This invention belongs to the field of
aerospace electronic device reliability testing technology, and particularly relates to a
proton microbeam single-event effect testing
system and an error rate assessment method. The
system includes a common reference positioning fixture, a
pulsed laser single-event test module, and a
proton microbeam single-event effect test module. A unified absolute coordinate
system is established through an optical positioning structure on the fixture, achieving precise alignment of the
pulsed laser platform and the
proton microbeam platform. The method involves first fixing the pre-processed
device under test (DUT) to the fixture, then scanning the sensitive area and acquiring the error section on the
pulsed laser platform, and finally transferring it to the proton microbeam platform to reproduce the coordinates and perform point-to-point
irradiation of the sensitive area. The on-
orbit error rate is then assessed based on the
irradiation response data. This invention solves problems such as the difficulty in selecting proton microbeam test parameters, insufficient cross-platform positioning accuracy, and the lack of multi-functional
chip partition testing, enabling efficient sensitive area positioning, precise
irradiation, and on-
orbit reliability assessment.