Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

89 results about "Electron pulse" patented technology

Method and system for ultrafast photoelectron microscope

An ultrafast system (and methods) for characterizing one or more samples. The system includes a stage assembly, which has a sample to be characterized. The system has a laser source that is capable of emitting an optical pulse of less than 1 ps in duration. The system has a cathode coupled to the laser source. In a specific embodiment, the cathode is capable of emitting an electron pulse less than 1 ps in duration. The system has an electron lens assembly adapted to focus the electron pulse onto the sample disposed on the stage. The system has a detector adapted to capture one or more electrons passing through the sample. The one or more electrons passing through the sample is representative of the structure of the sample. The detector provides a signal (e.g., data signal) associated with the one or more electrons passing through the sample that represents the structure of the sample. The system has a processor coupled to the detector. The processor is adapted to process the data signal associated with the one or more electrons passing through the sample to output information associated with the structure of the sample. The system has an output device coupled to the processor. The output device is adapted to output the information associated with the structure of the sample.
Owner:CALIFORNIA INST OF TECH

Time-resolved measurement system and method for reconstructing optical parameters of turbid media

InactiveCN101612034AEffective Response Scattering SituationImprove stabilityDiagnostic recording/measuringSensorsNon invasivePhoton counting
The invention belongs to the field of measurement of optical parameters, and particularly relates to a time-resolved measurement system and a method for reconstructing the optical parameters of turbid media. In order to realize fast, real-time, non-invasive in-vivo measurement of the optical parameters of an organizer under different wavelengths, the invention utilizes the technical scheme as follows: laser emerging from a variable attenuator enters into turbid media through incident optical fiber to be scattered or absorbed, and then reflected or transmitted laser from the surface of the medium is received by detection fiber; the laser detected by detection fiber is sent to a PMT detector with refrigeration function, electronic pulse output by the PMT detector is input to a time-correlated single photon counting (TCSPC) module, and the TCSPC module obtains a time extension curve emerging from an organization and inputs the curve into a computer for processing. The invention is mainly used for measuring the optical parameters of the organizer under different wavelengths.
Owner:TIANJIN UNIV

Determining an electromagnetic response of a sample

Determining electromagnetic response of sample structure having predetermined bulk permittivity and permeability, to electron and radiation pulses, includes calculating electron pulse response of sample structure to electron pulse excitation, using finite-difference time-domain method. Electron pulse excitation is represented by non-singular current source driven by relativistic moving non-Coulombian electron charges, electron pulse response is calculated based on interaction of electron pulse excitation with electromagnetic modes of sample structure at laboratory frame, and electron pulse response depends on bulk permittivity and permeability of sample structure, calculating radiation response of sample structure to electromagnetic radiation excitation, using finite-difference time-domain method. Radiation response depends on bulk permittivity and permeability of sample structure, and providing electromagnetic response of sample structure by superimposing electron pulse response and radiation response. Electromagnetic response comprises electron-energy-loss spectra and/or experienced phase of electron wave functions after interacting with photons of electromagnetic radiation excitation. Method and measuring apparatus are also described.
Owner:MAX PLANCK GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN EV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products