129 results about "Spot scanning" patented technology

The invention discloses a method for realizing high-quality stripping of large-size diamond by double-laser composite modification, which comprises the following steps: placing and fixing a sample on a three-dimensional mobile platform, and the upper surface of the sample is a crystal face (100); laser generated by an ultrafast laser generator penetrates through the upper surface of a sample and is focused into the sample, and then the laser generated by the ultrafast laser generator is used for performing first spot scanning on the sample to form an independent lattice structure; laser generated by the ultrafast laser generator is adopted to carry out secondary spot scanning on the sample to form a crack interconnected lattice structure; performing third-time line scanning on the sample by using laser generated by a nanosecond laser generator; and ultrasonically stripping the sample in water bath. By adopting a dual-laser composite modification process and combining bionic'honeycomb 'and'turtle shell' crack structure design, the crack is effectively guided to directionally extend along the crystal face (100), the problem of oblique crack when the stripping face is the crystal face (111) in the past is avoided, and the integrity and flatness of the stripping face are greatly improved.

The invention discloses an electron beam composite scanning filling melting forming method and device, and relates to the technical field of additive manufacturing. A melting forming method for electron beam composite scanning filling comprises the following steps that a three-dimensional digital model of a part to be printed is established and sliced and layered, and layered scanning data are obtained; dividing a contour edge area and an internal area of the section of the part based on the hierarchical scanning data; based on a random discrete point algorithm, generating a random discrete point scanning path of the contour edge area; generating a continuous line scanning filling path of the internal region based on a parallel equidistant line filling method; in the contour edge area, according to a random discrete spot scanning path, a pulsed electron beam is adopted for spot scanning, filling and melting; and in the internal area, according to a continuous line scanning filling path, a focused electron beam is adopted for line scanning filling melting, single-layer filling melting is completed, and then filling melting is completed layer by layer till the part is formed. According to the method, collaborative optimization of the surface quality and the printing efficiency is achieved, and the problem that at the present stage, the surface roughness of an electron beam powder bed printing part is too high is solved.

The invention discloses an airborne laser radar collimation axis error correction method based on an oval scanning track, belongs to the technical field of error correction, is used for collimation axis error correction, and comprises the following steps: correcting points of the oval scanning track and correcting a normal vector of a reflector; performing forward fixed-point scanning on an object to be measured by using the laser radar to obtain a forward oval scanning track, performing backward fixed-point scanning to obtain a backward oval scanning track, and obtaining points of the corrected oval scanning track; and calculating a scaling factor, and correcting the normal vector of the reflector to complete collimation axis error correction. The method does not need external auxiliary equipment, does not depend on ground control points or regular ground feature information, is suitable for complex application scenes without deployment and control, without overlapping areas and the like, and improves the adaptability, correction precision and engineering practicability of the system; the practicability in a field complex environment is remarkably improved, and the method is suitable for single-route flight in an uncontrolled area; the method has a trajectory scale distortion correction capability, and enhances the spatial consistency of sounding point clouds.

The invention discloses a static flying spot scanning method based on a flying focus point x-ray source, and belongs to the technical field of x-ray scanning, and the method comprises the following steps: S1, providing a flying focus point x-ray source; s2, providing a static restraint device; s3, controlling the focus of the flying focus x-ray source to move or switch according to a preset scanning mode, so that x-rays irradiate the scanned object point by point through a hole groove or a spiral gap in the static constraint device, and performing flying spot scanning on the scanned object; and S4, collecting a scattering x-ray signal of the scanned object by using a detector, converting the scattering x-ray signal into an electric signal, carrying out analog-to-digital conversion, and carrying out signal processing to generate a scanning image. According to the static flying spot scanning method based on the flying focus point x-ray source, a traditional combination of a fixed focus point and a high-speed mechanical device is replaced by the combination of the electrically-controlled x-ray source capable of changing the focus point and the static constraint device, and the scanning performance is improved.

The invention provides an arrival wave angle estimation method based on a zero scanning leaky-wave antenna. A rectangular waveguide is selected as a basic structure to design a periodic leaky-wave antenna only working in a-1 harmonic state; designing necessary antenna simulation parameters; a first leaky-wave antenna is designed; adjusting the gap interval p, and designing a second leaky-wave antenna; obtaining pattern functions of the first leaky-wave antenna and the second leaky-wave antenna; proper amplitude and phase parameters are selected for directional diagram synthesis, and a new directional diagram function is obtained; constructing an array guiding matrix suitable for the MUSIC algorithm; signal sources are arranged at different positions, simulation testing is carried out through MATLAB, and the incoming wave angle estimation capability of the zero-point scanning leaky-wave antenna is verified. According to the invention, a feasible technical path is provided for high-precision positioning and tracking application in future 6G mobile communication. The antenna is especially suitable for application in millimeter wave and terahertz frequency bands, such as vehicle-mounted communication, unmanned aerial vehicle platforms, military electronic countermeasures and the like.

The invention belongs to the technical field of infrared thermal imaging defect detection, and particularly discloses an in-situ infrared thermal imaging detection device based on low-frequency modulation magnetic field excitation, which comprises a magnet yoke, an infrared thermal imager, a computer, a modulation power supply and an excitation coil group, the excitation coil group at least comprises a first excitation coil, a second excitation coil, a third excitation coil and a fourth excitation coil; the modulation power supply respectively introduces low-frequency alternating currents with different phases and direct currents with different directions into the first excitation coil, the second excitation coil, the third excitation coil and the fourth excitation coil; through composite excitation of an orthogonal direct-current magnetic field and a low-frequency rotating alternating-current magnetic field, the device can form a rotating low-frequency alternating-current magnetic field in a to-be-detected pipeline, the rotating magnetic field uniformly sweeps a detection area in a plurality of periods, the influence of eddy current distribution direction sensitivity is eliminated, and large-area uniform heating is realized; the problem of low efficiency of a traditional spot scanning or line scanning mode is avoided, and the coverage area of single detection is remarkably increased.

The invention relates to the technical field of defect detection, in particular to a defect detection method and system based on a microwave frequency crystal resonator, and the method comprises the steps: forming a microwave probe through a microwave frequency crystal resonator array, placing a to-be-detected material below the microwave probe, and setting a scanning area and scanning step lengths in two directions on the surface of the material; controlling the probe to perform point-by-point scanning according to step length, and collecting a plurality of reflection coefficients of each sampling point to form an echo signal matrix; performing singular value decomposition on the matrix, applying an adjustable coefficient to a first singular value and a second singular value, and adaptively selecting an optimal coefficient according to imaging quality to reconstruct an echo signal; performing two-dimensional Fourier transform on the reconstructed matrix, constructing a spatial filter in combination with probe spacing and defect depth to perform phase compensation, performing two-dimensional Fourier transform to obtain a defect image, and performing threshold segmentation on the defect image to obtain a binary image only containing defects; and analyzing the connected regions to obtain the gravity center position of each defect and the defect area determined by the pixel number and the single pixel area. The problems of serious clutter interference, insufficient defect imaging contrast ratio, difficulty in quantitative evaluation of defect size and the like in the existing microwave detection can be solved.

The invention relates to the technical field of polyethylene pipeline welded joint defect detection, in particular to a polyethylene pipeline welded joint microwave detection device and method based on a separable annular guide rail. The detection device comprises a profile support, an axial movement control device, a separable annular guide rail assembly and a circumferential detection device. The detection method comprises the steps that the clamping jaw type control mechanism drives the motor to be connected with the semi-annular guide rail; the ultrasonic distance sensor array measures the relative position of the annular guide rail and the polyethylene pipeline in real time, and a distance model of the annular guide rail and the polyethylene pipeline is established; calculating the adjusting distance of the microwave probe, and pushing the microwave probe by an electric push rod according to the adjusting distance; performing axial line scanning analysis to obtain an axial coordinate of the welding joint; different scanning modes such as spot scanning are executed according to different detection signals; the electric push rod adaptively adjusts the distance of the microwave probe according to the distance model. The device has the characteristics of stability, reliability, high adaptability to pipelines with different pipe diameters, high detection efficiency and the like.

The invention discloses a solar cell and a preparation method thereof, and relates to the field of photovoltaic technology. According to the preparation method of the solar cell, the laser spot scanning speed is controlled, so that when the first doped silicon layer and the first dielectric layer of the exposure area are etched subsequently, the edge etching depth of the exposure area is shallower, the middle etching depth of the exposure area is deeper, and the first groove can have an inclined side wall. When the second doped silicon layer is subsequently prepared, the second doped silicon layer is not deposited below the first doped silicon layer. And then the first doped silicon layer and the second doped silicon layer can be completely separated by manufacturing the second groove, so that minority carrier recombination and electric leakage channels caused by contact of the first doped silicon layer and the second doped silicon layer are reduced, and the performance of the solar cell is improved. In addition, the preparation method is high in process efficiency.

The invention relates to the field of optical detection, in particular to a large-aperture quasi-plane optical element in-situ contour detection method based on three measuring heads, which comprises the following steps: S1, planning a detection point and a detection path of a large-aperture quasi-plane optical element; s2, carrying out point-by-point scanning on detection points distributed on the large-aperture quasi-plane optical element according to the planned detection path by adopting a three-probe detection device; wherein lasers emitted by three laser measuring heads of the three-measuring-head detection device are obliquely incident to the surface of the large-aperture quasi-plane optical element respectively to form three measuring points, and distance values from the three laser measuring heads to the measuring points are obtained at the same time; s3, calculating space coordinates of the three measurement points by using the three distance values, and performing plane fitting to obtain two-dimensional slopes of the detection points; and S4, reconstructing the surface shape of the large-aperture quasi-plane optical element according to the two-dimensional slope of each detection point. According to the invention, large-range mirror surface contour detection can be realized, and the mirror surface contour detection precision can be improved.

The invention provides a near-field scanning rapid imaging device for the radio frequency performance of a multi-channel electrically tunable base station antenna, and relates to the technical field of radio frequency antenna testing, the device comprises a scanning assembly and a data processing module, the scanning assembly is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a vector network analyzer connected with the radio frequency probe, and the data processing module is connected with the scanning assembly. The scanning module is used for performing point-by-point scanning in an antenna near-field area along a preset plane grid path and collecting scattering parameters representing electromagnetic field characteristics at sampling points to form a near-field scanning data set; and the data processing module receives the data set, executes fast Fourier transform operation, and converts near-field data into far-field radiation characteristics so as to generate a far-field radiation pattern representing the radio frequency performance of the antenna. And the data processing module applies a preset static compensation matrix to the near-field data before conversion, so that the mutual coupling effect between the probe and the antenna is inhibited, and the accuracy of a measurement result is improved.

The invention discloses a supersonic speed laser spraying device and method, relates to the technical field of laser spraying, and realizes laser transmission and supersonic speed powder flow collaboration through cooperation of optical elements such as an output optical fiber, a collimating lens group and a convergent lens and a Laval nozzle structure. The method comprises the steps that multi-parameter closed-loop regulation and control are conducted, parameters such as the molten pool temperature and the powder flow divergence angle are monitored synchronously, and a process health index is constructed to trigger laser power, airflow pressure and powder feeding amount dynamic compensation; self-adaptive focus scanning is carried out, the focus position is adjusted in real time through a laser displacement sensor, and working modes are switched in linkage with a process health index; and lens abnormity diagnosis is carried out, a health index is constructed by using dual-wavelength transmissivity and wavefront distortion, and grading early warning and linkage powder feeding amount adjustment are carried out. According to the scheme, coating defects can be reduced, and the spraying precision and the system stability are improved.

The utility model relates to the technical field of electron beam lithography, in particular to an electron emitter. The electron emitter comprises a patterned light source, a lens unit and a photoelectric material unit; the patterned light source comprises a light source and a pattern generator, the lens unit is arranged between the pattern generator and the photoelectric material unit, and the pattern generator is used for modulating light beams emitted by the light source; after a light beam emitted by the light source is modulated by the pattern generator, an optical pattern with light and shade changes is generated, the optical pattern is irradiated on the surface of the photoelectric material unit after being amplified and imaged by the lens unit so as to generate an external photoelectric effect, and an electron beam with the optical pattern is formed. According to the electron beam lithography device, electron beams with optical patterns can be sent into the electron optical system to directly carry out patterning electron beam lithography treatment, and exposure carried out in a point-by-point electron beam scanning mode in the prior art is not needed, so that the electron beam lithography efficiency is greatly improved by the electron beam lithography device.

The application provides a point melting forming method and system based on an electron beam heat source, and the method comprises the following steps: model slicing and path planning, adaptively slicing a three-dimensional model to obtain two-dimensional contour data of each layer section; point array processing, dividing a single layer section area into a contour point array and a filling point array, adaptively discretizing and sampling the contour point array based on curvature change, and generating a basic point array mode with regular arrangement for the filling point array; scanning sequence generation and optimization, converting the discretized point array into an ordered scanning instruction sequence, predicting thermal field evolution under different scanning sequences by establishing a thermal influence model, and iteratively optimizing the scanning sequence based on a multi-objective optimization algorithm; and layer-by-layer point melting forming, controlling electron beam point-by-point melting of metal powder according to the optimized point scanning sequence. The application replaces continuous line scanning with a discrete point melting mode, significantly reduces thermal accumulation and thermal stress, and improves the size accuracy and surface quality of the formed part.

The invention discloses a dual-polarized antenna with an adjustable radiation zero point applied to a satellite communication phased array system. The dual-polarized antenna comprises a radio frequency connector, a radiation metal patch, a metal floor and a dielectric substrate located between the radiation metal patch and the metal floor. The radiation metal patch comprises four groups of metal sheets, and any two adjacent groups of metal sheets are arranged at intervals; the number of the radio frequency connectors is four, and each radio frequency connector is connected with a group of metal sheets; the dual-polarized antenna with the adjustable radiation zero point further comprises two groups of radiation zero point scanning control networks, one group of radiation zero point scanning control networks is connected with two groups of opposite metal sheets through radio frequency connectors, and the other group of radiation zero point scanning control networks is connected with the other two groups of opposite metal sheets through radio frequency connectors. The dual-polarized antenna with the adjustable radiation zero point is simple in structure, and scanning control and dual polarization of the radiation zero point can be achieved.

The application discloses a kind of multi-beam confocal mask defect detection system and method based on fiber laser array, the present application obtains multi-point scanning light field as illumination light source based on fiber laser array, and can be based on the arrangement of laser array Realize the regulation and control of scanning light field, through the joint action of motion platform and multi-surface rotating mirror, realize fast and accurate mask two-dimensional scanning imaging, and based on confocal microscopic imaging method, with high-power microscope objective and photomultiplier tube Realize high-resolution detection of mask defect.Compared with the traditional point scanning type mask defect detection system, the present application has the advantages of high detection resolution, fast scanning speed, multi-point scanning light field can be freely regulated and controlled, and does not need to introduce additional diffractive optical element.

The invention discloses an angle continuously adjustable super-resolution microscope illumination device and method. The device comprises a light beam coupling assembly; an LED-DMD excitation light path and a digital micromirror array perform intensity modulation on Kohler illumination light according to a loaded intensity distribution reference pattern, a first light beam is reflected, and the first light beam is projected to a sample plane through a light beam coupling assembly and a conjugate light path in sequence; an SLM-Laser excitation / light control light path, a spatial light modulator performs phase modulation on parallel light according to a loaded phase distribution reference pattern to generate a second light beam, and the second light beam is coupled with the first light beam through a light beam coupling assembly and then is projected to a sample plane; the excitation mode switching module is used for switching a conjugate surface to realize TIRF illumination or spot scanning excitation; the control system realizes seamless switching between a preset light control imaging mode and a real-time light control imaging mode. The problems that a traditional super-resolution microscope is single in function, high in phototoxicity, poor in adaptability and the like are solved, and a more powerful imaging platform can be provided for biomedical research.

The invention discloses an up-conversion microscopic imaging rapid spot scanning method and device based on light-operated fluorescence erasure, and the device comprises an excitation light module, a loss light module, a double-beam coupling module, a laser spot scanning module, and a fluorescence detection imaging module. When the probe is lighted by the exciting light and the scanning passes, the following loss light acts on the probe which is emitting the fluorescence, and the fluorescence loss is quickly induced, so that the residual fluorescence is extinguished (the fluorescence lifetime is shortened) and the imaging brightness is not weakened. According to the method, the trailing phenomenon caused by overlong fluorescence lifetime in the up-conversion point scanning fluorescence microscope is solved, the limitation of the fluorescence lifetime on the point scanning imaging speed is broken through, and up-conversion rapid point scanning microscopic imaging without brightness loss and trailing can be realized.

The application discloses a multi-system microwave nondestructive testing and imaging scanning system and method, relates to the technical field of nondestructive testing, and comprises a near-field probe, a single-port vector network analyzer, a plane scanning frame and an upper computer.

The invention relates to the technical field of microscopy optics, in particular to a spot scanning confocal adjusting system and method, light emitted by a light source is parallel light beams, the divergence angle is smaller than 1mrad, the light beams reach a galvanometer through a spectroscope, reach a target object through a scanning mirror set and an objective lens, return after being reflected by the target object, pass through the spectroscope capable of rotating, and then pass through a scanning mirror set. After being reflected, the laser reaches the confocal hole through the focusing lens; the confocal hole is located at the rear focus of the lens, and confocal imaging is achieved. According to the invention, through the rotatable spectroscope, the imaging condition of the target object at the confocal hole position can be observed by one camera at the same time. The technical problem that the position of the confocal hole is difficult to find if the initial position of the confocal hole is not within the view field range of the camera due to the fact that the confocal hole is small, a camera with a high amplification factor needs to be selected for clearly seeing the confocal hole and the image plane range which can be observed by the camera is very small in the debugging process is solved.

The application discloses a glass substrate hole modification method and an integrated waveguide manufacturing method, and comprises the following steps: focusing a laser focus on one side of a glass substrate close to the bottom surface thereof; controlling the laser focus to perform annular scanning along the outer contour of a preset hole to form a closed modification ring; controlling the laser focus to perform point-by-point scanning with a preset dot array interval in the internal area surrounded by the modification ring to form an array distributed modification dot array; and making the laser energy density of the annular cutting area of the modification ring lower than the laser energy density of the filling area of the modification dot array. The application can assist in high-precision preparation of a through hole and a blind hole with a vertical sidewall and a flat bottom on a glass substrate, thereby effectively improving the performance of a millimeter wave slow wave passive device and reducing the cost.

This application proposes a method and device for calibrating a spectral sensor under low-light conditions. The method includes: constructing a calibration optical system, which consists of a standard low-light adjustable light source and a converging optical path; providing a motion unit for the spectral sensor to be calibrated; adjusting the wavelength output by the calibration optical system, moving the motion unit at each wavelength, obtaining an imaging unit response map for each position in the imaging array, and splicing the individual imaging unit response maps at the same wavelength into an array calibration image through an algorithm. The array calibration images at different wavelengths are matched with the spectral information of the calibration optical system to generate a data set reflecting the relationship between the spectral sensor response and the calibration spectrum; inverting the data set through an inversion algorithm to obtain the spectral response of the spectral sensor to complete the calibration. This method can perform complete and accurate spectral sensor calibration under low-light conditions by combining spot scanning and image splicing.

The present application provides a fixed-target sample scanning method and system based on an X-ray free electron laser. The method comprises: acquiring a fixed target sample image of an X-ray free electron laser; performing sample identification on the basis of the fixed target sample image to obtain an identified sample image; acquiring a pulse point of the X-ray free electron laser, and sorting sample coordinates in the identified sample image on the basis of coordinates of the pulse point, to determine a scanning path of a fixed target sample; and performing fixed-point scanning on the fixed target sample on the basis of the scanning path. The present application realizes the identification and fixed-point scanning of a fixed target sample of an X-ray free electron laser, thereby improving the utilization rate, and further improving the experimental efficiency and the quality of data.

The application provides a simulation prediction analysis method for laser polishing of a microtopography and roughness of a diamond surface, and comprises the following steps: creating a mapping relationship data table of laser parameters and laser spot size and power density; establishing a mapping relationship model diagram of laser spot power density, pulse width, laser incidence angle and diamond surface ablation pit depth; constructing an analysis model of a laser spot stacking state; generating a simulation image of the microtopography of the laser polished diamond surface; and predicting the roughness of the laser polished diamond surface. The application takes the machining parameters of laser spot power, pulse width, repetition frequency, defocusing amount, incidence angle, transverse scanning rate and longitudinal stepping interval as inputs, takes the microtopography and roughness of the laser polished diamond surface as outputs, and establishes a mapping relationship between the inputs and the outputs through simulation analysis of the size of the ablation pit, the spot scanning path and the spot stacking state, so as to guide the optimization of the laser polishing process parameters.

The invention relates to the technical field of photovoltaic modules, and discloses an IV test method and device, electronic equipment, a storage medium and a program product, and the method comprises the steps: carrying out the light bath pretreatment of a module, and evaluating the effect through a power stability test; after the standard is reached, forward and backward voltage scanning tests are carried out, the scanning speed is controlled to enable the hysteresis to be lower than a preset threshold value, and the test power is determined to be stable based on a power stability criterion; and then a fill factor and photoelectric conversion efficiency are calculated, and an efficiency true value is evaluated through a weighted average function. Short-term stability is established through preprocessing, and initial fluctuation caused by the capacitance effect is reduced; the power test ensures a reliable starting point; carrying out scanning control and criterion suppression on hysteresis errors; and the weighted average improves the accuracy. The hysteresis error problem caused by the capacitance effect is effectively solved, efficient and accurate testing is achieved, and the testing speed and the result reliability are improved.

The invention discloses a method for improving stress corrosion resistance of a welded joint through laser shock strengthening, and relates to the technical field of titanium alloy welded joint strengthening. The method comprises the following steps that firstly, a welding joint area of a titanium alloy welding sample is heated to 400-700 DEG C through heating of a magnetic induction coil, and then 2-5 times of laser shock peening treatment is conducted on the welding joint area with 1-10 J laser pulse energy under the heat preservation condition of 400-700 DEG C; the welding joint is obtained through an electron beam welding process; a laser spot scanning strategy of the laser shock peening treatment is the same as a scanning strategy when a welding joint is obtained through an electron beam welding process. According to the method, the stress corrosion resistance of a welding joint area is remarkably improved and the service life of the welding joint area is remarkably prolonged through the synergistic effect of magnetic induction coil heating and laser shock peening treatment and optimization of respective processes particularly aiming at the service requirement of a titanium alloy welding structure for deep sea equipment in a high-pressure and high-salt environment.

The invention discloses a method for correcting a jumping error in a height direction of a spot scanning topography instrument, and solves the problems of jumping error in the height direction and low measurement precision of the spot scanning topography instrument in the prior art. A spot scanning morphology instrument adopted in the error correction method comprises a base, a gantry stand column and a Y-direction direct-drive motion table are arranged on the base, a vertical lead screw module is arranged on the gantry stand column, and a vertical motion assembly is arranged on the vertical lead screw module; the vertical movement assembly comprises a rotary table and a swing table which are connected. A high-precision displacement sensor is arranged on the swing table; an X-direction direct-drive moving table is arranged on the Y-direction direct-drive moving table; and a marble leveling platform is arranged on the X-direction direct-drive moving platform. According to the invention, a high-precision displacement sensor of the spot scanning topography instrument is utilized to effectively reduce the influence of run-out errors on the measurement result of the height information of the sample when the X-direction and Y-direction direct-drive motion tables walk; the non-contact measurement ensures the measurement efficiency and avoids the friction and abrasion between the probe and the sample at the same time; and the accuracy of sample morphology measurement is effectively ensured.

The utility model relates to a kind of fine-tunable galvanometer fixed frame, for installing galvanometer, including base and installation fixed plate, base is equipped with galvanometer mounting portion, galvanometer mounting portion surface is galvanometer mounting face, first recess is equipped on galvanometer mounting face, installation fixed plate is buckled on galvanometer mounting face, galvanometer is installed between galvanometer mounting portion and installation fixed plate, installation fixed plate is connected with galvanometer mounting portion by adjusting screw, adjusting screw is located at the both sides of galvanometer.Compared with prior art, the utility model has installation fixed plate and galvanometer mounting portion are connected by adjusting screw, after adjusting screw is tightened, the clamping of galvanometer is realized, and the angle of galvanometer can be changed by fine-tuning adjusting screw, the installation error caused by slight eccentricity of galvanometer or machining tolerance is compensated;Further ensure the stability and repeatability of laser spot scanning path, especially suitable for the two-photon fluorescence imaging system with extremely high requirements for scanning consistency and spatial optical axis coincidence degree.

The present application relates to the technical field of crystal nondestructive testing, and particularly relates to a crystal defect nondestructive testing method and system based on pumped probe transient absorption spectrum, which comprises the following steps: detecting a target region of a crystal to be tested by using pump light and probe light; collecting a transient absorption image of the target region according to a preset time delay between the pump light and the probe light, and extracting a target risk region; focusing the pump light and the probe light, and performing point-by-point scanning on the target risk region by using the focused pump light and probe light; collecting three-dimensional transient absorption intensity distribution and defect dynamic evolution data of each scanning point in the target risk region under different time delays; performing correlation calibration based on the transient absorption image and the three-dimensional transient absorption intensity distribution to obtain defect parameters; and constructing a damage prediction model based on sample damage threshold data, and outputting damage threshold prediction results according to the defect parameters. The purpose is to realize nondestructive and rapid detection of internal defects of deuterated potassium dihydrogen phosphate crystals.

The invention discloses an aberration estimation method for a spot scanning fluorescence microscope based on a phase difference algorithm, and the method comprises the steps: taking a defocus plane image as a phase difference image through a point spread function three-dimensional image of a spot scanning structure illumination microsystem obtained through measurement in an experiment; and aberration estimation of the spot scanning structure illumination obvious microsystem is realized. Besides, in order to better realize aberration estimation, the invention provides a point spread function mathematical model of a point scanning structure illumination obvious microsystem, and the point spread function mathematical model is fused into an iterative algorithm to serve as a calculation basis of an optical transfer function. Therefore, the aberration estimation algorithm for estimating the conjugate aberration in the point spread function three-dimensional image of the spot scanning structured light microscopic illumination system is designed, and the problems that an existing aberration estimation method of the spot scanning structured light microscopic illumination system is high in cost and system complexity and difficult to maintain are solved.