In order to solve the problems of imperfect surface defect detection information, low precision, low efficiency and the like, the invention provides a defect detection method based on a polarization
structured light imaging technology and an improved
Mask RCNN. The method comprises the following steps: firstly, combining polarization
processing with
structured light three-dimensional imaging to obtain a high-definition two-dimensional physical graph and three-dimensional space information of an object; performing median filtering
processing on the two-dimensional physical graph; secondly, on the basis of a
Mask RCNN target recognition method, adding a K-means
algorithm to carry out clustering analysis on a
training set, adding branches with side edge connection from top to bottom to an original FPN structure, and combining lower-layer high-resolution features and upper-layer high-resolution features to generate a new feature map; detecting an image with defects by utilizing the improved
Mask RCNN network, and classifying, positioning and segmenting the defects; finally, obtaining a series of information such as the type, position, length, width, depth and area of the defect throughdata arrangement, achieving quantification of defect data, and the object surface defect detection precision and efficiency are effectively improved.