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67 results about "Doppler broadening" patented technology

In atomic physics, Doppler broadening is the broadening of spectral lines due to the Doppler effect caused by a distribution of velocities of atoms or molecules. Different velocities of the emitting particles result in different Doppler shifts, the cumulative effect of which is the line broadening. This resulting line profile is known as a Doppler profile. A particular case is the thermal Doppler broadening due to the thermal motion of the particles. Then, the broadening depends only on the frequency of the spectral line, the mass of the emitting particles, and their temperature, and therefore can be used for inferring the temperature of an emitting body.

Fusion reactor plasma density and temperature diagnosing method based on Thomson scattering weak coherent technique

InactiveCN104185353AReduced Power RequirementsReduction of background stray light requirementsPlasma techniqueRayleigh scatteringPlasma electron
The invention discloses a fusion reactor plasma density and temperature diagnosing method based on the Thomson scattering weak coherent technique. The method comprises the steps that a broadband low-coherency intense light source is set, a bandwidth modulator is set, a beam splitting system is set, a reference arm is used for generating an optical path difference and a frequency shift signal, the light returned from the reference arm and a detection arm interferes and passes through an optical grating to be divided into interference spectrum signals with different wavelengths to be received by an array CCD, the incident light direction, namely the axial scattering intensity distribution is obtained through the Fourier transform, and the plasma electron density axial distribution information is obtained through rayleigh scattering or raman scattering absolute calibration; the thermal motion rate information of electrons is obtained through the Doppler broadening of a spectral line, and then the plasma electron temperature distribution is obtained; the horizontal movement adjustment is carried out on the length of the reference arm to change the optical path difference changing so as to achieve measurement on the great depth plasma with the depth larger than 1 m. The electron temperature and density of the fusion reactor plasma are measured online through the Thomson back scattering optical coherent chromatographic technique.
Owner:中国人民解放军陆军军官学院

Moving target detection method and imaging method for near space slow platform SAR (Synthetic Aperture Radar)

ActiveCN103278820ASolve the problem of difficult separation of dynamic and static clutterSolve the difficult problem of moving target echo distance migration correctionRadio wave reradiation/reflectionSynthetic aperture sonarEstimation methods
The invention discloses a moving target detection method and an imaging method for a near space slow platform SAR (Synthetic Aperture Radar). In the detection method disclosed by the invention, the characteristics of low platform speed and smaller ground static clutter Doppler broadening of the near space slow platform SAR are utilized, and separation of a moving target from static clutter is realized by designing a Doppler filter in a Doppler domain, so that the problem of difficulty in separating dynamic and static clutters of the SAR in moving target imaging is solved. According to the imaging method disclosed by the invention, moving target echo is extracted after separation of dynamic and static clutters and moving target detection, one-order keystone conversion is combined with a variable-resolution Doppler frequency modulation estimation method, and range walk correction is completed under the condition that the speed of the moving target is unknown, so that the problem of difficulty in range walk correction of the moving target echo is solved. The methods have the advantages that rapid moving targes can be detected and imaged; and the methods are suitable for detecting and imaging slow moving targets.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Device and method for measuring gas temperature and concentration simultaneously through single spectral line

The invention discloses a device for measuring gas temperature and concentration simultaneously through a single spectral line, and also discloses a method for measuring gas temperature and concentration simultaneously through the single spectral line. The method comprises the steps: firstly employing a peak normalization second harmonic signal line style which is only determined by temperature, and extracting the temperature of gas; extracting the concentration information through employing the directly proportional relation of the amplitude of the first-harmonic normalization second harmonic signal with concentration (background is removed), and obtaining the temperature and concentration of gas at the same time. The method can measure the temperature and concentration of gas at the same time, reduces the number of needed spectral lines, is high in sensitivity, is high in precision, and is quick in response. Compared with a conventional Doppler broadening temperature measurement method, the method can be used under the conditions of normal temperature and pressure. In addition, the method, compared with a conventional double-line temperature measurement method, does not need to consider the problems of frequency crosstalk and time resolution.
Owner:SOUTHEAST UNIV

Thin-cell Doppler-broadening-free absorption spectrum frequency regulator

InactiveCN102664346ASolve the problem that the improvement of laser frequency stability is limitedLaser detailsSemiconductor lasersDoppler broadeningTrapping
The invention relates to a laser frequency regulation technology and particularly discloses a thin-cell Doppler-broadening-free absorption spectrum frequency regulator. With the adoption of the thin-cell Doppler-broadening-free absorption spectrum frequency regulator provided by the invention, the problem that the conventional laser frequency regulation technology is influenced by Doppler broadening so that the improvement of the laser frequency stability is limited, can be solved. The thin-cell Doppler-broadening-free absorption spectrum frequency regulator comprises a semiconductor laser device, a polarization beam splitter prism, a light absorption sheet, a photoelectric detector, a white glass sheet, a phase-locked amplifier, a single-photon detector and an oscilloscope; a light path formed by connecting a laser isolator and a half-wave plate in series and in sequence is arranged between an emergent end of the semiconductor laser device and an incidence end of the polarization beam splitter prism; and a second total reflector is arranged between a reflection emergent end of the polarization beam splitter prism and an incidence end of the white glass sheet. The thin-cell Doppler-broadening-free absorption spectrum frequency regulator provided by the invention is applicable to fields such as researches of high-resolution molecule and atomic spectrum, laser interference measurement, atom cooling and trapping, optical fiber communication, frequency selection, optical data storage and the like.
Owner:SHANXI UNIV

Plasma velocity measurement method and system

The invention discloses a plasma velocity measurement method and system. The method comprises the following steps: calibrating a frequency stating point of a macroscopic velocity of a flow field plasma to be measured; obtaining a curve of fluorescence signal intensity changing along with a laser frequency by performing measurement on the flow field plasma to be measured based on laser induced flourescense; and according to a measurement result, obtaining a Doppler broadening effect component through separation, and obtaining actual velocity distribution of the flow field plasma to be measured through conversion by taking the frequency starting point as a reference. According to the invention, plasma velocity measurement is carried out based on the laser induced flourescense, an ion motion velocity is measured through measuring a Doppler effect excited when ions are stimulated in a flow field to be measured, the noncontact type measurement technology is brand new, disturbance to the flow field to be measured does not exist, influences of electromagnetic interference widely existing in an electric thruster are eliminated, and the apparatus and system have the advantages of high precision, high interference immunity and wide applicability, thereby being widely promoted and applied.
Owner:NAT UNIV OF DEFENSE TECH

High-speed missile-borne radar waveform designing method

ActiveCN106940442AReduce the area of ​​ground and sea clutterImproved Radial Distance ResolutionRadio wave reradiation/reflectionDoppler broadeningMain lobe
The invention presents a high-speed missile-borne radar waveform designing method. One embodiment of the method comprises: limiting the synthetic bandwidth and determining its value by the distance resolution and the signal-to-noise threshold; giving the number of intra-frame pulses; determining the frequency step amount; determining the lower limit of the pulse repetition frequency and the upper limit of the pulse width; setting the initial value for the pulse width according to the limitation of the value range of the pulse repetition frequency; determining the value range and the value of the pulse repetition frequency; if the value range is an empty set, indicating that the initial value of the preset pulse width is unreasonable and re-setting an initial value for the pulse width; and determining the number of pulse accumulation points; determining the ultimately appropriate distance range by the non-fuzzy distance and blind distance. This embodiment, with the technologies of millimeter waves, large bandwidth, step frequency and duplex frequency, solves the problem that that a target passes off and deviates from a distance unit caused by the reduced signal-to-noise ratio, the main lobe clutter Doppler broadening and the high speed movement between the bombs, therefore, achieving the purpose of precision strikes.
Owner:NORTHWEST UNIV

Vacuum degree detection method and system based on infrared laser spectrum

The invention discloses a vacuum degree detection method and system based on an infrared laser spectrum. By use of the high-resolution absorption line broadening characteristic of adsorption steam released by the headspace of a sealing container, through double-optical-path detection, by use of synchronization interference fringe signals, the time domain of a detection spectrum is converted to a frequency domain, the absolute value of spectral line broadening is obtained, and absolute measurement of a gas pressure intensity is realized; light intensity information is obtained by use of a background fitting algorithm, and the influence of the change of the transmittance of the container on detection is eliminated through normalization processing; rapid fitting is performed on a steam absorption line by use of a composite linear model, and Doppler-broadening and pressure broadening of the spectral line broadening are separated from each other; and through synchronous measurement of steam pressure dividing, the precision of vacuum air pressure measurement is improved. The method and system provided by the invention can be applied to vacuum degree detection of a vacuum sealing container in foodstuff and medical industries and realize rapid leak detection.
Owner:黄山市开发投资集团有限公司

Simplified digital corresponding Doppler broadening spectrum machine

A simplified digital corresponding Doppler broadening spectrum machine is used for setting a digital Doppler broadening spectrum analysis drawing system in a computer. A high-pressure power source outputs high pressure of a high-purity germanium photoelectric detector. The high-purity germanium photoelectric detector receives positron annihilation radiation gamma photons and is used for converting optical energy into electric energy, outputting pulses which are in direct proportion to gamma light energy and then outputting the pulses to a digital acquisition card. The digital collection card is used for sampling the pulses, converting the pulses into digital signals and inputting the digital signals to the computer. After the pulses are analyzed and processed through a digital corresponding Doppler broadening spectrum analysis drawing system, corresponding Doppler broadening spectrum is drawn. The simplified digital corresponding Doppler broadening spectrum machine is little in parts, convenient to transport and very easy to assemble and use. Compared with a traditional corresponding Doppler broadening spectrum, the simplified digital Doppler corresponding broadening spectrum machine has better energy resolution and a counting rate and has lower total price, and therefore the simplified digital corresponding Doppler broadening spectrum machine has higher cost performance.
Owner:TAIYUAN UNIV OF TECH

Multidimensional positron annihilation lifetime spectrum and doppler broadening spectrum measurement systems

The invention discloses a multidimensional positron annihilation lifetime spectrum and doppler broadening spectrum measurement systems. Each of the multidimensional positron annihilation lifetime spectrum measurement system and the doppler broadening spectrum measurement system comprises an anticoincidence system and a three-dimensional moving system. Each anticoincidence system comprises a positron detector, a first preamplifier, a first spectrum amplifier, a first single-channel analyzer and a coincidence device, which are sequentially connected; each positron detector consists of a flicker flake and a photomultiplier tube, which are coupled through silicone oil, and a radioactive source is an isotope radioactive source, and is directly dropped on the flicker flake; the three-dimensional moving systems are used for loading a sample and moving the sample in a three-dimensional direction. According to the system, annihilation information not belonging to the sample is eliminated by adopting the anticoincidence systems, so that the detection reliability and the detection accuracy can be improved; the distances and the directions between the sample and the positron detectors are regulated by adopting three-dimensional moving platforms, so that multidimensional, accurate and nondestructive defect detection of a single irregular sample can be realized.
Owner:WUHAN UNIV

Nondestructive test method for microhardness of metal surface layer subjected to laser shock processing

The invention relates to a nondestructive test method for microhardness of a metal surface layer subjected to laser shock processing. The method comprises aiming at a metal pipe subjected to laser shock processing, firstly measuring the parameter value S of a Doppler broadening spectrum of the surface of the metal piece, then using a hardness instrument to measure the microhardness of the corresponding position, and finally performing linear fitting on the measured hardness value and the parameter value S by employing least squares, so as to obtain the linear relation curve of the measured hardness value and the parameter value S. According to the method, for the metal piece which is subjected to laser shock processing and needs hardness measurement, the parameter value S of the surface Doppler broadening spectrum of a to-be measured position of the metal piece is firstly measured, and then the microhardness of the position can be estimated according to the relation curve of the parameter value and the hardness value. The method realizes nondestructive test of the microhardness of the metal surface layer subjected to laser shock processing, the disadvantage that the metal surface layer possesses impressions because of hardness instrument measurement is effectively avoided, and the metal surface integrity is guaranteed.
Owner:JIANGSU UNIV

All-digital two-dimensional coincident Doppler broadening system

The invention relates to the nuclear electronics technology, in particular to an all-digital two-dimensional coincident Doppler broadening system, comprising a first detector, a second detector , a host computer, a first acquisition channel, a second acquisition channel, an FPGA digital processing platform and a gigabit Ethernet port. The first acquisition channel and the second acquisition channel have the same structures. The first detector and the second detector are connected with the first acquisition channel and the second acquisition channel respectively. The FPGA digital processing platform is respectively connected with the first and second acquisition channels and the gigabit Ethernet port; and the gigabit Ethernet port is connected to the host computer. According to the system, the system design is simplified by using the dual-channel all-digital acquisition circuit; and the pulse extraction, time calibration, and time coincident analysis are realized in the FPGA. The ADC is used directly to carry out pulse sampling and then pulse shaping, baseline recovery, stack identification, amplitude extraction, and time calibration are performed by entering the FPGA digital processing platform, so that the peak-to-background ratio of the Doppler broadening spectrum is increased by 2 to 3 magnitude order.
Owner:WUHAN UNIV

Method for detecting arrangement of ordered nano-tubular pores of porous film

The invention discloses a method for detecting the arrangement of ordered nano-tubular pores of a porous film. The method comprises measuring a sample-beam current geometric Doppler broadening spectrum of a nanoporous film to be tested based on the Doppler broadening spectrum of a slow positron beam through rotating the nanoporous film to be tested around a beam axis by 90 degrees, acquiring Doppler broadening spectrums of the nanoporous film before and after rotation, respectively calculating linear S parameters or linear W parameters of the Doppler broadening spectrums acquired by the two processes and determining the order of the nanoporous film according to the change of the linear S parameters and linear W parameters acquired by the two processes. The method can detect surface information of the detected material and accurately detect the pore structure information of the film and the change of defects along with depth distribution. The substrate does not affect the detection of the porosity of the film, thereby eliminating the need for the film to be removed from the substrate. The method does not damage the nanopore structure of the film and guarantees the accuracy of the measurement results and the reusability of the sample.
Owner:FOSHAN UNIVERSITY
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