6 results about "Polarized light microscopy" patented technology

The application discloses a kind of detection semiconductor light-emitting chip's polarized microscopy system and method, system includes chip excitation module, incident illumination modulation module, microscopic adjustment module, exit imaging module and control and image processing module.The application is continuously polarized by control module to incident illumination modulation module Modulation, modulated incident light is acted on light-emitting chip exit end face by microscopic system module, simultaneously using control module to adjust exit imaging module and carry out real-time image collection, obtain the polarized parameter image of exit end face by image processing module;Close incident illumination module, after using chip excitation module to excite light-emitting chip, adjust three-dimensional platform and exit imaging module by control module, real-time image collection, finally obtain the polarized parameter diagram of near-field light spot by image processing module.The application has very strong characterization ability and high sensitivity to the end face structure and near-field light spot of semiconductor light-emitting chip.

The invention relates to the technical field of optical imaging, and discloses a dark field polarized light microscopic imaging device, which comprises a dark field illumination light source; the light beam shaping system is arranged behind the light path of the dark field illumination light source; the polarizer is arranged behind the light path of the light beam shaping system; the dark field illumination ring is arranged behind the light path of the polarizer; the microscope objective is used for collecting signal light from the sample; the dark field imaging ring is arranged in an imaging light path of the microscope objective; the polarization analyzer is arranged behind the light path of the dark field imaging ring; and an imaging camera. The device provided by the invention has the advantage of high-sensitivity detection of a nano-scale scatterer by a dark-field microscope, and also obtains the capability of identifying and analyzing a material by a polarizing microscope by utilizing polarization characteristics, so that the signal-to-noise ratio and contrast ratio of imaging built-in nano impurities or defects in a strong birefringence material are remarkably improved; the problem of background interference which cannot be overcome by a single technical means is solved.

A method of calibrating a polarized light microscope comprises placing an optical data storage medium in a sample stage of the polarized light microscope, the optical data storage medium comprising a substrate having birefringent voxels embedded therein; measuring a background birefringence of the optical data storage medium; adjusting the polarized light microscope to compensate for the background birefringence. By correcting for background birefringence, image contrast may be improved. Further improvements may be obtained by optimizing swing angles of measurement states after compensating for the background birefringence. Also provided is a method of reading data from a birefringent optical data storage medium, and a system useful for implementing the methods.

The application discloses a polarized microscopic image material structure segmentation and identification method and device, relates to the technical field of image segmentation, and comprises the following steps: acquiring a polarized microscopic image of a sample to be measured; inputting the polarized microscopic image into a pre-trained mixed segmentation network to obtain an initial segmentation mask at a pixel level; and performing post-processing on the initial segmentation mask to obtain a final mask; wherein the post-processing at least includes connected domain filtering, hole filling and boundary smoothing; and based on the final mask, the area proportion of each type of material structure in an effective area is counted. The application realizes end-to-end automatic pixel-level segmentation and quantitative analysis of material structures in a polarized microscopic image, and significantly improves the identification efficiency, global consistency and anti-interference robustness.

The invention discloses an isosteviol crystal form I as well as a preparation method and application thereof, the isosteviol crystal with the crystal form I has obvious characteristic diffraction peaks at least at positions of 9.98, 13.54, 15.88, 16.60, 17.26, 18.56, 19.30, 20.76 and 26.04 of 2 theta angles (+ / -0.02) expressed by degrees through X-ray powder diffraction analysis measured by a Cu-K alpha ray, and the isosteviol crystal with the crystal form I has the characteristic diffraction peaks at least at positions of 9.98, 13.54, 15.88, 16.60, 17.26, 18.56, 19.30, 20.76 and 26.04 of the 2 theta angles (+ / -0.02) expressed by degrees. The crystal is characterized by chemical analysis means such as X-ray powder diffraction analysis (XRD), thermogravimetric analysis (TG), a polarizing microscope and infrared spectroscopy (IR), the crystal has the advantages of high crystallinity, high stability, high biological accessibility and the like, the crystal structure of the crystal is still kept stable after the crystal is placed at normal temperature for 12 months, and the crystal has a good application prospect. The method is suitable for wider application fields.

The traditional Chinese medicine diagnosis and treatment equipment comprises a shell, a detection mechanism is installed on one side of an inner cavity of the shell, the detection mechanism comprises a carrier assembly and an analysis assembly, the carrier assembly comprises a guide rail and a carrying disc, and the carrier assembly is used for bearing urine test paper; the analysis assembly comprises a mounting plate, a polarized light microscope and an electrochemical sensor. Through the shell, the detection mechanism, the control main board, the touch screen, the printer and the wiring board, the effect of diagnosing the calculus-prone constitution is achieved, the detection mechanism can analyze and detect basic information of urine, the control main board is used for summarizing and processing the detection information, and the detection result is more accurate. The whole mode is scored through the questionnaire generated by the control main board, the urine analysis result is obtained through the detection mechanism, and through double scoring of the whole mode and the local mode, calculus recurrence constitution diagnosis can be more accurate, and prevention can be more accurate.