The application provides a source device-based
positron annihilation lifetime measurement
system and method, which comprises a source chamber, a start gamma
detector, a stop gamma
detector and a
positron detector. 22 The Na
radioactive source is fixed on the surface of the source chamber, the source chamber and the
positron detector are placed on the two sides of the thin film sample and are symmetrically opposite, and the positions are relatively fixed; the start gamma detector and the stop gamma detector are placed on the two sides of the positron detector and are responsible for detecting the 1.28 MeV gamma photons generated by the
cascade when the positron is emitted by the
radioactive source and the 0.511 MeV gamma photons generated after the
positron annihilation. The application can effectively remove the
noise positrons by improving the positron range on the non-sample side, reducing the detection efficiency of the far-end
annihilation gamma photons, and reducing the size of the
electronics; the
positron annihilation position on the sample side can be accurately identified, the non-sample
positron annihilation components can be excluded, the sample thickness limitation can be broken, and the thin film sample positron
annihilation lifetime measurement can be realized.