214results about "Spectrum generation using diffraction elements" patented technology

Disclosed herein are scientific instrument support systems, related methods, computing devices and computer-readable media. A method of mitigating distortion of an optical emission spectrum obtained from an optical emission spectrometer is provided. The method may comprise a step of obtaining a spectrum recorded with the spectrometer and a respective one or more condition parameters indicative of an operating condition at a time of recording the spectrum. The method may further comprise a step of providing a model configured to output, in response to the one or more condition parameters, one or more transform parameters of a transformation to be applied to the obtained spectrum. A transformation may be applied in accordance with the obtained one or more transform parameters to the obtained spectrum to mitigate distortion of the spectrum due to a discrepancy between the operating condition and a baseline operating condition.

The application belongs to the field of spectral measurement and imaging, and specifically discloses a single-photon detection device and a rapid spectral and imaging system based on the same. According to the application, a transmission optical fiber spectrometer separates each waveband complex light according to wavelength in space, and couples the photons of different wavelengths into an optical fiber array for time delay, so that the different wavelengths are delayed to different time points and output to a single-photon detection device. The single-photon detection device converts the photons of different wavelengths arriving at the device in time sequence into electrical signals, and obtains the number of photons at different time points after amplification and signal processing, and converts the number of photons into a spectrum. Since the transmission spectrometer can provide higher diffraction efficiency, higher spectral resolution and signal strength, the single-photon detection device can provide a faster and more accurate photon discrimination and photon counting method, and compared with the prior art, the whole can measure the spectrum more quickly, and has higher spectral resolution and signal strength.

The invention provides a hyperspectral imaging system. The hyperspectral imaging system comprises a telescope group, a collimator objective, a prism, a volume holographic diffraction grating, an imaging objective and an imaging sensor which are arranged in sequence, the telescope group is composed of a primary reflector, a secondary reflector, a third reflector, a plane reflector and an entrance slit; the primary reflector, the secondary reflector and the third reflector form an off-axis three-reflector structure; the plane reflector is used for folding a light path; the collimating objective lens, the prism, the volume holographic diffraction grating, the imaging objective lens and the imaging sensor form an imaging spectrometer, and an entrance slit is used as object space input; the formed off-axis three-mirror and folded light path and an imaging spectrometer are in coaxial butt joint by taking an entrance slit as a node, and are used for joint correction and splicing to form a hyperspectral imaging system. According to the optical path architecture, optimal matching of the unobstructed total reflection front end and the transmission type rear end is realized, and the detection sensitivity of crop weak spectrum signals is greatly improved while a better modulation transfer function of a full view field is ensured.

Method (100) of optical spectroscopy for analyzing a sample using an optical spectrometer (10), comprising: Obtaining a sample spectrum (101) of the sample using the optical spectrometer; Obtaining a blank spectrum (102) using the optical spectrometer, wherein the blank spectrum includes structured background radiation that correlates with the sample spectrum; Determining a cross-correlation (103) of the sample spectrum and the blank spectrum; Generating a mapped blind spectrum (105) by mapping the blind spectrum onto the sample spectrum based on cross-correlation; and Subtracting the imaged blank spectrum from the sample spectrum to produce a background-corrected sample spectrum (106).

A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

There was a need for optical components or elements that would be useful in miniaturizing spectroscopic devices. [Solution] An optical component made of a solid material that transmits light of a wavelength to be used, characterized in that a diffraction grating consisting of a plurality of grooves extending along a second direction is provided on a first optical surface into which the light of the wavelength to be used is incident, and a plurality of lenses arranged along the second direction are provided on a second optical surface into which the light of the wavelength to be used that was incident from the first optical surface is emitted.

A calibration light source includes: a broad band light source emitting light in a broad spectral range; and a filter receiving light emitted by the broad band light source and providing structured light by imposing an attenuation pattern exhibiting pattern features at multiple spectral reference lines on the received light such that an emission spectrum of the structured light emitted by the calibration light source exhibits distinct, identifiable emission spectrum features corresponding to the pattern features at the multiple spectral reference lines. A method of calibrating at least one spectrometer using the calibration light source is further disclosed.

A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.

The present invention relates to an optical or Raman micro-spectrometry apparatus (100) comprising an optical microscope objective (10) and an optical spectrometer (20). According to the invention, the micro-spectrometry apparatus comprises an astigmatic optical system (30, 31, 32) arranged outside the optical spectrometer (20, 21), between the microscope objective (10) and the optical spectrometer, the astigmatic optical system (30, 31, 32) being arranged and configured to form an astigmatic image of a light beam transmitted through the microscope objective (10) on the input slit of the optical spectrometer (20, 21), the astigmatic image being elongated by astigmatism in the height direction of the input slit, the optical spectrometer being able to spectrally disperse the astigmatic image and form a spectrally dispersed image of the field of view on the detector, the astigmatic optical system being configured to reduce an optical aberration of astigmatism of the optical spectrometer in the spectrally dispersed image.

The invention comprises a method and system for cost effective, convenient remote high fidelity color reproduction and matching that can be used to convey color to observers remote from the physical source of color. Such remote observers can include product consumers wishing to view a product color, for example. In a preferred embodiment, the method comprises capture of article or product reflectance spectra and the use of this spectrum to filter ambient light or directed light in the environment of a user remote from the article or product. Other embodiments of methods include various techniques to capture product spectral information and color matching functions useful for color reproduction using colored light sources. Additional systems embodiments include devices exploiting multiprimary displays to render the product color with reduced metamerism.

An Offner spectrometer for use in a multi-slit hyperspectral imaging system for imaging a remote object includes a first surface that is a transmissive surface having a narrow slit receiving light from a multi-spectral light source, a second curved transmissive surface receiving light from the first surface, a third curved reflective surface receiving light from the second surface, a fourth reflective surface that is a curved surface with a grating receiving light from the third surface and diffracting and reflecting light, a fifth surface that is curved reflective surface receiving light from the fourth surface, a sixth curved transmissive surface receiving light from the fifth surface, and a seventh surface that is a focal plane of the Offner spectrometer receiving light from the sixth surface. Each curved surface has X and Y prescriptions that are decoupled.

The invention provides a high-resolution broadband integrated spectrometer based on thin film lead zirconate titanate and a preparation method, and relates to the technical field of integrated optics. The structure of the spectrometer comprises a substrate; the silicon dioxide lower cladding layer is arranged on the substrate; the lead zirconate titanate thin film waveguide layer is arranged on the silicon dioxide lower cladding, a plurality of micro-ring resonators and a plurality of array waveguide gratings are arranged in the lead zirconate titanate thin film waveguide layer, and each array waveguide grating is connected with each micro-ring resonator through a waveguide; the sectional periodic metal electrode arrangement system is arranged in each section of straight waveguide area in the micro-ring resonator; wherein the plurality of micro-ring resonators are configured with resonant wavelengths which are distributed in a staggered manner, and the interval between the adjacent resonant wavelengths is 1 / n of the interval between the array waveguide grating channels; the spectrometer is configured to change the local waveguide refractive index by using the residual polarization effect of the lead zirconate titanate thin film through a segmented polarization method so as to realize alignment of the resonant wavelength and the center of the array waveguide grating channel.

In order to provide a light source apparatus that can quickly change wavelengths of emission light, a light source apparatus includes an optical amplifier, a spectroscopic element, a spatial phase modulating element, and a controller. The optical amplifier amplifies and releases light. The spectroscopic element separates the light from the optical amplifier according to wavelengths. The spatial phase modulating element includes a base part and a plurality of grating elements that reflect the light separated by the spectroscopic element. The spatial phase modulating element relatively displaces at least a part of grating elements with respect to the base part and thereby performs phase modulation on the light separated by the spectroscopic element, and emits diffracted light along an incident optical path from the spectroscopic element regarding a part of the wavelengths within a wavelength range of the light separated by the spectroscopic element. The controller controls displacement of the plurality of grating elements with respect to the base part. The diffracted light emitted from the spatial phase modulating element generates the light having the part of the wavelengths in the spectroscopic element, and the light having the part of the wavelengths is amplified by the optical amplifier and is subsequently released toward the spectroscopic element. The light having the part of the wavelengths subjected to a plurality of times of amplification by the optical amplifier is output.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

A spectrometric device according to an aspect of the present application includes: a light splitting section (2) including a diffraction grating; a detection section (2) that detects light wavelength-dispersed by the diffraction grating; a rotation section that rotates the diffraction grating; a light blocking section that blocks measured light introduced into the light splitting section; a measurement condition setting section (4, 5) that sets a plurality of measurement conditions including a wavelength of a measurement target and at least one parameter value among an integration time, a gain, or a number of data accumulations; and a control section (4) that acquires a dark field measurement value for each of the plurality of measurement conditions set by the measurement condition setting section, blocks the measured light using the light blocking section, and performs a dark field measurement at other parameter values included in each measurement condition after rotating the diffraction grating to a position corresponding to the measurement target wavelength included in the measurement condition using the rotation section. Thus, a dark field measurement value can be accurately obtained.

To provide a small and inexpensive spectroscope.SOLUTION: A spectroscope is provided with light incident means for making light from the outside incident. Also, the spectroscope includes a diffraction grating for dispersing the wavelength of the light made incident by the light incident means. Moreover, the spectroscope includes reflecting means which has a reflection surface which reflects the light wavelength-dispersed by the diffraction grating and allows the tilt of the reflecting surface to be varied.SELECTED DRAWING: Figure 1

In order to obtain a high output together with a compact size using structurally simple means, a spectrometer having a lens (1), a dispersive element (2) and a detector (3), wherein a measuring light (4) directed onto the lens (1) is projected onto the dispersive element (2) by means of the lens (1), reflected back to the lens (1) in dispersed form by the dispersive element (2) and directed onto the detector (3) by means of the lens (1), is designed and developed in such a way that the lens (1) is a simple lens or single lens having at least one non-spherical surface (5) for influencing the imaging. The invention further relates to a corresponding distance measuring system and to a corresponding method for operating a spectrometer.

An Offner spectrometer for use in a multi-slit hyperspectral imaging system for imaging a remote object includes a first surface that is a transmissive surface having a narrow slit receiving light from a multi-spectral light source, a second curved transmissive surface receiving light from the first surface, a third curved reflective surface receiving light from the second surface, a fourth reflective surface that is a curved surface with a grating receiving light from the third surface and diffracting and reflecting light, a fifth surface that is curved reflective surface receiving light from the fourth surface, a sixth curved transmissive surface receiving light from the fifth surface, and a seventh surface that is a focal plane of the Offner spectrometer receiving light from the sixth surface. Each curved surface has X and Y prescriptions that are decoupled.

An optical mount, comprising: a first optical holder 201 for mounting a reflective first optical device 214; and an optical selector 202 comprising a second optical holder 229 for a plurality of second optical devices 216, 216a, 216b. The second holder 229 may be mounted for rotation about a selection axis B-B, where the second holder 229 positions a selected different one of the second optics 216, 216a, 216b in an optical path 215 at different angular positions about the selection axis B-B, and where the second holder 229 is mounted for rotation about the selection axis B-B, where the selected different one of the second optics 216, 216a, 216b is positioned in the optical path 215 at different angular positions about the selection axis B-B. Such that light on the optical input path 213 is transmitted to the optical output path 215 via the first optical device 2114 and the selected second optical device 216. The optical mount may comprise a mechanism for rotating a selected second optical device (216) and moving the first optical holder (201) in conjunction with the rotation of the selected second optical device (216) when the selected second optical device is located in the optical path (215), the second optical device 216 is selected such that light transmitted along the optical input path 213 is directed along the optical output path 215 for different angular positions of the selected second optical device 216 relative to the optical output path 215.

The application discloses a spectrometer based on a random spiral grating, wherein a device layer is an optical waveguide, the device layer comprises a random spiral grating, two groups of transmission waveguides and two groups of grating couplers; incident light is coupled into the first group of transmission waveguides through the first group of grating couplers, and then is transmitted to the random spiral grating from the first group of transmission waveguides; the amplitude-frequency response of the optical signal is randomly modulated through the random spiral grating; the application further comprises a heater; the random spiral grating is non-uniformly heated by the heater, so that the temperature of the random spiral grating is changed, and the phase-frequency response of the optical signal passing through the random spiral grating is randomly changed; finally, the obtained random optical signal is transmitted to the second group of grating couplers through the second group of transmission waveguides, and is coupled out from the second group of grating couplers; the application has the advantages of micron-level size, large bandwidth and super-high resolution.

This invention relates to a spectrometer for performing spectral analysis of electromagnetic radiation. The spectrometer includes an entrance slit (03) for allowing the electromagnetic radiation to be analyzed to enter, and an imaging grid for diffracting the entered electromagnetic radiation. The spectrometer also includes a detector extending in at least one direction for detecting the diffracted electromagnetic radiation, and a support plate (01) in which the entrance slit (03) is arranged. The spectrometer further includes a housing (02) supported on the support plate (01), which covers the detector and the entrance slit (03) and supports the imaging grid. According to the invention, the spectrometer further includes at least three floating bearings (04, 06, 07) for levitating the housing (02) supported on the support plate (01), wherein the floating bearings (04, 07) respectively release movement between the housing and the support plate along a directional axis and are distributed around the central axis of the housing (02).

A device used in a system for generating spectral images corresponding to four or more wavelength bands includes optical filters different in spectral transmittance and an image sensor that detects light through the optical filters, in which when the wavelength bands are given numbers in an ascending or descending order of a central wavelength, the image sensor outputs i-th mask data by detecting only light corresponding to an i-th wavelength band and outputs j-th mask data by detecting only light corresponding to a j-th wavelength band among the wavelength bands, a correlation coefficient between the i-th and j-th mask data is greater than or equal to 0.8 in a combination where |i−j| is 1, and is equal to or less than 0.8 in at least one combination where |i−j| is greater than or equal to 2 and less than or equal to N−1.

The invention discloses a two-dimensional wide-field-of-view broadband real-time hyperspectral imager, and belongs to the technical field of spectral imaging. A first micro lens array is used for acquiring two-dimensional wide-field-of-view incident light on a horizontal plane and a vertical plane; in the first micro lens array, each first micro lens in a central view field in the horizontal direction is coupled to each second micro lens through an optical fiber, and each first micro lens in an edge view field in the horizontal direction is coupled to each third micro lens through an optical fiber; the second micro-lens array is used for collimating incident light from a central view field in the horizontal direction into a first parallel light beam, and the third micro-lens array is used for collimating incident light from an edge view field in the horizontal direction into a second parallel light beam; and the first / second assembly is used for sequentially carrying out filtering and first-level diffraction on the first / second parallel light beams and then obtaining space information and spectral information of a central view field / an edge view field in the horizontal direction in real time. According to the invention, wide-view-field broadband spectrum general survey and center-view-field broadband spectrum detailed survey can be completed in real time.

A spectrometer 1A includes a package 2 having a stem 4 and a cap 5, an optical unit 10A disposed on the stem 4, and a lead pin 3 for securing the optical unit 10A to the stem 4. The optical unit 10A includes a dispersive part 21 for dispersing and reflecting light entering from a light entrance part 6 of the cap 5, a light detection element 30 having a light detection part 31 for detecting the light dispersed and reflected by the dispersive part 21, a support 40 for supporting the light detection element 30 such that a space is formed between the dispersive part 21 and the light detection element 30, and a projection 11 protruding from the support 40, the lead pin 3 being secured to the projection 11. The optical unit 10A is movable with respect to the stem 4 in a contact part of the optical unit 10A and the stem 4.

This invention discloses an extreme ultraviolet (EUV) high-resolution monochromaticization method and system, relating to the field of spectral technology. The EUV high-resolution monochromaticization method includes: S1, providing an incident light source; S2, setting an off-axis parabolic mirror as a collecting mirror, which receives the EUV light beam and collimates it into parallel light; S3, setting a grating to split the parallel light, the parallel light is incident on the grating at a preset angle along the grating's etched lines, forming conical diffraction. Rotating the grating adjusts the incident azimuth angle α of the parallel light, causing EUV light of different wavelengths to propagate along different diffraction azimuth angles β. This EUV high-resolution monochromaticization method, through the use of two off-axis parabolic mirrors, fundamentally avoids chromatic aberration and spherical aberration, ensuring high reflection efficiency in the EUV band. The use of conical diffraction results in high diffraction efficiency, uniform distribution of the light spot in the confocal plane, and ease of spot selection, thereby reducing linear dispersion and increasing resolution.

An analysis device (11, 11', 11'') for analyzing a sample substance by means of Raman spectroscopy comprises a sample chamber (13), a laser system (17) for irradiating the sample substance, a dispersive optical element (12, 35, 35') for spectral splitting of scattered light emanating from the irradiated sample substance, a detector unit (20) for receiving at least a part of the spectrally split scattered light and an electronic evaluation device (25) which is in signal communication with the detector unit (20) and is configured to determine at least one Raman line on the basis of the received scattered light.The detector unit (20) has two adjacent individual detectors (21, 22) which are designed to output respective separate signals (27), wherein the electronic evaluation device (25) is designed to take into account the signals of both individual detectors (21, 22) of the detector unit (20) when determining the at least one Raman line.

A data set is stored in memory circuitry, the data set indicating a state of a semiconductor manufacturing process or a semiconductor structure manufactured thereby. Features in the data set are resolvable within limits constrained by a data resolution. A machine learning model is also stored in the memory circuitry, the machine learning model including parameters having respective assigned values constrained by a model training process. Processor circuitry communicatively coupled to the memory circuitry generates an output data set from the data set in accordance with the machine learning model such that features in the output data set are resolvable within limits constrained by an output data resolution, the output data resolution being finer than a data resolution of the data set.

An optical component (3c) made of a solid material that transmits light of a specified wavelength includes a diffraction grating (DF) and a plurality of lenses (CL). The diffraction grating (DF) comprises a plurality of grooves extending in a second direction (Y) and arranged on a first optical surface onto which the light of the specified wavelength is incident. The plurality of lenses (CL) is arranged in the second direction (Y) and provided on a second optical surface from which the light of the specified wavelength, incident from the first optical surface, is emitted.

Spectrofilometers are provided. The spectrofilometer includes a profilometer, an enclosure, one or more interferometer beam-splitting elements, and / or one or more spectrometer beam-dispersing elements. The one or more interferometer beam-splitting elements and the one or more spectrometer beam-dispersing elements are housed in the enclosure, share one or more radiation sensitive elements with the profilometer, which are arranged to generate a signal in response to incident electromagnetic radiation, and each generate one or more optical outputs. The one or more optical outputs are arranged such that respective optical axes intersect substantially in a plane of the one or more radiation sensitive elements.