164 results about "Scattering radiation" patented technology

The invention relates to an electrochromic window multi-scene control method, system and device based on indoor human body thermal comfort and a medium. The method comprises the steps that a perception data set is constructed; based on the sensing data set, performing multi-parameter coupling calculation of solar incidence azimuth deviation constraint and dynamic projection overlapping to obtain a direct radiation component, performing window space coupling analysis and double space compensation calculation to obtain a scattered radiation component, and performing fusion to obtain an individual thermal radiation influence value; determining a scene category based on the perception data set, and establishing a thermal radiation evaluation benchmark by adopting a mode matched with the scene category; and if the thermal radiation evaluation benchmark exceeds a preset threshold value, the required transmissivity of the window faces is obtained through a full-transmissivity radiation distribution method, the corresponding window faces are adjusted to the target transmission gradient according to the required transmissivity, and coupling control over the wind direction and / or power of the air conditioning system is selectively triggered. According to the invention, by constructing a multi-dimensional dynamic sensing system and an intelligent control framework, collaborative optimization of human body thermal comfort and building energy efficiency is realized.

The invention provides an indoor temperature field prediction method and system considering dynamic change of solar radiation, and belongs to the field of indoor temperature field prediction.The method comprises the steps that an equivalent surface heat source intensity model of direct solar radiation and an equivalent surface heat source intensity model of scattered solar radiation are constructed respectively; respectively constructing a sub-temperature field prediction model of direct solar radiation and a sub-temperature field prediction model of scattered solar radiation; and performing linear superposition on the sub-temperature field prediction model of the direct solar radiation and the sub-temperature field prediction model of the scattered solar radiation according to moments to obtain an indoor temperature field space-time distribution prediction result under the influence of dynamic solar radiation. The method fully considers the influence of the dynamic change of the solar radiation, can predict the influence rule of the solar radiation on the indoor temperature distribution in the time and space dimensions, and further obtains an accurate prediction result.

Multiple synthetic aperture radar “SAR” images of a target area on the earth are acquired using a satellite travelling in an orbit above the earth in a single pass of the satellite over the target area. In some methods, the data for each image is acquired from a different angle of incidence with respect to the target area. Then, the variation of quantity of backscattered radiation with respect to angle of incidence is analysed and used to identify matter imaged in a pixel or pixel group. In other methods, the data for each image is acquired from a different angle of incidence with respect to the target area, and the different angles of incidence are determined based on the specular reflection curve for a particular material. Then the quantity of backscattered radiation is analysed to determine whether the particular material is present based on the quantity of backscattered radiation. ‘Extended dwell spotlight acquisition’ geometry may be used in which image data acquisition apparatus may be locked to illuminate same target as the satellite passes over the target for a period of for example 20 seconds.

Disclosed is a metrology method comprising: obtaining metrology data relating to a measurement obtained by illuminating a periodic structure comprising at least one pitch with partial coherent illumination comprising a wavelength and capturing the resultant scattered radiation from said periodic structure at a detection plane, said scattered radiation passing through at least one angularly resolved plane between said periodic structure and detection plane, said angularly resolved plane comprising at least one mask edge; non-iteratively reconstructing a field of said scattered radiation; using said reconstructed field to determine a parameter of interest of the structure; and in an initial step: selecting said wavelength and a maximum of said at least one pitch such that the wavelength- over-pitch ratio is greater than a first distance in said angularly resolved plane.

The invention relates to a photovoltaic array layout optimization method and device based on irradiation and shadow dynamic coupling, and the method comprises the steps: constructing a total irradiance model related to the inclination angle and azimuth angle of a photovoltaic module according to the direct solar radiation, scattered radiation and reflected radiation of the inclined surface of the photovoltaic module; calculating a shadow loss factor in combination with the critical unshielded spacing and the actual spacing of the front row and the rear row of the photovoltaic module array, and coupling the shadow loss factor to the total irradiance model to obtain an effective irradiance model; taking maximization of annual effective irradiance as an optimization objective, and constructing an optimization objective function based on an effective irradiance model; and by taking the inclination angle of the photovoltaic module, the azimuth angle of the photovoltaic module and the actual spacing as optimization variables, carrying out comprehensive balance optimization of dynamic irradiance income and shadow loss on the optimization objective function by adopting a fox-monkey optimization algorithm to obtain an optimal variable combination. According to the method, the core problems of large irradiation calculation error, shadow evaluation staticization and low optimization efficiency can be solved.

A method for training an algorithm for machine learning for a correction of recordings obtained by an imaging apparatus. A number of output images are recorded. Moreover a smaller number of first, high-quality scattered radiation images are simulated from the output images. A corresponding number of second, low-quality scattered radiation images is further simulated, wherein the simulation is undertaken with a number of photons reduced by at least an order of magnitude. The algorithm is trained with the second, low-quality scattered radiation images as input data and the first, high-quality scattered radiation images as output data.

An apparatus for measuring a parameter of a structure related to a semiconductor manufacturing process. The apparatus comprises a source assembly configured to provide measurement radiation having one or more first wavelengths for irradiating the structure on a substrate. The apparatus further comprises a filter arranged to receive scattered measurement radiation that has scattered from the structure, wherein the filter is configured to transmit the scattered measurement radiation at the one or more first wavelengths and filter out radiation at one or more second wavelengths. The filter comprises a film with a curvature in at least one direction. The apparatus further comprises a plurality of detectors, located downstream of the filter, configured to detect the filtered scattered radiation configured to measure the parameter of the structure.

An XRF borehole probe system and a method of operating an XRF borehole probe system are provided. The XRF borehole probe system includes at least a probe body, an X-ray radiation source arranged in the probe body, a detector for fluorescence and / or scattered radiation, the detector being arranged in the probe body, an evaluation device configured to evaluate the output signals generated by the detector, the evaluation device being configured for element analysis of the irradiated material, and the evaluation device being additionally configured to determine the specific density of the irradiated material and / or to determine the distance between the probe body and a borehole wall.

A computer-implemented method for determining an estimation of a two-dimensional scattered radiation distribution in a two-dimensional X-ray image that is based on an imaging procedure performed by an X-ray detector is provided. The method includes receiving the X-ray image, applying an estimation algorithm to the X-ray image or to a two-dimensional intermediate image determined from the X-ray image. The estimation algorithm determines a respective two-dimensional partial scattered radiation image for a plurality of physical scatter processes such that image values of pixels of the respective partial scattered radiation image in each case describe an estimated value for a respective scattered radiation dose that was applied to a respective detector region of the X-ray detector assigned to the respective pixel during acquisition of the X-ray image by the respective physical scatter process. The estimation of the scattered radiation distribution is determined based on the plurality of partial scattered radiation images.

The invention relates to a method for protecting an adhesive layer (20) on an optical component (11), in particular on an optical component (11) for wavefront deformation, from scattered radiation (22), in particular from scattered radiation (22) in the UV wavelength range, comprising: protecting the adhesive layer (20) from the scattered radiation (22) by introducing an internal engraving (23) into a material of the optical component (11) and / or protecting the adhesive layer (20) from the scattered radiation (22) by applying at least one protective layer (24) to at least one surface (19a) of the optical component (11) not covered by the adhesive layer (20). The invention also relates to an optical component (11) and to a semiconductor technology system.

The present disclosure describes methods and systems for measuring crosswind speed by optical measurement of laser scintillation. One method includes projecting radiation into a medium, receiving, over time, with a photodetector receiver, a plurality of scintillation patterns of scattered radiation, comparing cumulative a radiation intensity for each received scintillation pattern of the received plurality of scintillation patterns, and measuring a cumulative weighted average cross-movement within the medium using the compared cumulative radiation intensities.

The invention relates to a DUET photovoltaic power generation power prediction method and system based on space-time bi-clustering and dynamic gating fusion, and belongs to the technical field of new energy power system prediction. For the problems of low prediction precision and poor robustness caused by meteorological dynamic disturbance of photovoltaic power, a time clustering module TCM is adopted to extract potential distribution and a linear mode of historical power data, and a time drift error is solved; key control variables such as scattered radiation and temperature are screened through a channel clustering module (CCM) in combination with causal sparse constraint and a frequency domain attention mechanism, and periodic features are enhanced; a bidirectional space-time cross attention and adaptive gating technology of a fusion module FM is utilized to dynamically integrate a time sequence self-correlation characteristic and a cross-channel joint influence. According to the method, the prediction precision in sudden weather change is remarkably improved, the generalization ability and the real-time performance of the model are enhanced, and reliable decision support is provided for power grid dispatching.

For particularly rapid and effective scattered-radiation correction of 2D X-ray images, a method is provided for scattered-radiation correction for an X-ray image or a series of X-ray images, which images may be acquired by an acquisition system having an X-ray source, an X-ray detector, and a collimator that shapes the primary X-ray radiation. The method includes: providing the X-ray image acquired in a first setting of the collimator in which setting the object under examination is illuminated; providing an auxiliary X-ray image acquired in a second setting of the collimator in which second setting are illuminated, in particular solely one or more sub-regions of the X-ray detector; subtracting the auxiliary X-ray image from the X-ray image; determining a scattered-radiation correction using image data from the X-ray detector obtained from the subtraction at least in the region of the sub-regions; and correcting the X-ray image using the determined scattered-radiation correction.

The invention discloses a DEM-based earth surface solar radiation prediction method, equipment and a medium. The method comprises the following steps: correcting a direct radiation reference value based on nonlinear attenuation of a cloud layer to direct radiation to obtain actual direct radiation; based on the enhancement effect of the cloud layer on the scattered radiation, correcting the scattered radiation reference value to obtain first actual scattered radiation; according to a preset shadow judgment criterion, calculating actual horizontal plane direct radiation after the actual direct radiation reaches the earth surface by taking the condition that the slope surface back to the sun has no direct radiation as a constraint; calculating second actual scattered radiation after the first actual scattered radiation reaches the earth surface according to the control of the sky vision field factor of the earth surface area on the scattered radiation; calculating reflected radiation generated after the actual direct radiation and the first actual scattered radiation reach the earth surface based on the Lambert reflection law; therefore, the total solar radiation is obtained. According to the invention, high-precision quantification of earth surface solar radiation under complex terrain conditions is realized.

A method of determining a parameter of interest of a structure comprising at least one first feature oriented along a first axis of a structure coordinate system and at least one second feature oriented along a second axis of the structure coordinate system. The method comprising: illuminating the first feature and the second feature with first illumination from a first direction oblique to said first axis and second axis, so as to generate first scattered radiation from the first feature and second scattered radiation from the second feature, detecting a first interference pattern formed by interference between a portion of the first scattered radiation and first reference illumination; detecting a second interference pattern formed by interference between a portion of the second scattered radiation and the first reference illumination; and determining the parameter of interest of the structure using the first interference pattern and the second interference pattern.

The present application relates to the technical field of photovoltaic power generation, and discloses a photovoltaic power station equipment operation optimization method, system, device and readable storage medium, the present application obtains a radiation type index by using horizontal plane total radiation data and component surface direct radiation data of the photovoltaic power station equipment, to construct a proportional quantization model about direct radiation and scattered radiation, to facilitate capturing the radiation mutation of the actual operation of the photovoltaic power station under the condition of sand and dust; then by inputting the current radiation type index and real-time environmental data into the trained random forest prediction model, the present application breaks through the limitation of the traditional power prediction model which only depends on total radiation, and can obtain more accurate predicted power; by predicting the power, the current radiation type index and the working mode type, an intelligent decision model is used for decision-making to obtain the optimal equipment operation rule, and the operation state of the photovoltaic power station equipment is optimized by using the optimal equipment operation rule, so as to ensure the efficient and reliable operation of the photovoltaic power station equipment.

A system for determining at least one biomechanical property of a reproductive cellular structure includes a radiation source for generating illuminating radiation, at least one optic for directing the illuminating radiation onto at least a portion of the reproductive cellular structure, a detector for detecting at least a portion of radiation scattered from the reproductive cellular structure, a spectrometer for generating a frequency spectrum of the detected scattered radiation, and an analyzer. The analyzer is configured to identify at least one Brillouin frequency shift in the frequency spectrum for the at least a portion of the reproductive cellular structure, and determine viability of the reproductive cellular structure based on the at least one Brillouin frequency shift.

A lithographic apparatus includes a projection system and an inspection system including a radiation system, a photonic integrated circuit system, and a detector system. The projection system projects an image of the patterning device onto a substrate. The radiation system directs radiation toward a target on the substrate to generate scattered radiation from the target. The radiation system includes a radiation source for generating radiation and an optical system for focusing the radiation onto a target. A photonic integrated circuit system includes a waveguide system integrated on a board and a radiation coupler disposed at a waveguide of the waveguide system. The radiation coupler initiates at least a portion of the scattered radiation into the waveguide system. A detector system receives the scattered radiation from the waveguide system and generates a measurement signal based on the scattered radiation.

The invention discloses an antenna near-field coupling partitioning method for scattered radiation collaborative design of a planar antenna, and relates to the technical field of antennas. The method comprises the following steps: acquiring electromagnetic field distribution data of an antenna under a target working frequency; then, according to the electromagnetic field distribution data, calculating a field function partition criterion index of the space around the antenna, so as to divide a function area of the near field of the antenna; and finally, according to the field function partition criterion index, dividing the function areas of the near field of the antenna, and loading different electromagnetic function structures in different function areas. According to the method, a systematic and quantifiable design criterion is adopted, the method is used for near-field coupling partition of the planar antenna, the layout of electromagnetic functional structures with different functions is guided, and therefore the collaborative decoupling design of the radiation performance and scattering performance of the antenna is achieved.

The invention relates to a semiconductor technology system, in particular an EUV lithography system, comprising: at least one reflective optical element (7, M1, M2), a radiation source for irradiating a surface (7a, M1a, M1b) of the reflective optical element (7, M1, M2) with useful radiation, preferably with EUV radiation (16), at least one heating radiation source (30) for irradiating the surface (7a, M1a, M1b) of the reflective optical element (7, M1, M2) with IR radiation (31), and a housing (26), preferably for encapsulating a beam path (25) of the EUV radiation (16). The housing (26) has at least one shield (29) with a surface (29a) which is preferably formed from a material which absorbs scattered IR radiation (32), in particular a gas-binding material, wherein the surface (29a) has a profiling (33) for suppressing scattered radiation, in particular EUV scattered radiation (27) and / or scattered IR radiation (32).

An embodiment of the present invention relates to an infrared scene simulation system and method. The system includes a model construction module for constructing a model to be simulated, where the model to be simulated includes a background model and a target model; a scene construction module for setting the positions and movement trajectories of the background model and the target model to form a preset visible light scene and setting scene parameters of the visible light scene; an atmosphere calculation module for calculating the atmospheric transmission transmittance, the background and surface scattering radiation intensity, and the direct solar irradiance under the scene parameters; a thermal feature solving module for calculating the temperature fields of the background model and the target model; an infrared characteristic calculation module for calculating a first infrared radiance image of the visible light scene based on the temperature fields and simulation parameters; and a sensor effect calculation module for introducing sensor effects to the first infrared radiance image based on sensor parameters to generate a final infrared simulation image. This system can obtain infrared images under any scene with high imaging efficiency.

The application discloses a kind of inclined surface hourly solar radiation calculation method and related equipment, belong to solar energy resource assessment and building energy saving technical field.The method includes: obtaining horizontal plane solar radiation data and space-time information, and the inclination and azimuth of target inclined surface;Calculate solar elevation angle, solar incidence angle, clear sky index and horizontal plane scattering radiation ratio;Two scattering radiation conversion coefficients are obtained by using two basic models respectively;At least according to clear sky index, horizontal plane scattering radiation ratio and solar incidence angle to determine dynamic weight;Two scattering radiation conversion coefficients are weighted and summed with dynamic weight, to obtain combined scattering radiation conversion coefficient, and then obtain inclined surface hourly solar total radiation.The method is combined by dynamic weight based on weather state and solar position real-time change to two basic models with obvious difference in weather adaptability, overcome the limitation that single model is only accurate under certain weather, and does not depend on multi-regional long-term measured data, improve the calculation accuracy and applicability under all weather types.

To provide a scattering type RI measurement device that can minimize a device size.SOLUTION: An RI measurement device (1) is configured to discharge radiation underground, and measure density on the basis of a scattered ray from the underground. In the RI measurement device, provided are: a case (10) that is formed into a rectangular shape, and installed on a ground surface; a radiation source (23) that is installed inside the case to discharge the radiation; a detector (26) that is installed inside the case to detect the scattered ray; and a shield body (31) that is installed inside the case to shut down the radiation ray. The radiation source and detector are installed at a diagonal position of the case, and the shield body extends in a diagonal direction toward the shield body from the radiation source in between the radiation source and the detector.SELECTED DRAWING: Figure 2

The present invention relates to a system and method for non-contact temperature measurement of a portion (3') of an object (3) coated with a layer of a luminescent material from the zinc oxide family. Using a light source (1) emitting in a wavelength range covering at least partially a range between 360 and 480 nm, and means for measuring light intensity as a function of wavelength (5) covering at least part of the range of the light source (1), the light intensity is measured as a function of the wavelength of radiation scattered by the portion of the object. Then, from the measurement of the light intensity as a function of wavelength, a value of at least one parameter is determined, and the temperature of the portion (3') of the object (3) is determined from the value of the parameter and a predetermined lookup table. Figure 2 to be published

A measuring apparatus has at least two radiation sources arranged to illuminate a measuring region of a surface of a sample, the at least two sources configured to illuminate the measuring region along at least two illumination beam paths at different angles of incidence relative to a surface normal of the surface, a detector device configured to detect at least two scattered radiation images of surface sections in the illuminated measuring region at a predetermined viewing angle relative to the surface normal of the surface, portions of the scattered radiation received by the detector device, which portions are formed in each case by the illumination in one of the illumination beam paths, in each case having a common spatial frequency, and an evaluation device configured to determine at least one roughness feature of the surface sections from the at least two scattered radiation images.

This invention discloses a calculation method for an optical model of a parallel slat transparent heat-insulating window, including: determining environmental parameters such as the sun's position; determining the solar radiation value and the incident angle of direct radiation; determining the maximum number of reflections and the incident light segmentation ratio; calculating the transmittance of direct-to-direct radiation from the slats; calculating the transmittance and reflectance of direct-to-scattered radiation from the slats; calculating the transmittance and reflectance of scattered-to-scattered radiation from the slats; determining the transmittance, reflectance, and absorptivity of back radiation transmission; calculating the transmittance and reflectance of direct radiation, and the transmittance and reflectance of scattered radiation from the single-pane glass; calculating the solar radiation transmission through the parallel slat transparent heat-insulating window using the net radiation method; and further fitting a simplified formula for calculating solar transmittance. This invention enables designers to perform optical calculations on parallel slat transparent heat-insulating windows and reasonably evaluate their performance and energy-saving potential.

This invention relates to the field of radiation sterilization technology and discloses an irradiation sterilization device for cosmetics, comprising: support legs and a transmission belt frame mounted on top of them. A rotating shaft is disposed inside the transmission belt frame, and a conveying platform is disposed outside the rotating shaft. An electron beam chamber is disposed outside the transmission belt frame, and a support platform is fixedly mounted on the top of the electron beam chamber. Vertical poles are symmetrically fixed on the top of the support platform, and a retaining pin is disposed on the lower surface of the top of each vertical pole. This invention uses a follow-up shielding part to automatically conform to the top of the cosmetics and block scattered radiation, thus preventing excessive radiation burns to the cosmetics while eliminating irradiation dead zones, resulting in more uniform and thorough sterilization. A linkage part directly links the height of the cosmetics with the conveying speed, adapting to cosmetics of different heights and pre-matching a reasonable irradiation time. A temperature control and speed adjustment part automatically fine-tunes the conveying speed based on temperature feedback, ensuring that the irradiation dose remains stable within the acceptable range.

Disclosed is an illumination and detection arrangement for a lithographic or inspection apparatus, comprising: a plurality of individually configurable illumination sources located in an illumination plane, each being operable to emit illumination radiation; an objective lens defining an objective NA area and configured to receive the illumination radiation, focus it onto a structure in an object plane, and subsequently collect radiation scattered from the structure upon illumination; and at least one image sensor located in a detection plane and configured to detect at least one portion of the scattered radiation collected by the objective lens and record an image associated with the structure; wherein the at least one portion of the scattered radiation either is detected at or passes through the illumination plane.

Disclosed is a method of measuring a target on a substrate comprising: illuminating a target with measurement radiation comprising at least a first wavelength, collecting the resultant scattered radiation within a collection numerical aperture; and determining a parameter of interest from said scattered radiation. The target comprises a mediator periodic structure and at least a first target periodic structure each in a respective different layer on the substrate, wherein a pitch of at least the mediator periodic structure is below a single diffraction limit defined by the collection numerical aperture and a wavelength of said measurement radiation, such that said scattered radiation comprises double diffracted radiation, said double diffracted radiation comprising radiation having undergone two sequential same-order diffractions of opposite sign.

The utility model relates to an anti-radiation cover towel which comprises a cover towel body, and the cover towel body comprises an outer sleeve layer and an anti-radiation layer arranged in the outer sleeve layer. A window, a cutting line I and a cutting line II are arranged on the cover towel body, the cutting line I is longitudinally arranged and located on the rear side of the window, and the front end and the rear end of the cutting line I extend to the window and the rear edge of the cover towel body respectively; the number of the cutting lines II is two, the two cutting lines II are oppositely arranged in tandem, the front end of the cutting line II located on the front side extends to the edge of the front side of the cover towel body, and the cutting line II located on the rear side extends to the edge of the rear side of the cover towel body. The radiation shielding device is simple in structure, scattered radiation generated in the examination process can be effectively shielded in the examination process, and harm of the scattered radiation to medical staff is avoided.