The invention discloses a phase deflection measurement method and device based on four-step phase shift, and belongs to the technical field of
computer vision and precision measurement, and the method comprises the steps: S1, classifying patterns needing to be projected according to types, and fusing the patterns into a
color image; s2, sequentially projecting color images, and simultaneously collecting a pattern modulated and reflected by an object to be measured to obtain a reflection pattern; s3, carrying out channel separation
processing on the reflection pattern, recovering the reflection pattern into an original grey-
scale map, and respectively obtaining all phase patterns and
Gray code patterns in the horizontal direction and the vertical direction; s4, performing phase calculation and
Gray code auxiliary positioning according to the phase pattern and the
Gray code pattern to obtain an
absolute phase; and S5, mapping the
absolute phase into a depth value, and recovering the three-dimensional shape of the surface of the object to be measured in combination with calibration parameters of a camera-
projection system. The time of each measurement period is shortened, the
system delay in the projection and acquisition process is reduced, and the real-
time response capability of the whole set of detection
system is improved.