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3495 results about "Value set" patented technology

A value set is used in Oracle Applications to restrict the values entered by a user. The values can be of any data type (Char, Number etc.)

System and method for classifying media items

A method and apparatus aids consistent, high-quality input of meta-information associated with items inserted into a database by coupling a hierarchical subject taxonomy, used to definitively assign an element, with sets of attributes appropriate for each category. Each attribute in turn is itself associated with a set of legal values drawn from a universe of appropriately typed values. The method and apparatus can be used to enable a user of a database management system to input or augment a set of semantically relevant and consistent meta-information associated with content in or being placed into the database management system. The content in the database system is placed into one or more of a set of hierarchical taxonomic categories. Zero or more semantically relevant attributes are associated with each taxonomic category. Relevant sets of values for each attribute, drawn from a universe of appropriate values, are associated with each attribute at each level in the taxonomic hierarchy. The placement of an element into a category adds the hierarchical set of attributes associated with that category to those relevant to the element. The value sets associated with those attributes may then be used to select consistent and appropriate meta-information to be associated with the element.
Owner:VAST

Apparatus and method for processing bank notes and other documents in an automated banking machine

An apparatus and method for determining a type and / or a condition of a note passing through the apparatus includes a note transport (12) which moves the note past sensing assemblies (18). Each sensing assembly includes emitters (32). Each of the emitters produces radiation at a different wavelength. The sensing assemblies include a reflectance detector (20) and a transmission detector (22) which are disposed on opposed sides of the passing note. The emitters direct radiation onto test spots (34) on the passing note. Reflectance values are generated from radiation reflected from each type of emitter to the reflectance detector. Transmission values are generated from radiation transmitted from an emitter through each test spot to the transmission detector. A control circuit produces a sensed value set including the reflectance and transmission values from each of the emitters in each of the sensing assemblies. The control circuit also determines an angle of skew of the passing note. Memories (138) include templates of values corresponding to transmission and reflectance values for known note types in a number of note positions. The control circuit generates stored value sets from the templates and skew angle. The control circuit further calculates a value representative of a level of correlation between the sensed value set and each of the stored value sets. The control circuit determines the highest level of correlation between all the stored value sets which is indicative of the note type and / or a condition thereof Various types of sensing assemblies can be used including sensing assemblies that are also suitable for capturing image data from notes or instruments processed in an automated banking machine.
Owner:DIEBOLD NIXDORF

Non-volatile semiconductor memory device

A non-volatile semiconductor memory device includes a memory cell array in which electrically erasable and programmable memory cells are arrayed, each of the memory cells storing therein a first logic state with a threshold voltage lower than or equal to a first value or a second logic state with a threshold voltage higher than or equal to a second value that is higher than the first value, a data hold circuit for holding program data and sensing data as read out of the memory cell array, and a controller configured to control a program sequence, wherein the controller has the control functions of: a program control function for applying a program voltage to a selected memory cell of the memory cell array to let the data shift from the first logic state to the second logic state; a program verify control function for verifying that the programmed data of the selected memory cell shifted to the second logic state; an erratic program verify control function for checking that the threshold voltage of a memory cell to be held in the first logic state does not exceed a third value set as an upper limit value of a variation of the first logic state; and an over-program verify control function for checking that the threshold voltage of the selected memory cell shifted to the second logic state does not exceed a fourth value set as an upper limit thereof.
Owner:KK TOSHIBA
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