Small-size test device for mechanical and electrical coupling characteristics

A characteristic testing, electrical technology, applied in the direction of measuring device, strength characteristics, testing material hardness, etc., to achieve the effect of small size and compact structure

Active Publication Date: 2012-02-15
JILIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a miniaturized testing device for mechanical and electrical coupling characteristics, which solves the problem

Method used

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  • Small-size test device for mechanical and electrical coupling characteristics
  • Small-size test device for mechanical and electrical coupling characteristics
  • Small-size test device for mechanical and electrical coupling characteristics

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Embodiment Construction

[0017] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.

[0018] see Figure 1 to Figure 5 , the miniaturized mechanical and electrical coupling characteristic testing device of the present invention comprises a Z-axis macro-motion adjustment mechanism 15, an XY-axis macro-motion adjustment mechanism 23, a piezoelectric precision drive press-in unit 10, a load signal detection unit 2, and a displacement signal detection unit 12 and a current signal detection unit, wherein the Z-axis macro-motion adjustment mechanism 15 is arranged on the base 18, the XY-axis macro-motion adjustment mechanism 23 is arranged on the inner surface of the upper support plate 8, and the base 18 is connected to the upper support plate 1 through the side support plate The plate 8 is connected; the piezoelectric precision drive press-in unit 10 is connected to the micro-movement slide table 9 of ...

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Abstract

The invention relates to a small-size test device for mechanical and electrical coupling characteristics and belongs to a mechanical-electrical integrated precise scientific instrument. The small-size test device mainly comprises a Z axis autoexec adjusting mechanism, an XY autoexec adjusting mechanism, a piezoelectric precise driving pressing unit, a load signal detection unit, a displacement signal detection unit and a current signal detection unit, wherein the Z axis autoexec adjusting mechanism is installed on a base; the XY autoexec adjusting mechanism is installed on an upper supportingplate; the piezoelectric precise driving pressing unit is connected to a micro-slipway; the precise displacement sensor is fixedly connected to the front end side face of the piezoelectric precise driving pressing unit; a strain foil rood beam for detecting a load signal is installed on a worktable of the Z axis autoexec adjusting mechanism; and the change of the electrical characteristic generated by materials in the test process is detected by using the principle of a diamond indenter anvil cell and a PCD (Polycrystalline Diamond) diamond indenter. The small-size test device provided by theinvention has the characteristics of compact structure, small volume and high precision and the like.

Description

technical field [0001] The present invention relates to a precision scientific instrument of electromechanical integration, in particular to a test device integrating macro drive, high-precision detection, mechanical properties of micro-nano materials, and mechanical and electrical coupling properties, especially a miniaturized mechanical and electrical coupling properties test device. Background technique [0002] The invention of the diamond anvil cell (abbreviated as DAC) is a technological revolution in the development of high-pressure technology. It is currently the only experimental device that can generate ultra-high hydrostatic pressure (higher than 100GPa). The strange phenomenon that materials will change under high pressure and ultra-high pressure has been generally recognized at home and abroad, and has been confirmed by many experiments. Through DAC, the transformation of metals and semiconductors, the transformation of electrons, and the transformation of mater...

Claims

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Application Information

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IPC IPC(8): G01N3/00G01N3/42
Inventor 赵宏伟耿春阳黄虎徐利霞张镇鹏张鹏
Owner JILIN UNIV
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