Method for realizing fourier transform profilometry by using binary encoding strategy

A binary encoding and Fourier transform technology, applied in the field of optical three-dimensional sensing, can solve the problems of spectrum aliasing and spectrum aliasing in the camera-projector system, to overcome the problem of spectrum aliasing and background light interference, Rodness, the effect of suppressing random noise

Active Publication Date: 2015-01-28
SICHUAN UNIV
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Problems solved by technology

[0003] The purpose of the present invention is to solve the problem of spectrum aliasing caused by the traditional Fourier transform profilometry due to the spatial variation of background brightness and object reflectivity, random noise, and the nonlinearity of the camera-projector system, and propo

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  • Method for realizing fourier transform profilometry by using binary encoding strategy

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Embodiment Construction

[0010] The present invention will be described in further detail below in conjunction with the accompanying drawings and working principles.

[0011] attached figure 1 It is a structural diagram of the three-dimensional measurement system of the present invention. The device used has a CASIO XJ-M140 projector, and the projector buffer frame size is pixels, the gray quantization level is 8bit, the maximum output frequency of the projector is 150 frames / s; 1 Prosilica GC650 industrial camera, the resolution is pixel, the gray scale is 8bit, and the maximum capture frequency of the camera is 62 frames / s; a computer with Core i3 3530 CPU and 4GB memory controls the structured light projection and shooting process by the computer. attached figure 2 It is the flow chart of the Fourier transform profilometry of binary coding in this embodiment. The specific implementation steps of this example are as follows:

[0012] (1) Calibrate the camera and projector, and obtain the si...

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Abstract

The invention discloses a method for realizing fourier transform profilometry by using a binary encoding strategy. A high-frequency sine structure light pattern is decomposed into a series of binary encoding patterns according to a bit plane; a binary pattern sequence is projected to a three-dimensional target by using a projection device; synchronous photographing is performed by using a photographing device; binaryzation treatment is performed on a photographed binary image; a high-frequency sine structure light image is synthesized according to correspondence of the bit plane and a gray level image; the synthesized sine structure light image is treated by using the fourier transform profilometry to obtain a truncated phase; the truncated phase is subjected to phase unwrapping to obtain an absolute phase; the three-dimensional coordinate of the surface of an object is calculated by using the absolute phase and system calibration parameters. The method can be used for measuring the three-dimensional surface shape of the object with diffuse reflection characteristic. According to the method, the problem of spectrum aliasing and background light interference existing in the conventional fourier transform profilometry can be effectively avoided; the method has higher measurement accuracy.

Description

technical field [0001] The invention relates to optical three-dimensional sensing technology, in particular to three-dimensional surface shape measurement of space objects based on Fourier transform profilometry. Background technique [0002] Fourier transform profilometry (Fourier Transform Profilometry, referred to as FTP) is a widely used non-contact optical three-dimensional measurement technology, the paper "Su, X., & Chen, W. (2001). Fourier transform profilometry: a review . Optics and lasers in Engineering , 35 (5), 263-284” introduced the principle of Fourier transform profilometry in detail. Because Fourier transform profilometry generally only needs one frame of high-frequency structured light pattern, its remarkable advantage is that it can perform real-time monitoring of moving objects. Three-dimensional measurement. The core step of Fourier transform profilometry is to use a band-pass filter to filter out the DC component and higher harmonics in the frequency...

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Application Information

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IPC IPC(8): G01B11/25
Inventor 刘凯龙云飞郑晓军吴炜杨晓敏
Owner SICHUAN UNIV
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