Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

498results about "Electric/magnetic depth measurement" patented technology

Method and apparatus for deriving novel sports statistics from real time tracking of sporting events

A method and apparatus for deriving performance statistics from real time tracking of a sporting event. The method according to the present invention includes a step of obtaining a spatio-temporal trajectory corresponding to the motion of an athlete and based on real time tracking of the athlete. The trajectory is then broken down so that performance information corresponding to the motion of the athlete (such as speed, distance covered, acceleration, etc.) can be derived with respect to time. The information so obtained can be stored in a database or the like for later retrieval or can be used to graphically supplement a video broadcast of a sporting event. The apparatus includes a device for obtaining the trajectory, a computational device for obtaining the performance information based on the obtained trajectory, and a statistical device for compiling the performance information. In particular, the spatio-temporal trajectory may be obtained by an operation on a video image of the sporting event, in which motion regions in the image are identified, and feature points on the regions are tracked as they move, thereby defining feature paths. The feature paths, in turn, are associated in clusters, which clusters generally correspond to the motion of some portion of the athlete (e.g., arms, legs, etc.). The collective plurality of clusters corresponds with the motion of the athlete as a whole.
Owner:LUCENT TECH INC +1

Hole measurement apparatuses

The present invention is directed to automated apparatuses and methods for measuring fastener hole depth, fastener length, countersink depth and / or hole diameters in a workpiece (or other object) in an automated and extremely rapid, efficient and accurate manner. The apparatuses may be operably connected with a power source and with one or a plurality of computers or other data collection devices to transmit fastener hole depth, countersink depth and / or hole diameter measurement data and / or information to them each time that a fastener hole is measured, while the apparatus is continuously measuring fastener holes (i.e., with no interruptions). Extremely advantageously, using only one hand, and by only squeezing a trigger only one time, an operator of such an apparatus may successfully and very rapidly and accurately perform more than one, or all three, of the following functions: (i) normalize the apparatus relative to one or a plurality of fastener holes and / or workpiece surfaces; (ii) make one or a plurality of accurate measurements; and (iii) transmit the one or more measurements from the apparatus to one or a plurality of computers and / or other data collection devices for, for example, recordation, storage, manipulation, other use and / or the like.
Owner:DELTA SIGMA

A high-precision instrumented indenter and a method for calculating the indentation depth of a diamond indenter

InactiveCN102288500AElimination of influences on indentation depth measurementsGuaranteed accuracyElectric/magnetic depth measurementInvestigating material hardnessComputer control systemProbe type
The invention discloses a design of an instrumented indenter. A driving and load testing system adopts a design that a voice-coil linear motor is connected in series with a load sensor and an indenting head subassembly; an indenting-in-sample depth testing system for a diamond indenting head adopts a design that three probe type capacitor displacement sensors are combined with a depth measuring follow-up disc; a computer control system is designed to have an open-loop working mode and a closed-loop working mode according to different test progresses, and can control the voice-coil motor, so as to control the diamond indenting head to carry out tests of indenting loading, load keeping, unloading and the like on the surface of a sample; and simultaneously, the relationship of an indenting load, an indenting depth and time can be obtained. By using the design, the influence on the measurement of an indenting-in-sample depth of the indenting head as the surface of the sample generates small-angle inclination with respect to a horizontal plane and the surface of the sample generates transitional displacement along a vertical direction due to a supporting factor or a clamping factor in a process that the sample is indented is eliminated; simultaneously, the influence of the flexibility of a frame on the measurement of the indenting-in-sample depth of the indenting head is also eliminated; and the precision of the indenting-in-sample depth of a testing indenting head is guaranteed.
Owner:ACADEMY OF ARMORED FORCES ENG PLA

Low-power consumption intelligent three-dimensional magnetic leakage detecting probe

The invention provides a low-power consumption intelligent three-dimensional magnetic leakage detecting probe, which is applied to magnetic leakage detecting equipment for defects such as the corrosion, the cracks and the like of a long-distance transmission pipeline, can realize high-precision multi-sensor detection (1,500 to 4,000 sensors) and low power consumption (one thirtieth to one two hundredths of the conventional equipment), and solves the key problem of the battery capacity of a magnetic leakage detector. The probe consists of a Hall sensor array, a time-sharing power supply module, a signal processing module and an intelligent controller, wherein the Hall sensor array is used for measuring magnetic leakage intensity in an X direction, a Y direction and a Z direction; the time-sharing power supply module is used for only supplying power to sampling sensors in a time-sharing mode so as to realize the low power consumption; the signal processing module is used for signal filtering, analogue/digital conversion and the like; the intelligent controller is a complex programmable logic device (CPLD), realizes time-sharing power supply control, data acquisition, data transmission and communication, and has high interference resisting capability.
Owner:中机生产力促进中心有限公司

Silicon through-hole test structure and corresponding test method

The invention discloses a silicon through-hole test structure which comprises a semi-conductor substrate, a silicon through hole, insulation layers, conducting materials, a heavily doped area, a dielectric layer and metal interconnection layers, wherein the silicon through hole is located inside the semi-conductor substrate, the insulation layers are located on the side wall and the bottom surface of the silicon through hole, the conducting materials are filled into the silicon through hole and located on the surfaces of the insulation layers, the heavily doped area is arranged to surround the silicon through hole and located inside the semi-conductor substrate, the dielectric layer is located on the surface of the semi-conductor substrate, and the metal interconnection layers are located on the surface of the dielectric layer. The conducting materials in the silicon through hole is in electricity connection with a first metal interconnection layer, and the heavily doped area is in electricity connection with a second metal interconnection layer, and the conducting materials in the silicon through hole is in electricity isolation with the heavily doped area. When polarization voltages are applied across the conducting materials of the silicon through hole and the heavily doped area, and then whether the insulation layers are judged complete or not through that whether leakage currents are measured between the conducting materials and the heavily doped area or not, and the depth of the silicon through hole is judged to reach a standard value or not through a measured capacitance value between the conducting materials and the heavily doped area, and the test process is simple and convenient.
Owner:SEMICON MFG INT (SHANGHAI) CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products