184 results about "Two dimensional detector" patented technology

Systems and methods for obtaining two-dimensional images of an object, such as a patient, in multiple projection planes. In one aspect, the invention advantageously permits quasi-simultaneous image acquisition from multiple projection planes using a single radiation source.

An imaging apparatus comprises a gantry having a central opening for positioning an object to be imaged, a source of radiation that is rotatable around the interior of the gantry ring and which is adapted to project radiation onto said object from a plurality of different projection angles; and a detector system adapted to detect the radiation at each projection angle to acquire object images from multiple projection planes in a quasi-simultaneous manner. The gantry can be a substantially “O-shaped” ring, with the source rotatable 360 degrees around the interior of the ring. The source can be an x-ray source, and the imaging apparatus can be used for medical x-ray imaging. The detector array can be a two-dimensional detector, preferably a digital detector.

A scalable imaging spectrometer, using anamorphic optical elements to form an intermediate focus in only one dimension. Light reflects off an object to form an incident beam. The beam reflects off an anamorphic objective mirror to form a line focus at a slit. At the slit, the beam is focused along the spectral dimension, but remains substantially collimated along the spatial dimension. The beam is then recollimated in the spectral dimension by a second anamorphic mirror, reflects off a diffraction grating, passes through a lens, and is brought to focus on a two dimensional detector, which produces both spectral and spatial information about the object. Because there is no intermediate focus in the spatial dimension, there are no off-axis aberrations from the anamorphic mirrors, and the field of view may be substantially increased over prior art spectrometers in the spatial dimension.

A CT imaging system includes a two-dimensional detector array and an x-ray source that both revolve around the subject during a scan. The x-ray source produces a cone beam of x-rays and the focal point of this cone beam is electrically moved to different locations along the z-axis to increase the z-axis extent of the ROI that can be imaged without patient table movement. Different focal point scan patterns are described for a variety of different clinical applications.

A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.

The present invention is directed to an ophthalmologic measurement method which can depict three-dimensional structures of the interfaces of an eye by short-coherence interferometry based on reference points. For this purpose, the pupil is illuminated at a plurality of points by a short-coherence illumination source. The measurement beam reflected at these points by the interfaces and surfaces of the eye is superimposed with a reference beam. The measurement data which are generated in this way are spectrally split by a diffraction grating, imaged on a two-dimensional detector array and conveyed to a control unit which determines a three-dimensional structure of all intraocular interfaces and surfaces of the eye. In the suggested Fourier domain OCT method, the depiction of three-dimensional structures is preferably carried out by spline surfaces or polygon surfaces. In doing so, it is possible to determine the depth positions of the measurement beams in many points of the pupil with a single recording of the array camera in that the pupils are illuminated by a diaphragm grid and the reference mirror contains a periodic phase grid.

A spectroscopic beam profile metrology system simultaneously detects measurement signals over a large wavelength range and a large range of angles of incidence (AOI). In one aspect, a multiple wavelength illumination beam is reshaped to a narrow line shaped beam of light before projection onto a specimen by a high numerical aperture objective. After interaction with the specimen, the collected light is passes through a wavelength dispersive element that projects the range of AOIs along one direction and wavelength components along another direction of a two-dimensional detector. Thus, the measurement signals detected at each pixel of the detector each represent a scatterometry signal for a particular AOI and a particular wavelength. In another aspect, a hyperspectral detector is employed to simultaneously detect measurement signals over a large wavelength range, range of AOIs, and range of azimuth angles.

An instrument and method for scanning a large specimen comprises a specimen holder to support the specimen, an optical system to focus an image of a series of parallel object planes onto one of a two dimensional detector array, multiple linear arrays, multiple TDI arrays and multiple two-dimensional arrays. The detector array has a detector image plane that is tilted relative to the series of object planes in a scanned direction to enable a series of image frames of the specimen to be obtained in order to produce a three-dimensional image of at least part of the specimen with data from each row of the image frame representing a different plane in the three-dimensional image.

A sample S is irradiated with a two-dimensionally spread ray of laser light to simultaneously ionize substances within a two-dimensional area on the sample. The resultant ions are mass-separated by a TOF mass separator 4 without changing the interrelationship of the emission points of the ions. The separated ions are then directed to a two-dimensional detector section 7 through a deflection electric field created by deflection electrodes 61 and 62. The two-dimensional detector section 7 consists of a plurality of detection units 7a arranged in parallel, each unit including an MCP8a, fluorescent plate 9a and two-dimensional array detector 10a. The magnitude of deflecting the flight path of the ions by the deflection electric field is changed in a stepwise manner with the lapse of time from the generation of the ions so that a plurality of mass analysis images are sequentially projected on each detection unit 7. When the mass analysis image shifts from one detection unit to another, the data acquisition operation by the two-dimensional array detector in the previous detection unit is discontinued. As a result, a predetermined number of the latest images are held inside the detector. Thus, the measurement time can be extended to widen the measurable mass-to-charge ratio range, while ensuring a high mass resolution.

A quality control accessory (QC accessory) is provided which is adapted for use in linear accelerator quality control or in verification of an arbitrary isocentric radiation treatment plan of a patient or radiation sensitive body. The accessory includes an absorber, a detector and an optional orientation device. The absorber is rotationally symmetric, preferably spherical or hemispherical. The detector is adapted to be fixed in a stationary spatial relationship with respect to the absorber. The optional orientation device is adapted to maintain the two dimensional detector (2d detector) and the absorber in a fixed relative spatial relationship with respect to the beam focus of the linear accelerator, when the gantry is rotated, so that the central axis of the beam is essentially orthogonal to the 2d detector and the phantom axis of symmetry is parallel to or aligned with the central axis of the gantry rotation axis.

A distance of flight (DOF) approach to mass spectroscopy in which the resolution among the various ion masses is accomplished in space rather than time. A separate detector is associated with each ion mass resolution element. The DOF mass spectrometer can serve as one element in a tandem arrangement which has the capability to produce a full two-dimensional precursor/product spectrum for each bunch of ions extracted from the source. A “distance-of-flight” (DOF) mass analyzer is used in combination with time-of-flight (TOF) mass analysis for precursor and product dispersion. All the precursor ions can undergo a mass changing reaction simultaneously, while still retaining the essential information about the particular precursor m/z value from which each product ion m/z value emanated. Through the use of a two-dimensional detector, all the products ions from all the precursors can be detected for each batch of ions analyzed.

A computer-based stroboscopic interferometric microscope system for measuring the topography of a microscopic vibratory object includes an interferometric microscope equipped with a multiple-color (e.g., LED) or white-light source, a mechanical scanning apparatus for varying the optical path difference between the vibratory object and a reference surface, a camera having a two-dimensional detector array, and digital signal processing apparatus for determining surface height from interference data. Interferograms for each of the detector image points in the field of view are generated simultaneously by scanning the object in a direction approximately perpendicular to the object surface illuminated stroboscopically while recording detector data in digital memory. Recorded interferograms for each image point are then transformed into the spatial frequency domain by Fourier analysis, and the surface height for each corresponding object surface point is obtained by examination of the complex phase as a function of spatial frequency. A complete three-dimensional image of the object surface is then constructed from the height data and corresponding image plane coordinates. The three-dimensional image may be presented on a display or hard copy or written to a storage medium.

An array surface plasmon resonance (SPR) analysis instrument comprising a reflective SPR sensor array, a light source assembly arranged to project a collimated beam of light onto the reflective SPR sensor array to provide a reflected array image of the sensor array, and to scan the incident angle of the collimated beam of light over an angular range, and a detector assembly oriented to receive the reflected array image of the sensor array over the angular range, the detector assembly comprises a two-dimensional detector sensing element that is tilted with respect to the optical axis of the lens assembly in accordance with the Scheimpflug condition, and a lens assembly for focusing the reflected array image of said SPR sensor array onto said tilted detector sensing element. The lens assembly comprises an objective section which is arranged to produce a virtual image of the tilted reflected array at infinity, followed by an imaging section arranged to transform the virtual image of the tilted reflected array into a real tilted image on the tilted detector sensing element.

Methods and apparatuses for advanced, multiple-projection, dual-energy X-ray absorptiometry scanning systems include combinations of a conical collimator; a high-resolution two-dimensional detector; a portable, power-capped, variable-exposure-time power supply; an exposure-time control element; calibration monitoring; a three-dimensional anti-scatter-grid; and a gantry-gantry base assembly that permits up to seven projection angles for overlapping beams. Such systems are capable of high precision bone structure measurements that can support three dimensional bone modeling and derivations of bone strength, risk of injury, and efficacy of countermeasures among other properties.

A technique for modifying data of an image, such as can be implemented in a still camera or video recorder in order to correct for defects in its optical and/or electronic systems, includes generating data to modify the image as a function of radial position across it. A variation of the intensity across an image (lens shading) that appears in data from a two-dimensional detector is an example of an application of the technique. In order to make modifications to the data, positions of a two-dimensional raster scan pattern of an image sensor are converted to radial positions and this is then used to generate the modification data. The modification data is generated on the fly, at the same rate as the image data is being acquired, so that the modification takes place without slowing down data transfer from the image sensor.