Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.
11 results about "Transmittance spectra" patented technology
Filter
Efficacy Topic
Property
Owner
Technical Advancement
Application Domain
Technology Topic
Technology Field Word
Patent Country/Region
Patent Type
Patent Status
Application Year
Inventor
A UV-NIR spectrophotometer can precisely measure transmittance and reflectance spectra over a wide range of wavelengths, from the near-infrared region to the ultraviolet region. In this example, a UV-3700 UV-VIS-NIR spectrophotometer was used to measure the transmittance spectrum of a CD substrate and the reflectance spectra of silicon wafers.