85 results about "Spot scanning" patented technology

The invention discloses a method for realizing high-quality stripping of large-size diamond by double-laser composite modification, which comprises the following steps: placing and fixing a sample on a three-dimensional mobile platform, and the upper surface of the sample is a crystal face (100); laser generated by an ultrafast laser generator penetrates through the upper surface of a sample and is focused into the sample, and then the laser generated by the ultrafast laser generator is used for performing first spot scanning on the sample to form an independent lattice structure; laser generated by the ultrafast laser generator is adopted to carry out secondary spot scanning on the sample to form a crack interconnected lattice structure; performing third-time line scanning on the sample by using laser generated by a nanosecond laser generator; and ultrasonically stripping the sample in water bath. By adopting a dual-laser composite modification process and combining bionic'honeycomb 'and'turtle shell' crack structure design, the crack is effectively guided to directionally extend along the crystal face (100), the problem of oblique crack when the stripping face is the crystal face (111) in the past is avoided, and the integrity and flatness of the stripping face are greatly improved.

The invention discloses a static flying spot scanning method based on a flying focus point x-ray source, and belongs to the technical field of x-ray scanning, and the method comprises the following steps: S1, providing a flying focus point x-ray source; s2, providing a static restraint device; s3, controlling the focus of the flying focus x-ray source to move or switch according to a preset scanning mode, so that x-rays irradiate the scanned object point by point through a hole groove or a spiral gap in the static constraint device, and performing flying spot scanning on the scanned object; and S4, collecting a scattering x-ray signal of the scanned object by using a detector, converting the scattering x-ray signal into an electric signal, carrying out analog-to-digital conversion, and carrying out signal processing to generate a scanning image. According to the static flying spot scanning method based on the flying focus point x-ray source, a traditional combination of a fixed focus point and a high-speed mechanical device is replaced by the combination of the electrically-controlled x-ray source capable of changing the focus point and the static constraint device, and the scanning performance is improved.

The invention provides an arrival wave angle estimation method based on a zero scanning leaky-wave antenna. A rectangular waveguide is selected as a basic structure to design a periodic leaky-wave antenna only working in a-1 harmonic state; designing necessary antenna simulation parameters; a first leaky-wave antenna is designed; adjusting the gap interval p, and designing a second leaky-wave antenna; obtaining pattern functions of the first leaky-wave antenna and the second leaky-wave antenna; proper amplitude and phase parameters are selected for directional diagram synthesis, and a new directional diagram function is obtained; constructing an array guiding matrix suitable for the MUSIC algorithm; signal sources are arranged at different positions, simulation testing is carried out through MATLAB, and the incoming wave angle estimation capability of the zero-point scanning leaky-wave antenna is verified. According to the invention, a feasible technical path is provided for high-precision positioning and tracking application in future 6G mobile communication. The antenna is especially suitable for application in millimeter wave and terahertz frequency bands, such as vehicle-mounted communication, unmanned aerial vehicle platforms, military electronic countermeasures and the like.

The invention relates to the technical field of defect detection, in particular to a defect detection method and system based on a microwave frequency crystal resonator, and the method comprises the steps: forming a microwave probe through a microwave frequency crystal resonator array, placing a to-be-detected material below the microwave probe, and setting a scanning area and scanning step lengths in two directions on the surface of the material; controlling the probe to perform point-by-point scanning according to step length, and collecting a plurality of reflection coefficients of each sampling point to form an echo signal matrix; performing singular value decomposition on the matrix, applying an adjustable coefficient to a first singular value and a second singular value, and adaptively selecting an optimal coefficient according to imaging quality to reconstruct an echo signal; performing two-dimensional Fourier transform on the reconstructed matrix, constructing a spatial filter in combination with probe spacing and defect depth to perform phase compensation, performing two-dimensional Fourier transform to obtain a defect image, and performing threshold segmentation on the defect image to obtain a binary image only containing defects; and analyzing the connected regions to obtain the gravity center position of each defect and the defect area determined by the pixel number and the single pixel area. The problems of serious clutter interference, insufficient defect imaging contrast ratio, difficulty in quantitative evaluation of defect size and the like in the existing microwave detection can be solved.

The invention discloses a solar cell and a preparation method thereof, and relates to the field of photovoltaic technology. According to the preparation method of the solar cell, the laser spot scanning speed is controlled, so that when the first doped silicon layer and the first dielectric layer of the exposure area are etched subsequently, the edge etching depth of the exposure area is shallower, the middle etching depth of the exposure area is deeper, and the first groove can have an inclined side wall. When the second doped silicon layer is subsequently prepared, the second doped silicon layer is not deposited below the first doped silicon layer. And then the first doped silicon layer and the second doped silicon layer can be completely separated by manufacturing the second groove, so that minority carrier recombination and electric leakage channels caused by contact of the first doped silicon layer and the second doped silicon layer are reduced, and the performance of the solar cell is improved. In addition, the preparation method is high in process efficiency.

The invention provides a near-field scanning rapid imaging device for the radio frequency performance of a multi-channel electrically tunable base station antenna, and relates to the technical field of radio frequency antenna testing, the device comprises a scanning assembly and a data processing module, the scanning assembly is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a vector network analyzer connected with the radio frequency probe, and the data processing module is connected with the scanning assembly. The scanning module is used for performing point-by-point scanning in an antenna near-field area along a preset plane grid path and collecting scattering parameters representing electromagnetic field characteristics at sampling points to form a near-field scanning data set; and the data processing module receives the data set, executes fast Fourier transform operation, and converts near-field data into far-field radiation characteristics so as to generate a far-field radiation pattern representing the radio frequency performance of the antenna. And the data processing module applies a preset static compensation matrix to the near-field data before conversion, so that the mutual coupling effect between the probe and the antenna is inhibited, and the accuracy of a measurement result is improved.

The application provides a point melting forming method and system based on an electron beam heat source, and the method comprises the following steps: model slicing and path planning, adaptively slicing a three-dimensional model to obtain two-dimensional contour data of each layer section; point array processing, dividing a single layer section area into a contour point array and a filling point array, adaptively discretizing and sampling the contour point array based on curvature change, and generating a basic point array mode with regular arrangement for the filling point array; scanning sequence generation and optimization, converting the discretized point array into an ordered scanning instruction sequence, predicting thermal field evolution under different scanning sequences by establishing a thermal influence model, and iteratively optimizing the scanning sequence based on a multi-objective optimization algorithm; and layer-by-layer point melting forming, controlling electron beam point-by-point melting of metal powder according to the optimized point scanning sequence. The application replaces continuous line scanning with a discrete point melting mode, significantly reduces thermal accumulation and thermal stress, and improves the size accuracy and surface quality of the formed part.

The invention discloses a dual-polarized antenna with an adjustable radiation zero point applied to a satellite communication phased array system. The dual-polarized antenna comprises a radio frequency connector, a radiation metal patch, a metal floor and a dielectric substrate located between the radiation metal patch and the metal floor. The radiation metal patch comprises four groups of metal sheets, and any two adjacent groups of metal sheets are arranged at intervals; the number of the radio frequency connectors is four, and each radio frequency connector is connected with a group of metal sheets; the dual-polarized antenna with the adjustable radiation zero point further comprises two groups of radiation zero point scanning control networks, one group of radiation zero point scanning control networks is connected with two groups of opposite metal sheets through radio frequency connectors, and the other group of radiation zero point scanning control networks is connected with the other two groups of opposite metal sheets through radio frequency connectors. The dual-polarized antenna with the adjustable radiation zero point is simple in structure, and scanning control and dual polarization of the radiation zero point can be achieved.

The application discloses a kind of multi-beam confocal mask defect detection system and method based on fiber laser array, the present application obtains multi-point scanning light field as illumination light source based on fiber laser array, and can be based on the arrangement of laser array Realize the regulation and control of scanning light field, through the joint action of motion platform and multi-surface rotating mirror, realize fast and accurate mask two-dimensional scanning imaging, and based on confocal microscopic imaging method, with high-power microscope objective and photomultiplier tube Realize high-resolution detection of mask defect.Compared with the traditional point scanning type mask defect detection system, the present application has the advantages of high detection resolution, fast scanning speed, multi-point scanning light field can be freely regulated and controlled, and does not need to introduce additional diffractive optical element.

The invention discloses an angle continuously adjustable super-resolution microscope illumination device and method. The device comprises a light beam coupling assembly; an LED-DMD excitation light path and a digital micromirror array perform intensity modulation on Kohler illumination light according to a loaded intensity distribution reference pattern, a first light beam is reflected, and the first light beam is projected to a sample plane through a light beam coupling assembly and a conjugate light path in sequence; an SLM-Laser excitation / light control light path, a spatial light modulator performs phase modulation on parallel light according to a loaded phase distribution reference pattern to generate a second light beam, and the second light beam is coupled with the first light beam through a light beam coupling assembly and then is projected to a sample plane; the excitation mode switching module is used for switching a conjugate surface to realize TIRF illumination or spot scanning excitation; the control system realizes seamless switching between a preset light control imaging mode and a real-time light control imaging mode. The problems that a traditional super-resolution microscope is single in function, high in phototoxicity, poor in adaptability and the like are solved, and a more powerful imaging platform can be provided for biomedical research.

The invention discloses an up-conversion microscopic imaging rapid spot scanning method and device based on light-operated fluorescence erasure, and the device comprises an excitation light module, a loss light module, a double-beam coupling module, a laser spot scanning module, and a fluorescence detection imaging module. When the probe is lighted by the exciting light and the scanning passes, the following loss light acts on the probe which is emitting the fluorescence, and the fluorescence loss is quickly induced, so that the residual fluorescence is extinguished (the fluorescence lifetime is shortened) and the imaging brightness is not weakened. According to the method, the trailing phenomenon caused by overlong fluorescence lifetime in the up-conversion point scanning fluorescence microscope is solved, the limitation of the fluorescence lifetime on the point scanning imaging speed is broken through, and up-conversion rapid point scanning microscopic imaging without brightness loss and trailing can be realized.

The application discloses a multi-system microwave nondestructive testing and imaging scanning system and method, relates to the technical field of nondestructive testing, and comprises a near-field probe, a single-port vector network analyzer, a plane scanning frame and an upper computer.

The invention relates to the technical field of microscopy optics, in particular to a spot scanning confocal adjusting system and method, light emitted by a light source is parallel light beams, the divergence angle is smaller than 1mrad, the light beams reach a galvanometer through a spectroscope, reach a target object through a scanning mirror set and an objective lens, return after being reflected by the target object, pass through the spectroscope capable of rotating, and then pass through a scanning mirror set. After being reflected, the laser reaches the confocal hole through the focusing lens; the confocal hole is located at the rear focus of the lens, and confocal imaging is achieved. According to the invention, through the rotatable spectroscope, the imaging condition of the target object at the confocal hole position can be observed by one camera at the same time. The technical problem that the position of the confocal hole is difficult to find if the initial position of the confocal hole is not within the view field range of the camera due to the fact that the confocal hole is small, a camera with a high amplification factor needs to be selected for clearly seeing the confocal hole and the image plane range which can be observed by the camera is very small in the debugging process is solved.

The application discloses a glass substrate hole modification method and an integrated waveguide manufacturing method, and comprises the following steps: focusing a laser focus on one side of a glass substrate close to the bottom surface thereof; controlling the laser focus to perform annular scanning along the outer contour of a preset hole to form a closed modification ring; controlling the laser focus to perform point-by-point scanning with a preset dot array interval in the internal area surrounded by the modification ring to form an array distributed modification dot array; and making the laser energy density of the annular cutting area of the modification ring lower than the laser energy density of the filling area of the modification dot array. The application can assist in high-precision preparation of a through hole and a blind hole with a vertical sidewall and a flat bottom on a glass substrate, thereby effectively improving the performance of a millimeter wave slow wave passive device and reducing the cost.

The present application provides a fixed-target sample scanning method and system based on an X-ray free electron laser. The method comprises: acquiring a fixed target sample image of an X-ray free electron laser; performing sample identification on the basis of the fixed target sample image to obtain an identified sample image; acquiring a pulse point of the X-ray free electron laser, and sorting sample coordinates in the identified sample image on the basis of coordinates of the pulse point, to determine a scanning path of a fixed target sample; and performing fixed-point scanning on the fixed target sample on the basis of the scanning path. The present application realizes the identification and fixed-point scanning of a fixed target sample of an X-ray free electron laser, thereby improving the utilization rate, and further improving the experimental efficiency and the quality of data.

The application provides a simulation prediction analysis method for laser polishing of a microtopography and roughness of a diamond surface, and comprises the following steps: creating a mapping relationship data table of laser parameters and laser spot size and power density; establishing a mapping relationship model diagram of laser spot power density, pulse width, laser incidence angle and diamond surface ablation pit depth; constructing an analysis model of a laser spot stacking state; generating a simulation image of the microtopography of the laser polished diamond surface; and predicting the roughness of the laser polished diamond surface. The application takes the machining parameters of laser spot power, pulse width, repetition frequency, defocusing amount, incidence angle, transverse scanning rate and longitudinal stepping interval as inputs, takes the microtopography and roughness of the laser polished diamond surface as outputs, and establishes a mapping relationship between the inputs and the outputs through simulation analysis of the size of the ablation pit, the spot scanning path and the spot stacking state, so as to guide the optimization of the laser polishing process parameters.

The invention relates to the technical field of photovoltaic modules, and discloses an IV test method and device, electronic equipment, a storage medium and a program product, and the method comprises the steps: carrying out the light bath pretreatment of a module, and evaluating the effect through a power stability test; after the standard is reached, forward and backward voltage scanning tests are carried out, the scanning speed is controlled to enable the hysteresis to be lower than a preset threshold value, and the test power is determined to be stable based on a power stability criterion; and then a fill factor and photoelectric conversion efficiency are calculated, and an efficiency true value is evaluated through a weighted average function. Short-term stability is established through preprocessing, and initial fluctuation caused by the capacitance effect is reduced; the power test ensures a reliable starting point; carrying out scanning control and criterion suppression on hysteresis errors; and the weighted average improves the accuracy. The hysteresis error problem caused by the capacitance effect is effectively solved, efficient and accurate testing is achieved, and the testing speed and the result reliability are improved.

The invention discloses a method for improving stress corrosion resistance of a welded joint through laser shock strengthening, and relates to the technical field of titanium alloy welded joint strengthening. The method comprises the following steps that firstly, a welding joint area of a titanium alloy welding sample is heated to 400-700 DEG C through heating of a magnetic induction coil, and then 2-5 times of laser shock peening treatment is conducted on the welding joint area with 1-10 J laser pulse energy under the heat preservation condition of 400-700 DEG C; the welding joint is obtained through an electron beam welding process; a laser spot scanning strategy of the laser shock peening treatment is the same as a scanning strategy when a welding joint is obtained through an electron beam welding process. According to the method, the stress corrosion resistance of a welding joint area is remarkably improved and the service life of the welding joint area is remarkably prolonged through the synergistic effect of magnetic induction coil heating and laser shock peening treatment and optimization of respective processes particularly aiming at the service requirement of a titanium alloy welding structure for deep sea equipment in a high-pressure and high-salt environment.

The utility model relates to a kind of fine-tunable galvanometer fixed frame, for installing galvanometer, including base and installation fixed plate, base is equipped with galvanometer mounting portion, galvanometer mounting portion surface is galvanometer mounting face, first recess is equipped on galvanometer mounting face, installation fixed plate is buckled on galvanometer mounting face, galvanometer is installed between galvanometer mounting portion and installation fixed plate, installation fixed plate is connected with galvanometer mounting portion by adjusting screw, adjusting screw is located at the both sides of galvanometer.Compared with prior art, the utility model has installation fixed plate and galvanometer mounting portion are connected by adjusting screw, after adjusting screw is tightened, the clamping of galvanometer is realized, and the angle of galvanometer can be changed by fine-tuning adjusting screw, the installation error caused by slight eccentricity of galvanometer or machining tolerance is compensated;Further ensure the stability and repeatability of laser spot scanning path, especially suitable for the two-photon fluorescence imaging system with extremely high requirements for scanning consistency and spatial optical axis coincidence degree.

The present application relates to the technical field of crystal nondestructive testing, and particularly relates to a crystal defect nondestructive testing method and system based on pumped probe transient absorption spectrum, which comprises the following steps: detecting a target region of a crystal to be tested by using pump light and probe light; collecting a transient absorption image of the target region according to a preset time delay between the pump light and the probe light, and extracting a target risk region; focusing the pump light and the probe light, and performing point-by-point scanning on the target risk region by using the focused pump light and probe light; collecting three-dimensional transient absorption intensity distribution and defect dynamic evolution data of each scanning point in the target risk region under different time delays; performing correlation calibration based on the transient absorption image and the three-dimensional transient absorption intensity distribution to obtain defect parameters; and constructing a damage prediction model based on sample damage threshold data, and outputting damage threshold prediction results according to the defect parameters. The purpose is to realize nondestructive and rapid detection of internal defects of deuterated potassium dihydrogen phosphate crystals.

The invention discloses a modularized operation system based on ultrafast laser, which comprises a laser source, a first scanning module, an optical focusing module, a second scanning module and a control module, and is characterized in that the first scanning module is used for moving the optical focusing module to a specified position along a preset three-dimensional moving track; wherein the three-dimensional moving track is determined based on a three-dimensional model of a target surgical tissue, the optical focusing module is arranged at the tail end of the first scanning module and used for focusing laser emitted by the laser source to a designated position, and the second scanning module is arranged at the tail end of the first scanning module and used for controlling the focus of the laser to scan in a designated area. The first scanning module and the second scanning module are connected in a communication mode to ablate or cut target surgical tissue, and the control module is connected with the laser source, the first scanning module and the second scanning module in a communication mode and used for controlling the laser source, the first scanning module and the second scanning module so as to control laser energy, focal spot size, focus moving speed, focus scanning speed, focus moving track and focus scanning mode.

The application provides a multi-wavelength scanning imaging system, and relates to the technical field of scanning imaging. The multi-wavelength scanning imaging system comprises: a light source module configured to output a target pulse sequence, the target pulse sequence comprising light pulses of multiple different wavelengths separated in the time domain; a scanning imaging module configured to receive the target pulse sequence, focus the target pulse sequence on a test sample by means of point-by-point scanning and scan; a photoelectric detection module configured to receive light signals generated by the test sample in response to the target pulse sequence and convert the light signals into electrical signals; and a time-domain splitting module configured to split the electrical signals according to pixel time. In each pixel time, the electrical signals are time-domain split based on the timing of the light pulses of the multiple different wavelengths in the target pulse sequence to obtain imaging signals of each pixel point, wherein the pixel time represents the time for which a scanning point stays at each pixel point in the process of point-by-point scanning by the scanning imaging module.

The invention relates to a skin in-vivo confocal imaging image brightness adaptive adjusting device and method, and the method comprises the steps: employing a scanning imaging device to emit illumination light to a skin sample, and carrying out the point-by-point scanning imaging of the skin sample through a micro-electromechanical system in a point-by-point scanning mode; and the brightness of the illumination light is adaptively adjusted in an iterative mode through the brightness adjusting device. In the iteration process, the average signal intensity of the electric signals of the obtained imaging result in the sampling period and the number of the pixels with the signal intensity higher than the reference value are substituted into an empirical formula, an adjusting parameter value for adjusting the brightness of the illumination light in the next step is obtained, and then the brightness adjustment in the next step is carried out. Therefore, according to the self-adaptive adjusting device disclosed by the invention, the light emitting power of the light source does not need to be frequently and manually adjusted or the signal dynamic range in a software system does not need to be manually changed, special image processing is not needed, and the sample detection efficiency and the imaging effect can be improved.

The embodiment of the invention discloses a metal level detection method, device and equipment of a wafer and a computer storage medium. The metal level detection method of the wafer can comprise the steps that a target scanning method is determined in spot scanning and surface scanning according to the defect width of the wafer; determining scanning voltage intensity based on the defect depth of the wafer; and carrying out metal level detection on defects of the wafer by using a target scanning method and scanning voltage intensity.

The invention relates to the technical field of metal material manufacturing, in particular to an additive manufacturing method of a TiAl alloy material with a three-dimensional net stacking microstructure, which comprises the following steps: preheating a forming substrate to a set temperature, and preserving heat; according to a preset scanning path, TiAl alloy powder laid on a forming substrate layer by layer is scanned, and fixed-point scanning melting of a low-energy scanning area and a high-energy scanning area is correspondingly conducted on the TiAl alloy powder laid on the forming substrate layer by layer through a continuous electron beam and a continuous electron beam superposed pulse electron beam, the TiAl alloy material with the three-dimensional overlapped net microstructure is obtained; wherein the scanning speed is greater than or equal to 1000mm / s. The additive manufacturing method of the TiAl alloy material with the three-dimensional overlapped net microstructure aims at solving the problem of how to improve the high strength and the high crack propagation resistance of the TiAl alloy material at the same time.

Two-dimensional scanning system and method for high-throughput material characterization are applied to the field of high-throughput material characterization and scanning.The application proposes two different two-dimensional scanning systems and methods, which are composed of a laser, an efficient light splitting unit, a sample and a photodetector, and realize material scanning with high sampling speed, large data volume and high spatial / time resolution. 2 The two-dimensional scanning system based on spatial point-by-point method adopts a single MEMS mirror and a two-dimensional 1x n 2 MEMS mirror combination to perform point-by-point scanning on the sample; the two-dimensional scanning system based on spatial parallel method utilizes two two-dimensional 1x n MEMS mirror combination to perform parallel scanning. Both methods can be used for high-throughput material characterization technology, and the scanning system based on MEMS time-to-two-dimensional space mapping and the scanning system based on direct mapping to two-dimensional space by spatial spreader / disperser can greatly improve the scanning speed.

The invention discloses a multi-gun scanning electron beam thermal assessment method based on parallel expansion, and the method comprises the steps: carrying out the partitioning of a large-size target heat flux density field, and enabling each small region to correspond to an electron gun, and enabling the electron gun to be responsible for the reconstruction of the small-region target heat flux density field; acquiring current waveforms in deflection coils of the corresponding electron guns under target heat flux density fields of all the small partitions for reconstructing the small partitions; selecting one small partition as a contrast partition with a fixed scanning starting point, taking the other small partitions as experiment partitions, traversing the scanning starting point of the experiment partitions, and obtaining the minimum value of the Euclidean distance between two electron beams emitted by all electron guns in the scanning process of each group of scanning starting points in the traversal process of the experiment partitions; forming a minimum value sequence; and selecting an experimental partition scanning starting point mode corresponding to a maximum value in the minimum value sequence as an actual scanning starting point mode of each electron gun to reconstruct the large-size target heat flux density field. According to the invention, an experiment process of multi-gun parallel connection and partition reconstruction is established.

The application discloses an on-board laser radar collimation axis error correction method of an oval scanning track, belongs to the technical field of error correction, and is used for collimation axis error correction. The method comprises the following steps: correcting points of the oval scanning track and correcting a mirror normal vector; using a laser radar to perform forward fixed-point scanning on a to-be-measured object to obtain a forward oval scanning track, performing backward fixed-point scanning to obtain a backward oval scanning track, and obtaining the points of the corrected oval scanning track; calculating a scaling factor, correcting the mirror normal vector, and completing collimation axis error correction. The application does not need external auxiliary equipment, does not depend on ground control points or regular ground object information, is suitable for complex application scenes such as no control and no overlapping area, and improves the adaptability, correction accuracy and engineering practicability of the system. The practicability in a complex outdoor environment is significantly improved, and the application is suitable for no control area and single flight. The application has the track scale distortion correction capability and enhances the spatial consistency of the depth point cloud.

The application relates to the technical field of imaging detection, and specifically discloses an imaging method and system, which comprises the following steps: guiding incident laser to a scanning unit; the scanning unit converges the laser on a sample surface according to a preset path and performs point-by-point scanning within a field of view range; first signal light generated by the sample under wide-field illumination excitation is collected, focused to a camera target surface after being reflected by the scanning unit, and a wide-field image is generated; second signal light generated by the sample under the incident laser excitation is collected; when the second signal light is reflected light, the reflected light is converted into a first electric signal after being reflected by a scanning galvanometer; when the second signal light is transmitted light, the transmitted light is converted into a second electric signal after being focused; and the corresponding electric signals are input into a device to generate a corrected laser scanning image in combination with the corrected wide-field image. The imaging method and system provided by the application can meet the imaging detection requirements of a millimeter-level or centimeter-level field of view.

The present application relates to a kind of low content component energy spectrum analysis method, belong to metallurgical dust resource utilization and material microanalysis technical field.The method includes: preparation sample exposure center section, obtain full section image by scanning electron microscope image splicing, and different analysis regions are divided;Low multiple energy spectrum area scanning is carried out in each analysis region, and the element distribution and zinc content data of multiple positions are obtained;For each analysis region, the arithmetic mean of residual zinc content is calculated as the regional representative value;Based on the characteristic data image of zinc element distribution, high multiple energy spectrum area scanning and point scanning are carried out on the characteristic micro area of zinc element aggregation to analyze the phase form and element composition of residual zinc.The present application realizes the quantitative, zoned, spatial positioning and multi-scale characterization of residual zinc content distribution and occurrence state in metallized pellet by "overall observation-zoned statistics-micro area analysis" progressive analysis, provides more accurate data support for process optimization.