4results about "Gamma-ray/x-ray microscopes" patented technology

The invention relates to an imaging method and an imaging system for carrying out this method. The object of the invention is to provide an improved multispectral ptychographic imaging method and a corresponding system. To this end, the imaging method of the invention comprises the following process steps: generation of at least partially coherent electromagnetic radiation (3) containing spectral components at at least two different wavelengths; spatial separation of the spectral components of the electromagnetic radiation, in particular by angular dispersion; generation of structured illumination beams (9) by selecting one of the spectral components at a time using a structured aperture (8a, 8b, 8c); and movement of an object (6) in a direction transverse to the path of the illumination beams (9) into a plurality of positions.Detecting an intensity pattern for each of the positions, wherein the intensity patterns are generated by scattering and / or diffraction of the illumination rays (9) at the object (6) in a detection plane; and reconstructing an image of the object (6) from the detected intensity patterns, wherein an image of the object (6) is calculated for each of the at least two wavelengths using a ptychographic reconstruction algorithm.

An X-ray microscopy system and method for phase contrast and dark-field imaging are provided, utilizing a partially coherent X-ray beam generated by a micro-focused X-ray source with a small focal spot size. A spatial beam modulator such as a random phase object, e.g., silicon carbide sandpaper, is placed between the source and the sample to create a random granular speckle pattern. The system employs a high-resolution detection setup with a thin scintillator and a spatially resolved detector with small pixel size to capture shifts in the speckle pattern caused by the sample's refraction effects. By analyzing these shifts, the system computes phase gradients and integrates them to produce detailed phase images, enhancing contrast in low-atomic-number materials like soft tissues and polymers. The compact design reduces source-to-detector distance, improving flux efficiency and system throughput while enabling high-resolution, three-dimensional tomographic imaging.

The disclosure relates to an imaging method and an imaging system for carrying out this method. The disclosure provides an improved multispectral ptychographic imaging method and a corresponding system. For this, the imaging method of the disclosure comprises the following steps: Generation of at least partially coherent electromagnetic radiation (3) which contains spectral components at at least two different wavelengths; spatial separation of the spectral components of the electromagnetic radiation, for example by angular dispersion; generation of structured illumination beams (9) by selecting respectively one of the spectral components by means of a structured aperture (8a, 8b, 8c); moving an object (6) in a direction transverse to the path of the illumination beams (9) into a plurality of positions; detecting an intensity pattern for each of the positions, wherein the intensity patterns are generated by scattering and / or diffraction of the illumination beams (9) at the object (6) in a detection plane; and reconstructing an image of the object (6) from the detected intensity patterns, wherein for each of the at least two wavelengths an image of the object (6) is calculated by means of a ptychographic reconstruction algorithm.

An X-ray optic (1) for focusing X-ray radiation (300) into a focal plane (100), comprising at least the following components: - a diffractive X-ray lens (2) and - a diffraction order filter aperture (3), OSA, wherein the diffractive X-ray lens (2) and the diffraction order filter aperture (3) are arranged along an optical axis (200) of the X-ray optics (1), characterized in that the X-ray optics (1) has a holding device (12) extending along the optical axis (200) and a first shielding device (11) extending along the optical axis (200), wherein the holding device (12) is connected to the diffractive X-ray lens (2), wherein the first shielding device (11) is designed as a first shielding device (11) enclosing the optical axis (200), and is connected to the diffraction order filter aperture (3) and delimits a first volume (V1) in which both the holding device (12) and the diffractive X-ray lens (2) are fully shielded, so that electrons generated by X-rays (300) in the first volume (V1) (e -) are shielded by the first shielding device (11).