2105 results about "Fast measurement" patented technology

Systems and methods of the present invention measure at least one reflecting surface of an object disposed along an optical path. In some embodiments a measured optical interference signal for each of at least three wavelengths of reflected light may be used to determine a modulation of frequency components of a Fourier series. Frequency components of a Fourier series may be transformed to spatial components that describe intensities and positions of light reflected along an optical path. Systems and methods of the present invention permit rapid measuring and may monitor corneal thickness during surgery. The invention may do so by integrating an ablation device and a measurement apparatus into a single system. An integrated scanning and monitoring system may include an ablative light source producing an ablative beam and a measurement light source producing a measurement beam.

A multi-sensor system rapidly measures diffuse reflectance of soil, soil conductivity, and other soil properties in situ, in three dimensions. The system includes a tractor-drawn implement containing a sensor shank used for X-Y axis measurements, a hydraulic probe implement containing a sensor probe for −Z axis measurements, and a set of visible and near-infrared spectrometers, controls, and firmware that are shared by each implement. Both implements include optical sensors and soil electrical conductivity sensors. The probe implement incorporates a sensor that measures insertion force, and the shank implement includes a soil temperature sensor. These combinations of sensors are used to calibrate the system and to characterize the soil properties within a field or area. Geo-referenced soil measurements are collected with the shank implement to identify optimal locations for conducting sensor probe insertions. The probe implement is then used for sensor probing and for collecting soil core samples for lab analysis.

A device and method for identifying solid and powdered materials use near-infrared reflection spectroscopy combined with multivariate calibration methods for analysis of the spectral data. Near-infrared reflection spectroscopy is employed within either the 700-1100 nm or the 900-1700 nm wavelength range to identify solid or powdered materials and determine whether they match specific known materials. Uses include identifying solid and powdered materials with a fast measurement cycle time of about 2 to 15 seconds and with a method that requires no sample preparation, as well as quantitative analysis to determine the concentration of one or more chemical components in a solid or powdered sample that consists of a mixture of components. A primary application involving identification analysis verification of the identify and purity of powdered materials used for fabricating drug tablets and capsules for quality control purposes.

The invention discloses a method for quickly measuring a blade of a large-sized water turbine, which is characterized by comprising the following steps: firstly, sticking a mark point to the surface of the blade, then shooting a group of photos from different angles as measured primary data, and inputting the data to a computer to carry out analytic processing; by carrying out image detection for the group of photos in a measurement software, identifying the mark point in each photo and positioning the center of the mark point, and matching the mark points with the same name; finally, reconstructing a three-dimensional coordinate of corresponding object points according to a plurality of two-dimensional coordinates of the mark points, fitting a sparse framework model of a target by the reconstructed three-dimensional mark points, then scanning the surface of the blade block by block by using a binocular grating scanning method to acquire a local dense point cloud, and aligning the dense point cloud to an overall coordinate system according to the local mark points to acquire a dense point model of the blade; and by comparing the dense point model with a CAD designed model after aligning, calculating a three-dimensional processing error of the surface of a workpiece.

The invention relates to a wide range high accuracy fast laser distance measuring method and device based on multiple frequency synchronous condenser. The multiple frequency modulating signals are taken characteristic pre-compensation weight summarizing at laser emitting unit. After compounding, the laser power is modulated to take distance measuring. Synchronous band pass filter frequency selection and phase determination method is used to taken signal process. The method could gain the distance measuring result of distance measuring frequency in multiple frequency modulating distance measuring, and gain the final distance result. The distance measuring speed and real time is ensured. It also avoids measuring error coursed by the location movement of the target.'

The invention belongs to the field of optical precision measurement and relates to a method and a device for measuring the appearance and the wall thickness of a sphere by combining a differential confocal confocal technology and point-diffraction interference. The method realizes the high-precision rapid measurement on the appearance of the outer surface of the sphere by using the point-diffraction interference, the rotation of the measured sphere and the splice of a measuring sub-aperture; and the appearance and wall thickness of the inner surface and the outer surface of a key area of a transparent or semitransparent sphere can be scanned and measured point by point by using the differentia confocal technology. The invention organically integrates a point-diffraction interference technology and the differentia confocal technology so as to realize the synchronous measurement on the appearance and the wall thickness of the inner surface and the outer surface of the sphere, and aims to solve the difficult problems that the traditional AFM or a single confocal sensor and the other scanning methods have low measuring speed, low efficiency, easy leakage in measurement and the like during measuring the surface of the sphere. The invention has broad application prospect in the fields of testing the appearance and the wall thickness of a laser fusion pellet, the appearance and the outline of a spherical surface and the like.

Provided is an optical image measuring apparatus capable of speedily measuring a velocity distribution image of a moving matter. Including a broad-band light source, means for increasing a beam diameter, a polarizing plate converting the light beam to linearly polarized light, and a half mirror, a wavelength plate converting the reference light to circularly polarized light, the half mirror superimposing the signal light whose frequency is partially shifted by the moving matter in the object and the reference light is circularly polarized light to produce superimposed light including interference light, CCDs for receiving different polarized light components of the interference light, and outputting detection signals including interference frequency components corresponding to beat frequencies of the interference light, and a signal processing portion for forming the velocity distribution image based on interference frequency component corresponding to a beat frequency equal to an intensity modulation frequency of the light beam.

An apparatus for continuous on-line measurement of chemical composition of aerosol particles with a fast time resolution is provided. The apparatus includes an enhanced particle size magnifier for producing activated aerosol particles and an enhanced collection device which collects the activated aerosol particles into a liquid stream for quantitative analysis by analytical means. Methods for on-line measurement of chemical composition of aerosol particles are also provided, the method including exposing aerosol carrying sample air to hot saturated steam thereby forming activated aerosol particles; collecting the activated aerosol particles by a collection device for delivery as a jet stream onto an impaction surface; and flushing off the activated aerosol particles from the impaction surface into a liquid stream for delivery of the collected liquid stream to an analytical instrument for quantitative measurement.

The invention discloses a sediment particle analysis device based on digital image technology, which includes a collection box, an image acquisition unit, and a sediment particle analysis system; wherein the image collection unit is arranged in the collection box for collecting sediment samples. Image; the sediment particle analysis system includes an input module, an image preprocessing module, an image binarization module, an edge detection and contour extraction module, and a statistical output module. The invention also discloses a sediment particle analysis method based on digital image technology. The image of the sediment particle sample is collected by a camera, and then the image is preprocessed, binarized, and edge contour is extracted, and the projected area of ​​each particle is calculated. According to the equivalent projected area, the particle size of each particle is obtained, and then a series of particle information is obtained, which realizes the rapid measurement of the characteristic parameters of sediment particles.

The invention provides a registration and measurement method of a spherical panoramic image and a three-dimensional laser scanning point cloud. The method comprises the following steps: firstly, using a three-dimensional structure simulation spherical panoramic image of a unit sphere, converting a pixel coordinate of the spherical panoramic image into a three-dimensional rectangular coordinate, then calculating an attitude parameter of the spherical panoramic image in point cloud data and a position coordinate of the optical center of the spherical panoramic image in the point cloud data to carry out the registration to the spherical panoramic image in the point cloud data; obtaining a depth map of the spherical panoramic image through the calculation; and finally moving a mouse to a target point position to be measured when the measurement is required to be carried out on the spherical panoramic image to calculate a three-dimensional coordinate of the target point. The registration and measurement method provided by the invention not only can carry out the height registration on the spherical panoramic image and the three-dimensional laser scanning point cloud, and also can realize fast measurement on a target point simultaneously.

A lithium ion battery internal health feature extraction method based on an impedance spectrum, and relates to the new energy research field; an existing method uses an EIS to analyze and estimate a SOH, wherein the EIS is long in measuring time, and cannot realize online measurements; the lithium ion battery internal health feature extraction method comprises the following steps: building a lithium ion battery electrochemistry impedance spectrum mathematics model; fast measuring a lithium ion battery electrochemistry impedance spectrum, and obtaining the lithium ion battery electrochemistry impedance spectrum; using the lithium ion battery electrochemistry impedance spectrum mathematics model to identify the lithium ion battery electrochemistry impedance spectrum parameters respectively under high, medium and low frequency stages, thus obtaining the lithium ion battery model parameters; periodically measuring the electrochemistry impedance spectrum of the aged lithium ion battery, using the lithium ion battery electrochemistry impedance spectrum mathematics model to identify the lithium ion battery electrochemistry impedance spectrum parameters of the aged lithium ion battery, thus obtaining the model parameter changing rules in the lithium ion battery aging process, and serving as the features that evaluate the battery health states. The lithium ion battery internal health feature extraction method is used for evaluating the battery health states.

The invention provides a method for rapidly measuring a plurality of parameters of an electro-acoustic product and also provides a test system realizing the method. The method comprises the following steps: adopting a continuous logarithmic swept-frequency signal to stimulate an electro-acoustic component and collecting an acoustic response signal transmitted by the electro-acoustic component to be tested and a current response signal flowing through the electro-acoustic component to be tested; obtaining a frequency response curve and a phase curve after the acoustic response signal is filtered by an inverse filter, and calculating and obtaining a harmonic distortion curve after time domain processing is carried out on the frequency response curve; calculating and obtaining an impedance curve after inverse filter and time domain processing are carried out on the current response signal; and further analyzing a result curve and obtaining results, such as sensitivity, polarity, rated impedance, linear parameters and the like. The test system comprises a test instrument, an amplifier, a current measurement module and a microphone.

The present invention discloses a robot automatic scanner through combination of multi-scanning modes and a scanning method thereof. The device comprises a six-axis manipulator arm, an MEMS scanning galvanometer laser three-dimensional measuring head, and a rotary table; and the MEMS scanning galvanometer laser three-dimensional measuring head mainly comprises a remote scanning camera and a close-range scanning camera, and the scanning measuring head is installed at the tail end of the six-axis manipulator arm. The remote scanning camera is configured to perform rapid measurement of the surface of an object to obtain whole point cloud data of the object and perform scanning path planning of the point cloud data. The close-range scanning camera is configured to perform high-precision measurement of the surface of the object along the planned measurement path.

The present invention relates to methods for efficient adaptive measurement and classification of contrast sensitivity functions and spatiotemporal contrast sensitivity surface by selecting the most informative stimulus before each trial. Also disclosed are devices for implementing such methods.

The invention relates to the field of precise engineering survey, in particular to a method for rapidly measuring a foundation pile control net (CPIII) of a rapid transit railway on the basis of movable laser radar measuring technology and high-speed digital imaging technology. control net (CPIII) measurement data is obtained by using a movable high-precision measurement system comprising a laser scanner (1), a GPS/IMU positioning and orientating system (2), a high-speed digital imaging system (3), an industrial computer (4) and a power supply device (5); and united weighted adjustment is carried out on advanced net data, united measured data and auxiliary measurement points extracted from images to obtain high-precision control net (CPIII) control point coordinates. The invention can greatly shorten the measurement time of the control net (CPIII), overcomes the defect of little total correlation of discrete single-point measurement, carries out integral adjustment on all control points, has good closing property and high relative precision, obtains plane and elevation coordinates of all control points, and greatly simplifies the measurement work of the control net (CPIII).

The resistance measuring method and device is especially suitable for quickly measuring small resistance and varying resistance according with Ohmí»s law. The resistance measuring device includes constant-current pulse source, four-end network containing the measured resistance, high input impedance amplifier, real-time measuring and automatic recording display circuit for voltmeter, and digital millivoltmeter. It measures resistance through generating constant-current pulse, producing voltage drop on the measured resistance, amplifying the voltage drop, automatic conversion between reading state and holding memory state and recording and displaying voltage drop. During measuring resistance change, given voltage synchronous with the constant-current pulse is added into the four-end network, and the varying voltage drop the constant-current pulse produces on the measured resistance is measured by means of potential approaching method and further differential method.

The invention discloses a method and a device thereof for measuring three-dimensional topography of a nano structure, which can simultaneously measure three-dimensional topography parameters such as line width, depth, side corner, line edge roughness, line width roughness and the like of the nano structure. The method comprises the following steps of: performing splitting, polarization and front and back phase compensation on light beams with wavelengths in ultraviolet to near-infrared wave band to obtain elliptical polarized light and projecting the elliptical polarized light for later measurement; acquiring surface reflected zero-level diffraction signals of the to-be-measured structure, and obtaining a measurement Mueller matrix of the nano structure by calculation; and matching the measurement Mueller matrix and a theoretical Mueller matrix, and obtaining a three-dimensional topography parameter value of the to-be-measured nano-scale structure. The device provided by the invention for measuring the three-dimensional topography parameter of the nano structure can provide a non-contact, nondestructive, low-cost and quick measurement means for one-dimensional and two-dimensional sub-wavelength periodic structures in processes of photo-etching, nano impressing and the like of an image transfer-based batch manufacturing method.

A scanning probe microscope has an XY scanner for making a probe scan a sample surface, an approach and separate drive element for making the probe approach to the sample surface at a sampling position and separate the probe from the sample surface during movement between the sampling positions, and a servo controller for holding the distance between the probe and the sample surface at a reference distance during measurement at the sampling position. A plurality of scattered measurement locations are set away from each other as sampling positions. The approach and separation movements are performed at each sampling position. When measuring the surface by the probe at a sampling position and while making the probe move between sampling positions, servo control by the servo controller is continued. This makes it possible to quickly measure the surface by a simple controller and possible to measure a wide area or measure a high aspect ratio. When making the probe approach to the sample surface for measurement at the sampling position, it is also possible to cause a scan motion for tandem movement at an equal speed and in the same direction as the scan motion by the XY scanner.

The invention discloses a rapid industrial robot tail end pose measuring device and a measuring method thereof. The rapid industrial robot tail end pose measuring device is characterized by comprising a planar rotating device, a concentric triaxial adjusting device, a magnetic base and a target ball. Firstly, an industrial robot is controlled to move to a point to be measured, then, the planar rotating device is controlled to drive the target ball to do circling motion, the position of the target ball is measured through a laser tracker, the concentric triaxial adjusting device can actively adjusts the direction of the target ball according to the motion of the planar rotating device to ensure that the target ball can reflect laser rays; according to a rotating plane and a trajectory circle center are fit according to measuring point data, a coordinate system (E) of the rapid tail end pose measuring device is established, a tail end pose in a measurement coordinate system (S) can be calculated; an expression of a flange pose in the measurement coordinate system (S) is further obtained through conversion matrix between a flange coordinate system (N) and the coordinate system (E) of the rapid tail end pose measuring device, and accordingly pose measurement of an industrial robot tail end is achieved.