Electrical performance testing method for multi-material number spliced board

Abstract

The invention discloses an electrical performance testing method for a multi-material number spliced board, comprising steps of splicing multiple single-material number boards on one production board, wherein the single-material number board has a plurality of network units, obtaining network unit position information of each single-material number board, and performing electric performance test on all network units according to the position information of all network units by a flying probe device, wherein electric performance test comprises the test to determine whether the network unit is an open circuit or a short circuit. As a result, the whole board can be put into the test device to test for one time instead of cutting the production board into multiple pieces and placing the multiple pieces into the flying probe testing device one-by-one to performthe electric performance test. The invention can greatly reduce the steps of the operation upper board and the lower board on the probe flying test device, greatly improves the working efficiency and greatly reduces the labor cost.

Description

technical field [0001] The invention relates to the technical field of circuit boards, in particular to a method for testing the electrical performance of a composite board with multiple material numbers. Background technique [0002] Existing electrical performance testing of multi-number combination generally needs to cut the entire board into multiple single-number boards, and then put the single-number boards into the flying probe test device for testing. The number of boards for placing and placing orders is many, the operation efficiency is low, and the labor cost is high. When the size of the single-number board is small, the flying probe test fixture can easily clamp the edge test point of the single-number board. When the flying probe touches the edge test point, it will be affected by the flying probe test fixture, making the test effect affected. Contents of the invention [0003] Based on this, the present invention overcomes the defects of the prior art, and...

AI Technical Summary

Problems solved by technology

The number of boards for placing and placing orders is many, the operation efficiency is low, and the labor cost is high

When the size of the single-number plate is small, the flying probe test fixture can easily clamp the edge test point of the single-number plate. When the flying probe touches the edge test point, it will be affected by the flying probe test fixture, making the test effect affected

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