215 results about "Ftir spectra" patented technology

The system and method for spectral analysis uses a set of spectral data. The spectral data is arranged according to a second dimension, such as time, temperature, position, or other condition. The arranged spectral data is used in a signal separation process, such as an independent component analysis (ICA), which generates independent signals. The independent signals are then used for identifying or quantifying a target component.

An illumination subsystem for use in optical analysis which provides spatially and angularly homogenized radiation to the sample being analyzed. The system eliminates the illumination system as an interferent in the overall optical analysis. Thus, modest translations or rotations of the illumination source or changing the illumination source does not require recalibration of the instrument or prior modeling of illumination variability due to such changes. Illumination stability is achieved by incorporating a light pipe which both angularly and spatially homogenizes the light. Further, a series of filters and/or lenses are incorporated to provide bandpass filtering which eliminates unwanted wavelengths or bands of wavelengths from contacting the tissue and allows for a higher signal-to-noise ratio when the sample is tissue, while preventing thermal damage.

Novel spectrometer arrangements are described. They may employ a resin-based preconcentration system to sample chemical vapors. A field-widened interferometer modulates radiant energy. The signal generated by the interaction of the radiant energy with the sample is detected and processed by a computer. A variety of enhancements to the basic design are described, providing a family of related spectrometer designs. These spectrometers have applications in spectrometry, spectral imaging and metrology.

An apparatus for spectrometry that includes a spectrometer configured for second order focusing and capable of 2π azimuthal collection.

The invention concerns methods for the wavelength calibration of spectrometers and in particular secondary spectrometers which achieve considerably better calibration accuracies than the conventional peak search methods especially for spectrometers with a relatively large bandwidth. The methods according to the invention are based on the principle of a stepwise relative shift of corresponding measured-value blocks of a model and calibration spectrum where a correlation value is calculated for each shift step. A shift value is determined for each measured-value block at which the correlation value reaches an optimum. A value pair consisting of a position marker of the measured-value block and the associated shift value is determined for each measured-value block. These value pairs represent the design points for fitting to a suitable assignment function. The coefficients obtained in this manner can be used directly as coefficients of a wavelength assignment or be combined with the coefficients of an existing first wavelength assignment in that they for example replace these coefficients or are offset against the coefficients of an existing first wavelength assignment.

Spectroscopic devices and techniques for determining the presence or absence of an analyte of interest or the presence or absence of desired characteristics of an object are provided. In an embodiment, a portable device or attachment for a smart phone or comparable device includes a light source and a detector. The detector detects light after reflection from a target surface and, based upon attributes in the detected light absent from the emitted light such as covariances among different wavelengths, determines the presence or absence of the analyte of interest.

Fiber-laser light is Raman shifted to eye-safer wavelengths prior to spectral beam combination, enabling a high-power, eye-safer wavelength directed-energy (DE) system. The output of Ytterbium fiber lasers is not used directly for spectral beam combining. Rather, the power from the Yb fiber lasers is Raman-shifted to longer wavelengths, and these wavelengths are then spectrally beam combined. Raman shifting is most readily accomplished with a “cascaded Raman converter,” in which a series of nested fiber cavities is formed using fiber Bragg gratings.

Systems and methods for spectral imaging are disclosed. Such spectral imaging can be used to determine properties of a subject material at different locations upon the surface and/or within the material. For example, strain and/or stress within an imaged area of the material can be determined. A system for spectral imaging can include a light source, a two-dimensional sensor array configured to image light from a two-dimensional area of a subject material, a filter configured to filter light from the subject material before the light is imaged and a processor in communication with the two-dimensional sensor array. The processor can be configured to determine a property of the subject material at a plurality of locations within the two-dimensional area of the subject material. Such spectral imaging systems can facilitate the performance of piezospectroscopic measurements of two-dimensional surfaces in a rapid manner while preserving accuracy.

There is disclosed a device or apparatus that is particularly suitable for use in the analytical fields of polarized light microscopy and spectroscopy/spectral imaging. The apparatus comprises an automated polarized light microscope combined with means for achieving spectroscopic analysis. The apparatus may optionally include means for spectral imaging associated with the means for achieving spectroscopic analysis. Any means for achieving spectroscopic analysis may be utilized for example Raman, mid-infrared, near-infrared, ultraviolet, visible, luminescence, and the like.

A method and apparatus are provided for correcting gamma ray data representative of gamma ray energies for spectral degradation. The method and apparatus include degrading reference gamma ray spectra. At least one correction factor is calculated between the degraded gamma ray spectra and the reference gamma ray spectra. The gamma ray data are then corrected using a calculated correction factor. Another method is provided for determining a correction factor for correcting data representative of gamma ray energies for spectral degradation. The method includes disposing a downhole tool in a simulated environment representative of actual downhole conditions, the tool including a neutron source and at least one gamma ray detector. The temperature of at least one of the gamma ray detectors of the tool is then varied while the simulated environment is irradiated with neutrons emitted from the neutron source. Gamma ray energy signals are then detected at the at least one detector in response to gamma rays produced during nuclear reactions between the neutrons and materials in and of the simulated environment. A characteristic of the simulated environment is then determined along with a characteristic of the at least one detector. The determined characteristics of the simulated environment and of the at least one detector are then correlated to determine at least one correction factor.

An imaging spectral device for use in the spectrum image analysis for performing the spectroscopic analysis of the respective points in two dimensional field is disclosed. The device comprises an imaging spectral device composing a white-light source to illuminate an object to be measured, a tunable filter located in the optical path between the object and the white-light source, a driving mechanism for wavelength scanning of the tunable filter, and a control unit in which scanning rate of transmitting wavelength of the tunable filter is controlled by the above-mentioned driving mechanism in such a manner that the spectral transmittance of the tunable filter integrated within the exposure time becomes desired spectral distribution of the object to be measured.

Systems and methods for hyper-resolution beyond the diffraction limit of optical microscopes for applications in spectroscopy, absorption and lithographic photochemical patterning are described. These systems are based on interference of a pump pulse and a Stokes laser pulse which interfere to localize the population of an excited vibrational state in an area that is smaller than the scanning resolution of the microscope. Another (interfering) Stokes pulse has an annular shape at focus and destructively interferes with the the Stokes laser pulse. This destructive interference causes narrowing of the population distribution of the vibrational excited state well below the diffraction limit, which in turn localizes the population of the central electronic excited state by a separate actinic laser pulse having a lower energy than the ground state excitation energy of the molecule.

A stepped photolithography system uses two photomasks to produce photoresist images capable of printing features smaller than 10 nm.

Performance and reliability of microelectromechanical system (MEMS) components enhanced dramatically through the incorporation of protective thin film coatings. Current-generation MEMS devices prepared by the LIGA technique employ transition metals such as Ni, Cu, Fe, or alloys thereof, and hence lack stability in oxidizing, corrosive, and/or high temperature environments. Fabrication of a superhard, self-lubricating coating based on a ternary boride compound AlMgB₁₄ is described in this letter as a potential breakthrough in protective coating technology for LIGA microdevices. Nanoindentation tests show that hardness of AlMgB₁₄ films prepared by pulsed laser deposition ranges from 45 GPa to 51 GPa, when deposited at room temperature and 573 K, respectively. Extremely low friction coefficients of 0.04-0.05, which are thought to result from a self-lubricating effect, have also been confirmed by nanoscratch tests on the AlMgB₁₄ films. Transmission electron microscopy studies show that the as-deposited films are amorphous, regardless of substrate temperature; however, analysis of FTIR spectra suggests that the higher substrate temperature facilitates formation of the B₁₂ icosahedral framework, therefore leading to the higher hardness.

A patient interface and a method of installing a patient interface for a spectroscopy kit on a patient. The patient interface includes a butterfly-shaped patient interface with a cap on top of the patient interface and in proximity to an optical head.

The invention is suitable for the spectral imaging technical field, and provides a coded aperture spectral imaging system which comprises a preposition imaging system, a digital micro-mirror, a collimation system, a reflection raster, a microlens array and a detector. The microlens array comprises a plurality of microlenses; the filtering bands of the filtering layer on each microlens are different; the preposition imaging system images an object to be measured on the digital micro-mirror; the image after coded modulation is incident on the reflection raster through the collimation system to perform light splitting; a space spectrum mixing image is obtained after light splitting; a plurality of images are obtained through the microlens array with a filtering function; the detector simultaneously receives the plurality of images, and performs fusion decoding on the plurality of images to obtain the spectral information of the object to be measured. The coded aperture spectral imaging system can maintain system single rapid measurement, and meanwhile substantially improve system spatial resolution.

Embodiments of the invention pertain to a method and apparatus for spectral deconvolution of detector spectra. In a specific embodiment, the method can be applied to sodium iodide scintillation detector spectra. An adaptive chi-processed (ACHIP) denoising technique can be used to remove the results of stochastic noise from low-count detector spectra. Embodiments of the ACHIP denoising algorithm can be used as a stand alone tool for rapid processing of one dimensional data with a Poisson noise component. In a specific embodiment, the denoising technique can be combined with the spectral deconvolution method. Embodiments of the denoising technique and embodiments of the deconvolution method can be applied to any detector material that provides a radiation spectrum. Specific embodiments can incorporate one or more of the following for spectral deconvolution: denoising, background subtraction, detector response function generation, and subtraction of detector response functions. Photopeaks can be rapidly identified, starting at the high-energy end of the spectrum. The detector response functions can be estimated for photopeaks with a combination of Monte Carlo simulations and simple transformations.

A spectroscopic instrument (38) includes a first optical component (48) for spatial spectral splitting of a polychromatic beam of light (46) impinging onto the first optical component (48), an objective (50), which routes various spectral regions (B1, B2, B3) of the split beam of light (46a, 46b, 46c) onto differing spatial regions (52a, 52b, 52c), and a sensor (54), situated downstream of the objective (50) in the beam path of the beam of light (46a, 46b, 46c), with a plurality of light-sensitive sensor elements (54a, 54b, 54c). The sensor elements (54a, 54b, 54c) are arranged in the beam path of the split beam of light 46a, 46b, 46c in such a manner that each sensor element (54a, 54b, 54c) registers the intensity of a spectral sector (A1, A2, A3) of the beam of light (46) and the medians (Mk1, Mk2, Mk3) of the spectral sectors (A1, A2, A3) are situated equidistant from one another in the k-space, where (k) denotes the wavenumber.

The invention belongs to the field of ultra-fast laser micro-nano processing and discloses an ultra-fast laser micro-nano processing device with an online monitoring function. The device comprises a laser unit, a dichroic mirror, a microscope, an object carrying platform and an imaging spectrometer. The laser unit is used for outputting two paths of pulsed laser with different wavelengths, and thefirst path of pulsed laser is divided into a first light beam and a second light beam, wherein the first light beam carries out laser micro-nano processing. The second light beam is combined with thesecond path of pulsed laser for spectral imaging and is combined with the first light beam at the same time. After passing through the dichroic mirror and the microscope, the combined light beams areconcentrated on an object to be processed so as to carry out cooperative laser micro-nano processing and real-time monitoring of spectra and imaging; and then non-linear optical signals such as backward coherent anti-stokes raman scattering generated by the object to be processed are collected backward and are to be received by an imaging spectrometer so as to realize real-time monitoring in theprocessing process. Through the ultra-fast laser micro-nano processing device, ultra-fast laser micro-nano processing with nonlinear imaging and spectrum online monitoring functions is realized.

A calibration light source outputs emission lines having a known emission-line wavelength, a spectral luminometer to be calibrated measures an emission-line output of the calibration light source, and a system control unit calibrates the wavelength of the spectral luminometer by estimating the wavelength of the emission-line output from ratios of outputs of a light receiving unit at a plurality of measurement wavelengths neighboring an emission-line wavelength and estimating a wavelength change amount from a difference between the estimated wavelength of the emission-line output and the known emission-line wavelength. The wavelength and the sensitivity of a spectral luminometer can be calibrated at a user side.