Total-rock component testing method based on in-situ electronic probe analysis

An electronic probe, in-situ analysis technology, applied in the field of microbeam analysis and testing, and earth science, can solve the problems of unrecoverable samples, damaged samples, etc., to achieve simple production, high quantitative accuracy, high reliability and accuracy Effect

Inactive Publication Date: 2014-10-29
GUILIN UNIVERSITY OF TECHNOLOGY
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Problems solved by technology

The disadvantage of the above two analysis and test methods is that...

Method used

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  • Total-rock component testing method based on in-situ electronic probe analysis
  • Total-rock component testing method based on in-situ electronic probe analysis
  • Total-rock component testing method based on in-situ electronic probe analysis

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Embodiment

[0019] In this embodiment, the national standard granite sample (number: 07103) is the test object, and the specific steps are as follows:

[0020] (1) Grind the granite sample numbered 07103 into a light sheet or thin sheet of standard thickness and size.

[0021] (2) Carry out carbon conductive film spraying treatment on the rock sample ground in step (1).

[0022] (3) Put the spray-coated sample in step (2) into the electron probe sample chamber for analysis, and take a backscattered electron image at a magnification of 500 times.

[0023] (4) Carry out precise quantitative analysis to different types of minerals in the backscattered electron image taken in step (3) with a spectrometer, and the number of analysis points for each mineral is 90 to 110, and the number of analysis points is appropriately increased or decreased according to the uniformity of the minerals, The number of analysis points for uniform minerals is appropriately reduced, and the number of analysis poi...

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Abstract

The invention discloses a total-rock component testing method based on in-situ electronic probe analysis. The total-rock component testing method comprises the steps of jet-plating a manufactured rock X-ray plate or a thin X-ray plate with a carbon conductive film, putting a jet-plated sample into an electronic probe sample chamber for analysis, shooting a back scattering electronic image under the condition of a magnification factor of 450-550, performing precision quantitative analysis on different minerals in the image through an electronic probe wavelength dispersive spectrometer, and counting the area percentages of the different minerals in the shot back scattering image by adopting a grid method; calculating a result which is the content of a total-rock element of the rock sample by performing a weighing average operation on an element content average value of different analysis points of the same mineral and the area percentages of the minerals. The method disclosed by the invention has the advantages of no destroy to the sample, in-situ microbeam analysis, high analysis precision, easiness in sample preparation, zero pollution and the like, and has an extremely good application prospect in the analysis of aerolite, gem-jade and precious rare rock samples.

Description

technical field [0001] The invention belongs to the technical field of earth science and micro-beam analysis and testing, and in particular relates to an analysis and testing method for obtaining the whole-rock material components of rocks by using the in-situ micro-beam analysis and testing technology of an electron probe. The method is especially suitable for meteorites, precious jade Whole-rock analysis of boulders and precious and rare rock samples. Background technique [0002] At present, in the field of geosciences, X-ray fluorescence spectroscopy (XRF) is mainly used for the analysis of major elements in rocks, and the analysis of trace elements is performed by inductively coupled plasma mass spectrometry (ICP-MS). However, sample preparation by X-ray fluorescence spectrometry requires grinding rock samples into powders below 200 meshes, and then testing mechanically pressed cakes or high-temperature fused glass samples; and inductively coupled plasma mass spectromet...

Claims

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Application Information

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IPC IPC(8): G01N23/225
Inventor 陈宏毅谢兰芳缪秉魁王葆华
Owner GUILIN UNIVERSITY OF TECHNOLOGY
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