The application belongs to the technical field of
semiconductor chip testing, and particularly relates to a
test matrix instant stop method based on target result triggering, which is suitable for a
test matrix scene, and realizes instant termination of a test process by relying on a preset hardware
signal line designed by connecting a pull-up
resistor to Vcc and comprises the following steps: S1, a pre-test configuration stage, S2, a
test matrix preparation execution stage, S3, a test matrix execution stage, and S4, an instant stop stage. A flexible configuration mechanism of
test target event registration and stop event binding is constructed, and a special hardware
signal line of connecting a pull-up
resistor to Vcc is matched to realize global synchronous triggering and stopping across a board card, the traditional
fixed sequence test mode is abandoned, and the core problems of executing redundant test items after a
test target is achieved in the prior art, causing invalid consumption of test time and equipment resources, and lacking of unified synchronous stopping capability in multi-board card cooperative testing and high parallel / multi-
station test period being greatly lengthened are solved.