240 results about "Diffractometer" patented technology

A method for diagnosing diseases in human patients can include providing a set of global X-ray diffraction (XRD) data to a global data center (GDC) and processing the set of global XRD data and categorizing it into data clusters, where each data cluster corresponds to a diagnostic indicator for assessment of a physiological or pathological condition. The method can further include communicating local XRD data and local patient data from a local autonomous cell (LAC) to the GDC, where the local XRD data includes information about a tissue sample measured using a tissue diffractometer of the LAC, and wherein the tissue sample includes skin. The method can further include processing the local XRD data, comparing it with the data clusters to determine a local diagnostic indicator for the local patient, and communicating the local diagnostic indicator to the LAC.

The invention relates to the technical field of fluorescence sensing development, in particular to a Cd (II)-based metal organic framework crystalline material as well as a preparation method and application thereof. The chemical formula of the Cd (II)-based metal organic framework crystalline material is {[Cd3 (H2O) 2 (DMA) 2 (5-CMOIA) 2]. 6 / 5H2O} n, the organic framework material is characterized by an X-ray single crystal diffractometer, and the result shows that the organic framework material is crystallized in a triclinic system P-1 space group, the asymmetric unit of the organic framework material is composed of three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions and three The complex is composed of two deprotonated (5-CMOIA) 3-ligands, two coordinated DMA solvent molecules, two coordinated water molecules and six fifths of crystal water molecules. The solid fluorescence spectrum of the Cd (II)-based metal organic framework crystalline material is measured, the fluorescence response of the Cd (II)-based metal organic framework crystalline material to metal ions in a solution is explored, and the result shows that the Cd (II)-based metal organic framework crystalline material can effectively recognize Hg < 2 + > from different ions and can be applied to the field of fluorescence sensing.

The invention relates to the technical field of process data analysis and processing, and discloses a coal-based solid waste recycling full-process intelligent management and control platform and a digital twin system. The platform is characterized in that an identification module identifies a coal-based solid waste mineral phase through a ray diffractometer to obtain mineral composition classification data; the construction module constructs a digital twinborn model based on the classification data, simulates a dissolution reaction, and obtains weathering soil formation process data; the establishment module establishes a pollutant migration prediction model according to the process data to obtain environmental risk data; the optimization module optimizes the risk data through an improved particle swarm-genetic hybrid algorithm to obtain a resource path scheme; and the adjusting module adaptively adjusts the process parameters based on the path scheme to obtain a whole-process management and control instruction. The problems that accurate mineral phase recognition and intelligent classification are lacked in the coal-based solid waste recycling process, and a dynamic prediction model cannot be constructed and a weathering soil forming process cannot be simulated in real time based on mineral composition data are solved.

The invention provides a positive active material and a preparation method thereof, a positive pole piece, a battery and electric equipment, the change rate d of the characteristic peak interplanar spacing of the positive active material (104) is greater than or equal to 0.05% and less than or equal to 0.5%, d = (d before-d after) / d before * 100%, d before is the interplanar spacing of the characteristic peak of the positive active material (104) measured by an X-ray diffractometer before circulation, and d after is greater than or equal to 0.05% and less than or equal to 100%. And d, measuring the interplanar spacing of the characteristic peak of the positive electrode active material (104) by an X-ray diffractometer at 45 DEG C after circulation for 80 weeks. Therefore, the interplanar spacing change rate of the positive electrode active material before and after circulation is small, which shows that the crystal structure stability of the positive electrode active material is good, the positive electrode active material is not easy to pulverize in the long-term circulation process of the battery, and the cycle performance of the battery can be improved.

The invention relates to the technical field of hydraulic test of nickel alloy pipes, and discloses a hydraulic test system for a thin-wall nickel alloy pipe. According to the system, in the axial loading state of the thin-wall nickel alloy pipe, a closed water pressure cavity is established through an annular sealing clamp, and then strain distribution data on the surface of the pipe body is collected through a distributed optical fiber sensor array. And constructing a three-dimensional stress field reconstruction model based on the acquired strain distribution data, calculating an equivalent plastic deformation threshold value of the pipe body under different water pressure gradients, adjusting a water pressure loading curve slope parameter according to the equivalent plastic deformation threshold value, and generating a dynamic water pressure loading instruction. And the high-frequency pressure pulse generator executes the instruction, synchronously triggers the X-ray diffractometer to collect lattice distortion data of the tube body, inputs the data into the material microscopic damage evolution model, and outputs a microscopic defect spatial distribution map. And finally, material constitutive parameters of the three-dimensional stress field reconstruction model are corrected based on the atlas, closed-loop feedback control is formed, and multi-dimensional data acquisition and accurate management and control of the thin-wall nickel alloy pipe hydrostatic test are achieved.

The invention discloses an in-situ identification analysis method for superfine non-metallic inclusions in steel, and mainly solves the technical problems that the superfine non-metallic inclusions in the existing steel are difficult to identify and extract and the microstructure and phase composition of the inclusions are difficult to characterize. According to the technical scheme, the method for detecting and analyzing the small-size non-metallic inclusions in the steel by using the scanning electron microscope comprises the following steps: (1) preparing a metallographic sample; 2) preparing a transmission electron microscope sample, and determining an area where the inclusion of the metallographic sample is located by using a scanning electron microscope; carrying out accurate positioning and in-situ micro-nano thinning and cutting on the area where the inclusion of the metallographic sample is located by using a focused ion beam double-beam electron microscope system, and extracting the superfine non-metallic inclusion; and 3) analyzing the ultrafine non-metallic inclusions in the transmission electron microscope sample, and detecting the grain orientation of the ultrafine inclusions by using a transmission-type electron back scattering diffractometer. The method provided by the invention can accurately identify and extract the superfine non-metallic inclusions and the phase composition, components and grain orientation thereof in situ.

The invention discloses a prospecting method and a prospecting system for mainly extracting soil micro-fine particles in a shallow coverage area, and the prospecting method comprises the following steps: separating a micro-fine particle part from a soil sample by adopting a wet screening method according to a preset particle size range to obtain a target micro-fine particle sample; the method comprises the following steps: for a target micro-fine particle sample, acquiring chemical component data through an X-ray fluorescence spectrophotometer, and determining the content and distribution characteristics of main elements in the sample; analyzing the mineral composition of the target micro-fine particle sample by adopting an X-ray diffractometer, and identifying the types and relative contents of main minerals in the sample; determining the particle size distribution of the target micro-fine particle sample through a laser particle size analyzer to obtain the proportion information of particles with different particle sizes in the sample; according to the geophysical data, gravity, magnetic force and electrical parameters of the target area are extracted, and a geophysical feature model is established; and carrying out data fusion on the geochemical features and the geophysical feature model, and extracting key feature variables in multi-source information by adopting a principal component analysis method.

The invention provides a micro-area variable-angle grazing incidence wide-angle scattering test method based on a single-crystal X-ray diffractometer, which comprises the following steps: preparing a sample from a test material deposited on a substrate, and placing the sample on an improved sample rack which is provided with a specific structure and a driver for controlling an incident angle and the like; selecting an X-ray light source, aligning the X-ray light source with the sample, and switching and matching a copper target and a molybdenum target; z-scan scanning and tilting scanning along a light path direction and a direction vertical to the light path are carried out, and related parameters are set; the scattered X-rays are collected through a two-dimensional surface detector; and finally obtaining a correlation graph through software integration. Specific requirements for the table size, scanning parameters and the like of the improved sample holder are met, a height reference position, an adjusting structure and the like are further arranged, and a connecting part is installed on an equipment sample table through screw joint. The problems of inaccurate incident angle and height control and the like in the prior art are solved, and the test accuracy and reliability are improved.

The invention relates to the technical field of grading gangue selection of coal gangue, in particular to a grading gangue selection method of coal gangue, which comprises the following steps: acquiring mineral texture data through a multispectral imaging device, analyzing the spatial distribution of aluminum and silicon elements in combination with an X-ray diffractometer, and generating a three-dimensional component map through spatial registration and fusion with infrared heat value data; impurities are dynamically removed through sulfur element spectrum detection, and the air pressure and the material flow of winnowing equipment are adjusted by matching roasting process parameters; components of the sorted waste are analyzed through an X-ray fluorescence spectrometer, particle size data are obtained through a laser particle analyzer, a genetic algorithm is input to iteratively optimize detection channel combination and sampling density, a resource distribution instruction is generated, and equipment parameter correction is fed back. According to the method, aluminum-silicon ratio critical value accurate identification, sorting parameter dynamic adaptation and waste recycling path optimization are realized, and the problem of overburning caused by insufficient quantitative analysis of element distribution in the prior art is solved.

An x-ray diffractometer may perform 3D-analysis of collagen tissue of a patient (a human or another animal). The diffractometer includes an oblong housing that may be hinged and that contains an x-ray projector on one side of a recess and a receiver on an opposite side of the recess. The recess accommodates analyzed tissue such as the external ear and skin of a patient. The x-ray projector directs an x-ray micro-beam at the patient's tissue, and the receiver contains a movable two-dimensional x-ray detector that detects a transmitted x-ray micro-beam passed through the analyzed tissue and detects x-rays scattered or diffracted by the analyzed tissue.

The invention relates to the technical field of zone-melting polycrystalline silicon rod stress uniformity detection, in particular to a zone-melting polycrystalline silicon stress detection method which comprises the following steps: S1, cutting along the radial direction of a silicon rod to obtain a slice; s2, performing multi-point sampling on the slices at the same interval to obtain an initial sample; s3, an oxide layer on the surface of the initial sample is removed, then cleaning and drying are conducted in sequence, and a final sample is obtained; s4, testing the final sample by using an X-ray diffractometer to obtain a data file; s5, processing the data file by using XRD data analysis software, and extracting position information of different final sample diffraction peaks; s6, judging whether the stress distribution is uniform or not according to the extracted position information of the diffraction peaks; the stress magnitude and uniformity of the polycrystalline silicon rod on the same level or the vertical level can be measured, and theoretical support is provided for preparation of zone-melting polycrystalline silicon.

The invention provides a testing device and a testing system for a temperature-induced phase change material. The testing device comprises a device main body, a heating assembly, a pair of conductive probe assemblies and an automatic control system. When the device is used, the device body is used for being connected with an XRD diffractometer, the heating assembly responds to a temperature regulation and control instruction of an automatic control system so that the temperature of the temperature-induced phase change material can be increased or decreased to multiple preset temperatures, and heat preservation is conducted for a preset duration when each preset temperature is reached. In the heating or cooling process of the temperature-induced phase change material, the automatic control system continuously collects the temperature and electric signals of the temperature-induced phase change material, XRD scanning is conducted on a sample through an XRD diffractometer in the heat preservation process, and XRD data are collected; and finally, outputting the temperature value of the temperature-induced phase change material in the heating process and the cooling process, and the corresponding relationship between the electric signal and the XRD data. According to the testing device for the temperature-induced phase change material, the effect of real-time coupling observation of electrical and structural characteristics of the temperature-induced phase change material in the temperature changing process can be achieved.

The invention relates to the technical field of mineral analysis, and discloses a rock alternating temperature and pressure characteristic analysis method, system and equipment and a storage medium, a plurality of pressure values and a plurality of temperature values of a spherical cavity are obtained to simulate different actual environmental conditions, and a micro scanning electron microscope, an X-ray diffractometer and an X-ray fluorescence spectrometer are combined to simulate the temperature and pressure characteristics of the spherical cavity. The rock sample to be analyzed can be comprehensively tested and analyzed from multiple angles. Furthermore, the detector is used for collecting the test data set of the rock sample to be analyzed generated by the test, so that the automatic collection of the data is realized, and the test efficiency is improved. Finally, alternating temperature and pressure characteristic analysis is carried out through the data processing subsystem, and characteristic changes of the rock under different temperature and pressure conditions can be obtained. Therefore, by implementing the method, the rock sample to be analyzed is comprehensively tested and analyzed from multiple angles, the limitation that the conventional research method is single is overcome, and meanwhile, the obtained alternating temperature and pressure characteristic analysis result is more comprehensive.

The invention relates to the technical field of metal material detection, in particular to a test method for evaluating the recrystallization completion degree of a steel material. The method comprises the following steps: dividing a to-be-detected steel plate into a plurality of blocky steel plate samples; preliminarily determining the range of the recrystallization temperature of the steel plate to be measured according to experience, setting a plurality of temperature gradients in the range, respectively heating a plurality of steel plate samples at different temperatures, carrying out heat preservation for a period of time, and then cooling to room temperature; grinding and polishing the cooled steel plate sample; putting the polished steel plate sample into an X-ray diffractometer sample table, and starting an X-ray diffractometer for scanning to obtain diffraction patterns of the steel plate sample at different temperatures; and judging the recrystallization completion degree of the steel plate sample according to the separation condition of the diffraction peaks K alpha1 and K alpha2 in the diffraction pattern. The method has the advantages of simple sample preparation and inspection methods, and results are representative and are basically not influenced by subjective effects of operators due to a large test area.

The invention relates to the technical field of image processing, and discloses an AI-based lithium manganate process parameter regulation and control method and system. The method comprises the following steps: collecting lithium manganate preparation whole-process technological parameters through an infrared temperature measurement array, a pH sensor and an electrochemical workstation to establish a database, training and generating a technological parameter predictor by using an Actor-Critic deep reinforcement learning algorithm, quantifying a deviation degree output early warning level based on a fuzzy comprehensive evaluation algorithm, and determining the lithium manganate preparation whole-process early warning level according to the deviation degree output early warning level. And starting a self-adaptive PID control algorithm to generate a multi-equipment coordination control instruction set, synchronously driving an inclined mixer, a roasting kiln fan and an electrolytic bath temperature control system to adjust, detecting the product quality through an X-ray diffractometer, and feeding back an optimization control instruction. According to the invention, the process parameter control precision and the product quality stability in the lithium manganate preparation process are improved.

The invention relates to a fluorescent whitening agent, in particular to a stilbene biphenyl fluorescent whitening agent and a preparation method thereof. The stilbene biphenyl fluorescent whitening agent is a crystal represented by a formula (1), and contains crystal water or an isomer. The fluorescent whitening agent CBS provided by the invention comprises rod-shaped, needle-shaped and lamellar crystal forms. In the invention, all crystal forms are measured by adopting an X-ray diffractometer, and the water content is precisely measured by adopting a KarlFischer titration method. The X-ray scanning spectrum peak attributions of the crystal samples obtained by different preparation methods have significant difference. # imgabs0 #

The utility model discloses an X-ray diffractometer which comprises a sample table, an X-ray source and at least one detector group, and the sample table is provided with a sample placing area for placing a sample; the X-ray source is used for emitting X-rays to the sample placing area; the detector group comprises a plurality of detectors, the plurality of detectors are arranged in a row along a bent arrangement direction, the arrangement direction extends in a central plane of the detector group, a first surface, with an effective detection area, of each detector faces the sample placement area, and the effective detection area is used for detecting diffracted X-rays; the effective detection areas of the plurality of detectors are arranged at intervals along the arrangement direction. According to the X-ray detection device, the plurality of detectors are arranged in a bent arrangement mode, the plurality of detectors can simultaneously detect diffracted X-rays, so that the detection efficiency is improved, the diffraction information of the X-rays continuously distributed in the space can be obtained, and in addition, due to the fact that effective detection areas of the detectors are two-dimensional pixel arrays, the obtained diffraction information is more.

The invention belongs to the technical field of condensed physics and material science, and particularly relates to an ultrathin single crystal ferroelectric PZT film and a preparation method thereof. The method comprises the following steps of: bombarding a PZT target material by using pulse laser to grow a single crystal ferroelectric PZT film on a single crystal substrate by using a pulse laser deposition PLD method; the deposition process comprises two stages: a single crystal layer growth stage and a rapid cooling stage; the method is simple and easy to operate, and the growth of the ultrathin ferroelectric single crystal film is realized by controlling the laser energy, the substrate deposition growth temperature and the oxygen pressure during PLD growth. According to the method, the growth process is monitored in real time by using a high-energy electron diffractometer RHEED, the quality and thickness of a thin film crystal during growth are ensured, and the atomic-scale flatness of the surface of a prepared sample is proved by observing the surface morphology of the prepared sample through an atomic force microscope; the PZT thin film grown on the single crystal substrate still keeps ferroelectricity when only two layers of crystal lattices are thinnest, and ferroelectric polarization overturning can be achieved.

The invention discloses an X-ray diffractometer sample holder powder sample automatic preparation device, and relates to the technical field of experimental equipment, the X-ray diffractometer sample holder powder sample automatic preparation device comprises a sample table, a sample holder is arranged on the sample table, and a plurality of sample boxes are sequentially placed on the sample holder; the sample table comprises a circular positioning plate, two placement tables, two mounting frames, a feeding mechanism for conveying sample powder into the sample box, a flattening mechanism for flattening the sample powder in the sample box, and a driving mechanism for driving the sample frame to move in the length direction of the placement tables and penetrate through the circular positioning plate; according to the invention, through the uniform flattening of sample powder by the flattening mechanism and the control of the powder granularity by a screen of the feeding mechanism, the preferred orientation phenomenon of crystals in a sample due to overlarge pressure or improper method is reduced, the diffraction line broadening phenomenon is reduced, the definition of a diffraction pattern and the intensity measurement precision of a diffraction peak are improved, and the measurement accuracy of the diffraction peak is improved. The uniform distribution of the powder in each sample box is ensured, and the repeatability of experimental data is improved.

The invention discloses a perforated powder reverse filling device for an x-ray diffractometer, and relates to the technical field of experimental equipment. The sample table comprises a circular positioning plate, a sample frame, a flattening mechanism used for flattening sample powder in the sample box, an abutting mechanism used for sealing an opening of the sample box, and a driving mechanism used for driving the sample box to enter the abutting mechanism. Through cooperation of the pressing mechanism and the piston cylinder, the uniformity and consistency of the sample are ensured, particle distribution of the sample is more random, the influence of the preferred orientation of the sample is reduced, a more accurate diffraction pattern is obtained, multiple times of slicking is not needed, and the situation that multiple times of flattening is needed due to unevenness of powder is avoided; and the lattice of the sample powder after long-time grinding is damaged.

The utility model discloses an X-ray source and an X-ray diffractometer, the X-ray source comprises a containing cylinder, a mounting rack and an X-ray tube, the mounting rack is inserted into the containing cylinder, the X-ray tube is inserted into the containing cylinder and mounted on the mounting rack, the X-ray tube is used for emitting X-rays, and the containing cylinder is provided with a transmission hole allowing the X-rays to transmit; wherein the X-ray tube is provided with a first light outlet and a second light outlet which are arranged at an interval, and the mounting rack and the X-ray tube can jointly rotate relative to the accommodating cylinder. Thus, the first light outlet or the second light outlet of the X-ray tube can be directly adjusted to face the transmission hole by rotating the mounting frame, the X-ray tube does not need to be taken out of the containing cylinder for adjustment, and user operation is facilitated.

The utility model discloses an X-ray diffractometer, which comprises a sample table, an X-ray detector, an X-ray detector, an X-ray detector and an X-ray detector, the X-ray source is used for emitting X-rays to the sample placing area; the detector group comprises a plurality of detectors, the plurality of detectors are arranged in a row along a bent arrangement direction, the arrangement direction extends in a central plane of the detector group, a first surface, with an effective detection area, of each detector faces the sample placement area, and the effective detection area is used for detecting the diffracted X-rays; the effective detection areas of the plurality of detectors are arranged at intervals along the arrangement direction; the fixing support is provided with a bent surface facing the sample placing area, and the second surfaces, opposite to the first surface, of the multiple detectors of the at least one detector group are installed on the bent surface; the cooling assembly is arranged on the back face, away from the bent surface, of the fixing support and used for cooling the detector set. In this way, when the detector group generates much heat in the detection process, heat can be dissipated in time through the cooling assembly.

The invention discloses a low-orientation-deviation silicon carbide wafer and a method for non-destructively detecting the crystal face deflection angle and orientation deviation of the wafer, and belongs to the technical field of silicon carbide wafer detection. The method is used for fixing a wafer and testing the wafer by using an X-ray diffractometer, and comprises the following steps of: (1) adjusting an incident angle scanning range to be (17.8 degrees-a preset deflection angle) + / -0.5 degrees to obtain a crystal face deflection angle A of the wafer, if a difference value between the crystal face deflection angle A and the preset deflection angle is within + / -0.1 degrees, continuing the next step of testing, otherwise, judging that the wafer is unqualified, and stopping testing; (2) adjusting the scanning range of the incident angle to be (17.8 degrees-A) + / -0.1 degrees, defining the Notch position of the wafer as 0 degree, and rotating the wafer in a plane by 360 degrees to obtain an in-plane deflection angle P of the wafer; and (3) testing to obtain a diffraction angle C, and calculating the orientation deviation angle omega of the wafer according to a formula. According to the method, an X-ray diffractometer is adopted to carry out nondestructive testing on the wafer, the testing accuracy is improved while the testing speed is increased, and industrial application detection is facilitated.

The utility model discloses an X-ray diffractometer sample table suitable for a large-thickness sample, belongs to the technical field of metal material performance detection equipment, and is used for detecting the large-thickness sample. According to the technical scheme, a base is a rectangular flat plate, the lower end of a gear disc fixing rod is perpendicularly connected with the base, the upper end of the gear disc fixing rod is rotationally connected with a gear disc, a rotary knob is fixed to one side of the gear disc, the lower end of a rack sleeve is perpendicularly connected with the base, and the lower portion of a lifting rack is inserted into an opening in the upper end of the rack sleeve; the upper portion of the lifting rack is meshed with gear teeth of the gear disc, the upper end of the lifting rack is connected with the bottom face of the sample platform, a jackscrew hole is formed in the side wall of the upper portion of the rack sleeve, and the front end of a jackscrew penetrates through the jackscrew hole to be connected with the side wall of the lifting rack in an abutting mode. The device is simple in structure, convenient to use, simple, convenient and rapid to disassemble and assemble, solves the problem of thickness limitation of a test sample of a sample table of equipment, and can realize detection of a large-size sample.

The utility model provides a sample table device of an X-ray diffractometer, which comprises a sample table body provided with a sample groove; the groove opening of the sample groove is rectangular, the bottom surface of the sample groove is an arc surface, and the arc center of the arc surface is positioned above the groove opening; the length of the notch is larger than 20 mm and smaller than 60 mm. The length of the groove opening of the sample groove of the X-ray diffractometer is set to be larger than 20 mm, it can be guaranteed that X-rays can effectively irradiate on samples, diffraction intensity is guaranteed, meanwhile, impurity peaks can be reduced, and therefore measurement accuracy is guaranteed. The bottom face of the sample groove is arranged to be the arc face, compared with an existing sample groove with the bottom face being a plane, deeper samples can be filled in the middle of the sample groove, the requirement of high-angle measurement for the sample amount is met, the diffraction intensity of high-angle measurement is improved, the utilization rate of the samples can be improved to the maximum degree, and in other words, on the premise that the samples are limited, the measurement accuracy is improved. And high-quality detection data can also be obtained.

The invention relates to the technical field of single crystal preparation, in particular to a preparation method of a desonide single crystal. The method comprises the following steps: adding a desonide sample into a solvent 1; ultrasonically dissolving to a saturated state; adding a solvent 2 into the mixture, uniformly shaking, and filtering; adding the obtained clear filtrate into a bottle, adding a solvent 3 again, and sealing with a sealing film; pricking a hole in a sealing film of the sealed bottle; standing and culturing at the temperature of 20-30 DEG C, separating out crystals, removing supernate, enabling a crystallization system to slowly reach supersaturation by controlling different solvents and solution temperature, and promoting ordered growth of the crystals to obtain the single crystal of desonide. And irradiating the single crystal by using an X-Ray diffractometer under specific conditions to obtain a diffraction pattern and diffraction data.

The invention relates to an X-beam collimator for a crystal diffraction experiment. A main body of the X-beam collimator is of a stepped structure comprising an upper end thin part and a lower end thick part; the fixing hole is formed in the upper end thin part of the main body and is fixedly connected with an external driving motor to drive the main body to move; the loading hole is formed in the thick part of the lower end of the main body and is a cylindrical blind hole; the light beam control piece is of a cylindrical structure and is made of platinum iridium alloy, a small round hole is formed in the center of the light beam control piece, and the light beam control piece is installed in the loading hole in a matched mode. The light-transmitting hole is formed in the bottom of the loading hole, the axis of the light-transmitting hole is collinear with the light path axis of the coaxial microscope and the diffractometer, and the light-transmitting hole is used for allowing the X beams screened by the small hole to pass through. The fixing holes are fixedly connected with the motor, so that the motor can drive the main body to move; light beam control sheets with different light beam size control capabilities are loaded through the loading holes; the X-ray beam passes through the collimator through the light hole, the structure is simple, the size and the mass are small, and rapid collimation and size control of the X-ray beam can be achieved.

The utility model relates to the field of optical detection equipment, in particular to an X-ray diffractometer sample table clamp which comprises a boss arranged on the inner side wall of a machine body, an elastic piece is arranged at the position, opposite to the lower portion of the boss, in the machine body, one end of the elastic piece is used for abutting a slide against the lower surface of the boss, and the other end of the elastic piece is arranged on the inner side wall of the machine body. A pull rope is adhered to one end, opposite to the slide, of the elastic sheet, and a pull head is adhered to the bottom end of the pull rope. The slide clamping device has the effect of conveniently clamping the slide.

The application discloses an X-ray diffractometer high-temperature in-situ detection device, a base lifting assembly is installed on the diffractometer, a tank body assembly rear end is connected with a lifting pad in the base lifting assembly, and a tank body assembly front end is connected with an upper cover in a tank body cover assembly; a heat preservation cavity assembly is arranged in the tank body assembly; a heating chamber assembly is arranged in the heat preservation cavity assembly, and a connecting pipe at a tail of the heating chamber assembly is connected with a gas distribution connector in the tank body cover assembly; sample entering holes for sample passing are arranged at lower ends of the tank body assembly and the heat preservation cavity assembly; the tank body and the tank body cover are provided with cooling water channels; a sample holder assembly is fixed at the tank body assembly lower end, and a measured sample is placed in a sample holder in the sample holder assembly and is sent into the heating chamber assembly; the application has novel structure, stable performance and convenient use, and greatly improves the temperature range of the heating chamber. Since the heat preservation cavity is in a sealed form, the heating speed is fast, and heat preservation is long-lasting.

The utility model discloses a sample table of an X-ray diffractometer, which relates to the field of X-ray diffractometers and comprises a positioning support column, a pair of guide arms is arranged on the positioning support column, movable connecting arms are arranged on the pair of guide arms, one end of each connecting arm exposed to the front of the positioning support column is connected with a positioning arm through a rotating shaft, and the other end of each connecting arm is connected with an X-ray diffractometer through a rotating shaft. One end, far away from the rotating shaft, of each positioning arm is provided with a channel capable of accommodating a glass slide, each positioning arm is provided with a pressure piece capable of being in contact with the glass slide, and the pressure pieces are positioned on the inner sides of the channels. And brackets are arranged on the connecting arms. In the process of positioning the glass slides, due to the fact that the angle between the positioning arm and the connecting arm is adjustable, the positioning arm and the pressure piece can be matched with clamping and positioning operation of the glass slides of different specifications. And meanwhile, the stability of the glass slide can be kept, the phenomena of deviation and falling of the glass slide in the process of operating the positioning arm and the pressure piece are avoided, and the glass slide is protected.