Rapid phase-height mapping calibration method

A calibration method and height technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of time-consuming and accumulated errors of the displacement table, the equipment is not easy to carry, and accumulated errors, etc., to reduce random errors, solve system calibration problems, Effect of Improving Calibration Accuracy

Active Publication Date: 2020-02-28
NANCHANG HANGKONG UNIVERSITY
View PDF16 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the actual large field of view measurement, it is time-consuming to use the stage to move the standard plane multiple times and more cumulative errors will be generated during the process of moving the standard plane
At the same time, the multi-view point cloud splicing by using the rotary table parameter calibration can complete the three-dimensional measurement of the measured object. However, when the traditional calibration method of a displacement table and a standard plane is used to calibrate the measurement system, the calibration process is time-consuming and the equipment is not easy. Issues such as carryover and accumulation errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Rapid phase-height mapping calibration method
  • Rapid phase-height mapping calibration method
  • Rapid phase-height mapping calibration method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings, but the present embodiments are not intended to limit the present invention, and any similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0018] A fast phase-height mapping calibration method includes the following steps:

[0019] (1) Establish a three-dimensional measurement system. Such as figure 1 As shown, the system includes a DLP projector, a CCD camera and a reference plane; where the optical axis of the DLP projector and the optical axis of the CCD camera intersect at point O, the DLP projector and the CCD camera are at the same height, and the distance between them is d, Their distance from the reference plane is L;

[0020] (2) Verticality calibration. Standard black and white checkerboards are used for verticality calibration, the checkerboard grid...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a rapid phase-height mapping calibration method. The method comprises the following steps: establishing a three-dimensional measurement system; using a Harris corner detectionalgorithm for detecting the difference value of pixel coordinate values of checkerboard specific points shot by a camera to adjust the optical axis of the CCD camera to be perpendicular to a referenceplane; respectively obtaining high-precision absolute phase values of the standard plane before and after rotation through a time phase unwrapping method based on period correction; carrying out two-dimensional identification on the mark points on the rotated standard plane by using a centroid method to obtain pixel coordinates, and searching the absolute phase value of the corresponding mark point in the absolute phase value data of the corresponding standard plane; and fitting a plurality of virtual planes by using the slope of the standard plane and the absolute phase value of the mark point before rotation, and optimizing and solving system parameters by using a least square method to complete phase-height calibration. According to the invention, the calibration speed of the three-dimensional measurement system is greatly improved, and the method has potential application prospect and practical value in the field of desktop three-dimensional scanners.

Description

technical field [0001] The invention relates to an optical three-dimensional measurement method, which belongs to the technical field of photoelectric detection. In particular, it relates to a fast phase-height mapping calibration method. Background technique [0002] Structured light 3D imaging technology has the advantages of high precision, high speed and non-contact measurement, and has been widely used in industrial inspection, quality control, 3D printing, cultural relics protection and other fields. With the industrialization and upgrading of my country's production structure, the demand for the accuracy of three-dimensional measurement of large structural parts is gradually increasing, and fast three-dimensional precision is inseparable from the processing and manufacturing, process equipment and product testing links of aerospace, large ships, automobile bodies and rail transit. Measure to ensure product quality. [0003] In phase measurement profilometry, the trad...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 伏燕军蔡晓奇刘彦昭陈建斌钟可君
Owner NANCHANG HANGKONG UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products