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Method for realizing three-dimensional imaging of symmetrical micro/nano sample through single X-ray measurement

A single-measurement, three-dimensional imaging technology, applied in the field of X-ray imaging, achieves considerable application value, improves sample utilization, and improves data acquisition efficiency

Inactive Publication Date: 2014-01-01
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the method of realizing three-dimensional reconstruction of samples by using X-ray free electron laser as a light source and single-shot irradiating symmetrical micro-nano samples has not been reported.

Method used

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  • Method for realizing three-dimensional imaging of symmetrical micro/nano sample through single X-ray measurement
  • Method for realizing three-dimensional imaging of symmetrical micro/nano sample through single X-ray measurement
  • Method for realizing three-dimensional imaging of symmetrical micro/nano sample through single X-ray measurement

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Experimental program
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Embodiment 1

[0031] In the X-ray imaging method for achieving three-dimensional imaging of symmetrical samples with a single measurement, this embodiment chooses to perform three-dimensional imaging on highly symmetrical trioctahedral gold single crystal nanoparticles with 48 symmetric operations, and the steps are as follows:

[0032] 1), sample preparation:

[0033] In this embodiment, the symmetry sample selects three octahedral gold single crystal nanoparticles with a high degree of spatial symmetry; the sample belongs to Crystallographic point group, including 3 4-fold axes, 3 symmetry planes, 4 3-fold rotation-inversion axes, 6 2-fold axes, 6 symmetry planes; the average size of the sample is 150nm; the exposed surface of the sample is { 552};

[0034] Dilute the uniformly synthesized three-octahedral gold single crystal nanoparticles with deionized water, and use a high-speed centrifuge to select 10,000 rpm for centrifugation to wash away the surfactant of the gold single crystal n...

Embodiment 2

[0054] In this embodiment, three-dimensional imaging of the highly symmetrical icosahedral mouse herpes virus particles with 60 symmetric operations is selected, and the steps are as follows:

[0055] 1), sample preparation:

[0056] In this embodiment, the symmetric sample is an inactivated icosahedral mouse herpes virus particle with a high degree of spatial symmetry; the shape symmetry of the virus sample belongs to the 532 crystallographic point group, including 6 quintuple symmetry axes, and 10 Cubic symmetry axes, 15 quadratic symmetry axes;

[0057] The mouse herpes virus particles are inactivated with ultraviolet rays, fixed with 3% glutaraldehyde solution, and centrifuged at 3000 r / min in a centrifuge to screen out virus particles with uniform particle size; the virus particle solution is diluted to About 10,000 cells / μL, use a vortex shaker to shake the diluted sample for 5 minutes to fully disperse the virus particles; use a pipette to draw 3 μL drops to Si with a ...

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Abstract

The invention discloses a method for realizing three-dimensional imaging of a symmetrical micro / nano sample through single X-ray measurement. The method comprises the following steps: by taking a coherent X-ray diffraction microscope as imaging equipment and utilizing the characteristics of free electron laser all-coherence, high flux and short pulse of X ray, acquiring two-dimensional diffraction data of the symmetrical micro / nano sample under single pulse irradiation, calculating an equivalent line of the diffraction data of the sample according to crystallographic symmetry characteristics of the symmetrical sample to determine spatial orientation of the sample, performing symmetry operation of a crystallographic point group of the sample on the two-dimensional diffraction data by utilizing the spatial symmetry of the sample to obtain three-dimensional diffraction data of the sample, and performing phase retrieval and image reconstruction on the three-dimensional recombinant diffraction data according to an oversampling and iterative algorithm to finally obtain a three-dimensional structure of the symmetrical sample. According to the method, three-dimensional reconstruction of the sample can be realized through single measurement only, the experiment efficiency of three-dimensional imaging is effectively improved, and a new thought is provided for enriching a three-dimensional imaging method.

Description

technical field [0001] The invention belongs to the technical field of X-ray imaging methods, and in particular relates to an X-ray imaging method for realizing three-dimensional reconstruction of a sample structure by measuring two-dimensional diffraction data of a symmetrical micro-nano sample at a single time. Background technique [0002] With the continuous improvement of the brightness of the synchrotron radiation source, the X-ray imaging method has been developed rapidly, new X-ray imaging methods are constantly emerging, and the imaging resolution is also further improved. Due to the short wavelength and strong penetrating ability of X-ray, it is an ideal light source for high-resolution three-dimensional imaging. At present, Micro-CT and Nano-CT imaging technologies have become more and more mature, which can respectively obtain the three-dimensional structure of large samples with micron resolution and the three-dimensional structure of smaller samples with nanome...

Claims

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Application Information

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IPC IPC(8): G01N23/20
Inventor 江怀东范家东孙智斌刘宏
Owner SHANDONG UNIV
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