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2 results about "Electron probe microanalysis" patented technology
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An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials.
Method for detecting trace oxygen element based on electron probe microanalyzer
PendingCN122283194AEffectively corrects absorption effectsAvoid low oxygen content measurement resultsElectron probe microanalysisPhysical chemistry
This application discloses a method for detecting trace oxygen elements based on an electron probe microanalyzer, relating to the field of analytical detection technology. The method includes: placing the sample to be tested in the electron probe microanalyzer to obtain the signal intensity of oxygen and the signal intensity of major elements in the sample; obtaining the theoretical standard content of oxygen in a standard sample calculated by the built-in calculator of the electron probe microanalyzer; determining a total correction factor based on the signal intensity of oxygen and the signal intensity of major elements; and determining the oxygen content in the sample based on the total correction factor, the theoretical standard content of oxygen in the standard sample calculated by the built-in calculator, and the signal intensity of oxygen. This application solves the technical problem of insufficient accuracy in detecting trace oxygen content in samples using electron probe microanalyzers.
Owner:PETROCHINA SHENZHEN NEW ENERGY RESEARCH INSTITUTE CO LTD +1
A detection and evaluation method for Ti6Al4V titanium alloy recycled chip material purification treatment
PendingCN122171525AMaterial analysis using wave/particle radiationPreparing sample for investigationElectron probe microanalysisIngot
This invention discloses a method for purifying and evaluating Ti6Al4V titanium alloy recycled scrap, belonging to the field of titanium alloy material processing technology. The method first involves remelting each batch of recycled titanium alloy scrap into laboratory-grade small button ingots to prepare button ingots with uniform composition. Subsequently, inductively coupled plasma spectroscopy and electron probe microanalysis are used to systematically detect and analyze the main element content and trace impurity elements in the button ingots. This invention cleverly transforms the detection of discrete, heterogeneous scrap into the detection of homogeneous standard ingots by remelting titanium alloy scrap with varying shapes and uneven contamination into laboratory-grade small button ingots. This completely eliminates the significant sampling errors and detection biases caused by direct scrap detection due to factors such as high sampling randomness, the mixing of oxide scale and metal matrix, and uneven distribution of surface contaminants. The composition of the button ingots can accurately and stably reflect the average purity level of the entire batch of scrap.
Owner:XIANYANG TIANCHENG TITANIUM IND