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Storage equipment testing method and device and medium

A technology of storage device and testing method, which is applied in the field of testing, and can solve the problems of slow input command line speed, input errors, increased labor costs, etc.

Inactive Publication Date: 2018-04-20
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the limitation of the above method is that it is necessary to manually enter the command line to execute the test every time, which increases the labor cost of the test, but the overall speed of artificially inputting the command line is slow, and there may be input errors, which reduces the overall cost. Test efficiency

Method used

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  • Storage equipment testing method and device and medium
  • Storage equipment testing method and device and medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0040] figure 1 It is a flow chart of a storage device testing method provided by an embodiment of the present invention. Please refer to figure 1 , the specific steps of the testing method of the storage device include:

[0041] Step S10: Select the test command of the storage device, select the target keyword from the preset option keywords and assign parameters.

[0042] It should be noted that the test command referred to in this step is a collection of test methods pre-written according to the test content of the storage device. For example, the test command is used to test the data consistency of the storage device. In the test command Including a series of execution constraints related to the test content of data consistency, each execution constraint needs to be satisfied when executing the test command, the execution constraint is the command option of the test command, so the test can be executed by setting the command option during the test The corresponding exec...

Embodiment 2

[0050] On the basis of the above embodiments, as a preferred implementation manner, the command options specifically include:

[0051]Test equipment name options, test group number options, test data model options, test operation model options, test address assignment options, and test cycle count options.

[0052] It is understandable that due to the constraints on the test equipment name and test group number, it is more systematic to distinguish the test results of different groups and equipment when the user conducts multi-group and multi-device testing; the test data model, test operation Constraints on the model, test address allocation, and test cycle times can make the test more targeted and the test results more accurate.

[0053] In addition, as a preferred implementation, select the target keyword from the preset option keywords and assign parameters as follows:

[0054] Select the target keyword from the preset option keywords in the configuration file and assign ...

Embodiment 3

[0066] The embodiment of the storage device testing method has been described in detail above, and the present invention also provides a storage device testing device corresponding to the method. Since the embodiment of the device part corresponds to the embodiment of the method part, Therefore, for the embodiment of the device part, please refer to the description of the embodiment of the method part, and details will not be repeated here.

[0067] figure 2 It is a structural diagram of a test device for a storage device provided by an embodiment of the present invention. The test device for the storage device provided by the embodiment of the present invention specifically includes:

[0068] The selection assignment module 10 is used for selecting a test command of the storage device, and selecting a target keyword among preset option keywords and assigning parameters.

[0069] The relationship acquisition module 11 is configured to acquire the preset corresponding relati...

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PUM

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Abstract

The invention discloses a storage equipment testing method and device and a medium. The method comprises the steps that a test command of storage equipment is selected, target keywords are selected inpreset option keywords, and parameters are assigned; a preset corresponding relationship between command options of the test command and the option keywords; target common options corresponding to the target command options are found according to the preset corresponding relationship in the mode of executing an script; according to the preset combination mode, the test command, the target commandoptions and the parameters are combined to be a command line, and the command is executed to conduct testing. In this way, the labor cost of testing is relatively lowered, due to the fact that the subsequent operation is executed by the script, the test speed is relatively fast, the accuracy of the combined command line can be guaranteed, and the overall test efficiency is guaranteed. In addition, the invention further provides the storage equipment testing device and the medium. The device and the medium have the advantages as mentioned above.

Description

technical field [0001] The invention relates to the testing field, in particular to a storage device testing method, device and medium. Background technique [0002] Whether the storage device is reliable is the focus of technical personnel, and testing the storage device to ensure its reliability is a commonly used method at present. [0003] For storage device testing, important concerns include data consistency, computing execution performance, and system operation stability. The current usual test method is to establish the access of the main device to the storage device to be tested through the fiber card or the network card, and then the tester inputs and runs a command line composed of test commands and test parameters on the main device to test the storage device. However, the limitation of the above method is that it is necessary to manually enter the command line to execute the test every time, which increases the labor cost of the test, but the overall speed of a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/263
CPCG06F11/2205G06F11/2273G06F11/2635
Inventor 李雅明
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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