Semiconductor integrated circuit test equipment

Abstract

The invention relates to the technical field of integrated circuit production and processing, and discloses semiconductor integrated circuit test equipment. The semiconductor integrated circuit test equipment comprises a workbench, wherein a test board is fixedly installed at the center of the top part of the workbench, a probe board is arranged at the top part of the test board, a lifting mechanism is arranged at the top part of the workbench, and the lifting mechanism comprises a lifting table. According to the semiconductor integrated circuit test equipment, a rotating ring rotates in one direction on the outer wall of the lifting table, so that a positioning frame is driven by four groups of moving rods and four groups of linkage rods to continuously reciprocate up and down in a hollow part in the middle of the lifting table, the positioning frame drives a circuit board limited in a cavity of the positioning frame to reciprocate up and down, when the positioning frame moves to the lowest part of the lifting platform, the circuit board is in extrusion contact with a probe on the top part of the probe plate, and the circuit board is accurately butted with the probe on the probe plate up and down. The positioning test efficiency of a semiconductor integrated circuit board is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit production and processing, in particular to a semiconductor integrated circuit testing device. Background technique [0002] Semiconductor integrated circuit testing is the process of detecting integrated circuits or modules, by measuring the output response of integrated circuits and comparing the expected output, to determine or evaluate the function and performance of integrated circuit components. It is to verify design, monitor production, ensure quality, An important means of analyzing failure and guiding application. [0003] The semiconductor integrated circuit testing equipment in the prior art generally manually inserts the circuit board into the test base for testing. Manual insertion cannot guarantee the accuracy of each insertion, so it is necessary to repeat or even Multiple plugging attempts are required to achieve various electrical signal connections of the circuit boa...

AI Technical Summary

Problems solved by technology

[0003] The semiconductor integrated circuit testing equipment in the prior art generally manually inserts the circuit board into the test base for testing. Manual insertion cannot guarantee the accuracy of each insertion, so it is necessary to repeat or even Multiple plugging attempts are required to achieve various electrical signal connections of the circuit board, which not only easily causes irreversible damage to the tested circuit board, but also the friction of the plug hole may affect the normal signal transmission, resulting in test data inaccurate

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