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1914 results about "System testing" patented technology

System testing is testing conducted on a complete integrated system to evaluate the system's compliance with its specified requirements. System testing takes, as its input, all of the integrated components that have passed integration testing. The purpose of integration testing is to detect any inconsistencies between the units that are integrated together (called assemblages). System testing seeks to detect defects both within the "inter-assemblages" and also within the system as a whole. The actual result is the behavior produced or observed when a component or system is tested.

FAQ Chinese request-answering system implementing method in tourism field

The invention provides an implement method of an FAQ Chinese question answering system in the tourism field. The implement method comprises the steps of FAQ collection and organization, construction of a tourism field knowledge base, user query, question analysis, answer extraction and the like, thereby realizing the FAQ Chinese question answering system in the tourism field. The implement method constructs the tourism field knowledge base-field knowledge network with the help of the idea of ontology, utilizes the KDML language to define and describe the terms and the relations of the tourism field and realizes the integration of the tourism field knowledge network and a general knowledge base-knowledge network. The invention proposes a calculation method of similarity of tourism questions on the basis, the method realizes the calculation of the similarity of the questions with the help of the characteristics of the questions of the tourism field and the combination of morphological relations, the syntactic dependency relations and the field concept semantic relations in the questions, and the method further searches the related question from a candidate question set and extracts the answer of the question based on the similarity calculation. The test result of a Yunnan tourism FAQ question answering system proves that the method is feasible and has better effect.
Owner:KUNMING UNIV OF SCI & TECH

Apparatus and methods for testing a microprocessor chip using dedicated scan strings

A test apparatus and method for design verification of at least one microprocessor chip includes a compatible Joint Task Action Group (JTAG) terminal for access to a plurality of computer functional units contained in the chip. A test input terminal included in the JTAG terminal receives a scan string, the string being coupled to each computer functional unit through a first multiplexer. The scan input string is separated by the JTAG terminal under program control into a series of dedicated scan strings, each dedicated scan string being supplied to a selected functional unit through the first multiplexer. Each functional unit includes start and stop scan clocks for testing the functional under program control using the dedicated scan train for the functional unit. A test output terminal included in the JTAG terminal is coupled to each functional unit through a second multiplexer. The test results of the dedicated scan string under control of the scan clock are supplied to the output terminal through the second multiplexer. The compatible JTAG terminal includes further elements for controlling the scan clocks to select a targeted functional unit for testing purposes while the scan strings for non-targeted functional units remain in an inactive state.
Owner:GOOGLE LLC
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