17 results about "Electron probe microanalysis" patented technology

This invention discloses a method for preparing a Ti-Mo-Cr alloy diffusion couple without stress-induced phase transformation, belonging to the field of titanium alloy diffusion technology. This invention utilizes hot isostatic pressing (HIP) technology, selecting appropriate process parameters to prepare diffusion couples with both ends being single-phase, exhibiting good adhesion and free from stress-induced phase transformation. On the one hand, this invention allows for the preparation of diffusion couples that meet experimental requirements by adjusting process parameters, thus enabling effective subsequent experimental research and avoiding blindly setting experimental parameters. On the other hand, it allows for precise control, greatly avoiding the occurrence of stress-induced phase transformation or gaps at the diffusion couple interface due to inaccurate parameter control during fixture preparation, which could lead to experimental failure. This invention enables the preparation of diffusion couples that conform to diffusion concentration gradient experiments, which can be used for subsequent electron probe microanalysis to further solve for the diffusion coefficient, facilitating the establishment of a titanium alloy diffusion kinetics database.

The present invention discloses a parameter error calibration method for an electron probe microanalysis instrument. A one-dimensional grating standard template is prepared based on atomic lithography technology, and the theoretical grating period D of the one-dimensional grating standard template is calculated. The one-dimensional grating standard template is placed on the stage of the electron probe microanalysis instrument for a set time to maintain a stable test state. After the electron probe microanalysis instrument is clearly focused, the electron probe microanalysis instrument scans the one-dimensional grating standard template on the stage, captures and measures the grid spacing of the one-dimensional grating standard template, obtains a grating scanning distance measurement value L, and records the magnification at this time. Based on D and L, a calibration factor K at this magnification is calculated. The parameter error calibration method for an electron probe microanalysis instrument of the present invention shortens the traceability chain length for calibrating the instrument, reduces error accumulation in the measurement value transfer process, improves calibration consistency between different instruments, and is easy to operate.

A method for calculating a formation temperature of a mineral based on a chlorite spectrum includes: S1, recording characteristic data of each chlorite sample; S2, acquiring a Fe—OH wavelength value of each chlorite sample; S3, calculating a formation temperature of and contents of major elements in each chlorite sample; and S4, according to the formation temperature and major element contents obtained in the step S3, determining a formation environment and a category of a corresponding chlorite sample. The calculation of a formation temperature of a chlorite mineral is based on characteristic wavelength parameters acquired by field short-wave infrared spectroscopy instead of traditional calculation based on major element data acquired by laboratory electron microprobe analysis (EMPA), which facilitates the rapid identification of a formation environment and an alteration zone of a mineral and greatly improves a working efficiency of mineral exploration.

This invention discloses a method for eliminating stress-induced phase transformation during the preparation of diffusion couples in Ti-V-Mo alloys, belonging to the field of titanium alloy diffusion technology. This invention utilizes spark plasma sintering technology, selecting appropriate process parameters to prepare diffusion couples with both ends being single-phase, exhibiting good adhesion and free from stress-induced phase transformation. On the one hand, this invention allows for the preparation of diffusion couples that meet experimental requirements by adjusting process parameters, thus effectively facilitating subsequent experimental research and avoiding blindly setting experimental parameters. On the other hand, it allows for precise control, greatly reducing experimental failures caused by inaccurate parameter control during fixture preparation. This invention enables the preparation of diffusion couples that conform to diffusion concentration gradient experiments, which can then be used for subsequent electron probe microanalysis to further solve for the diffusion coefficient, facilitating the establishment of a titanium alloy diffusion kinetics database.

This application discloses a method for detecting trace oxygen elements based on an electron probe microanalyzer, relating to the field of analytical detection technology. The method includes: placing the sample to be tested in the electron probe microanalyzer to obtain the signal intensity of oxygen and the signal intensity of major elements in the sample; obtaining the theoretical standard content of oxygen in a standard sample calculated by the built-in calculator of the electron probe microanalyzer; determining a total correction factor based on the signal intensity of oxygen and the signal intensity of major elements; and determining the oxygen content in the sample based on the total correction factor, the theoretical standard content of oxygen in the standard sample calculated by the built-in calculator, and the signal intensity of oxygen. This application solves the technical problem of insufficient accuracy in detecting trace oxygen content in samples using electron probe microanalyzers.

The invention discloses a multi-parameter test optical fiber preform quality detection and grading method and device, and the method comprises the steps: carrying out the electron probe microscopic analysis test, Raman spectrum test and electron paramagnetic resonance test of an optical fiber preform sample, and obtaining element distribution data, Raman spectrum data and paramagnetic resonance spectrum data; performing preprocessing and feature extraction on the element distribution data, the Raman spectrum data and the paramagnetic resonance spectrum data to obtain a plurality of key quality parameters; inputting the plurality of key quality parameters into a pre-trained comprehensive quality evaluation model, and calculating to obtain a comprehensive quality evaluation coefficient of the optical fiber preform; and comparing the comprehensive quality evaluation coefficient with a preset grading threshold value, and carrying out quality grading on the optical fiber prefabricated member. According to the method, three testing modes are adopted, a plurality of key quality parameters are obtained, the detection dimension is enriched, the comprehensive quality evaluation coefficient is calculated through the model, and subjective errors of operators are reduced.

This invention discloses a method for purifying and evaluating Ti6Al4V titanium alloy recycled scrap, belonging to the field of titanium alloy material processing technology. The method first involves remelting each batch of recycled titanium alloy scrap into laboratory-grade small button ingots to prepare button ingots with uniform composition. Subsequently, inductively coupled plasma spectroscopy and electron probe microanalysis are used to systematically detect and analyze the main element content and trace impurity elements in the button ingots. This invention cleverly transforms the detection of discrete, heterogeneous scrap into the detection of homogeneous standard ingots by remelting titanium alloy scrap with varying shapes and uneven contamination into laboratory-grade small button ingots. This completely eliminates the significant sampling errors and detection biases caused by direct scrap detection due to factors such as high sampling randomness, the mixing of oxide scale and metal matrix, and uneven distribution of surface contaminants. The composition of the button ingots can accurately and stably reflect the average purity level of the entire batch of scrap.

This invention discloses a method for obtaining the refractive index distribution of a graded-index lens, relating to the field of graded-index lens technology. The method includes: sample preparation of the graded-index rod lens before electron probe microanalysis; and performing a full elemental scan at the center of the graded-index lens sample and an electron probe microanalysis of exchanged ions A along the lens diameter direction using an electron probe microanalysis instrument. + Line scan; based on electron probe point scan data, the refractive index at the center of the graded refractive index lens sample and the refractive index difference between the center and the edge are calculated using the HSD model; the relative intensity distribution of exchange ions in the graded refractive index lens sample is obtained based on electron probe line scan data; thus, the refractive index distribution of the graded refractive index lens sample is obtained; by analyzing the difference between the refractive index distribution of the same graded refractive index lens sample obtained by the present invention and the thin-film interferometry method, the present invention can easily and conveniently obtain the refractive index distribution of the graded refractive index lens.

Disclosed are a double-sided copper-clad laminated film, a printed circuit board comprising same, and a method for manufacturing the double-sided copper-clad laminated film. The double-sided copper clad laminated film comprises: a polyimide-based substrate having a thickness of 10 ㎛ (exclusive) to 30 ㎛; a first nickel layer disposed on a first surface of the polyimide-based substrate; a first copper layer disposed on a surface of the first nickel layer opposite to the first surface of the polyimide-based substrate; a second nickel layer disposed on a second surface of the polyimide-based substrate; and a second copper layer disposed on a surface of the second nickel layer opposite to the second surface of the polyimide-based substrate, wherein the thickness of the first copper layer or the second copper layer is 10% to 25% (exclusive) based on the thickness of the polyimide-based substrate, and when the surface of the first copper layer or the second copper layer is etched with an etching solution containing ferric chloride, chromium is not detected by energy dispersive spectroscopy (EDAX) or electron probe microanalysis (EPMA), and the height of curls on the film surface may be less than 0.1 mm.

This invention provides a comprehensive investigation system for the boron enrichment mechanism of metamorphic rocks based on micro-area in-situ technology. The system comprises a sample target preparation and characterization module, a combined micro-area in-situ analysis module, a data integration and processing module, and a spatiotemporal correlation and evolutionary sequence reconstruction module, connected sequentially. By establishing a unified spatial coordinate system, multiple micro-area analysis instruments, such as electron probe microanalysis, laser ablation mass spectrometry, and ion probe microanalysis, are sequentially invoked to perform collaborative analysis on the same sample target, obtaining data on mineral composition, trace elements, boron isotopes, and zircon U-Pb-Hf isotopes. The system automatically fuses multi-source data and intelligently identifies mineral generations, and couples geochemical models with machine learning algorithms to construct an evolutionary sequence model of boron geochemical behavior with absolute time as the axis, achieving a quantitative characterization of the entire process of boron source, migration, and enrichment in an open system. This invention significantly improves the systematicness and accuracy of research on boron enrichment mechanisms in metamorphic rocks.

The invention relates to the technical field of fish marking and tracking, and discloses a scleroderma fish marking method based on multi-element composite marking. The method specifically comprises the following steps: marking the sclerobone fish for two or more times by adopting a plurality of marking elements, and introducing the marking elements into the sclerobone fish body, so as to form a composite element fingerprint spectrum formed by a plurality of marking peaks in the otolith of the sclerobone fish. And then, scanning along the growth axis of the otolith through electron probe microscopic analysis (EPMA), analyzing the position, intensity and width characteristics of a mark peak, and realizing high-resolution identification and tracking of an individual or a group. According to the method, the stable and recognizable compound element fingerprints can be formed in the otolith by reasonably designing element types, concentration gradients and processing time, and the method is suitable for multiple scenes such as fish population dynamic monitoring, fishery management and species protection.

The invention discloses a detection method, device and equipment for dry-method mixing uniformity and a storage medium, and belongs to the technical field of dry-method electrode preparation. According to the method, a to-be-detected sample is scanned through an electronic probe microscopic analyzer, the surface of the to-be-detected sample is bombarded by the electronic probe microscopic analyzer through focused high-energy electron beams, characteristic X-rays of the sample are excited, and the content of a target element can be quantitatively calculated by measuring the intensity of the characteristic X-rays. Therefore, the element surface distribution diagram of the target element can be accurately obtained. And performing image processing on the element surface distribution diagram to obtain a uniformity evaluation parameter, and detecting the distribution uniformity of the target element through the uniformity evaluation parameter. The uniformity evaluation parameter is a quantitative index, and can objectively and effectively characterize the uniformity of dry mixing.

The present invention provides a grain-oriented electrical steel sheet 1 which has a large applied tension. The grain-oriented electrical steel sheet 1 is provided with an insulating coating film 3 that is disposed on the surface of the steel sheet. The insulating coating film 3 contains silicon and phosphorus, and in a region R1 on the surface of the grain-oriented electrical steel sheet 1, the void ratio, which is the ratio of a region R2 in which a void part is present inside the insulating coating film 3, is 50% or less. The region R1 is a region that has an X-direction length of 125 µm and a Y-direction length of 125 µm. The region R2 is a region in which, in the region R1, the ratio of the detected amount of iron to the detected amount of phosphorus is 10% or more, and the detected amount of silicon is 90% or less of the maximum value in the region R1. The detected amount of each element is determined by analyzing the region R1 using an electron probe microanalyzer.

This item is a carbon rod holder. Carbon rods held by this item are used for pretreatment of electron microscope observations, such as those using scanning electron microscopes and electron probe microanalyzers. This pretreatment involves evaporating the tip of the carbon rod to deposit carbon on the surface of the observation object. The tip of the carbon rod to be evaporated is sharpened into a cone shape with the shaft at the apex. This cone shape is achieved using a rotary handle pencil sharpener. When a carbon rod is inserted into a rotary handle pencil sharpener without a carbon rod holder, for example, if the carbon rod is 100 mm long, 60 mm will fit into the sharpener's clip. This means that if 40 mm of the carbon rod is used, it will no longer fit into the sharpener's clip. In this case, the carbon rod must be discarded even though 60 mm remains. On the other hand, using this carbon rod holder reduces the amount of carbon rod waste compared to when a carbon rod holder is not used, thereby increasing the utilization rate of the carbon rod. When using this product, the upper cover holder and the lower receiving holder are screwed together from above with flat screws, and a cylindrical carbon rod with a conical tip is clamped and fixed in the cylindrical notches in both holders. As shown in the bottom view of the cover holder and the top view of the receiving holder, the cylindrical notches have two widths, allowing for the accommodation of carbon rods of two different thicknesses. Furthermore, by inserting flat screws into the two flat portions, the carbon rod can be inserted into the insertion hole of a rotary handle pencil sharpener without the flat screw head interfering with the hole. Furthermore, a flat washer is sandwiched between the mating surfaces of the cover holder and receiving holder on one of the flat screws farthest from the carbon rod. This allows the carbon rod to be gripped at one end of the upper and lower insertion sections, similar to the gripping of a piece of chopsticks or tweezers, increasing the holding pressure and enabling a more secure grip of the carbon rod.

This item is a carbon rod holder. Carbon rods held by this item are used for pretreatment of electron microscope observations, such as those using scanning electron microscopes and electron probe microanalyzers. This pretreatment involves evaporating the tip of the carbon rod to deposit carbon on the surface of the observation object. The tip of the carbon rod to be evaporated is sharpened into a cone shape with the shaft at the apex. This cone shape is achieved using a rotary handle pencil sharpener. If a carbon rod is inserted into a rotary handle pencil sharpener without a carbon rod holder, for example, if the carbon rod is 100 mm long, 60 mm will fit within the sharpener's clip. This means that if 40 mm of the carbon rod is used, it will no longer be able to be held by the sharpener's clip. In this case, the carbon rod must be discarded, even though 60 mm remains. On the other hand, using this carbon rod holder reduces the amount of carbon rod waste compared to when a carbon rod holder is not used, thereby increasing the utilization rate of the carbon rod. When using this product, the upper cover holder and the lower receiving holder are screwed together from above with flat screws, and a cylindrical carbon rod with a conical tip is clamped and fixed in the cylindrical notches in both holders. As shown in the bottom view of the cover holder and the top view of the receiving holder, the cylindrical notches have two widths, allowing for the accommodation of carbon rods of two different thicknesses. Furthermore, by inserting flat screws into the two flat portions, the carbon rod can be inserted into the insertion hole of a rotary handle pencil sharpener without the flat screw head interfering with the hole. Furthermore, a flat washer is sandwiched between the mating surfaces of the cover holder and receiving holder on one of the flat screws farthest from the carbon rod. This allows the carbon rod to be gripped at one end of the upper and lower insertion sections, similar to the gripping of a piece of chopsticks or tweezers, increasing the holding pressure and enabling a more secure grip of the carbon rod. In addition, handle-rotating pencil sharpeners use a system in which the sharpening blade, operated by a planetary gear, is installed at an angle and rotates around the pencil to sharpen it.In this design, taking this method into consideration, the outer diameter of the carbon rod holder is tapered toward the front so that it does not interfere with the sharpening blade. Specifically, a taper is set on the outer circumference of the carbon rod holder at an angle (6 degrees in this design) that does not interfere with the sharpening blade. By tapering the outer diameter from near the center toward the front of both the cover holder and the receiving holder, the impact of the carbon rod holder's interference with the sharpening blade is reduced, and the carbon rod and carbon rod holder can be inserted deeper into the insertion hole of the handle-tight pencil sharpener. In this design, the carbon rod and carbon rod holder can be inserted 10 mm deeper into the insertion hole of the handle-tight pencil sharpener than if there was no taper.

A solid electrolytic capacitor element included in a solid electrolytic capacitor includes: an anode body including a porous portion in at least a surface layer; a dielectric layer covering at least a part of the surface of the anode body; and a solid electrolyte covering at least a part of the dielectric layer. The anode body contains a tantalum element, and the solid electrolyte contains a sulfur element. The solid electrolyte has: a first portion disposed in the pores of the porous portion; and a second portion disposed from the main surface of the anode body having the dielectric layer to the outside of the porous portion. In an element mapping in a predetermined region of a cross-section of the porous part using an electron probe microanalyzer, the abundance ratio of elemental sulfur is 0.17% or more when the abundance ratio of elemental tantalum is 100%.

Provided is an iron oxide which can be used for manufacturing a ferrite having higher absorbency. The iron oxide of the present invention is an iron oxide for an electromagnetic wave-absorbing magnetoplumbite-type ferrite that contains different elements and has a coefficient of variation (Cv value) of the signal intensity of an electron probe microanalyzer (EPMA) for the different elements of 1.000 or less.