The invention discloses a
ceramic substrate surface defect intelligent identification method and
system based on multispectral imaging, and the method comprises the following steps: synchronously collecting multispectral images under a plurality of visible light and near-
infrared wavebands, constructing a
multispectral image stack, and completing dark field deduction, registration and geometric correction
processing; inputting the crack sensitive
wave band combination image into a CrackFormer crack identification network, extracting slender structure characteristics and positioning a crack area; inputting the
edge enhancement graph into an improved BDCN
edge detection network, extracting the contour structure of the
ceramic substrate, and identifying the position of a contour gap; a
chromatic aberration defect area is extracted through brightness difference calculation; and fusing the identification results of the three types of defects, and outputting a defect
mask pattern and structured defect information. According to the method, the multi-band image and the
deep learning model are fused, and the accuracy and adaptability of
ceramic substrate defect detection are improved.