191 results about "Diffractometer" patented technology

A method for diagnosing diseases in human patients can include providing a set of global X-ray diffraction (XRD) data to a global data center (GDC) and processing the set of global XRD data and categorizing it into data clusters, where each data cluster corresponds to a diagnostic indicator for assessment of a physiological or pathological condition. The method can further include communicating local XRD data and local patient data from a local autonomous cell (LAC) to the GDC, where the local XRD data includes information about a tissue sample measured using a tissue diffractometer of the LAC, and wherein the tissue sample includes skin. The method can further include processing the local XRD data, comparing it with the data clusters to determine a local diagnostic indicator for the local patient, and communicating the local diagnostic indicator to the LAC.

The invention relates to the technical field of fluorescence sensing development, in particular to a Cd (II)-based metal organic framework crystalline material as well as a preparation method and application thereof. The chemical formula of the Cd (II)-based metal organic framework crystalline material is {[Cd3 (H2O) 2 (DMA) 2 (5-CMOIA) 2]. 6 / 5H2O} n, the organic framework material is characterized by an X-ray single crystal diffractometer, and the result shows that the organic framework material is crystallized in a triclinic system P-1 space group, the asymmetric unit of the organic framework material is composed of three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions, three Cd (II) ions and three The complex is composed of two deprotonated (5-CMOIA) 3-ligands, two coordinated DMA solvent molecules, two coordinated water molecules and six fifths of crystal water molecules. The solid fluorescence spectrum of the Cd (II)-based metal organic framework crystalline material is measured, the fluorescence response of the Cd (II)-based metal organic framework crystalline material to metal ions in a solution is explored, and the result shows that the Cd (II)-based metal organic framework crystalline material can effectively recognize Hg < 2 + > from different ions and can be applied to the field of fluorescence sensing.

The invention relates to the technical field of process data analysis and processing, and discloses a coal-based solid waste recycling full-process intelligent management and control platform and a digital twin system. The platform is characterized in that an identification module identifies a coal-based solid waste mineral phase through a ray diffractometer to obtain mineral composition classification data; the construction module constructs a digital twinborn model based on the classification data, simulates a dissolution reaction, and obtains weathering soil formation process data; the establishment module establishes a pollutant migration prediction model according to the process data to obtain environmental risk data; the optimization module optimizes the risk data through an improved particle swarm-genetic hybrid algorithm to obtain a resource path scheme; and the adjusting module adaptively adjusts the process parameters based on the path scheme to obtain a whole-process management and control instruction. The problems that accurate mineral phase recognition and intelligent classification are lacked in the coal-based solid waste recycling process, and a dynamic prediction model cannot be constructed and a weathering soil forming process cannot be simulated in real time based on mineral composition data are solved.

The invention relates to the technical field of hydraulic test of nickel alloy pipes, and discloses a hydraulic test system for a thin-wall nickel alloy pipe. According to the system, in the axial loading state of the thin-wall nickel alloy pipe, a closed water pressure cavity is established through an annular sealing clamp, and then strain distribution data on the surface of the pipe body is collected through a distributed optical fiber sensor array. And constructing a three-dimensional stress field reconstruction model based on the acquired strain distribution data, calculating an equivalent plastic deformation threshold value of the pipe body under different water pressure gradients, adjusting a water pressure loading curve slope parameter according to the equivalent plastic deformation threshold value, and generating a dynamic water pressure loading instruction. And the high-frequency pressure pulse generator executes the instruction, synchronously triggers the X-ray diffractometer to collect lattice distortion data of the tube body, inputs the data into the material microscopic damage evolution model, and outputs a microscopic defect spatial distribution map. And finally, material constitutive parameters of the three-dimensional stress field reconstruction model are corrected based on the atlas, closed-loop feedback control is formed, and multi-dimensional data acquisition and accurate management and control of the thin-wall nickel alloy pipe hydrostatic test are achieved.

The invention discloses a prospecting method and a prospecting system for mainly extracting soil micro-fine particles in a shallow coverage area, and the prospecting method comprises the following steps: separating a micro-fine particle part from a soil sample by adopting a wet screening method according to a preset particle size range to obtain a target micro-fine particle sample; the method comprises the following steps: for a target micro-fine particle sample, acquiring chemical component data through an X-ray fluorescence spectrophotometer, and determining the content and distribution characteristics of main elements in the sample; analyzing the mineral composition of the target micro-fine particle sample by adopting an X-ray diffractometer, and identifying the types and relative contents of main minerals in the sample; determining the particle size distribution of the target micro-fine particle sample through a laser particle size analyzer to obtain the proportion information of particles with different particle sizes in the sample; according to the geophysical data, gravity, magnetic force and electrical parameters of the target area are extracted, and a geophysical feature model is established; and carrying out data fusion on the geochemical features and the geophysical feature model, and extracting key feature variables in multi-source information by adopting a principal component analysis method.

The invention relates to the technical field of grading gangue selection of coal gangue, in particular to a grading gangue selection method of coal gangue, which comprises the following steps: acquiring mineral texture data through a multispectral imaging device, analyzing the spatial distribution of aluminum and silicon elements in combination with an X-ray diffractometer, and generating a three-dimensional component map through spatial registration and fusion with infrared heat value data; impurities are dynamically removed through sulfur element spectrum detection, and the air pressure and the material flow of winnowing equipment are adjusted by matching roasting process parameters; components of the sorted waste are analyzed through an X-ray fluorescence spectrometer, particle size data are obtained through a laser particle analyzer, a genetic algorithm is input to iteratively optimize detection channel combination and sampling density, a resource distribution instruction is generated, and equipment parameter correction is fed back. According to the method, aluminum-silicon ratio critical value accurate identification, sorting parameter dynamic adaptation and waste recycling path optimization are realized, and the problem of overburning caused by insufficient quantitative analysis of element distribution in the prior art is solved.

An x-ray diffractometer may perform 3D-analysis of collagen tissue of a patient (a human or another animal). The diffractometer includes an oblong housing that may be hinged and that contains an x-ray projector on one side of a recess and a receiver on an opposite side of the recess. The recess accommodates analyzed tissue such as the external ear and skin of a patient. The x-ray projector directs an x-ray micro-beam at the patient's tissue, and the receiver contains a movable two-dimensional x-ray detector that detects a transmitted x-ray micro-beam passed through the analyzed tissue and detects x-rays scattered or diffracted by the analyzed tissue.

The invention relates to the technical field of zone-melting polycrystalline silicon rod stress uniformity detection, in particular to a zone-melting polycrystalline silicon stress detection method which comprises the following steps: S1, cutting along the radial direction of a silicon rod to obtain a slice; s2, performing multi-point sampling on the slices at the same interval to obtain an initial sample; s3, an oxide layer on the surface of the initial sample is removed, then cleaning and drying are conducted in sequence, and a final sample is obtained; s4, testing the final sample by using an X-ray diffractometer to obtain a data file; s5, processing the data file by using XRD data analysis software, and extracting position information of different final sample diffraction peaks; s6, judging whether the stress distribution is uniform or not according to the extracted position information of the diffraction peaks; the stress magnitude and uniformity of the polycrystalline silicon rod on the same level or the vertical level can be measured, and theoretical support is provided for preparation of zone-melting polycrystalline silicon.

The invention provides a testing device and a testing system for a temperature-induced phase change material. The testing device comprises a device main body, a heating assembly, a pair of conductive probe assemblies and an automatic control system. When the device is used, the device body is used for being connected with an XRD diffractometer, the heating assembly responds to a temperature regulation and control instruction of an automatic control system so that the temperature of the temperature-induced phase change material can be increased or decreased to multiple preset temperatures, and heat preservation is conducted for a preset duration when each preset temperature is reached. In the heating or cooling process of the temperature-induced phase change material, the automatic control system continuously collects the temperature and electric signals of the temperature-induced phase change material, XRD scanning is conducted on a sample through an XRD diffractometer in the heat preservation process, and XRD data are collected; and finally, outputting the temperature value of the temperature-induced phase change material in the heating process and the cooling process, and the corresponding relationship between the electric signal and the XRD data. According to the testing device for the temperature-induced phase change material, the effect of real-time coupling observation of electrical and structural characteristics of the temperature-induced phase change material in the temperature changing process can be achieved.

The invention relates to the technical field of metal material detection, in particular to a test method for evaluating the recrystallization completion degree of a steel material. The method comprises the following steps: dividing a to-be-detected steel plate into a plurality of blocky steel plate samples; preliminarily determining the range of the recrystallization temperature of the steel plate to be measured according to experience, setting a plurality of temperature gradients in the range, respectively heating a plurality of steel plate samples at different temperatures, carrying out heat preservation for a period of time, and then cooling to room temperature; grinding and polishing the cooled steel plate sample; putting the polished steel plate sample into an X-ray diffractometer sample table, and starting an X-ray diffractometer for scanning to obtain diffraction patterns of the steel plate sample at different temperatures; and judging the recrystallization completion degree of the steel plate sample according to the separation condition of the diffraction peaks K alpha1 and K alpha2 in the diffraction pattern. The method has the advantages of simple sample preparation and inspection methods, and results are representative and are basically not influenced by subjective effects of operators due to a large test area.

The invention relates to the technical field of image processing, and discloses an AI-based lithium manganate process parameter regulation and control method and system. The method comprises the following steps: collecting lithium manganate preparation whole-process technological parameters through an infrared temperature measurement array, a pH sensor and an electrochemical workstation to establish a database, training and generating a technological parameter predictor by using an Actor-Critic deep reinforcement learning algorithm, quantifying a deviation degree output early warning level based on a fuzzy comprehensive evaluation algorithm, and determining the lithium manganate preparation whole-process early warning level according to the deviation degree output early warning level. And starting a self-adaptive PID control algorithm to generate a multi-equipment coordination control instruction set, synchronously driving an inclined mixer, a roasting kiln fan and an electrolytic bath temperature control system to adjust, detecting the product quality through an X-ray diffractometer, and feeding back an optimization control instruction. According to the invention, the process parameter control precision and the product quality stability in the lithium manganate preparation process are improved.

The invention relates to a fluorescent whitening agent, in particular to a stilbene biphenyl fluorescent whitening agent and a preparation method thereof. The stilbene biphenyl fluorescent whitening agent is a crystal represented by a formula (1), and contains crystal water or an isomer. The fluorescent whitening agent CBS provided by the invention comprises rod-shaped, needle-shaped and lamellar crystal forms. In the invention, all crystal forms are measured by adopting an X-ray diffractometer, and the water content is precisely measured by adopting a KarlFischer titration method. The X-ray scanning spectrum peak attributions of the crystal samples obtained by different preparation methods have significant difference. # imgabs0 #

The invention discloses an X-ray diffractometer sample holder powder sample automatic preparation device, and relates to the technical field of experimental equipment, the X-ray diffractometer sample holder powder sample automatic preparation device comprises a sample table, a sample holder is arranged on the sample table, and a plurality of sample boxes are sequentially placed on the sample holder; the sample table comprises a circular positioning plate, two placement tables, two mounting frames, a feeding mechanism for conveying sample powder into the sample box, a flattening mechanism for flattening the sample powder in the sample box, and a driving mechanism for driving the sample frame to move in the length direction of the placement tables and penetrate through the circular positioning plate; according to the invention, through the uniform flattening of sample powder by the flattening mechanism and the control of the powder granularity by a screen of the feeding mechanism, the preferred orientation phenomenon of crystals in a sample due to overlarge pressure or improper method is reduced, the diffraction line broadening phenomenon is reduced, the definition of a diffraction pattern and the intensity measurement precision of a diffraction peak are improved, and the measurement accuracy of the diffraction peak is improved. The uniform distribution of the powder in each sample box is ensured, and the repeatability of experimental data is improved.

The invention discloses a perforated powder reverse filling device for an x-ray diffractometer, and relates to the technical field of experimental equipment. The sample table comprises a circular positioning plate, a sample frame, a flattening mechanism used for flattening sample powder in the sample box, an abutting mechanism used for sealing an opening of the sample box, and a driving mechanism used for driving the sample box to enter the abutting mechanism. Through cooperation of the pressing mechanism and the piston cylinder, the uniformity and consistency of the sample are ensured, particle distribution of the sample is more random, the influence of the preferred orientation of the sample is reduced, a more accurate diffraction pattern is obtained, multiple times of slicking is not needed, and the situation that multiple times of flattening is needed due to unevenness of powder is avoided; and the lattice of the sample powder after long-time grinding is damaged.

The invention discloses a low-orientation-deviation silicon carbide wafer and a method for non-destructively detecting the crystal face deflection angle and orientation deviation of the wafer, and belongs to the technical field of silicon carbide wafer detection. The method is used for fixing a wafer and testing the wafer by using an X-ray diffractometer, and comprises the following steps of: (1) adjusting an incident angle scanning range to be (17.8 degrees-a preset deflection angle) + / -0.5 degrees to obtain a crystal face deflection angle A of the wafer, if a difference value between the crystal face deflection angle A and the preset deflection angle is within + / -0.1 degrees, continuing the next step of testing, otherwise, judging that the wafer is unqualified, and stopping testing; (2) adjusting the scanning range of the incident angle to be (17.8 degrees-A) + / -0.1 degrees, defining the Notch position of the wafer as 0 degree, and rotating the wafer in a plane by 360 degrees to obtain an in-plane deflection angle P of the wafer; and (3) testing to obtain a diffraction angle C, and calculating the orientation deviation angle omega of the wafer according to a formula. According to the method, an X-ray diffractometer is adopted to carry out nondestructive testing on the wafer, the testing accuracy is improved while the testing speed is increased, and industrial application detection is facilitated.

The utility model discloses an X-ray diffractometer sample table suitable for a large-thickness sample, belongs to the technical field of metal material performance detection equipment, and is used for detecting the large-thickness sample. According to the technical scheme, a base is a rectangular flat plate, the lower end of a gear disc fixing rod is perpendicularly connected with the base, the upper end of the gear disc fixing rod is rotationally connected with a gear disc, a rotary knob is fixed to one side of the gear disc, the lower end of a rack sleeve is perpendicularly connected with the base, and the lower portion of a lifting rack is inserted into an opening in the upper end of the rack sleeve; the upper portion of the lifting rack is meshed with gear teeth of the gear disc, the upper end of the lifting rack is connected with the bottom face of the sample platform, a jackscrew hole is formed in the side wall of the upper portion of the rack sleeve, and the front end of a jackscrew penetrates through the jackscrew hole to be connected with the side wall of the lifting rack in an abutting mode. The device is simple in structure, convenient to use, simple, convenient and rapid to disassemble and assemble, solves the problem of thickness limitation of a test sample of a sample table of equipment, and can realize detection of a large-size sample.

The invention relates to an X-beam collimator for a crystal diffraction experiment. A main body of the X-beam collimator is of a stepped structure comprising an upper end thin part and a lower end thick part; the fixing hole is formed in the upper end thin part of the main body and is fixedly connected with an external driving motor to drive the main body to move; the loading hole is formed in the thick part of the lower end of the main body and is a cylindrical blind hole; the light beam control piece is of a cylindrical structure and is made of platinum iridium alloy, a small round hole is formed in the center of the light beam control piece, and the light beam control piece is installed in the loading hole in a matched mode. The light-transmitting hole is formed in the bottom of the loading hole, the axis of the light-transmitting hole is collinear with the light path axis of the coaxial microscope and the diffractometer, and the light-transmitting hole is used for allowing the X beams screened by the small hole to pass through. The fixing holes are fixedly connected with the motor, so that the motor can drive the main body to move; light beam control sheets with different light beam size control capabilities are loaded through the loading holes; the X-ray beam passes through the collimator through the light hole, the structure is simple, the size and the mass are small, and rapid collimation and size control of the X-ray beam can be achieved.

The utility model relates to the field of optical detection equipment, in particular to an X-ray diffractometer sample table clamp which comprises a boss arranged on the inner side wall of a machine body, an elastic piece is arranged at the position, opposite to the lower portion of the boss, in the machine body, one end of the elastic piece is used for abutting a slide against the lower surface of the boss, and the other end of the elastic piece is arranged on the inner side wall of the machine body. A pull rope is adhered to one end, opposite to the slide, of the elastic sheet, and a pull head is adhered to the bottom end of the pull rope. The slide clamping device has the effect of conveniently clamping the slide.

The application discloses an X-ray diffractometer high-temperature in-situ detection device, a base lifting assembly is installed on the diffractometer, a tank body assembly rear end is connected with a lifting pad in the base lifting assembly, and a tank body assembly front end is connected with an upper cover in a tank body cover assembly; a heat preservation cavity assembly is arranged in the tank body assembly; a heating chamber assembly is arranged in the heat preservation cavity assembly, and a connecting pipe at a tail of the heating chamber assembly is connected with a gas distribution connector in the tank body cover assembly; sample entering holes for sample passing are arranged at lower ends of the tank body assembly and the heat preservation cavity assembly; the tank body and the tank body cover are provided with cooling water channels; a sample holder assembly is fixed at the tank body assembly lower end, and a measured sample is placed in a sample holder in the sample holder assembly and is sent into the heating chamber assembly; the application has novel structure, stable performance and convenient use, and greatly improves the temperature range of the heating chamber. Since the heat preservation cavity is in a sealed form, the heating speed is fast, and heat preservation is long-lasting.

The invention provides a sample table for a table type X-ray diffractometer, and relates to the field of diffractometers, the sample table comprises a sample rack, a sample table structure is inserted in the sample rack, the sample rack is provided with a lifting locking part used for limiting the sample table structure, the lifting locking part comprises a first T-shaped tube mounted at the bottom of the sample rack, and the first T-shaped tube is provided with a second T-shaped tube; a second T-shaped pipe is inserted into the bottom end of the first T-shaped pipe, a second T-shaped rod is connected to the second T-shaped pipe in a penetrating mode, a first T-shaped rod is connected to the top end of the second T-shaped rod, the top of the first T-shaped rod penetrates through the sample frame and extends into the sample frame, and the top of the first T-shaped rod makes contact with the bottom of the sample table structure. According to the sample table structure, the lifting locking part is arranged, the lifting locking part can complete locking of the sample table structure in a mode of rotating after lifting, the lifting locking part can complete unlocking action by moving downwards and resetting after rotating, operation is convenient and fast, use is facilitated, and the abrasion problem of traditional screw adjustment is avoided.

An X-ray diffractometer system analyzes objects including biological tissue samples and physical and chemical samples. The diffractometer system includes an X-ray beam projector that projects an incident micro-beam of X-ray at an analysis target, an X-ray receiver including an X-ray detector array to detect the transmitted X-rays passed through the object and X-rays that the target diffracts, and a computer workstation for system control and data analysis. The X-ray beam projector may include a radiation source, a beam forming system including at least one of a monochromator, a collimator, and focusing device. The computer workstation may control the X-ray devices and positioning mechanisms and motors, may acquire, process, store, or display data received from diffractometric examination, and may also calculate parameters of the three-dimensional reciprocal lattice of the analyzed target.

This invention discloses an apparatus and method for measuring the residual stress of rock mass under non-uniform temperature, including a sample cell, a heating and temperature control system, and an X-ray diffractometer system. The sample cell includes an upper base and a lower base, and the rock mass sample to be tested is placed in the upper base. The heating and temperature control system includes a thermocouple, a heating element, and a PID temperature controller. By changing the non-uniform temperature evolution process during X-ray diffraction testing through the heating and temperature control system, the non-uniform temperature environment of the rock mass under real working conditions is simulated. In-situ testing of the rock mass under non-uniform temperature conditions is performed using the X-ray diffractometer, and diffraction peak data of the rock mass at each dipping angle ψ is collected using the dipping method, thereby determining the residual stress evolution process of the rock mass at different temperatures. Simultaneously, the rock mass sample can be subjected to stress-relief annealing treatment through the heating and temperature control system to study the changes in residual stress after stress-relief annealing treatment under different non-uniform temperature fields.

The invention provides a material surface and interface damage in-situ characterization system for multi-factor coupling corrosion, and relates to the technical field of in-situ detection equipment. The technical problem that in the prior art, in-situ microscopic observation cannot be conducted on a material surface interface in a simulated service environment, and the dynamic evolution rule of surface interface corrosion behaviors in the same area in the corrosion process cannot be accurately tracked is solved. According to the material surface and interface damage in-situ characterization system for multi-factor coupling corrosion, simulation of heat, salt and force multi-field coupling corrosion is achieved through a salt mist generating device, a multi-point heating module and a corrosion-resistant loading table, an X-ray diffractometer is allowed to conduct in-situ diffraction testing through an X-ray incident window and an X-ray emergent window, corrosion product in-situ phase analysis under the simulated working condition is achieved, and in-situ phase analysis of the corrosion product under the simulated working condition is achieved. And the corrosion-resistant loading table can enter the electron microscope for micro-area structure and micro-area component analysis, the multi-point heating module can keep the consistency of the sample state in the X-ray diffractometer and the electron microscope, and different heating sites can be used for heat, salt and force environment experiments.

The present invention provides a silver electrode having smaller change in resistivity due to temperature change as compared with the related arts, and a method of manufacturing the silver electrode. The silver electrode is configured to have one peak in a range of a diffraction angle 2θ=37.5° to 38.3° in an X-ray diffraction pattern measured by an X-ray diffractometer using a CuKα1 ray, and a change rate of the diffraction angle of the peak after heated at 150° C. for 30 minutes is less than or equal to 0.5%. In this way, the silver electrode has smaller change in resistivity due to temperature change as compared with the related arts.

An X-ray diffractometer sample stage for bulk solid samples is disclosed. In use, the base is moved to the designated position, and the bulk solid sample is placed on the sample stage within the sample placement groove and secured with modeling clay. Since there are three wedge mechanisms arranged in a triangle, based on the principle that three points not on the same straight line can define a plane, the three wedge mechanisms can support the sample stage. Furthermore, because the wedge mechanisms drive the bottom of the sample stage and can convert horizontal movement into vertical movement, the corresponding parts of the sample stage can be raised or lowered by the wedge mechanisms, thereby adjusting the height and angle of the sample stage. This eliminates the need for cutting or processing the bulk solid sample, simplifying operation. When the sample quantity is small, there is no need to lay a large amount of modeling clay on the sample stage, making it more convenient to use. In summary, by using this sample stage, the depth and angle of the sample stage can be adjusted.

The invention aims to establish a synergistic catalytic system in which catalysts cannot coexist. The amide chiral catalyst is prepared through a series of synthesis. The hollow mesoporous COF-carboxylic acid / chiral amide multi-catalyst is prepared by a hydrothermal method. The morphology and the structure of the material are characterized by using a scanning electron microscope, a transmission electron microscope, an X-ray diffractometer, a specific surface instrument, an infrared spectrometer and the like, an asymmetric tandem-addition reaction is catalyzed to construct a chiral acetal compound, high performance liquid chromatography analysis is combined, and multiple catalysts are continuously recycled. Results show that the hollow mesoporous COF-carboxylic acid / chiral amide multi-catalyst not only has good morphology, excellent specific surface area and high porosity, but also enables contradictory catalysts to coexist for synergistic catalysis. The catalyst can be used for rapidly catalyzing an asymmetric tandem-addition reaction, high selectivity of ee = 99% and high yield of 98% are achieved, and the catalyst can be repeatedly used for 10 times. The method is green, environment-friendly, low in cost and suitable for concerted catalysis of catalysts which cannot coexist.

The invention belongs to the related technical field of diffractometer corollary equipment, and discloses an X-ray diffractometer sample stage compatible with different manufacturers, which comprises three structural layers in vertical layering and splicing design, the X-ray diffractometer and goniometer butt joint layer is used for being in butt joint with X-ray diffractometers and goniometer of different manufacturers, and meanwhile splicing with the core function execution layer is achieved through a conical surface positioning pin, an annular magnetic attraction groove and the like. An independent driving and control module is arranged in the core function execution layer and is used for independently completing the functions of translation, rotation, inclination angle adjustment and the like; the sample bearing and fixing layer is provided with a plurality of sample clamps matched with samples in different forms. The technical problems that mechanical interfaces of sample tables of different manufacturers are not uniform, control protocols are not compatible, and recalibration is needed after replacement are effectively solved, and the sample table has the advantages of being compact in structure, convenient to control, high in switching efficiency, accurate and reliable in positioning, capable of achieving plug and play and the like.

The invention provides a material surface and interface damage in-situ characterization transit warehouse for multi-factor coupling corrosion, relates to the technical field of in-situ detection equipment, and aims to solve the technical problems that a load and a high-temperature sample cannot be directly conveyed into an electron microscope from an X-ray diffractometer and salt mist on the surface of the sample easily causes corrosion damage to the electron microscope in the prior art. According to the material surface interface damage in-situ characterization transfer bin for multi-factor coupling corrosion, a pre-pumping chamber is independent from an electron microscope, a transfer chamber and the pre-pumping chamber are isolated through a gate valve, a rail assembly, a vacuum pump set and a nitrogen blowing device are integrated, and a transfer channel special for corrosion surface interface damage in-situ characterization is constructed; the corrosion-resistant loading table clamps a sample to move through the track assembly, the nitrogen blowing device is used for rapidly drying moisture on the sample and preventing salt mist from damaging the electron microscope when the sample enters the electron microscope, and the vacuum pump set can vacuumize the pre-vacuumizing chamber, so that the corrosion-resistant loading table can clamp the sample to enter the electron microscope.

Cell parameters of the crystal compound are as follows: diffraction data are collected in an omega-theta scanning mode by using MoK alpha rays monochromatized by a graphite monochromator on an Oxford X-ray single crystal diffractometer at the temperature of 273 k, and the crystal compound is characterized in that the crystal belongs to a triclinic system, P-1; the cell parameters are as follows: alpha is equal to 79.857 (3) degrees; beta is equal to 87.082 (3) degrees; gamma is equal to 87.829 (3) degrees; the synthesis method of the crystal chlorine compound (I) comprises the following steps: weighing 0.02 35 g of benzophenone hydrazone and 0.6720 g of 1.0 g of 7-chloroisatin and acetic acid ketone monohydrate complex, putting into a 150mL flask, adding 100.0 mL of chlorobenzene as a solvent, stirring at room temperature for 48 hours, carrying out column chromatography separation, eluting with petroleum ether / dichloromethane (1 / 1), and carrying out vacuum drying to obtain the crystal chlorine compound (I). And naturally volatilizing the collected front component points to obtain the target crystal compound I, namely the 6-bromo-3-diphenylmethylene indoline-2-ketone crystal. The application of the crystal chlorine compound (I) is that the crystal chlorine compound (I) has a relatively strong inhibition effect on epidermophyton flocculent, and the IC50 value of the crystal chlorine compound (I) is 0.063 + / -0.008.

The utility model relates to the field of X-ray diffraction, in particular to a special fixture for sample detection of an X-ray diffractometer, which is used for being matched with the X-ray diffractometer to carry out phase analysis and residual stress test and is suitable for residual stress detection of workpieces with square and cylindrical structures. The utility model aims to provide a special fixture for sample detection of an X-ray diffractometer. The fixture has the characteristics of simplicity in operation and high positioning precision. According to the technical scheme, the clamp special for sample detection of the X-ray diffractometer is characterized by comprising a base, a limiting plate fixed to the top of the base, a supporting plate located between the base and the limiting plate in a liftable mode, and a spring pushing the supporting plate to ascend so that a workpiece can be clamped and fixed between the supporting plate and the limiting plate; a detection cavity allowing the supporting plate to ascend and descend and containing a workpiece is formed in the base, the limiting plate is provided with a detection hole allowing X-rays to irradiate the workpiece, and the bottom face of the limiting plate serves as a positioning face for determining the highest point position of the workpiece.