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216 results about "Standard plane" patented technology

Standard plane. [′stan·dərd ′plān] (crystallography) The crystal plane whose Miller indices are (111), that is, whose intercepts on the crystal axes are proportional to the corresponding sides of a unit cell.

Device for detecting wave front of large-aperture optical system

The invention relates to a device for detecting the wave front of a large-aperture optical system. The device comprises an interferometer, a five-dimensional adjustment platform, a numerical-control turntable, a numerical-control electric displacement platform, a self-collimation standard plane mirror, a two-dimensional adjustment rack and a computer control and data processing system. The device is characterized in that: the wave front of the large-aperture optical system is divided into a plurality of sub-aperture wave fronts, the interferometer and the self-collimation standard plane mirror detect the sub-aperture wave fronts of the large-aperture optical system, the numerical-control turntable and the numerical-control electric displacement platform control the standard plane mirror to move so as to scan the sub-aperture wave fronts, the interferometer detects and records the sub-aperture wave fronts, so that the detected sub-aperture wave fronts cover the whole large-aperture optical system; and the computer control and data processing system stitches the sub-aperture wave fronts through algorithms, so that the full-aperture wave front of the large-aperture optical system is obtained, and the detection on the wave front of the large-aperture optical system is finished. The device has the advantages of simple structure, low cost and capability of detecting the image quality of the wave front of a large-aperture optical system with the aperture of not less than 1000 mm.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Large-caliber off-axis non-spherical measuring and calibration system

The invention relates to a large-caliber off-axis non-spherical measuring and calibration system, which comprises an interference instrument, a standard lens, two plane concave lenses, a right-angle reflection prism, a standard plane reflection mirror and an off-axis non-sphere to be measured or calibrated. Standard parallel light which is transmitted from the interference instrument is focused on a focus point of the off-axis non-sphere to be measured or calibrated through the standard lenses, then the standard parallel light becomes parallel light after being reflected by the off-axis non-sphere and is reflected back along the original light path through the standard plane reflection mirror, finally the surface shape of the large-caliber off-axis non-sphere is analyzed and processed by image processing software of the interference instrument so as to complete the measurement of the large-caliber off-axis non-sphere. Narrow beam which is also transmitted from the center of the interference instrument enters the first plane concave lens along the direction of the main light axis, the narrow beam enters the right-angle reflection prism after being transmitted, the narrow beam deflects 90 degrees after being reflected by the right-angle reflection prism to enter the second plane concave lens, the narrow beam is finally emitted through the lowest point and the highest point of the off-axis non-sphere surface vector, and the standard plane reflection mirror is moved, so the beam is returned along the original path, the center of each element can be ensured to stay on the same height, and the geometric parameter measurement and calibration of the large-diameter off-axis non-sphere can be completed according to the known conditions.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Astigmatic compensation type interference detecting device and method for optic free curved surfaces

The invention discloses an astigmatic compensation type interference detecting device and method for optic free curved surfaces. The device comprises He-He lasers, a beam expander, a 1 / 2 wave plate, a polarized beam splitter, a first 1 / 4 wave plate, a second 1 / 4 wave plate, a standard plane reflector, a phase shifter, a first convergent lens, a to-be-tested free curved surface, a second convergent lens, a plane reflector, a polarizer, a rotating frosted glass screen, an imaging objective lens, a detector, a displayer and a computer. The method comprises the steps of placing the to-be-tested free curved surface in an inclined state to make test beams come in a specific angle in an inclined mode to compensate for main surface shape astigmatic error components of the to-be-tested free curved surface, therefore reducing the degree of divergence of the subsequent test beams, and making the stripes discernable on the detector. The detector collects a series of phase-shifting interferograms which are treated with a wave front reconstruction algorithm to obtain a surface shape of the to-be-tested free curved surface. According to the astigmatic compensation type interference detecting device and method for optic free curved surfaces, the astigmatic compensation method is used for testing optic free curved surfaces for which the main surface shape error components are astigmatism, the stability is high, and the cost is low.
Owner:NANJING UNIV OF SCI & TECH

Resetting and calibration of detector for visible and infrared composite light path light axis parallelism

The invention relates to a metnod for the assembling adjusting and standardization of a visible-infrared light compound optical path optical axis parallelism detector, which is characterized in that: placing a standard plane mirror on the back of the visible-infrared light compound optical path optical axis parallelism detector to roughly adjust the detector; placing a reflecting collimator and a high-temperature cross wire respectively on the back and the focal plane of the visible-infrared light compound optical path optical axis parallelism detector; electrifying the high-temperature cross wire to emit visible light wave and infrared light wave; adjusting the reflecting collimator to ensure the complete coincidence of the emitting visible cross wire image and the visible light image of the high-temperature cross wire on visible light CCD; adjusting the infrared part of the visible-infrared light compound optical path optical axis parallelism detector to ensure the completer coincidence of the infrared laser spot on infrared CCD and the infrared image of the high-temperature cross wire; standardizing the detector and calculating the optical axis parallelism difference between the visible light wave and the infrared light wave after the visible light and the infrared light gather in the same optical system with the help of software processing algorithm. The method has the advantages of convenient assembling adjustment and high precision.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Calibration method of spot scanning galvanometer of three-dimensional measuring system

The invention discloses a calibration method of spot scanning a galvanometer of a three-dimensional measuring system. The calibration method comprises seven major steps as follows: firstly performing system modeling, so as to obtain a galvanometer deflection angle expression, then adjusting a standard plane to be positioned in a known position and perpendicular to a system main direction, measuring the plane, projecting measured data to the standard plane, so as to obtain ideal data, utilizing the data to calculate a galvanometer deflection angle, matching a relational expression between the galvanometer deflection angle and driving voltage, and measuring the standard plane again through the relational expression, and repeating the process till the standard deviation from the measured data to the standard plane is smaller than a set value, so as to obtain an accurate relational expression between the galvanometer deflection angle and the corresponding driving voltage, establishing the interactional relation between two galvanometers, describing the non-perpendicularity error of axes of the two galvanometers, and correcting the relational expression, so as to improve the calibration accuracy. The calibration method has higher practical value in the technical field of optical three-dimensional measurement and laser processing.
Owner:BEIHANG UNIV

Occludator, face bow, occlusion-confirming system and temporomandibular joint-reproducing system

It is intended to provide an occludator whereby joint movements at occlusion being similar to the actual tempromandibular joint movements of an individual patient or ideal movements can be reproduced, and a face bow to be used for the occludator. To achieve this object, an occlusion plane against a standard plane is accurately drawn by using the above face bow F whereby the occlusion plane can be drawn at a high accuracy. A solid model of the tempromandibular joint similar to the tempromandibular joint form of an actual patient is used as the joint unit of the occludator K, while the positional relationship in the body at occlusion is three-dimensionally reproduced in the occludator I with the use of the above-described face bow F. It is also intended to provide an occlusion-confirming system and a tempromandibular joint-reproducing system with the use of an occludator whereby joint movements at occlusion being similar to the actual tempromandibular joint movements of an individual patient or ideal movements can be reproduced. To achieve this object, the tempromandibular joint of the body is photographed with a local X-ray CT device to give three-dimensional image data and then a solid model of the tempromandibular joint is constructed based on the three-dimensional image data. This solid model is employed as the joint unit of the occludator K and the positional relationship in the body at occlusion is three-dimensionally reproduced.
Owner:NIHON UNIVERSITY

Surveymeter for parallelism of optical axis of visible and infrared light wave

The invention relates to a surveymeter for parallelism of optical axis of visible and infrared light wave, comprising an infrared light part and a visible light part. Firstly, aiming is operated by employing visible light, the visible light emitted by a visible light source lightens up a cross wire by a cross-linegraticule, an emergent visible cross wire image is formed on a visible light CCD, after being reflexed by an infrared beam splitter, a secondary mirror, a primary mirror and a standard flat mirror, the emergent visible light returns to the visible light CCD by the optical devices and forms a return cross wire image, and a system is adjusted to superpose the emergent visible cross wire image and the return cross wire image, thereby completing instrument aiming. Then infrared light is employed for detecting, iraser emitted by an infrared laser passes through a series of optical elements of the infrared light part, and an emergent infrared spot and a return infrared spot on an infrared CCD are extracted by measurement software. Error value of the parallelism can be obtained by formula computing. The surveymeter of the invention adopts the visible light to aim and the infrared light to detect the parallelism error, thereby reducing experiment risk while improving measurement precision.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Sub-aperture stitching-based high-accuracy planar optical element face type detection method

The invention relates to a sub-aperture stitching-based high-accuracy planar optical element face type detection method. A detection device comprises a two-dimensional translation table, an interferometer and a standard planar lens. The method specifically comprises the following steps: fixing a planar optical element on the two-dimensional translation table and arranging the interferometer aiming at the position of the planar optical element; adjusting the two-dimensional translation table to reach a specified target distribution region to align an exit pupil of the interferometer with a geometric central part of the planar optical element; sampling, measuring and calculating the geometric central part by the interferometer to obtain sub-aperture face type information; and repeating the steps until the measurement of all sub-apertures is finished, thereby realizing sub-aperture measurement of the planar optical element. According to the method, the complete face type of the measured planar element is restored through a certain stitching algorithm aiming at the characteristic of higher planarity of the face type of the high-accuracy planar optical element, and an economic and effective detection method is provided for checking the face type of the high-accuracy planar optical element.
Owner:TONGJI UNIV

Opto-mechanics infrared imager based on hartmann wavefront sensor

The invention relates to a photodynamic infrared imaging instrument based on a Hartmann wavefront sensor. The invention comprises an infrared imaging system, a focal plane array, a cold light source system, an optical readout system and an IR image restorator; an infrared object images on the focal plane array by the infrared imaging system; infrared thermal radiation gets an FPA unit in the focal plane array to produce slight deformation, then standard plane waves emitted by the cold light source system irradiate on the FPA unit by a spectroscope and are reflected in order that the wavefront information with a slight surface-shape change can enter the optical readout system by the spectroscope; wavefront detection is carried out on the wavefront information by the Hartmann wavefront sensor of the optical readout system, then the thermotropic corner information of each FPA unit is extracted from the wavefront information detected by the optical readout system and reconstructed to an infrared image of a detected object by the IR image restorator according to relative algorithm. The photodynamic infrared imaging instrument utilizes the Hartmann wavefront sensor, has the advantages of detecting wavefront signals in high precision and high frame rate and improves the sensitivity of the photodynamic infrared imaging instrument, thereby acquiring the infrared image with better quality.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Micro-impulse measuring method based on multi-beam laser heterodyne second harmonic method and torsion pendulum method

The invention relates to a micro-impulse measuring method, in particular to a micro-impulse measuring method based on a multi-beam laser heterodyne second harmonic method and a torsion pendulum method. The micro-impulse measuring method solves the problem of low measurement accuracy caused by poor laser difference frequency signal acquisition effect and low signal processing speed when the existing method of using multi-beam laser heterodyne to measure micro-impulses is adopted. By using the multi-beam laser heterodyne second harmonic method in the micro-impulse measuring method, the measurement of the micro-impulses is converted into the measurement of the swinging angle of a torsion pendulum, the information of the swinging angle to be measured can be obtained indirectly through the measurement of the thickness of a standard plane mirror, the measurement accuracy is effectively improved, the measured impulses are in a linear relation with the incident angles when a rotating angle issmaller than 5 degrees, the measurement error is smaller than 0.5 percent, the requirement on the measurement of the impulse of a laser micro-thruster can be satisfied, and a very good measurement means for evaluating the performance of the laser micro-thruster is provided.
Owner:HARBIN INST OF TECH

Method for quickly measuring object surface steps through spectrum confocal line scanning

The invention discloses a method for rapidly measuring object surface steps through spectrum confocal line scanning. The method comprises: a spectrum confocal line scanning device is built; a standardplane mirror is detected, the position of the standard plane mirror is moved in the axial direction, meanwhile, the coordinate position of the standard plane mirror is monitored, and the dispersion focusing range of a chromatic dispersion focusing element and the wavelength-position relation curve of the spectrum confocal line scanning device are calibrated; the standard plane mirror is replacedwith a sample for detection, and the surface of the sample is placed in a dispersion focusing range of the chromatic dispersion focusing element; an intensity point spread function of a return signalof a spectrograph is analyzed, a peak coordinate position is calculated by using a centroid method to obtain a return signal wavelength, and according to the wavelength-position relation curve, the maximum height difference of the surface of the sample is decoded, and the steps of the surface of the sample are rapidly calculated. The method has the beneficial effects that the structure is simple,the measurement speed is high, precision is high, the application range is wide, and the method is suitable for precise measurement of transparent or opaque steps, grooves, inclined surfaces and the like.
Owner:XI AN JIAOTONG UNIV

REVO (Resident Encrypted Variable Output) measuring head position posture calibrating method in joint arm type coordinate measuring machine

The invention belongs to the field of testing technology and instrument and provides a calibrating method of a joint arm type coordinate measuring machine which can improve the measuring precision. According to the technical scheme adopted by the invention, an REVO (Resident Encrypted Variable Output) measuring head position posture calibrating method in the joint arm type coordinate measuring machine is carried out on a measuring machine device and the method comprises the following steps of: establishing a coordinate system, wherein an X axis is parallel to an x-directional movement axis of the REVO measuring head and a Z axis is parallel to a z-directional movement axis of the REVO measuring head; calibrating the parallelism depth of a B axis of the REVO measuring head and the z-directional movement axis: in order to determine a parallelism depth error on an xoy coordinate plane of the A axis of the Revo measuring head corresponding to the x-directional movement axis, vertically placing the other plane on a standard plane which is vertically placed and carrying out measurement. The REVO measuring head position posture calibrating method in the joint arm type coordinate measuring machine is mainly used for measuring.
Owner:TIANJIN UNIV

Method for adjusting optical axis parallelism of multi-optical-axis imager

InactiveCN103116209AGuaranteed image qualityParallelism Tuning RealizationMountingsOptical axisPlane mirror
The invention relates to a method for adjusting optical axis parallelism of a multi-optical-axis imager. The method includes the steps: assembling a standard plane mirror on an interferometer and adjusting a single-mode dual-plane reflector to be self-aligned; inversely placing an optical-mechanical structure of the multi-optical-axis imager between the interferometer and the single-mode dual-plane reflector; adjusting a mounting base surface of the multi-optical-axis imager to be perpendicular to the optical axis of the interferometer; assembling a standard spherical mirror on the interferometer and adjusting the position and the inclination angle of a first channel optical-mechanical system on the mounting base surface to enable the first channel optical-mechanical system and a standard spherical mirror system to be confocal; and adjusting the position and the inclination angle of a second channel optical-mechanical system on the mounting base surface to enable the second channel optical-mechanical system and the standard spherical mirror system to be confocal. In the method, no special devices are needed, multi-optical-axis parallelism and system wave aberration can be simultaneously adjusted, and adjusting precision and efficiency are effectively improved.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Three-dimensional laser scanning device system parameter calibration method

The invention discloses a three-dimensional laser scanning device system parameter calibration method. Since laser scanning device system parameters have inherent mechanical installation and measurement errors during measuring, each parameter needs to be tuned slightly on the basis of the measured value. The invention discloses a reliable method for obtaining system parameter fine-tuning amount. The method is characterized by, to begin with, obtaining a point cloud model of a standard plane target through a three-dimensional laser scanning device; then, determining an evaluation index serving as a metric of precision of the point cloud model to enable the fine-tuning amount of the system parameters and the metric of precision of the point cloud model to be in a function relationship; and finally, searching a group of system parameter fine-tuning amount capable of enabling the point cloud model precision to be the highest, that is, precision metric value to get the optimum value, through a pattern search method, and thus the group of fine-tuning amount is the optimum system parameter fine-tuning amount. Result shows that after the system parameters are calibrated through the method above, the precision of point cloud data obtained by the scanning device in scanning a three-dimensional space scene is effectively improved.
Owner:HUAZHONG UNIV OF SCI & TECH

Calibration method for linear radar measurement system based on standard plane

The invention discloses a calibration method for a linear radar measurement system based on a standard plane, which comprises the following steps: step one, a linear laser sensor is enabled to be connected to a numerically-controlled moving platform, and a selected tetrahedron calibration workpiece is installed in the measurement system; step two, a calibration coordinate system is built according to a coordinate axis to be calibrated in a linear laser sensor coordinate system and a non-correspondence coordinate axis of the coordinate axis to be calibrated in a world coordinate system; step three, point cloud data of the calibration workpiece in the linear sensor coordinate system is acquired through the linear laser sensor; step four, calibration parameters in the calibration coordinate system are calculated according to the point cloud data acquired in the step three; step five, a direction vector of the coordinate axis to be calibrated is calculated according to the calibration parameters in the step four and a calibration model; and step six, the linear laser sensor moves along the direction of the other coordinate axis to be calibrated in the linear laser sensor coordinate system, executing the above steps in a repeated manner so as to acquire a direction vector of the other coordinate axis to be calibrated. The calibration method is high in reliability and small in system error.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

Infrared radiometer calibration method on basis of standard plane source black body

ActiveCN103743489AEliminate the effects of additional radiationRadiation pyrometryTemperature controlEmissivity
The invention discloses an infrared radiometer proportional constant calibration method on the basis of a standard plane source black body and belongs to the field of infrared optimal radiation. The calibration method aims at the characteristics that a chopper of a current infrared radiometer is sprayed with high-emissivity black paint and the current infrared radiometer is provided with four temperature probes; when the temperature of the chopper is equal to that of a built-in temperature control reference black body, a signal is acquired, so that additional radiation of the chopper is avoided entering a detector; and moreover, in the signal acquiring process, the environment temperature, the temperature in a shell and the temperature of the chopper are requested to be equal to enable radiation among the environment, the shell and the chopper is dynamically balanced, and thus, influence of additional radiation of the chopper, the inside of the shell, the environment and the like can be eliminated. In addition, in the calibration method, calibration of a plurality of temperature points is also carried out in a common environment temperature range, so that the defect of replacing a plane with points in a conventional method, i.e. one temperature point replaces a plurality of temperature points to carry out calibration, is overcome. Compared with the prior art, the infrared radiometer proportional constant calibration method has higher accuracy.
Owner:西安应用光学研究所

Method for measuring three-dimensional surface shape of membrane mirror

The invention discloses a method for measuring a three-dimensional surface shape of a membrane mirror. A measuring system comprises a liquid crystal display, a standard planar mirror, a charge coupled device (CCD), an image acquisition card, a computer and the like, wherein the liquid crystal display displays orthogonal sine stripes input through the computer; the CCD acquires compound stripes which are reflected by the standard planar mirror and the membrane mirror; and the system extracts phases in two orthogonal directions by using Fourier transformation profilometry, calculates phase changes in the two orthogonal directions caused by the membrane mirror, calculates gradient distribution of the membrane mirror according to a relation between gradient and the phase changes, and reconfigures the surface shape according to the gradient. By adopting an orthogonal sine stripe reflection technology, measurement of the surface shape of the membrane mirror can be realized only by acquiringa frame of bar graph reflected by the standard planar mirror and the membrane mirror respectively. A measuring device is simple, low in cost and high in instantaneity; and the problem that the three-dimensional surface shape of the membrane mirror is difficult to measure can be solved effectively.
Owner:SUZHOU UNIV

A processing method for the seam of a cylinder block

The invention discloses a method for processing a stop mouth of an air cylinder body. The method comprises the following steps of: 1) finely milling the upper plane of the air cylinder; 2) measuring the sizes of at least three preset points at the periphery of each cylinder hole of the air cylinder body away from the preset plane to obtain each size parameter and inputting the size parameters into a numerical control platform, wherein the preset plane is parallel with the standard plane of the upper plane of the air cylinder body; 3) comparing each size parameter with the preset parameter value to obtain an offset value; 4) judging whether the offset value is in the preset offset value range, if so, turning to the step 5), and otherwise, turning to the step 2); 5) determining the plane byutilizing each size parameter and amending a processing coordinate system; and 6) under the amended processing coordinate system, processing the stop mouth of the air cylinder body according to the preset processing size. By the processing method provided by the invention, the processing precision of the stop mouth of the air cylinder body can be improved, consistency of products can be improved,processing rework rate and rejection rate are reduced, and manufacturing cost is reduced.
Owner:WEICHAI POWER CO LTD

Rapid phase-height mapping calibration method

The invention discloses a rapid phase-height mapping calibration method. The method comprises the following steps: establishing a three-dimensional measurement system; using a Harris corner detectionalgorithm for detecting the difference value of pixel coordinate values of checkerboard specific points shot by a camera to adjust the optical axis of the CCD camera to be perpendicular to a referenceplane; respectively obtaining high-precision absolute phase values of the standard plane before and after rotation through a time phase unwrapping method based on period correction; carrying out two-dimensional identification on the mark points on the rotated standard plane by using a centroid method to obtain pixel coordinates, and searching the absolute phase value of the corresponding mark point in the absolute phase value data of the corresponding standard plane; and fitting a plurality of virtual planes by using the slope of the standard plane and the absolute phase value of the mark point before rotation, and optimizing and solving system parameters by using a least square method to complete phase-height calibration. According to the invention, the calibration speed of the three-dimensional measurement system is greatly improved, and the method has potential application prospect and practical value in the field of desktop three-dimensional scanners.
Owner:NANCHANG HANGKONG UNIVERSITY
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