Fault-tolerant asynchronous serial transceiver device based on field programmable gata array (FPGA)

Abstract

The invention provides a fault-tolerant asynchronous serial transceiver device based on a field programmable gata array (FPGA). The device comprises a data transmitter, a data receiver, an extended Hamming code encoder, an extended Hamming code decoder, a majority voter and a minority voter. Triple modular redundancy (TMR) processing is respectively conducted on all modules. As for the transmitter, firstly, to-be-sent data are sent to the extended Hamming code encoder by a data processing unit, encoded codons are sent to the majority voter by the encoder, the codons voted by the majority voter are sent to a serial transmitter, and parallel data are converted to serial data by the serial transmitter and are sent out. As for the receiver, serial input signals are input into the FPGA through a pin, serial-parallel converting of received data is achieved in the FPGA by a serial receiver, the serial data are converted to the parallel data by the serial receiver, and the parallel data are transmitted to the decoder.

Description

technical field [0001] The present invention relates to the technical field of communication and radiation resistance fault tolerance. It mainly involves the use of FPGA to implement radiation-hardened fault-tolerant asynchronous serial transceivers. Background technique [0002] With the continuous development of modern information technology, high-speed information transmission and high-reliability transmission have become the main development direction of information transmission. High reliability transmission is particularly important in spaceborne equipment and medical equipment. The ever-advancing integrated circuit technology has made VLSI more and more integrated, faster and lower power consumption, but at the same time, the node size of VLSI has become smaller and smaller, resulting in critical The decrease in charge reduces the single event effect (SEE) threshold of VLSI, which severely limits the application of high-performance VLSI in radiation environments suc...

AI Technical Summary

Problems solved by technology

To solve the problem of single event upset (SEU) and error detection and error correction in data communication when the transmitter and receiver of UART are irradiated by high-energy rays

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