The invention relates to a
structured light three-dimensional measurement technology, and provides a
system joint calibration optimization method fusing three-dimensional offset modeling and phase identity constraint for an industrial field low-precision target scene. The method comprises the following core steps: introducing a three-dimensional offset for a target feature point, and compensating spatial deformation and eliminating scale
ambiguity through zero-mean constraint; sub-pixel matching is realized based on a phase identity principle, and projection constraint is enhanced to reduce dependence on a target; and constructing a joint
reprojection error function, and adjusting and synchronously optimizing
system parameters and offset by means of a
bundle method. The prior art depends on a high-precision plane target, and when the target has manufacturing errors, installation warping or pasting deformation, calibration errors can be transmitted through an imaging link, so that the
measurement precision is reduced, and target deformation and geometric errors of a
projector are difficult to compensate at the same time. The method breaks through the limitation of a traditional inverse camera model, does not need to depend on a high-precision glass target, reduces the hardware cost, and constructs a cooperative compensation mechanism of a target manufacturing error and an imaging parameter. Experiments show that after explicit compensation is carried out on the local deformation of the target by adopting the three-dimensional offset factor, the flatness error gt is detected; on a paper target of 10 microns, the re-projection error of the camera is reduced by 79.6%, and the re-projection error of the
projector is reduced by 74.8%; sub-pixel matching is achieved through phase identity constraint, multi-parameter collaborative optimization of
bundle adjustment is combined, the high-precision measurement requirement of an
industrial site is met, and an efficient solution is provided for high-precision three-dimensional measurement.