric ceramic; a pressing-in load is measured by the force sensor; precise driving is realized by the y-directional packaging piezoelectric ceramic and a pressing-in displacement is measured; a test piece is heated by a silicon nitride heating element so that an impression load displacement curve at a high temperature is obtained; precise scratching driving is realized through z-directional packaging piezoelectric ceramic; and deformation and damage conditions of a material at the high temperature can be observed in real time through heating the test piece by the silicon nitride heating element.
Owner:JILIN UNIV

Portable pressure testing system having in situ observation and continuously testing functions

A portable pressure testing system having in situ observation and continuously testing functions comprises a host testing system, which comprises a working platform adjusting module, a pressure testing module, an in situ observation module and a mounting and fixing module, wherein the working platform adjusting module comprises a working platform and a working platform lifting adjustment assembly, the working platform is connected to the working platform lifting adjustment assembly, the in situ observation module and the pressure testing module are coaxially mounted on a swivel plate of the working platform with respect to each other at a fixed angle, the swivel plate is connected to a switching and driving assembly used for driving the swivel plate to rotate for the fixed angle to implement switching between a pressure mode and an observation mode, and the working platform is fixed on the mounting and fixing module used for locating the entire testing system on a surface of an object to be tested. The invention provides a portable pressure testing system having in situ observation and continuously testing functions which can effectively achieve in situ observation, implement continuously testing, and improve testing efficiency and testing accuracy.
Owner:ZHEJIANG UNIV OF TECH

In-situ observation device and observation method for crystal growth based on tiny droplets

An in-situ observation device for crystal growth based on tiny droplets includes a droplet generation and control unit, a droplet bearing platform and an observation recording unit. The droplet generation and control device includes a micro dropper, a droplet generation controller and a dropper fixing holder. A part, located below the micro dropper, of the droplet bearing platform is used for placing a glass slide. The observation and recording unit includes an observation mirror and a data acquisition system, the observation mirror is located below the glass slide, and a lens faces to the glass slide. The observation mirror includes a microscope or a spectrometer. The droplet generation and control device can produce tiny droplets with the volume from a femto-liter level to a micro-literlevel, and the volume of the droplets can be accurately controlled by the diameter of the micro dropper and the droplet generation controller. A solution is quantitatively jetted on the glass slide, then the observation mirror is used for observation and the data acquisition system is used for recording, and the shape change and rule of the nucleation, growth and precipitation processes of the crystal formed from micro droplets can be obtained. The invention provides a simple and rapid technical means to realize in-situ observation of the crystal material growth process.
Owner:TSINGHUA UNIV +1

Method for crystallizing germanium antimony tellurium materials through electronic beam irradiation induction

ActiveCN108588672AFacilitate in-situ observation and microstructure characterizationEnables in-situ performance testingVacuum evaporation coatingSputtering coatingMicrostructureVoltage
The invention discloses a method for crystallizing germanium antimony tellurium materials through electronic beam irradiation induction. The method comprises the steps that a substrate capable of carrying out microstructure representation or electrical property testing or in-situ performance testing is selected for preparing a germanium antimony tellurium amorphous film; the substrate for preparing the germanium antimony tellurium amorphous film is subjected to electron microscope sample pretreatment; a clean and smooth area of the surface of the germanium antimony tellurium amorphous film isfound in an electron microscope sample; the irradiation range, irradiation voltage, irradiation intensity and irradiation time are set in an electron microscope; the crystallizing process of the irradiation area of the electron microscope sample is observed in the electron microscope in real time, germanium antimony tellurium crystals meeting the crystallizing range, the crystal structure and thegrain size are obtained, and the process of crystallizing the germanium antimony tellurium materials through electronic beam irradiation induction is completed. The method provides experimental evidences for the study of the phase-change material crystallization mechanism and corresponding structural performance.
Owner:XI AN JIAOTONG UNIV

A method for realizing three-dimensional imaging of symmetrical micro-nano samples with a single X-ray measurement

InactiveCN103487452BImproving the efficiency of 3D imaging experimentsRealize in situ observationMaterial analysis using radiation diffractionSpatial OrientationsX-ray
The invention discloses a method for realizing three-dimensional imaging of a symmetrical micro / nano sample through single X-ray measurement. The method comprises the following steps: by taking a coherent X-ray diffraction microscope as imaging equipment and utilizing the characteristics of free electron laser all-coherence, high flux and short pulse of X ray, acquiring two-dimensional diffraction data of the symmetrical micro / nano sample under single pulse irradiation, calculating an equivalent line of the diffraction data of the sample according to crystallographic symmetry characteristics of the symmetrical sample to determine spatial orientation of the sample, performing symmetry operation of a crystallographic point group of the sample on the two-dimensional diffraction data by utilizing the spatial symmetry of the sample to obtain three-dimensional diffraction data of the sample, and performing phase retrieval and image reconstruction on the three-dimensional recombinant diffraction data according to an oversampling and iterative algorithm to finally obtain a three-dimensional structure of the symmetrical sample. According to the method, three-dimensional reconstruction of the sample can be realized through single measurement only, the experiment efficiency of three-dimensional imaging is effectively improved, and a new thought is provided for enriching a three-dimensional imaging method.
Owner:SHANDONG UNIV

Method for in-situ study of amorphization mechanism of germanium-antimony-tellurium material under electron beam irradiation

The invention discloses a method for in-situ study of an amorphization mechanism of a germanium-antimony-tellurium material under electron beam irradiation. The method comprises the following steps: selecting a germanium-antimony-tellurium crystal thin film of which the surface is deposited on a carbon supporting film copper carrying net with a standard size of a transmission electron microscope;carrying out surface pretreatment on the prepared film sample by adopting a plasma cleaning technology, and carrying out plasma cleaning by selecting argon; placing a pretreated electron microscope sample in the transmission electron microscope, and searching an area which is smooth in surface, free of carbon deposition, pollution and damage and uniform in thickness in the thin film sample to serve as an irradiation area; setting irradiation parameters, and inducing the material to be gradually amorphized; and observing and recording the evolution process of the amorphous structure of the material in situ, and analyzing the amorphous phase change mechanism of the material. According to the method, the gradual amorphization of the germanium-antimony-tellurium material is realized through electron beam irradiation, and the structural evolution process of the material amorphization is directly observed and analyzed by virtue of the transmission electron microscope, so that the convenientresearch method and a reliable experimental basis are provided for exploring the amorphization mechanism of the germanium-antimony-tellurium material.
Owner:XI AN JIAOTONG UNIV

Method for testing dynamics and interface behaviors of molten slag dissolved solid oxide based on hot filament method

The invention relates to a method for testing dynamics and interface behaviors of molten slag dissolved solid oxide based on a hot filament method. The method comprises the following steps: step 1, setting an experimental temperature control curve of hot filament method equipment; step 2, wetting the powder slag with alcohol, adding the wetted powder slag into a melting zone of the hot filament method equipment, and performing heating for melting; step 3, after reaching of the temperature to a set value, adding a certain mass of solid oxide particles into the slag; step 4, observing a dissolution process of the solid oxide particles in situ through a video, processing a picture by utilizing graphic processing software, and calculating an average dissolution rate; and step 5, carrying out quenching and cooling at a set rate to obtain an in-situ test sample, and acquiring parameters or performance indexes of dynamics and interface behaviors of the molten slag dissolved solid oxide through a micro-area analysis means. According to the invention, in-situ observation of the solid oxide dissolving process can be realized; an opaque slag system containing transition metal oxide can be researched; an in-situ sample for micro-area structure and component analysis is obtained through quenching, and the obtained micro-area component analysis sample has good in-situ performance.
Owner:CHONGQING UNIV

Seabed Lateral Deformation and Sliding Observation Device and Method

ActiveCN105301193BObvious lateral deformationTest accurateMaterial analysisOcean bottomMeasurement device
The invention provides a seabed lateral deformation and sliding observation device and method. The seabed lateral deformation and sliding observation device comprises an auxiliary ship and a seabed observation system, wherein the auxiliary ship is provided with an offshore drilling rig and a lifting device, and the seabed observation system is provided with a displacement measurement device, a data acquisition sealing cabin and a subsidence prevention frame. The displacement measurement device is of a rod joint combination structure with a cable, each joint point is provided with a three-axis acceleration sensor, and the displacement deviation of each joint point can be calculated according to the posture change of the corresponding three-axis acceleration sensor. The method includes the steps that the auxiliary ship is utilized for drilling a target point position so that the seabed observation system can be arranged, the seabed lateral deformation and sliding are observed and recorded through the displacement measurement device in the seabed observation system, fishing and recycling are conducted after the in-situ observation cycle is ended, and the deformation amount and the deformation process of seabed soil can be obtained by analyzing data. The seabed lateral deformation and sliding observation device and method provide a new thought and a new method for seabed lateral deformation and sliding observation and have the advantages of being long in observation cycle, capable of being repeatedly used, wide in observation range, high in accuracy and the like.
Owner:OCEAN UNIV OF CHINA

Device and method for in-situ observation of domain structure of ferroelectric material before and after electric field action

ActiveCN104880577AReduce leakageObservation position unchangedScanning probe microscopyInsulation layerObservation point
The invention discloses a device and a method for in-situ observation of a domain structure of a ferroelectric material before and after an electric field action. The device is mainly characterized in that an insulation layer grows on the surface of a ferroelectric film which is provided with a lower electrode; the insulation layer is provided with at least one electrode hole; and a part of the ferroelectric film enclosed by each electrode hole serves as an observation point for observing the domain structure of the ferroelectric film before and after the electric filed action. During observation, an upper electrode is arranged in one of the electrode holes, voltage is applied between the upper electrode and the lower electrode for performing polarization of the ferroelectric film covered by the upper electrode. According to the invention, different voltages can be applied to the ferroelectric film, meanwhile, the upper electrode is configured to be capable of being easily removed from the corresponding electrode hole, so that a fact that different voltages can be applied to the same observation point of the ferroelectric film, and in-situ observation of change in a longitudinal direction in the domain structure of the ferroelectric material before and after different electric field actions can be achieved.
Owner:嘉兴巨腾信息科技有限公司

Heating device for micro-area controllable nano functional material synthesis

The invention relates to a microdomain controllable nanometer functional material synthetic heating device, which solves the problems of enormous volume, dissipation energy, consuming and single synthetic method of the existing nanometer functional material synthetic device. The heating device comprises a rectangle box body and a box cover. Two side walls which are corresponding to the box body are respectively provided with an entering air port connector and an outgoing gas connector. The other two side walls are respectively provided with an electric wire connector. The interior of the box body is sequentially provided with a cooling water pipe, a heat dissipation foundation bed, a workbench, a junction board, a lower panel and an upper panel from bottom to top. The middle of the workbench is provided with a stepped hole which is big at the upper part and small at the lower part. The junction board is provided with a connector lug and a probe. The heating device has small volume; the volume is 240dm3, thereby the heating device is convenient to be moved; the consuming time of vacuumizing is shortened to 5-15 minutes; the heating up and cooling time and the height are controllable; the whole temperature increasing and decreasing course can be finished in 2-10 minutes; the nanometer structure can be prepared on a silicon base with an external circuit; a plurality of nanometer structures can be integrated on the same under layer. The consumption of water, electric and gas reduced to 5-10% of the former.
Owner:HEFEI UNIV OF TECH

Scanning electron microscope electron detector with high collection efficiency

The invention provides a scanning electron microscope electron detector with high collection efficiency. The scanning electron microscope electron detector improves the collection efficiency of secondary electrons or backscattered electrons and can further improve a signal-to-noise ratio and resolution of images. The scanning electron microscope electron detector comprises a grid mesh; a Faraday cup; a scintillator; a light guide column; a photomultiplier tube; a high-voltage power supply; a current amplification circuit board; and a stainless steel shell, wherein an electronic signal input end of the Faraday cup is provided with a convex screen, an electronic signal output end of the Faraday cup is arranged towards the scintillator, a photon signal output end of the scintillator is arranged towards an input end of the light guide column, an output end of the light guide column is connected to a signal input end of the photomultiplier tube, a signal output end of the photomultiplier tube is connected with a signal input end of the current amplification circuit board, and the photomultiplier tube is connected with the high-voltage power supply; and the high-voltage power supply, the photomultiplier tube, the light guide column and the scintillator are coated in the stainless steel shell, and the Faraday cup is fixedly arranged at the input end of the front part of the stainless steel shell.
Owner:无锡量子感知技术有限公司

A method for preparing in-situ stretched samples for transmission electron microscopy

The invention relates to a method of preparing an in-situ tensile sample of a transmission electron microscope. The method comprises the steps of preparing a block sample and feeding the block sampleto an FIB sample cabin, and focusing an ion beam onto the block sample; preparing an I-shaped rough blank with two thick ends and a thin middle crossbeam by using an ion beam; preparing a substrate, digging an I-shaped hole with two big ends and a thin middle crossbeam on the substrate, and cutting at two sides of the thin crossbeam of the I-shaped hole to form slopes, wherein the thin crossbeam is at the highest position of the slopes; connecting the rough blank with the substrate so as to form a sample; thinning the middle of the rough blank, and drilling a hole in the axis of the rough blank; and thinning the thin crossbeam of the rough blank in the thickness direction till the bottom end of the rough blank is damaged. The in-situ tensile sample of the transmission electron microscope comprises the substrate and the rough blank, wherein the rough blank is cut from a to-be-observed test sample, the substrate is made of a plastic material, and the rough blank is fixed in the substrate. Both plastic material and brittle material can be prepared into samples suitable for existing transmission electron microscope sample rods, and the yield of finished products is high.
Owner:ZHEJIANG UNIV
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