Method for high-precision analysis on trace elements of olivine

A technology of trace elements and olivine, which is applied in the direction of analyzing materials, using wave/particle radiation for material analysis, measuring devices, etc., can solve the problem of inability to meet the accuracy requirements of olivine, and achieve the effect of saving test time and convenient operation.

Inactive Publication Date: 2018-03-13
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

Under normal conditions, the minimum detection limit of electron probe analysis is 0.0 n% level (hundreds

Method used

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  • Method for high-precision analysis on trace elements of olivine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0017] The electron probe adopts high accelerating voltage; when analyzing the main elements of olivine, the electron probe adopts a small beam current; when analyzing the trace elements of olivine, the electron probe adopts a large beam current; the electron probe is equipped with 5 spectrometers.

[0018] During the implementation, the electronic probe adopts CAMECA SXFive electronic probe, and the small beam current and large beam current can be automatically switched; Among them, LTAP means large TAP beam splitting crystal, LLiF means large LiF beam splitting crystal. The maximum accelerating voltage of the electron probe is 25kv, the small beam current is 20~40nA, and the large beam current is 800~900nA. When the electronic probe analyzes the main elements of olivine Si, Mg, Fe, the peak counting time is 10 seconds; when the electronic probe analyzes the trace elements of olivine, the peak counting time for analyzing Na, Cr, Ca, Mn, Ni, Zn is 120 seconds Seconds, analysi...

Embodiment 2

[0024] When the small beam and large beam of the electron probe cannot be switched automatically, the energy spectrometer is used to analyze the main elements of olivine, and the spectrometer is used to analyze the trace elements of olivine. All the other are the same as embodiment one.

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Abstract

The invention relates to a method for high-precision analysis on trace elements of olivine. The elements of olivine are analyzed by using an electronic probe. The method is characterized in that highacceleration voltage is supplied to the electronic probe; when main elements of the olivine are analyzed, small-beam current is supplied to the electronic probe; when trace elements of the olivine areanalyzed, large-beam current is supplied to the electronic probe; the electronic probe is equipped with five spectrometers. Under an abnormal experiment condition that high-acceleration voltage, small-beam current and large-beam current are combined, the detection limit of specific elements is optimized to a grade of 10ppm to several ppm, and requirements of high resolution and high precision analysis on trace elements on olivine are completely met.

Description

technical field [0001] The invention relates to a method for analyzing trace elements of olivine with high precision. Background technique [0002] Olivine accounts for more than 50% of the mineral composition of the upper mantle, and is also the main constituent mineral of ultrabasic rocks and basalts. Recent studies have shown that olivine can provide important petrological and geochemical indication information for the study of magma formation and evolution and mantle geodynamics. These trace information mainly depend on secondary and trace elements in olivine, such as nickel, manganese, calcium, aluminum, chromium, cobalt, titanium, zinc, phosphorus and sodium, etc., and their content is usually tens of ppm to thousands of ppm. And the distribution in the olivine mineral grains may be uneven (such as a zonal change). In order to obtain the content information of these sub-trace elements, it depends on the microbeam in situ analysis technology. [0003] Electron probe ...

Claims

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Application Information

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IPC IPC(8): G01N23/225
CPCG01N23/2252G01N2223/079G01N2223/102
Inventor 毛骞张迪陈意苏斌马玉光
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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