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990results about How to "Reduce scan time" patented technology

Apparatus and methods for testing a microprocessor chip using dedicated scan strings

A test apparatus and method for design verification of at least one microprocessor chip includes a compatible Joint Task Action Group (JTAG) terminal for access to a plurality of computer functional units contained in the chip. A test input terminal included in the JTAG terminal receives a scan string, the string being coupled to each computer functional unit through a first multiplexer. The scan input string is separated by the JTAG terminal under program control into a series of dedicated scan strings, each dedicated scan string being supplied to a selected functional unit through the first multiplexer. Each functional unit includes start and stop scan clocks for testing the functional under program control using the dedicated scan train for the functional unit. A test output terminal included in the JTAG terminal is coupled to each functional unit through a second multiplexer. The test results of the dedicated scan string under control of the scan clock are supplied to the output terminal through the second multiplexer. The compatible JTAG terminal includes further elements for controlling the scan clocks to select a targeted functional unit for testing purposes while the scan strings for non-targeted functional units remain in an inactive state.
Owner:GOOGLE LLC

Scanning method for projected capacitive touch panels

The invention relates to a scanning method for projected capacitive touch panels, which includes the following steps that: (a) the self capacitance reference values of each first electrode and each second electrode and the mutual capacitance reference value of each intersection are set; (b) a controller scans the self capacitances of all the electrodes to obtain the current self capacitance value of each electrode, which is compared with the self capacitance reference value corresponding to the electrode to determine that the first and the second electrodes with the changed self capacitance values are touched; and (c) the controller scans the mutual capacitance of each intersection between the first and the second electrodes determined to be touched in the step b to obtain the current mutual capacitance value of each intersection, which is compared with the mutual capacitance reference value corresponding to the intersection to determine that the area where the intersection with the changed mutual capacitance value is positioned is an actually touched area. The method effectively combines self capacitance scanning with mutual capacitance scanning, the scanning frequency is high, the precision is high, and the method is particularly suitable for the multi-spot scanning of medium-sized and large-sized touch panels.
Owner:TPK TOUCH SOLUTIONS (XIAMEN) INC

Automatic stacking/reclaiming system for bulk cargo storage yard

The invention provides an automatic stacking/reclaiming system for a bulk cargo storage yard. The automatic stacking/reclaiming system comprises a stacker distributed in the storage yard and provided with a stacking cantilever, a reclaimer distributed in the storage yard and provided with a reclaiming cantilever, a first laser scanning device installed on the stacking cantilever and used for acquiring scanning data of the storage yard, a second laser scanning device installed on the reclaiming cantilever and used for acquiring the scanning data of the storage yard, a stacking positioning device and a reclaiming positioning device for acquiring GNSS positioning information, a stacker control device, a reclaimer control device, a remote stacking processing device and a remote reclaiming processing device. The stacker control device and the reclaimer control device acquire and output the GNSS positioning information, receive a stacking control signal and a reclaiming control signal, and control the stacker and the reclaimer to execute corresponding stacking/reclaiming actions according to the control signals. The remote stacking processing device and the remote reclaiming processing device receive a stacking instruction and a reclaiming instruction input by a peripheral user, acquire coordinate information of the corresponding storage yard according to the instructions, the scanning data and the GNSS positioning information, and generate stacking/reclaiming path information to serve as the stacking/reclaiming control signals to be output to the stacker control device and the reclaimer control device. The automatic stacking/reclaiming system is based on GNSS positioning, and is high in accuracy and low in cost, data can be shared, and automatic operation of the bulk cargo storage yard is achieved.
Owner:CCCC THIRD HARBOR CONSULTANTS

Laser and microbeam plasma composite 3D (3-dimensional) printing equipment and method

The invention discloses a laser and microbeam plasma composite 3D (3-dimensional) printing equipment and method. The equipment comprises a central control system, a sealing forming chamber, a laser forming device and a plasma processing device, wherein a laser forming spray head and a plasma gun are correspondingly put on a support frame arranged at the left and right side inner walls of the sealing forming chamber, and the laser forming spray head or the plasma gun is clamped through a co-work numerical control main shaft, so that the laser forming spray head or the plasma gun moves in the Z, X and Y directions in the sealing forming chamber. The central control system controls the co-work numerical control main shaft for conveying back the laser forming spray head back to the support frame, then, the co-work numerical control main shaft clamps the plasma gun for filling the inside of the profile of a formed metal part, and the work is alternately carried out in such a way until the part manufacturing is completed, so that the scanning time is reduced to a great degree. The laser fast forming is combined with the plasma, the problem of conflict between the efficiency and the precision of a metal 3D printing technology is solved, and in addition, the plasma is adopted for replacing the laser to be used as a heat source, so that the high-efficiency and low-cost industrial level metal 3D printing equipment is obtained.
Owner:SOUTH CHINA UNIV OF TECH

System and method for measuring radio-frequency signal high-speed sweeping frequency spectrum based on digital local oscillator

The invention relates to a system for measuring a radio-frequency signal high-speed sweeping frequency spectrum based on a digital local oscillator. The system comprises a radio frequency conversion unit, an intermediate frequency signal conditioning unit and a digital intermediate frequency signal processing and controlling unit which are sequentially connected in series. The digital intermediate frequency signal processing and controlling unit is provided with a digital scan synchronous control circuit module and a programmable digital oscillator, wherein the digital scan synchronous control circuit module is connected with an in-phase quadrature (IQ) signal shunt processing circuit module through the programmable digital oscillator, the digital scan synchronous control circuit module is connected with a first local oscillator device, a detector, or a fast fourier transform (FFT) convertor. The invention further relates to a method which is based on the system and achieves synchronous control for the scanning in high-speed sweeping frequency spectrum measurement. Due to the fact that the system and method for measuring radio-frequency signal high-speed sweeping frequency spectrum based on the digital local oscillator are adopted, scanning time is greatly shortened, local frequency accuracy in a scanning process is improved, circuit hardware is simplified, cost is reduced, working performance is stable and reliable, and range of application is wide.
Owner:TRANSCOM INSTR
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