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Position energy time testing device and apparatus based on CZT detector

A test device and detector technology, which is applied in the field of radiation measurement, can solve problems such as inconsistencies in opening angles, achieve high sensitivity, short-time response, and expand the upper limit of sensitivity

Active Publication Date: 2020-01-14
NAT INST OF METROLOGY CHINA
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Problems solved by technology

[0008] The detectors disclosed in the above patent still cannot avoid the problem of the deviation of the modulation curve obtained by the system due to the fact that several detectors are set in different orientations and the opening angles are inconsistent with each other. It cannot avoid the trouble of offline correction of the modulation curve, which affects other System detection efficiency and energy resolution

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  • Position energy time testing device and apparatus based on CZT detector
  • Position energy time testing device and apparatus based on CZT detector
  • Position energy time testing device and apparatus based on CZT detector

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Embodiment approach

[0040] According to a preferred embodiment, the test device includes at least a plurality of pixel detectors 120 . Such as figure 1 and image 3 As shown, a plurality of the pixel detectors 120 are spliced ​​around the scintillation crystal array 110 adjacent to each other along its circumference in order to form a detection surface based on the central axis of the scintillation crystal array 110 . When radiation particles are incident on the scintillation crystal array 110 , the radiation particles undergo a fluorescence effect in the scintillation crystal array 110 and are converted into scintillation light. During the transmission process of the scintillation light photons, scintillation events with a luminous intensity distribution centered on the incident position of the radiation particles on the scintillation crystal array 110 are formed. Based on the time information when each scintillation event occurs, the relative time information of the radiation action detector ...

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Abstract

The invention relates to a position energy time testing device based on a CZT detector. The testing device at least comprises a scintillation crystal array, one or more pixel detectors, a dedicated readout ASIC. The dedicated readout ASIC is capable of determining relative time information of ray action detectors corresponding to a plurality of scintillation cases detected by each pixel detector respectively by utilizing a determined corresponding relation between electronic pulses provided by the pixel detectors and the luminous intensity of scintillation light generated by the scintillationcrystal array under the incidence of radiation particles at a multi-pixel energy spectrum detector module level, focusing the plurality of scintillation cases from a single gamma photon, performing time coincidence logic processing to discriminate effective scintillation cases from Compton scattering, and outputting scintillation case information that includes relative time information, pixel energy spectrum information, and position information of the ray action detectors and are treated by time coincidence logic processing.

Description

technical field [0001] The invention relates to the technical field of radiation measurement, in particular to a position energy time test system and device based on a CZT detector. Background technique [0002] Cadmium zinc telluride (CZT) semiconductor is an excellent room temperature X-ray and γ-ray detection material. It is a wide bandgap II-VI compound semiconductor crystal formed by solid solution of CdTe and ZnTe. It is used in environmental monitoring, medical diagnosis, It has broad application prospects in many fields such as industrial non-destructive testing, safety inspection, and space science. Cadmium zinc telluride (CZT) semiconductors have at least the following advantages: 1. Cadmium zinc telluride (CZT) semiconductors are the only ones that can work at room temperature and can process millions to tens of millions of photons per second per square millimeter The sensitivity of semiconductors can reach the limit, and even the weak to almost no cosmic backgro...

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Application Information

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IPC IPC(8): G01T1/24G01T1/202G01T1/208
CPCG01T1/202G01T1/208G01T1/24G01T1/247
Inventor 梁珺成李正伟亢锐杨志杰刘皓然勒孚河张明
Owner NAT INST OF METROLOGY CHINA
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