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250 results about "Spot scanning" patented technology

Scanning method for projected capacitive touch panels

The invention relates to a scanning method for projected capacitive touch panels, which includes the following steps that: (a) the self capacitance reference values of each first electrode and each second electrode and the mutual capacitance reference value of each intersection are set; (b) a controller scans the self capacitances of all the electrodes to obtain the current self capacitance value of each electrode, which is compared with the self capacitance reference value corresponding to the electrode to determine that the first and the second electrodes with the changed self capacitance values are touched; and (c) the controller scans the mutual capacitance of each intersection between the first and the second electrodes determined to be touched in the step b to obtain the current mutual capacitance value of each intersection, which is compared with the mutual capacitance reference value corresponding to the intersection to determine that the area where the intersection with the changed mutual capacitance value is positioned is an actually touched area. The method effectively combines self capacitance scanning with mutual capacitance scanning, the scanning frequency is high, the precision is high, and the method is particularly suitable for the multi-spot scanning of medium-sized and large-sized touch panels.
Owner:TPK TOUCH SOLUTIONS (XIAMEN) INC

Optical scanner, optical scanning method, scanning image forming optical system, optical scanning lens and image forming apparatus

An optical scanner which performs optical scanning of a surface to be scanned by deflecting a luminous flux having a wavelength λ from a light source by means of an optical deflector, and condensing the deflected flux toward the surface to be scanned through a scanning image forming optical system, thereby forming an optical spot on the surface to be scanned. The scanning image forming optical system has at least one lens, and when the focal length fσ in the main scanning direction at a surface accuracy σi is defined as follows: fσ={2.6846 λ×√(k)×fm2 / ω2}−fm where, fm represents the focal length in the main scanning direction of the scanning image forming optical system; k represents the number of lens surfaces; ω represents the aimed spot diameter of the optical spot in the main scanning direction at an image height of 0; σI represents the surface accuracy of the i-th lens surface as counted from the optical deflector side; n represents the refractive index of material of the lens having the i-th lens surface; and 1 / l represents the spatial frequency in the main scanning direction on the lens surface; then, the surface accuracy σi, the focal length fσ, the refractive index n, and the spatial frequency 1 / L satisfy, for each lens surface, the following condition: 0<log σi<−2 log (1 / L)+log [1 / {32 fσ(n−1)}].  (1)
Owner:RICOH KK

Method and device for measuring appearance and wall thickness of sphere by combining differential confocal and point-diffraction interference

The invention belongs to the field of optical precision measurement and relates to a method and a device for measuring the appearance and the wall thickness of a sphere by combining a differential confocal confocal technology and point-diffraction interference. The method realizes the high-precision rapid measurement on the appearance of the outer surface of the sphere by using the point-diffraction interference, the rotation of the measured sphere and the splice of a measuring sub-aperture; and the appearance and wall thickness of the inner surface and the outer surface of a key area of a transparent or semitransparent sphere can be scanned and measured point by point by using the differentia confocal technology. The invention organically integrates a point-diffraction interference technology and the differentia confocal technology so as to realize the synchronous measurement on the appearance and the wall thickness of the inner surface and the outer surface of the sphere, and aims to solve the difficult problems that the traditional AFM or a single confocal sensor and the other scanning methods have low measuring speed, low efficiency, easy leakage in measurement and the like during measuring the surface of the sphere. The invention has broad application prospect in the fields of testing the appearance and the wall thickness of a laser fusion pellet, the appearance and the outline of a spherical surface and the like.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Method for preparing multistage metal micro-nanostructures inside micro fluidic chip

The invention relates to a method for selectively preparing or integrating multistage silver micro-nanostructures inside various plane substrates and micro fluidic chip channels by the utilization of the femtosecond laser inducing metallic silver reduction technology. In addition, the silver multistage micro-nanostructure substrate prepared by the method is used as a reinforced substrate for surface-enhanced raman spectroscopy SERS. The method provided by the invention comprises the following steps of: preparing a silver plating solution for femtosecond laser micro-nano machining, establishing a femtosecond laser micro-nano machining system for realizing multi-point scan in the silver plating solution, placing the silver plating solution and the substrate into the femtosecond laser micro-nano machining system and preparing the multistage silver micro-nanostructures on the substrate. According to the invention, a laser beam scans in the silver plating solution along a track designed in advance by a program. The preparation method is independent of the smoothness of the substrate. In particular, the preparation of silver multistage structure SERS substrate can be accomplished on the bottom of the micro fluidic chip channels, thus realizing catalysis and surface-enhanced raman test application.
Owner:JILIN UNIV

Tera-hertz two-dimensional area array scanning imaging method and imaging system for implementing same

The invention discloses a tera-hertz two-dimensional area array scanning imaging method and an imaging system for implementing the same, which relate to a tera-hertz scanning imaging method and an imaging system. The method and the system solve the problem of overlong imaging time caused by the point-by-point scanning imaging which can only process single data points in the prior art and the problem that the area array canning imaging can only image small objects in the prior art. The method comprises the following steps of: scanning and imaging a two-dimensional area array by using a tera-hertz laser, an optical system, an area array detector, a two-dimensional translation stage, a stepper motor controller, a data acquisition card and a computer; under the condition that an imaging light source is fixed, moving the a two-dimension translation stage to a proper initial position and completely scanning a target in an imaging process, wherein a certain area of the imaging object is imaged at each time, and all sub-graphs are stitched together finally. An image of the imaging target is obtained by controlling the two-dimensional translation stage and the data acquisition card and processing and storing data. The method and the system are suitable for large-size and high-speed target imaging.
Owner:HARBIN INST OF TECH

Calibration method of spot scanning galvanometer of three-dimensional measuring system

The invention discloses a calibration method of spot scanning a galvanometer of a three-dimensional measuring system. The calibration method comprises seven major steps as follows: firstly performing system modeling, so as to obtain a galvanometer deflection angle expression, then adjusting a standard plane to be positioned in a known position and perpendicular to a system main direction, measuring the plane, projecting measured data to the standard plane, so as to obtain ideal data, utilizing the data to calculate a galvanometer deflection angle, matching a relational expression between the galvanometer deflection angle and driving voltage, and measuring the standard plane again through the relational expression, and repeating the process till the standard deviation from the measured data to the standard plane is smaller than a set value, so as to obtain an accurate relational expression between the galvanometer deflection angle and the corresponding driving voltage, establishing the interactional relation between two galvanometers, describing the non-perpendicularity error of axes of the two galvanometers, and correcting the relational expression, so as to improve the calibration accuracy. The calibration method has higher practical value in the technical field of optical three-dimensional measurement and laser processing.
Owner:BEIHANG UNIV

Ground feature contour extraction method based on ground laser point cloud

According to a ground feature contour extraction method based on a ground laser point cloud provided by the invention, surface-based space measurement breaking through a traditional single-point measurement mode is introduced into urban measurement application, and the urban measurement efficiency is improved. As the most important space entity of a city, the three-dimensional information of ground objects, especially buildings, is the important basic geographic information of the city and has important application value. The whole scanning process is high in data acquisition efficiency, ground control points do not need to be specially arranged, scanning measurement is slightly influenced by the external environment, and the measurement precision is high. Not only is automation degree ofbuilding space data acquisition improved, but also scanned point cloud can express real three-dimensional information and detail structure of a building in detail. Accurate contour information is acquired by means of the point cloud data, and a three-dimensional model of the building is reconstructed. The method has the advantages of high interaction performance, high intelligent degree, high expandability, high extraction speed, high contour extraction precision and the like.
Owner:湖南航天智远科技有限公司

Real-time fluorescence radiation differential super-resolution microscopy method based on parallel spot scanning and device

ActiveCN109632756AFast sampling speedAchieve super-resolution dynamic microscopyFluorescence/phosphorescenceLight beamUltimate tensile strength
The invention discloses a real-time fluorescence radiation differential super-resolution microscopy method based on parallel spot scanning and device. In the method, a laser beam is divided to S-polarized light and P-polarized light, the S-polarized light is modulated to a circularly-polarized solid spot, and the P-polarized light is firstly modulated to eddy polarized light and is then modulatedto a circularly-polarized hollow spot; solid spot excitation light and hollow spot excitation light are staggered for at least 200 nm on an object plane; the solid spot excitation light and the hollowspot excitation light are used to perform two-dimensional scanning on a fluorescence sample simultaneously, and a positive confocal fluorescence intensity map obtained by solid spot modulation and anegative confocal fluorescence intensity map obtained by hollow spot modulation are obtained; and the two fluorescence intensity maps are subjected to shift matching. As two spots are adopted for simultaneous scanning, in comparison with the method of switching a modulation spot back and forth by the traditional fluorescence emission differential microscopy system, the sampling speed is more thantwice the traditional speed, the super-resolution dynamic microscopy effects under the confocal scanning speed can be realized, and the imaging speed can be improved significantly.
Owner:ZHEJIANG UNIV
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