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514 results about "Aliasing" patented technology

In signal processing and related disciplines, aliasing is an effect that causes different signals to become indistinguishable (or aliases of one another) when sampled. It also often refers to the distortion or artifact that results when a signal reconstructed from samples is different from the original continuous signal.

Monitoring method for time reversal damage to no-datum Lamb wave of engineering structure

InactiveCN102998370AAchieving focus reconstructionEliminate scalabilityAnalysing solids using sonic/ultrasonic/infrasonic wavesEllipseEngineering
The invention discloses a monitoring method for time reversal damage to no-datum Lamb wave of an engineering structure. The monitoring method comprises the following steps of: distributing a group of excitation/sensing arrays on a structure to be monitored; building detection channels, and collecting Lamb wave response signals of all excitation/sensing channels; intercepting the response signals, and then conducting time reversal to obtain time reversal structure response signals; loading the time reversal structure response signals onto corresponding excitation, and collecting time reversal focusing structure response signals on the corresponding sensing; and in the time reversal focusing structure response signals of all the detection channels, extracting the occurrence time difference of focusing main wave crest and sidelobe signals, taking the occurrence time difference as a characteristic parameter, calculating to obtain the position and approximate range of the damage by adopting an ellipse positioning method, and analyzing and judging the health condition of the structure to be detected. With the method, the wave packet extension and signal aliasing caused by frequency dispersion can be eliminated, no-datum active positioning and detection to the Lamb wave can be realized, and the healthy monitoring practicalization of the structure can be benefited.
Owner:NANJING UNIV OF POSTS & TELECOMM

Double frequency laser grating interference two-dimensional measurement method and system with optical aliasing resistance

ActiveCN103604375AEliminate Optical Frequency AliasingEliminate polarization aliasingUsing optical meansGratingBeam splitter
The invention discloses a double frequency laser grating interference two-dimensional measurement method and system with optical aliasing resistance, and belongs to a grating measurement technology. The system comprises a laser device, a grating interference mirror set and a photoelectric detection and signal processing unit. Two laser beams which are simultaneously output by the laser device, different in frequency and separated in space enter a polarizing beam splitter in parallel and in an incident mode. The first laser beam enters a reference grating in an incident mode after being reflected by the polarizing beam splitter to form multiple reference diffraction laser beams with multiple levels, the second laser beam enters a measurement grating in an incident mode after being transmitted by the polarizing beam splitter to form multiple measurement diffraction laser beams, three of the reference diffraction laser beams are sequentially and correspondingly joint with the 0 laser beam, the +1 laser beam and the -1 laser beam in the measurement diffraction laser beams respectively to form an optical beat frequency, and two-dimensional relative motion information of the measurement grating is acquired through photoelectric detection and signal processing. By the adoption of the method and system, optical frequency aliasing, polarization state aliasing and corresponding periodic non-linear errors caused by traditional incomplete polarizing beam splitting are eliminated, and combination properties of a photoetching machine ultra-precise workpiece table position measurement system can be improved when the double frequency laser grating interference two-dimensional measurement system is used for the photoetching machine ultra-precise workpiece table position measurement system.
Owner:HARBIN INST OF TECH

Two-dimensional sub-pixel sampling-based super-resolution display method and device

The invention discloses a two-dimensional sub-pixel sampling-based super-resolution display method and a two-dimensional sub-pixel sampling-based super-resolution display device. Based on the characteristic of diversity of R, G and B primary color sub-pixel arrangement of flat panel display equipment, a Nyquist frequency limiting region of each primary color sub-pixel arrangement is calculated, and a group of R, G and B primary color anti-aliasing filters is designed on the basis of the calculated Nyquist frequency limiting region of each primary color sub-pixel arrangement, so that the aim of weakening and even eliminating the aliasing introduced by sub-pixel sampling is fulfilled while a high image sensing resolution is kept. According to the method and the device, corresponding anti-aliasing filtering is applied to R, G and B primary color components of an original image respectively, and then sub-pixel sampling is performed on the filtered image according to the spatial position structure of the two-dimensional sub-pixel arrangement of the display equipment. The visual perception resolution of the flat panel display equipment is improved at a lower cost on the premise of not changing any physical attribute, super-resolution display of the display equipment is realized, and meanwhile, the method is simple and easy to implement.
Owner:XIAN NOVASTAR TECH

Demosaicing method and device of image sensor

ActiveCN104539919ASuppress bright color aliasingWeaken artificial traces such as "grid"Image enhancementPicture signal generatorsGamutImage resolution
The invention discloses a demosaicing method and device of an image sensor. The method includes the steps that 2*2 serves as shortest sampling cycles, an original RAW image obtained through the image sensor with four different filters exists in each shortest sampling cycle is taken as an output result formed after original color gamut images of four full breadths are added through a sampling function; the conversion relations between brightness, chrominance components and the original color gamuts corresponding to the four filters of the image sensor are defined, and each RAW image is taken as an output result generated after adding brightness and the chrominance components of the four full breadths through the sampling function; demosaicing computation is carried out on the brightness and the three chrominance components, and a brightness and chrominance signal of a current pixel position is restored from input RAW data; a corresponding original color gamut image signal is obtained by converting the brightness and chrominance signal of the current pixel position through matrix operation after demosaicing. The method and device can solve the problems that the resolution ratio of output images after demosaicing is low and bright color aliasing is severe.
Owner:SHANGHAI FULLHAN MICROELECTRONICS

Double frequency laser grating interference three-dimensional measurement method and system with optical aliasing resistance

ActiveCN103604376AEliminate Optical Frequency AliasingEliminate polarization aliasingUsing optical meansGratingBeam splitter
The invention discloses a double frequency laser grating interference three-dimensional measurement method and system with optical aliasing resistance, and belongs to a grating measurement technology. The system comprises a laser device, a grating interference mirror set and a photoelectric detection and signal processing unit. Two laser beams which are simultaneously output by the laser device, different in frequency and separated in space enter a polarizing beam splitter in parallel and in an incident mode. The first laser beam enters a reference grating in an incident mode after being reflected by the polarizing beam splitter to form multiple reference diffraction laser beams with multiple levels, the second laser beam enters a measurement grating in an incident mode after being transmitted by the polarizing beam splitter to form multiple measurement diffraction laser beams, five of the reference diffraction laser beams are sequentially and correspondingly joint with the (0, 0) level laser beam, the (0, +1) level laser beam, the (0, -1) level laser beam, the (+1, 0) level laser beam and the (-1, 0) level laser beam in the measurement diffraction laser beams respectively to form an optical beat frequency, and three-dimensional relative motion information of the measurement grating is acquired through photoelectric detection and signal processing. By the adoption of the method and system, optical frequency aliasing, polarization state aliasing and corresponding periodic non-linear errors caused by traditional incomplete polarizing beam splitting are eliminated.
Owner:HARBIN INST OF TECH

Method for realizing fourier transform profilometry by using binary encoding strategy

The invention discloses a method for realizing fourier transform profilometry by using a binary encoding strategy. A high-frequency sine structure light pattern is decomposed into a series of binary encoding patterns according to a bit plane; a binary pattern sequence is projected to a three-dimensional target by using a projection device; synchronous photographing is performed by using a photographing device; binaryzation treatment is performed on a photographed binary image; a high-frequency sine structure light image is synthesized according to correspondence of the bit plane and a gray level image; the synthesized sine structure light image is treated by using the fourier transform profilometry to obtain a truncated phase; the truncated phase is subjected to phase unwrapping to obtain an absolute phase; the three-dimensional coordinate of the surface of an object is calculated by using the absolute phase and system calibration parameters. The method can be used for measuring the three-dimensional surface shape of the object with diffuse reflection characteristic. According to the method, the problem of spectrum aliasing and background light interference existing in the conventional fourier transform profilometry can be effectively avoided; the method has higher measurement accuracy.
Owner:SICHUAN UNIV
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