The application discloses a method for measuring close-packed hexagonal
lattice constant based on space
plane fitting, which comprises the following steps: firstly, obtaining the X-
ray diffraction spectrum of a close-packed hexagonal
crystal and indexing; secondly, converting the
crystal plane spacing formula into a three-dimensional space
plane equation through mathematical transformation; thirdly, calculating a plurality of groups of data according to the measured
diffraction angle and performing space
plane fitting to obtain a space
plane equation containing an intercept; fourthly, introducing a
goniometer zero drift error correction quantity to perform multiple iteration correction on the measured angle until the absolute value of the intercept of the fitting plane tends to be zero, so that the accurate value is obtained; and finally, calculating the high-precision
lattice constant. The application converts the complex parameter fitting problem into an intuitive space
plane fitting and intercept correction process, has clear principle and strong
operability, and effectively improves the
measurement precision of the close-packed hexagonal
lattice constant.