1080 results about "Space charge" patented technology

Methods and apparatus are described for space charge dosimeters for extremely low power measurements of radiation in shipping containers. A method includes insitu polling a suite of passive integrating ionizing radiation sensors including reading-out dosimetric data from a first passive integrating ionizing radiation sensor and a second passive integrating ionizing radiation sensor, where the first passive integrating ionizing radiation sensor and the second passive integrating ionizing radiation sensor remain situated where the dosimetric data was integrated while reading-out. Another method includes arranging a plurality of ionizing radiation sensors in a spatially dispersed array; determining a relative position of each of the plurality of ionizing radiation sensors to define a volume of interest; collecting ionizing radiation data from at least a subset of the plurality of ionizing radiation sensors; and triggering an alarm condition when a dose level of an ionizing radiation source is calculated to exceed a threshold.

A chemical processing system and a method of using the chemical processing system to treat a substrate with a mono-energetic space-charge neutralized neutral beam-activated chemical process is described. The chemical processing system comprises a first plasma chamber for forming a first plasma at a first plasma potential, and a second plasma chamber for forming a second plasma at a second plasma potential greater than the first plasma potential, wherein the second plasma is formed using electron flux from the first plasma. Further, the chemical processing system comprises a substrate holder configured to position a substrate in the second plasma chamber.

An N-channel device (40, 60) is described having a lightly doped substrate (42, 42′) in which adjacent or spaced-apart P (46, 46′) and N (44) wells are provided. A lateral isolation wall (76) surrounds at least a portion of the substrate (42, 42′) and is spaced apart from the wells (46, 46′, 44). A first gate (G1) (56) overlies the P (46) well or the substrate (42′) between the wells (46′, 44) or partly both. A second gate (G2) (66), spaced apart from G1 (56), overlies the N-well (44). A body contact (74) to the substrate (42, 42′) is spaced apart from the isolation wall (76) by a first distance (745) within the space charge region of the substrate (42, 42′) to isolation wall (76) PN junction. When the body contact (74) is connected to G2 (66), a predetermined static bias Vg2 is provided to G2 (66) depending upon the isolation wall bias (Vbias) and the first distance (745). The resulting device (40, 60) operates at higher voltage with lower Rdson and less HCI.

A refrigerator door is provided. The refrigerator door has an outer case forming a shape of the refrigerator door, an inner case provided within the outer case to configure a backside of the refrigerator door wherein a space between the inner case and the outer case is charged with a foaming liquid, an ice making unit provided to one side of the inner case to make ice, a fixing unit provided to the space charged with the foaming liquid between the inner case and the outer case and fixing the ice making unit to the refrigerator door, and a dispenser provided to one side of the outer case to discharge the ice supplied by the ice making unit.

An electrostatic discharge (ESD) protection clamp (61) for I/O terminals (22, 23) of integrated circuits (ICs) (24) comprises an NPN bipolar transistor (25) coupled to an integrated Zener diode (30). Variations in the break-down current-voltage characteristics (311, 312, 313, 314) of multiple prior art ESD clamps (31) in different parts of the same IC chip is avoided by forming the anode (301) of the Zener (30) in the shape of a base-coupled P+ annular ring (75) surrounded by a spaced-apart N+ annular collector ring (70) for the cathode (302) of the Zener (30). Even though an angled implant (51, 86, 98) used to form the N+ annular collector ring (70) causes location dependent variations in the width (53) of the Zener space charge (ZSC) region (69), the improved annular shaped clamp (61) always has a portion that initiates break-down at the design voltage so that variations in the width (53) of the ZSC region (69) do not cause significant variations in the clamp's current-voltage characteristics (611, 612, 613, 614).

Electrodynamic on funnels confine, guide, or focus ions in gases using the Dehmelt potential of oscillatory electric field. New funnel designs operating at or close to atmospheric gas pressure are described. Effective on focusing at such pressures is enabled by fields of extreme amplitude and frequency, allowed in microscopic gaps that have much higher electrical breakdown thresholds in any gas than the macroscopic gaps of present funnels. The new microscopic-gap funnels are useful for interfacing atmospheric-pressure ionization sources to mass spectrometry (MS) and on mobility separation (IMS) stages including differential IMS or FAIMS, as well as IMS and MS stages in various configurations. In particular, “wedge” funnels comprising two planar surfaces positioned at an angle and wedge funnel traps derived therefrom can compress on beams in one dimension, producing narrow belt-shaped beams and laterally elongated cuboid packets. This beam profile reduces the ion density and thus space-charge effects, mitigating the adverse impact thereof on the resolving power, measurement accuracy, and dynamic range of MS and IMS analyzers, while a greater overlap with coplanar light or particle beams can benefit spectroscopic methods.

In a method for inhibiting space charge-related effects in an ion source, an electron beam is directed into a chamber to produce ions from sample material in the chamber. A voltage pulse is applied to the chamber to perturb an electron space charge present in the chamber. The ion source may be an electron impact ionization (EI) apparatus. The ion source may operated in conjunction with a mass spectrometry system.

The invention provides a device, a system and a method for measuring space charges by using an electro-acoustic (PEA) method. The device comprises a first electrode, a second electrode, a first thermostatic source, a second thermostatic source, a high-voltage direct current power supply, a pulse generator and a piezoelectric transducer, wherein the first electrode is used for contacting with one surface of the tested insulation material sample; the second electrode is used for contacting with the other surface of the tested insulation material sample; the first thermostatic source is used forconducting the temperature to the first electrode; the second thermostatic source is used for conducting the temperature to the second electrode; the high-voltage direct current power supply is used for transmitting the high-voltage direct current to the first electrode; the pulse generator is used for transmitting a high-voltage pulse signal to the first electrode; the piezoelectric transducer is used for detecting the acoustic signal of the tested insulation material sample, generated by the functions of the temperature gradient field, the high-voltage electric field and the high-voltage electric pulse, and is used for converting the acoustic signal into an electrical signal to output. The invention is used for measuring the distribution of the space charges in the high-voltage direct current power equipment insulation in the temperature gradient field.

A method and apparatus for multiplexing ions in an MSn mass spectrometer is provided. Ion are filtered to produce a group of ions of interest, the group of ions below a space charge limit of the MSn mass spectrometer. At least a portion of the group of ions are fragmented to form a fragmented group of ions. At least a portion of the fragmented group are stored such that a plurality of portions of the fragmented group can be sequentially selected for mass spectrometry analysis. Each of the plurality of portions of the fragmented group are sequentially selected and re-fragmented prior to mass spectrometry analysis. Each of the plurality of portions of the fragmented group are analyzed, via mass spectrometry, once each of the plurality of portions of the fragmented group has been fragmented.

Ion mobility spectrometer. The spectrometer includes an enclosure for receiving a sample therewithin and an electron beam window admits an electron beam into the enclosure to ionize the sample in an ionization region. A shutter grid is spaced apart from the ionization region and means are provided for sample ion preconcentration upstream of the shutter grid. The ion preconcentration is effective to reduce space charge resulting in a lowered threshold detection level.

A device for detecting the angle of incidence of radiation on a radiation incidence surface (14) comprises at last two first pairs (36) of photodiodes comprising first photodiodes (30) arranged along a first axis (12) and connected in series in a pair-wise manner. Each of the first photodiodes (30) comprises a space-charge zone (32) having a space-charge zone face (34) oriented towards the radiation incidence face (14). Further, the device is provided with a a shading mask (46) arranged at a distance (44) above the space-charge zone faces (34) of the first photodiodes (30) and comprising radiation-transmitting areas (48). Each radiation-transmitting area (48) is assigned to the space-charge zone faces (34) of the two first photodiodes (30) of a first pair (36) of photodiodes. When viewed in the direction of the normal of the radiation incidence face (14), the degree of overlapping between a radiation-transmitting area (48) and its assigned space-charge zone faces (34) in the direction of the first axis (12) is different for at least two of the first pairs (36) of photodiodes. The device also comprises an evaluation unit (56) for monitoring the photocurrent and/or the photovoltage of each first photodiode (30) of each first pair (36) of photodiodes and for detecting, on the basis of a comparison of the photocurrents and/or the photovoltages, the angle of incidence under which the component of the radiation which in the projection is directed parallel to the first axis (12) impinges on the radiation incidence face (14).

The invention belongs to the technical field of high voltage and insulation, and in particular relates to a PEA space charge test device capable of testing conductive current; the test device consists of a top electrode, a bottom electrode, a space charge collection channel, a current signal collection channel, and a pulse input channel; the top electrode is casted by epoxy resin to fix the metal shell of the top electrode and the central electrode of the top electrode to form an integral and movable top electrode; the bottom electrode is a tri-electrode structure composed of a bottom electrode external ring, a bottom electrode internal ring and a bottom electrode central column in a coaxial way; the bottom electrode external ring, the bottom electrode internal ring and the bottom electrode central column respectively realize the functions of inputting pulse, collecting conductive current signal and collecting space charge PEA signal; DC voltage and high voltage narrow pulse are respectively introduced in from two sides of a sample to avoid coupling with the DC high voltage and pulse, thus eliminating influence of surface current of the sample, solving the problem that pulsed electro-acoustic method (PEA) can not test conductive current, realizing synchronous test of sample conductive current and space charge, and being especially suitable for field of electronic engineering insulation material.

An optoelectronic device comprising a mesa structure including:

• • a first and a second semiconductor portions forming a p-n junction,
  • a first electrode electrically connected to the first portion which is arranged between the second portion and the first electrode,
  • the device further comprising:
  • a second electrode electrically connected to the second portion,
  • an element able to ionize dopants of the first and/or second semiconductor portion through generating an electric field in the first and/or second semiconductor portion and overlaying at least one part of the side flanks of at least one part of the first and/or second semiconductor portion and of at least one part of a space charge zone formed by the first and second semiconductor portions,
  • upper faces of the first electrode and of the second electrode form a substantially planar continuous surface.

The invention relates to a method for measuring and judging insulation aging based on PEA space charges. The method includes the steps that a pulsed electro-acoustic space charge measurement system is built, a space charge test is conducted on an insulating layer of a power cable, statistics is conducted on the absolute charge quantity of the space charges, the currently measured quantity and a threshold value are compared with historical data, and insulation is evaluated by utilizing the total quantity and the charge increased speed to analyze parameters; according to an externally applied high voltage power supply electric field and an insulation internal space charge distribution curve, an electric field intensity method is utilized to analyze insulation of the power cable, when calculated field intensity is higher than a design value, the insulation can be damaged, and the aging degree of insulation can be judged according to the increased speed of the electric field intensity. According to the method, the insulation internal space charges of the power cable are online monitored, and insulation aging of the power cable is evaluated according to data.

A method of setting a fill time for a mass spectrometer including a linear ion is provided. The mass spectrometer is operated first in a transmission mode and ions are supplied to the mass spectrometer. Ions are detected as they pass through at least part of the mass spectrometer in a preset time period, to determine the ion current. From a desired maximum charge density for the ion trap and the ion current, a fill time for the ion trap is determined. The mass spectrometer is operated in a trapping mode to trap ions in the ion trap, and the ion trap is filled for the fill time, as just determined. This utilizes the ion trap to its maximum, while avoiding problems due to overfilling the trap, causing space charge effects.

An electron beam emitted from an electron gun (G) forms a reduced image on a sample (S) through a non-dispersion Wien-filter (5-1), an electromagnetic deflector (11-1), a beam separator (12-1), and a tablet lens (17-1) as an objective lens. The beam separator (12-1) is configured such that a distance by which a secondary electron beam passes through the beam separator is approximately three times longer than a distance by which a primary electron beam passes through the beam separator. Therefore, even if a magnetic field in the beam separator is set to deflect the primary electron beam by a small angle equal to or less than approximately 10 degrees, the secondary electron beam can be deflected by approximately 30 degrees, so that the primary and secondary electron beams are sufficiently separated. Also, since the primary electron beam is deflected by a small angle, less aberration occurs in the primary electron beam. Accordingly, since a light path length of a primary electro-optical system, it is possible to reduce the influence of space charge and the occurrence of deflection aberration.

The invention relates to a system and a method for measuring high voltage cable space charges based on an electroacoustic pulse method. A high voltage pulse source and a high voltage capacitor are connected in series and are then connected with measuring electrodes at two ends of a tested piece, a high voltage power source is further connected with the measuring electrodes at two ends of the tested piece through a current limit resistor, a piezoelectric sensor closely clings to the lower measuring electrode, the piezoelectric sensor acquires a stress wave signal and sends the processed signal to a computer to form the measuring system, the high voltage power source can be a direct current high voltage power source and further can be an alternating current high voltage power source, the alternating current high voltage power source is connected with a phase detection unit, and a phase detection circuit outputs a synchronous control signal to a pulse generation unit of the high voltage pulse source. The high voltage power source forms space charges in an insulation layer of an electric power cable through electrodes, disturbance of the charges in the insulation layer of the electric power cable is realized through the high voltage pulse source to form dynamic stress waves, the measuring system acquires a signal of a pressure sensor, and a distribution state of the space charges of the electric power cable is analyzed. Through the system and the method, measurement on the distribution state of the space charges in the insulation layer of the electric power cable under the alternating current state is realized.