188 results about "Hamming code" patented technology

Decoding that uses an extended Hamming code in one of the primary stages of static encoding uses a calculation of the r+1 Hamming redundant symbols for k input symbols from which Hamming redundant symbols are calculated, where r satisfies 2r−1−r≦k<2r−r−1. This efficient method requires on the order of 2k+3r+1 XORs of input symbols to calculate the r+1 Hamming redundant symbols.

A Forward Error Correction (FEC) code compatible with the self-synchronized scrambler used by the 64B / 66B encoding standard for transmission on Serializer / Deserializer (SerDes) communications channel links. The FEC code allows encoding and decoding to occur before and after scrambling, respectively, so as to preserve the properties of the scrambling operation on the transmitted signal. The code allows the correction of any single transmission error in spite of the multiplication by three of all transmission errors due to the 64B / 66B scrambling process. A Hamming code is combined with a Bit Interleaved Parity code of degree n (BIP-n). These two codes provide for protection both for an error anywhere in the maximum length of the packet as well as for an error replicated two or three times by the descrambling process. All single bit errors, whether multiplied or not, have unique syndromes and are therefore easily correctable. In addition, the packet can be transported across multiple serial links for higher bandwidth applications without a degradation of the code efficiency. The Hamming code can be generated from any irreducible polynomial, such as H(x)=x10+x3+1. The BIP code is chosen to be of degree 6 to fit with 64B / 66B scrambling polynomial and is represented by B(x)=x6+1.

A system and method for data entry by an operator uses data containing a first component and a second component derived therefrom, wherein the second component has error detection and correction abilities therein. The second component of the entered data is used to detect and correct error in the data entered for the first component. The first and second components are preferably characters (e.g., representing GPS position information) entered via a data entry device, while the second component preferably comprises Hamming code. The detection and correction can be performed after data entry and again after signal transmission.

Data is read from a memory array. Before being stored in a data buffer, a Hamming code detection operation and a Reed-Solomon code detection operation are operated in parallel to determine if the data word has any errors. The results of the parallel detection operations are communicated to a controller circuit. If an error is present that can be corrected by the Hamming code correction operation, this is performed and the Reed-Solomon code detection operation is performed on the corrected word. If the error is uncorrectable by the Hamming code, the Reed-Solomon code correction operation is performed on the word.

A semiconductor storage device, a method of controlling the same, and an error correction system allow reduction in power consumption and circuit scale without detriment to error correction capability. An error correction code (ECC) circuit of a solid state drive (SSD) performs first error correction on read data using a first error correction code (Hamming code), and further performs second error correction on the result of the first error correction using a second error correction code (BHC code). Furthermore, the ECC circuit performs third error correction on the result of the second error correction using a third error correction code (RS code).

An apparatus being able to not only detect a manufacturing defect of an integrated circuit but also specify a position at which the defect occurs even when outputs from scan paths are compressed and stored, or when the number of the scan paths is large. The apparatus has a pattern generator built in an integrated circuit to generate test patterns, a plurality of shift registers formed in parallel, into which the test patterns are shifted, and an output compressor for compressing a plurality of outputs shifted out from the shift registers with check bits of a Hamming code, and outputting them to the outside of the integrated circuit.

Basic redundancy information is non-volatily stored in a reserved area of an addressable area of a memory array, and is copied to volatile storage therein at every power-on of the memory device. The unpredictable though statistically inevitable presence of failed array elements in such a reserved area of the memory array corrupts the basic redundancy information established during the test-on wafer (EWS) phase of the fabrication process. This increases the number of rejects, and lowers the yield of the fabrication process. This problem is addressed by writing the basic redundancy data in the reserved area of the array with an ECC technique using a certain error correction code. The error correction code may be chosen among majority codes 3, 5, 7, 15 and the like, or the Hamming code for 1, 2, 3 or more errors, as a function of the fail probability of a memory cell as determined by the EWS phase during fabrication.

In an error correcting method and an apparatus therefor using Hamming codes, a frame regulated by a synchronous network is divided into L blocks in the direction of row. Preferably, information bits and check bits are allocated to a payload portion and non-defined bits of an LOH portion, respectively. More preferably, the information bits and the check bits are divided into M sub blocks to form a Hamming code block. In addition, a code error correcting means rearrange each Hamming code block per bit and further preferable, a syndrome register with a plurality of banks operates an error syndrome of the Hamming code block, and based on the operation result, the code error correction of the Hamming code block is performed by a bank switchover.