60 results about "Electron probe microanalysis" patented technology

A thin film analysis system includes multi-technique analysis capability. Grazing incidence x-ray reflectometry (GXR) can be combined with x-ray fluorescence (XRF) using wavelength-dispersive x-ray spectrometry (WDX) detectors to obtain accurate thickness measurements with GXR and high-resolution composition measurements with XRF using WDX detectors. A single x-ray beam can simultaneously provide the reflected x-rays for GXR and excite the thin film to generate characteristic x-rays for XRF. XRF can be combined with electron microprobe analysis (EMP), enabling XRF for thicker films while allowing the use of the faster EMP for thinner films. The same x-ray detector(s) can be used for both XRF and EMP to minimize component count. EMP can be combined with GXR to obtain rapid composition analysis and accurate thickness measurements, with the two techniques performed simultaneously to maximize throughput.

A system and method for using electron beams with engineered phase dislocations as scanned probes in electron probe beam instruments such as scanning transmission electron microscopes. These types of electron beams have unique properties and can provide better information about a specimen than conventional electron beams. Phase dislocations may be created based on a pattern disposed on a nanoscale hologram, which may be placed in the electron optical column of the electron probe beam instrument. When an electron beam from the instrument is directed onto the hologram, phase dislocations may be imprinted onto the electron beam when electrons are diffracted from these holograms. For example, electron probe beams with spiral phase dislocations may occur. These spiral phase dislocations are formed using a hologram with a fork-patterned grating. Spiral phase dislocations may be used to provide magnetic contrast images of a specimen.

The invention discloses a facility for manufacturing vertical GaN-based LED chips by metal substrates. The facility comprises a computer information acquisition controller, a reaction room, a metal substrate feeding room, a gaseous-phase metal organism supply device, a nitrogen and/or hydrogen and/or ammonia supply device, an ECR (electron cyclotron resonance) plasma resource supply device, a vacuum degree meter and an imaging display formed relatively by a reflection high-energy electron diffractometer and a fluorescent screen, and is mainly characterized by further comprising a magnetic field coil support cylinder, a photoelectric alarm, a Faraday cylinder, an electronic probe and a direct-current bias voltage. The facility is reasonable in structure, high in film-coating quality and working efficiency, low in chip manufacture cost and the like.

A synthetic polyisoprene latex emulsion has pre-vulcanization composition and post vulcanization composition. The pre-vulcanization composition comprises soluble sulfur with high S₈ ring structure that is catalytically broken by a zinc dithiocarbamate. Surfactants present in the pre-vulcanization composition wets synthetic polyisoprene particles and permeates small sized sulfur and accelerator molecules into the interior of these particles thereby pre-vulcanizing the particles. The degree of pre-vulcanization is verified by isopropanol index test. The latex emulsion has post-vulcanization composition with accelerators that crosslink inter-particle region during post vulcanization cure cycle. The dipped synthetic polyisoprene article is substantially uniformly cured both in the inter-particle and intra-particle regions and reliably exhibits high cross link density, uniform distribution of double bonds in TEM and zinc segregation at the boundaries or original particles by electron microprobe analysis. The films exhibit high tensile strength, tensile modulus, tear strength, burst pressure and burst volume.

There is provided a reconfigurable scanning electron microscope (RSEM) (100) comprising: (a) a gun assembly (110) and an associated electron optical column (120) for generating an electron beam (600), for demagnifying the electron beam (600) to generate an electron probe (C3) and for scanning the probe (C3) across a sample (190); (b) an electron detector (550) for detecting emissions from the sample (190) in response to scanned electron probe irradiation thereof and for generating a corresponding detected signal (Sd) indicative of the magnitude of the emissions; and (c) a display (170) for receiving the detected signal (Sd) and scanning signals (x, y) indicative of the position of the probe (C3) relative to the sample (190) for generating the image of the sample (190). The RSEM (100) is distinguished in that it further includes aperture bearing members (500, 520), each member (500, 520) including an associated electon-beam transmissive aperture, for at least partially gaseously isolating the gun assembly (110) and the electron optical column (110) from the sample (190), thereby enabling the RSEM (100) to be reconfigurable as a high-vacuum scanning electron microscope and also as an environmental scanning electron microscope, the RSEM (100) being reconfigurable to include no aperture members, one aperture member (500, 750) and a plurality of aperture members (500, 750; 520 850, 860).

The invention belongs to the technical field of uranium ore, and specifically relates to a method for testing the formation age of crystalline uranium ore; The age of uranium deposits and the role of metallogenic evolution analysis, decomposing the key elements and main ore-controlling factors of each metallogenic period from complex geological phenomena, providing ideas for uranium deposit exploration, and guiding specific ore-prospecting work to test crystal quality The method for the formation age of uranium ore; including the following steps: Step 1, field investigation and collection of uranium ore samples; Step 2, rock ore identification and electronic probe analysis on the ore samples; Step 3, using LA-ICP-MS Micro-zone dating of crystalline uranium ore; step 4, data collation, parameter calculation and mapping, and finally the formation age of uranium ore is obtained.

The invention relates to a measuring method of the equilibrium phase of a multi-component Ti-Al-X intermetallic compound. The measuring method comprises the steps of firstly carrying out diffusion-couple reference alloy composition design;preparinga diffusion-couple reference alloy casting ingot byadopting a vacuum-induction electric arc melting technology; cutting the melted diffusion-couple reference alloy casting ingot into a test sample; grinding the test sample till the surface is smooth and flat, and then carrying out vacuum prewelding; then carrying out long-time balance diffusion treatment on the pre-welded sample, and forming a diffusion layer between two reference alloys; then preparing a middle diffusion layer into a metallographic sample, andobserving; testing the contents of Al and Ti of the two ends of a phase interface of the sample by adopting an electronic probe technology, drawing concentration distribution curve of the Al and the Ti from an alpha-phase area to a gamma-phase area and obtaining equilibrium compositions of the two phases. Compared with the prior art, the measuring method has important theoretical guidance and practice significance on research ofthe equilibrium phase of multi-component Ti-Al-X intermetallic compound.

The invention discloses a total-rock component testing method based on in-situ electronic probe analysis. The total-rock component testing method comprises the steps of jet-plating a manufactured rock X-ray plate or a thin X-ray plate with a carbon conductive film, putting a jet-plated sample into an electronic probe sample chamber for analysis, shooting a back scattering electronic image under the condition of a magnification factor of 450-550, performing precision quantitative analysis on different minerals in the image through an electronic probe wavelength dispersive spectrometer, and counting the area percentages of the different minerals in the shot back scattering image by adopting a grid method; calculating a result which is the content of a total-rock element of the rock sample by performing a weighing average operation on an element content average value of different analysis points of the same mineral and the area percentages of the minerals. The method disclosed by the invention has the advantages of no destroy to the sample, in-situ microbeam analysis, high analysis precision, easiness in sample preparation, zero pollution and the like, and has an extremely good application prospect in the analysis of aerolite, gem-jade and precious rare rock samples.

A glass or metal wire is precisely etched to form the paraboloidal or ellipsoidal shape of the final desired capillary optic. This shape is created by carefully controlling the withdrawal speed of the wire from an etchant bath. In the case of a complete ellipsoidal capillary, the etching operation is performed twice in opposite directions on adjacent wire segments. The etched wire undergoes a subsequent operation to create an extremely smooth surface. This surface is coated with a layer of material which is selected to maximize the reflectivity of the radiation. This reflective surface may be a single layer for wideband reflectivity, or a multilayer coating for optimizing the reflectivity in a narrower wavelength interval. The coated wire is built up with a reinforcing layer, typically by a plating operation. The initial wire is removed by either an etching procedure or mechanical force. Prior to removing the wire, the capillary is typically bonded to a support substrate. One option for attaching the wire to the substrate produces a monolithic structure by essentially burying it under a layer of plating which covers both the wire and the substrate. The capillary optic is used for efficiently collecting and redirecting the divergent radiation from a source which could be the anode of an x-ray tube, a plasma source, the fluorescent radiation from an electron microprobe, or some other source of radiation.

Belonging to the technical field of metal material detection, the invention relates to a quantitative analysis method for continuous casting billet dendritic segregation. The method includes: sample preparation: controlling the sample diameter less than or equal to 30mm; electron probe surface analysis: setting an acceleration voltage of 15-30kV, and a beam current of 100-500nA, etc.; selection of segregation and substrate position; electron probe quantitative analysis: applying a "Quantitative" module for quantitative element analysis using ZAF correction method; and result analysis and data processing: representing the dendritic segregation degree of an element with dendrite segregation ratio, etc. The method provided by the invention has the advantages of strong pertinence and high result analysis accuracy.

In an electron probe microanalyzer (EPMA) and a method of use thereof, even if plural sets of X-ray image data are obtained at different timings from regions between which a positional deviation occurs, processing for obtaining the correlation is performed precisely. The sets of X-ray image data are obtained from the same region of a sample using the EPMA at different timings and stored in memory along with sets of electron image data based on detection of secondary or backscattered electrons arising from the region. The sets of electron image data obtained at the different timings are compared, and the amount of positional deviation is calculated. An operation for extracting a region common to the regions respectively producing the sets of X-ray image data obtained at the different timings is performed on these sets of X-ray image data based on the calculated amount of positional deviation.

The invention belongs to the technical field of F-element micro-cell in-situ testing, and in particular discloses an electronic probe quantitative analysis method for testing content of F in natural ore. The electronic probe quantitative analysis method comprises the following steps: grinding a natural ore sample into a sample to be tested, and coating the sample to be tested and a standard sample with carbon; checking and confirming F-containing ore to be tested according to an X-ray energy spectrum; sequentially measuring counting strength of the standard sample and counting strength of the F-containing ore to be tested under same quantitative analysis conditions; comparing and analyzing the counting strength of the standard sample and the counting strength of the F-containing ore to be tested, and modifying comparison and analysis results, thereby obtaining the content of the element F. By adopting the electronic probe quantitative analysis method, interference factors in the testing process are eliminated to the maximum extent, optimal electronic probe analysis testing conditions are confirmed, and the purpose of accurately testing the content of the element F in the natural ore in a microcosmic scale is achieved.

The invention relates to a characterization method for distinguishing multi-phase sinter in hot-rolled silicon steel, and belongs to the technical field of status analysis of steel and iron materials. The method adopts an electron probe and an EBSD (electron backscatter diffraction) device arranged on a scanning electronic microscope for micro-structural characterization on four phases of Fe2O3, Fe3O4, FeO and Fe2SiO4 on the surface of the polished hot-rolled silicon steel. The method comprises the following steps: according to the diversities of L Beta/L Alpha peak intensity ratios of the Fe elements in different valence states, through the adoption of the status analysis of the electron probe to resolve three typical oxides of Fe, and the use of the middle-phase resolution function of the EBSD technology to distinguish Fe2SiO4, the in-depth research on the microstructures of the sinter containing different phases is carried out in order to eventually realize the comprehensive characterization of the multi-phase sinter.

The invention relates to a method for high-precision analysis on trace elements of olivine. The elements of olivine are analyzed by using an electronic probe. The method is characterized in that highacceleration voltage is supplied to the electronic probe; when main elements of the olivine are analyzed, small-beam current is supplied to the electronic probe; when trace elements of the olivine areanalyzed, large-beam current is supplied to the electronic probe; the electronic probe is equipped with five spectrometers. Under an abnormal experiment condition that high-acceleration voltage, small-beam current and large-beam current are combined, the detection limit of specific elements is optimized to a grade of 10ppm to several ppm, and requirements of high resolution and high precision analysis on trace elements on olivine are completely met.

X-ray monochromators and electron probe micro-analysis (EPMA) systems using such monochromators are disclosed. A turretless x-ray monochromator may have a cassette of reflectors instead of a turret. The cassette stores a plurality of reflectors that can be inserted into a conventional Rowland circle monochromator geometry. A transfer mechanism selectively moves reflectors from the cassette to a reflector positioner. The use of the cassette allows each reflector to be placed closer to a source of x-rays, thereby allowing a larger solid angle for x-ray collection. An alternative x-ray monochromator uses a non-focusing reflector that can be fixed, scanned axially or scanned radially to provide large solid angle detection of x-rays at various energies with a single reflector.