The invention discloses a
spectrograph light intensity correlation Mueller matrix four-element spectrum measurement method. According to the method, the
relative intensity data [Iti, theta i] of light received by the ith pixel unit of the
spectrometer CCD, which is obtained by a measuring device for the
light intensity related Mueller matrix four-element spectrum of the
spectrometer based on an angle scanning method, is substituted into a principle formula of the
relative intensity of light received by the ith pixel unit of the
spectrometer CCD. And traversing the range of [0, 2pi] where theta i is located, selecting four theta i values according to a certain rule, establishing an equation set with four Iti measured values corresponding to the four theta i values, solving and normalizing to obtain a Mueller
matrix element related to the
light intensity of the
spectrograph corresponding to the
wavelength lambda i. The measurement method is an external measurement method, and the
spectrograph is not disassembled; all light intensity related Mueller
matrix element spectrums are measured by adding a retardation curve of a 1 / 4 wave plate, and the method is not only suitable for a single spectrograph, but also suitable for a spectrograph
system; the core optical device only uses the
polarizer and the rotary 1 / 4 wave plate, the related hardware cost is low, and the method is simple and rapid; the environment adaptability is good.