This application provides a performance
analysis method, apparatus, electronic device,
chip, and medium, relating to the field of
chip design and development. The method includes: generating at least one set of test configuration schemes based on the performance requirements of the
module under test and a preset performance
scenario; performing performance
simulation of the
module under test under the preset performance
scenario in parallel based on the at least one set of test configuration schemes to trigger at least one target performance event and acquire at least one performance
data point through a preset
performance monitoring unit; quantifying and analyzing the at least one performance
data point to obtain performance analysis results under the preset performance
scenario; and updating at least one set of test configuration schemes based on the performance
bottleneck when the performance analysis results show a performance
bottleneck, thereby determining the optimal configuration parameters of the
optimal test configuration scheme based on the updated at least one set of test configuration schemes. This improves
performance tuning efficiency, reduces development cycle and labor costs, and ensures that the
module under test achieves optimal
resource allocation while meeting performance targets.