The invention discloses a visual observing system for observing growth design of a microcrystalline silicon film in real time and a measurement method, which effectively improve the defect that a traditional polarization microscope is relatively low in resolution in an observing process. The visual observing system for the growth process of the microcrystalline silicon film comprises a light source, a pinhole, a polarizer, a 1 / 4 wave plate, a convergent lens, a beam splitting prism, a vertical objective lens, a sample, an objective table, a polarization analyzer, a CCD camera and a computer. The visual observing system has the beneficial effects that a scanning problem in a traditional film thickness detection method is effectively improved, the continuous dynamic detection of the film is realized, the detection efficiency and precision are improved, and the resolution is high; besides, the observing system disclosed by the invention is simple in structure, and the method is simple, convenient and feasible and is convenient to popularize.