16 results about "Diffusion layer" patented technology

The invention provides a backlight module and a display device, and the backlight module comprises a frame structure which comprises a bottom plate and a side plate connected with the bottom plate; the light-emitting element is positioned on one side of the bottom plate; the diffusion layer is located on the side, away from the bottom plate, of the light-emitting element and comprises a first side face; the first reflection part is located on the first side face, and a gap is formed between the first reflection part and the opposite side plate in the direction parallel to the plane where the bottom plate is located. According to the backlight module, direct contact between the first reflection part and the side plate can be avoided, the situation that the first reflection part is extruded by the side plate due to preparation errors or external action is avoided, and the reliability of the first reflection part is guaranteed. Besides, the situation that light reflected by the edge, close to the side plate, of the first reflection part is directly emitted without passing through the quantum dot film located above the diffusion layer can be avoided, the phenomenon that due to the problems, edge light leakage occurs, for example, the phenomenon that the periphery of the visual effect is blued due to blue light leakage occurs is avoided, and the use performance of the backlight module is improved.

The present application relates to a kind of seismic wave impedance diffusion inversion method and device, its essence is a kind of from well site to surrounding diffusion layered structure and attribute inversion method.Core is to use well logging curve to carry out layering etc., then carry out well position inversion, simultaneously, to make the result obtained by well logging interpretation and actual seismic record difference minimum, need to be appropriately disturbed by the square wave type calibration layering curve obtained from well logging interpretation, generate hundreds of reflection coefficient curves, to generate synthetic seismic record, find the synthetic record with actual seismic record difference minimum, the horizon etc. corresponding to this best synthetic record is regarded as the best seed solution and diffuses to all around, during diffusion process, by adding time window or horizon to constrain vertical propagation interval, to obtain the inversion optimum value of entire data set, specific flow as shown in Figure 1.The present application improves the precision of thin layer boundary delineation, and has higher potential for thin layer resolution.

The invention relates to the technical field of analysis and testing of composite board materials, in particular to a method for evaluating diffusion of heterogeneous metal interface elements. The method specifically comprises the following steps that S1, a cross section sample of the composite board is prepared, S2, an interlayer interface of the composite board is determined, and S3, a component change curve from a base body to a bonding interface to another layer of base body is obtained. S5, segmenting the curve according to the content change of the interface element, taking the average value of the curve on each section of spectrum line which tends to be gentle, drawing a straight line, and taking the separation point of the straight line and the spectrum line as the measurement end point; S6, measuring the distance between the end points to obtain the diffusion layer width value L and the content variation sigma of the element at the interface of the multilayer composite board, and S7, calculating a diffusion index D = sigma / L. The diffusion capability of the heterogeneous metal interface elements is accurately evaluated, and a basis is provided for improvement of technologies such as composite plate rolling and subsequent heat treatment.

Provided is a gas sensor element or the like in which the diffusion mode of NOx that reaches a measurement electrode is changed from molecular diffusion to a mode of diffusing while repeatedly colliding with a wall face of a sufficiently narrow flow path. In a gas sensor element according to one aspect of the invention, a porous diffusion layer, which accounts for 70% or more of a cross-section of a flow path of a measurement target gas that is orthogonal to a flow direction of the measurement target gas, has a porosity of 5% or more and 25% or less, and is located at a position that is upstream of the measurement electrode and where the distance to the measurement electrode is 0.15 mm or less.

The present disclosure relates to a thin layer type electrochemical system including a salt bridge and an electrochemical analysis method using the same and, more particularly, to a thin layer type electrochemical system including a salt bridge and an electrochemical analysis method using the same, which implement the chamber part accommodating the analytical solution of the thin layer type electrochemical system including a salt bridge, such that it is thinner than the diffusion layer; use polyelectrolyte gel as a salt bridge to limit lateral diffusion of reactants; use a specific polyelectrolyte gel; and use a transparent working electrode, thereby measuring the peaks of several consecutive reactions in voltammetry with high resolution, enabling analysis of organic solvents, and allowing electrochemical and spectroscopic measurements to be performed simultaneously.

A wafer-level diffusion layer thickness measurement method converts limiting diffusion current into diffusion layer thickness, realizes evaluation of mass transfer performance of different types of electroplating tanks in the same dimension, overcomes the problem of great difference between electric field, flow field, concentration field and wafer-level electroplating copper process in the test electrolytic cell, is closer to the actual electroplating process, and can guide the understanding of TSV hole, bump, RDL and other electroplating copper processes.

The present invention relates to a gas sensor (100) comprising a measurement chamber (102) for measuring presence of a first gas, the first gas being nitrous oxide (N2O) and an optical source (103) for emitting radiation in the measurement chamber (102). The sensor also comprises a radiation detector (104) sensitive to radiation emitted by the optical source (103), the radiation being detected by the radiation detector (104) following passage through the measurement chamber (102). A diffusion layer (131) is configured to allow diffusion of ambient gas into and out from the measurement chamber (102), and the diffusion layer (131) comprises means (133) for preventing diffusion of carbon dioxide (CO2) in the ambient gas into the measurement chamber (102). The invention also relates a nitrous oxide detector comprising such a gas sensor, and a method for determining presence of nitrous oxide in the ambience.

The application provides an image processing system and method for natural gas pipeline leakage detection. Firstly, the natural gas pipeline infrared image is collected, and the pipeline boundary feature is extracted according to the natural gas pipeline image. The natural gas pipeline infrared image is subjected to layer feature extraction according to the pipeline boundary feature, and the natural gas leakage diffusion layer of the natural gas pipeline infrared image is obtained. The heat friction diffusion vector set is obtained by extracting the heat friction diffusion vector according to the natural gas leakage diffusion layer, and the pipeline leakage point image is generated through the heat friction diffusion vector set. The diffusion characteristic quantity corresponding to each pipeline leakage point in the pipeline leakage point image is extracted, the pipeline leakage area image is generated through the natural gas pipeline flow pressure and the diffusion characteristic quantity corresponding to each pipeline leakage point, and the friction heat effect between the high-pressure natural gas and the natural gas pipeline leakage port can be analyzed according to the heat friction diffusion vector, so that the visual pipeline leakage area image is generated.

The present invention relates to the technical field of thermoelectric components, and specifically discloses a skutterudite thermoelectric component and its preparation method and application. The present invention develops two different types of anti-diffusion layer alloy compositions for N-type and P-type thermoelectric materials in thermoelectric components, respectively, so that their linear expansion coefficients match those of N-type and P-type thermoelectric materials, respectively, to reduce the thermal stress of the interface, thereby improving the reliability and service life of the thermoelectric device. Among them, the anti-diffusion layer composition for N-type thermoelectric material is Fe a Cr b V c , the composition of the anti-diffusion layer for P-type thermoelectric materials is Fe a’ Cr b’ Si c’ ; Wherein, a, b, c, a', b', c' represent the mass percentage of each component, a+b+c=100, a'+b'+c'=100; 70≤a≤90, 10≤b≤20, 0<c≤10; 70≤a'≤90, 10≤b'≤20, 0<c'≤10; a and a', b and b', c and c' may be the same or different.

The invention discloses a TEM image-based film thickness automatic measurement method and measurement system, and a medium. The method comprises the following steps of image preprocessing, contour recognition execution and rotation correction; carrying out region selection to obtain a cut rectangular image; performing signal analysis, extracting an average gray scale curve in the growth direction of the film layers, and judging upper and lower boundaries of each film layer and a diffusion interface between the film layers based on gray scale distribution characteristics and threshold segmentation; thickness calculation: calculating and outputting the thickness of each film layer and the diffusion layer according to the determined boundary position; and visualizing and generating a film thickness distribution broken line graph and a film thickness marking image. According to the invention, based on the MRC format image output by the cross section of the thin film shot by using the transmission electron microscope, the interactive software with an interface is used for self-adaptively and horizontally correcting the image, and the thickness of each layer of film and the thickness of the diffusion layer between the film layers are automatically calculated and output, so that the repetitive operation of repeatedly recording coordinates and carrying out difference value operation in the traditional measurement process is avoided; the condition that the threshold value selection of each period is deviated during manual measurement is avoided, the measurement time of the thickness of the multilayer film is remarkably shortened, and the automation degree of measurement and the consistency and repeatability of measurement results are improved.

This optical stack has a first main surface and a second main surface that is on the opposite side from the first main surface, wherein: the optical stack includes an optical filter layer that transmits infrared rays and reflects visible light, and a diffusion layer that diffuses visible light; the reflectivity with respect to infrared rays having a wavelength of 850 nm is 66%; and when the second main surface is disposed on a pattern that is readable using infrared rays, the pattern being formed on a foundation having a backscatter rate of 19%, the pattern can be read using infrared rays from the first-main-surface side.

The invention discloses a gradient diffusion thin film DGT device calibration and environmental adaptability verification method and device. The device comprises an experimental water tank, a closed-loop flow path, a DGT placement module and a flow velocity adjusting system. The closed-loop flow path is composed of a pump and a pipeline; the DGT placing module comprises six three-way pipe fittings connected in series, and a threaded knob is arranged at a middle interface of each three-way pipe fitting to fix a DGT device; the DGT device is composed of a base, an adsorption layer, a diffusion layer, a filter membrane and a cover from bottom to top, the base adheres to the top of a threaded rotary knob, and a middle connector of a three-way pipe fitting is fixed by tightening the rotary knob; the flow speed adjusting system is composed of a flow adjusting valve, a main adjusting valve, a flow meter and a rectification grid. Adding a calibration target pollutant solution to be measured based on the device, starting a pump system, adjusting the flow rate, and reading and measuring monitoring data; the purposes of standardization, high contact efficiency, low detection limit and space saving of the device calibration and environment adaptability verification method are achieved.

The application relates to the cross field of nanofluid mechanics and interface chemistry, and specifically discloses a kind of nanobubble stability dynamic analysis and life prediction method, establishes double hyperbolic pressure balance equation considering inter-ring electrostatic repulsion, constructs concentric ring dense packing ion distribution model, deduces the series expression of surface hydroxyl ion dynamic adsorption;Propose the diffusion layer Prandtl number correction method based on Brown motion correction, realize the accurate calculation of dynamic mass transfer parameter;Establish the multi-dimensional coupled nanobubble radius change rate equation, establish the critical stable radius criterion and the closed solution of life prediction. The application breaks through the plane hypothesis limitation of traditional Young-Laplace equation, solves the technical problem of large deviation of existing nanobubble model theoretical prediction through multi-physical field coupling modeling and experimental parameter joint debugging.

The present invention discloses a method and system for optimizing alloy bonding process parameters, which relates to the field of data processing technology, including presetting a target microstructure state and constructing an evaluation index system; obtaining actual microstructure data of the bonding interface during the alloy bonding process, and marking key evolution features to determine the diffusion layer thickness and grain size distribution; establishing a relationship model between process parameters and microstructure by comparing the actual microstructure data with the target microstructure state, and completing a first prediction; analyzing the dynamic characteristics of the diffusion layer through the results of the first prediction, and completing a second prediction in combination with the thermal-diffusion threshold; and deriving an optimal process parameter combination through the results of the second prediction to achieve the target microstructure state. The present invention effectively solves problems such as target ambiguity and insufficient model accuracy, significantly improves bonding quality and stability, reduces scrap rate and cost, and provides an innovative solution for high-performance material processing.

The invention relates to the crossing field of nanofluid mechanics and interface chemistry, and particularly discloses a nanobubble stability dynamic analysis and life prediction method, which comprises the following steps: establishing a hyperbolic pressure balance equation considering inter-ring electrostatic repulsion, constructing a concentric ring close packing ion distribution model, and deducing a series expression of surface hydroxyl ion dynamic adsorption; a diffusion layer Prandtt number correction method based on Brownian motion correction is provided, and accurate calculation of dynamic mass transfer parameters is achieved; and establishing a multi-dimensional coupled nanobubble radius change rate equation, and establishing a critical stable radius criterion and life prediction closed solution. According to the method, the plane hypothesis limitation of a traditional Young-Laplace equation is broken through, and the technical problem that the theoretical prediction deviation of an existing nano bubble model is large is solved through multi-physics field coupling modeling and experimental parameter joint debugging.