15 results about "Wollaston prism" patented technology

The application belongs to the technical field of optical precision measurement, automation control and artificial intelligence, and particularly relates to an interference optical path for obtaining multiple information in single exposure and application thereof, the interference optical path comprising: rotating a polarization direction of a light source through a half-wave plate to obtain first linearly polarized light; the first linearly polarized light is evenly divided into reference light and test light by a common beam splitter; the reference light passes through a quarter-wave plate back and forth to obtain second linearly polarized light orthogonal to the first linearly polarized light; the test light is decomposed into third linearly polarized light and fourth linearly polarized light by a Wollaston prism; the third linearly polarized light and the fourth linearly polarized light irradiate on a measured object, pass through the Wollaston prism again after reflection, and are combined with the second linearly polarized light at the common beam splitter; the combined light beam is received by a polarization resolution camera and records interference signals.The application can realize absolute phase reconstruction in single exposure, and is suitable for measuring refractive index distribution of dynamic or environment-sensitive samples.

The utility model relates to the technical field of light beam separation angle measurement, and discloses a testing device for measuring a Wollaston prism light beam separation angle, which comprises a laser beam generator used for emitting a light beam; the first plane mirror is used for carrying out first reflection on the light beam emitted by the laser beam generator; the second plane mirror is used for carrying out second reflection on the light beam reflected by the first plane mirror; the sample objective table is used for placing a Wollaston prism sample and enabling the light beam reflected by the second plane mirror to enter the Wollaston prism sample; the light beam analyzer is used for receiving two light beams emitted by the Wollaston prism sample; the displacement driving motor is used for driving the light beam analyzer to move back and forth; the optical bread board is used for fixing the laser beam generator, the first plane mirror, the sample objective table and the displacement driving motor; the Wollaston prism beam splitting angle measuring device is high in moving precision and repeatability, and ensures that the Wollaston prism beam splitting angle is accurately measured and calculated.

The utility model relates to an intracavity frequency doubling laser, which comprises a pumping source, a light beam combiner and a bidirectional optical amplifier, and is characterized in that a first optical fiber collimator, a first Wollaston prism, a first roof prism, a first Faraday rotator, a polarizer, a frequency doubling crystal, a first reflection cavity mirror and a second reflection cavity mirror are sequentially arranged on one side of the bidirectional optical amplifier along an optical path; and a second optical fiber collimator, a second Wollaston prism, a second roof prism, a second Faraday rotator and a rectangular prism are sequentially arranged on the other side of the bidirectional optical amplifier along the optical path. According to the utility model, the two Faraday rotators and the polarizer are utilized, the oscillation of the linear polarization fundamental frequency laser is realized by using the non-polarization-maintaining gain fiber, the generation of the frequency doubling laser is realized through the frequency doubling crystal in the cavity, and finally the stable frequency doubling laser is output through the endoscope; the utility model has the characteristics of low manufacturing cost, high extinction ratio and high frequency doubling efficiency.

The application discloses a kind of dual-channel hyperspectral imaging device and method based on Sagnac interferometer.The incident light from target collimates after passing through pre-imaging objective, diaphragm and collimating objective, and is incident to Wollaston prism again after passing through polarizer, and Wollaston prism shears incident light into different direction o light and e light, and after passing through Sagnac waveband division shear structure, different waveband o light and e light produce different lateral shear amount, and are emitted along different directions, pass through polaroid array and filter array, and finally form spatially separated two different waveband interference images on area array detector by post-imaging objective.The application can obtain two groups of interference images under different wavebands by once push scanning, and realizes high-resolution spectral imaging under wide waveband range.

The application discloses a kind of shearing and carrier frequency independently adjustable common-path shearing interferometry imaging system and method, including coherent light source, the light beam of coherent light source is shot to the surface of measured object by beam expander, and measured object, lens one, diaphragm, lens two, Wollaston prism, polaroid, imaging lens, camera are sequentially arranged on the same axis with measured object.The application also discloses a kind of shearing and carrier frequency independently adjustable common-path shearing interferometry imaging method.The application uses the above-mentioned one kind of shearing and carrier frequency independently adjustable common-path shearing interferometry imaging system and method, the control of shear quantity and spatial carrier frequency in imaging system is distributed to different parts of imaging system, and adjustable near-zero shear quantity provides small enough shear force, to ensure that complex surface shape or deformation can be solved;When configuring the required near-zero shear quantity, the separate control of spatial carrier wave further ensures the well-distributed spatial spectrum.

This invention discloses a laser interferometric device for simultaneous measurement of straightness and displacement that is insensitive to angular errors. It comprises an interferometric optical path and a measurement mirror assembly. The measurement mirror assembly consists of a Wollaston prism, a cornerstone prism, and a beam splitter, forming a moving measurement mirror. As this measurement mirror moves, it generates two measurement beams with different Doppler frequency differences. These beams are received by two photodetectors, outputting two measurement signals. These signals, along with a reference signal from a dual-frequency laser, are processed by a signal processing board and a computer to obtain the straightness error and displacement of the measured object. This invention achieves simultaneous measurement of straightness and displacement within a single laser interferometric device through the combination of the Wollaston prism, cornerstone prism, and beam splitter. By utilizing the insensitivity of the Wollaston prism and cornerstone prism to angular errors, the influence of the angular error of the measured object on the straightness error and displacement measurement results is reduced, thus improving measurement accuracy and stability.

This application discloses a method and apparatus for generating light sheets. The apparatus, along the direction of light propagation, sequentially includes: a light source module having a laser for generating a laser beam; a polarization state pre-adjustment module configured to collimate and rotate the polarization direction of the laser beam; a Wollaston prism, wherein a laser beam whose polarization direction is rotated by the polarization state pre-adjustment module to form a 45° angle with the optical axis of the Wollaston prism is incident on the Wollaston prism, so that two beams of light are emitted from the Wollaston prism; a one-dimensional shaping module; a polarization adjustment and optical path compensation module; a dual-mirror synchronous scanning module; and an objective lens.

The invention provides a plasma plume density diagnosis system based on a Wollaston prism. The plasma plume density diagnosis system comprises a laser ablation subsystem, a differential interference subsystem, an image acquisition subsystem and a general subsystem, the laser ablation subsystem is used for generating plasma plume; the differential interference subsystem is used for providing a beam of high-quality and collimated continuous laser as probe light for interference measurement, realizing detection of a density field of plasma plume, and converting phase change caused by plasma into a recordable interference fringe pattern; the image acquisition subsystem is used for capturing a transient interference fringe pattern in a target material ablation process under accurate time sequence control; and the general subsystem is used for providing a stable and controllable experimental environment for a target ablation experiment. The device is high in anti-interference capability, high in measurement precision and high in temporal-spatial resolution, can realize clear imaging of the evolution process of transient plasma plume generated by laser ablation, and quantitatively inverts the distribution of a two-dimensional electron density field.

An optical device is provided that incorporates twin wavelength selective switches (WSSs), is compact, and avoids using a Wollaston prism. Additionally, the path lengths traversed by wavelength components through each WWS may be the same. The optical device may include a first subset and second subset of optical ports, where each of the first and second subsets can operate as an independent WSS. An optical arrangement of the optical device may support optical coupling between (i) any ports in the first subset of ports for light in a first polarization state and (ii) any ports in the second subset of ports for light in a second polarization state. The optical device may further include beam directing optics for coupling wavelength components of an optical beam from a focusing element to a programmable optical phase modulator and from the programmable optical phase modulator to the focusing element.

An optical device is provided that incorporates twin wavelength selective switches (WSSs), is compact, and avoids using a Wollaston prism. Additionally, the path lengths traversed by wavelength components through each WWS may be the same. The optical device may include a first subset and second subset of optical ports, where each of the first and second subsets can operate as an independent WSS. An optical arrangement of the optical device may support optical coupling between (i) any ports in the first subset of ports for light in a first polarization state and (ii) any ports in the second subset of ports for light in a second polarization state. The optical device may further include beam directing optics for coupling wavelength components of an optical beam from a focusing element to a programmable optical phase modulator and from the programmable optical phase modulator to the focusing element.

The application provides a kind of space charge measurement electrically excited ellipsometric joint detection system and method, the high voltage pulse source of the excitation part generates electric pulse, disturbs the space charge accumulated in the interior of insulating sample and excites elastic wave, the elastic wave is transmitted to the photoelastic sensor that is attached to the surface of polarization electrode, causes the refractive index change of sensor;Subsequently, the detection part adopts the ellipsometric measurement light path, is polarized after polaroid and is incident to photoelastic sensor, and the reflected light is decomposed into two orthogonal polarized lights by 1 / 4 wave plate and Wollaston prism in turn, and the light intensity difference is detected by balanced detector difference, so that the elastic wave signal is converted into electrical signal output.The physical isolation of detection end and high voltage loop is realized, and the breakdown risk of capacitive isolation is avoided;At the same time, since the detection laser does not need to be in direct contact with the sample, the damage of the original electric field distribution of the insulating sample by the full contact structure is eliminated, and the measurement result more truly reflects the original state of the internal space charge of the insulating sample.

Shearography systems provide independent setting of fringe frequency and shear magnitude by situating an interferometer with a tiltable reflector proximate a pupil plane of an imaging optical system. Fringe frequency can be selected based on a modified Savart plate. In other examples, a Wollaston prism or a polarization grating is translated with respect to an image sensor to vary shear magnitude while maintaining a substantially fixed fringe frequency.

The application relates to a device and a method for generating high-power broadband terahertz radiation by utilizing sulfur-doped gallium selenide crystals, which comprises a femtosecond laser, a beam splitter, a first reflector, a second reflector, an optical delay line, a mechanical chopper, a BBO frequency-doubling crystal, a sulfur-doped gallium selenide crystal, a terahertz horizontal polarizer, a zinc telluride crystal, a 1 / 4 wave plate, a Wollaston prism, a balanced detector and a lock-in amplifier, the first reflector and the second reflector are respectively arranged on two light paths split by the beam splitter, the mechanical chopper, the BBO frequency-doubling crystal, the sulfur-doped gallium selenide crystal, the terahertz horizontal polarizer, the zinc telluride crystal, the 1 / 4 wave plate, the Wollaston prism, the balanced detector and the lock-in amplifier are sequentially arranged along the light path, and the optical delay line is further arranged between the first reflector and the zinc telluride crystal. Compared with the prior art, the application has the characteristics of simple device, easy operation, operation at room temperature, high terahertz radiation power and wide frequency band.

The embodiment of the application discloses a kind of orthogonal polarized light control device, interferometer and grating displacement measurement system.Therein, by setting double-frequency laser and first Wollaston prism, wherein double-frequency laser emits first light beam and second light beam, the first light beam includes first linearly polarized light, the second light beam includes second linearly polarized light, the polarization direction of the first linearly polarized light is perpendicular to the second linearly polarized light;First Wollaston prism is used to emit the first linearly polarized light at first preset angle, and the second linearly polarized light is emitted at second preset angle, can realize two linearly polarized light of complete orthogonal.This embodiment of the application solves the problem that the existing laser is difficult to meet the requirement of the measurement system on the polarization of linearly polarized light, and can realize the incident light with high polarization linearity and orthogonality, to ensure that the polarization linearity of two light beams meets the measurement requirements.

The invention provides a dual-port chip communication signal error vector amplitude measurement system and method. The system comprises a dual-port chip to be detected, a first laser, a second laser, a first Wollaston prism, a second Wollaston prism, a first balance photoelectric detector, a second balance photoelectric detector, a first oscilloscope, a second oscilloscope, a bias voltage, a matching load, a reference clock, a data acquisition card and a computer. Wherein the input port and the output port of the dual-port chip to be tested are transmitted to the coplanar waveguide chip in a gold wire bonding mode; the first laser is used for generating excitation light; the second laser is used for generating detection light; the first balanced photoelectric detector and the second balanced photoelectric detector are respectively used for carrying out differential detection on the two beams of linearly polarized light, through the system, the stability of chip packaging is improved, the measurement frequency band of chip signal error vector amplitude measurement is widened, and a more accurate measurement result is obtained.