A
test management method in a
smart card test
system, the method performs the following iterative steps: S1: the
test agent sends the generated failed
test report to the judge agent; S2: if the attribution result is code or
firmware defect, the judge agent generates a defect report and dispatches it to the development agent, and then performs steps S3 and S4; S3: after receiving the defect report, the development agent locates the defect code and generates a repair patch, and sends a repair completion notification to the judge agent after completing the repair; S4: after receiving the repair completion notification, the judge agent triggers the
test agent to re-execute the test using the modified
test case, and returns to the
test execution link in step S1, realizing closed-loop management of
smart card testing.